Test device

Abstract

The utility model discloses an embodiment of the utility model discloses a kind of test devices, which is used to test product to be tested, product to be tested includes pin, pin includes upper test point and lower test point.The test device includes bearing structure and the first probe and the second probe on bearing structure. Among them, bearing structure is used to place product to be tested, the first probe is electrically contacted lower test point of product to be tested from below product to be tested, and the second probe is electrically contacted upper test point of product to be tested from above product to be tested. Therefore, test device realizes stable electrical contact from two sides with the upper and lower test points of product to be tested, to realize accurate detection to the electrical property of product to be tested.

Description

Technical Field

[0001] This utility model relates to the field of semiconductor packaging and testing technology, and in particular to a testing device. Background Technology

[0002] With the development of power modules, their designs have become increasingly diverse and complex. Consequently, testing of power modules, including electrical parameters and aging tests, has become more complex, placing higher demands on the accuracy and stability of testing tools. Currently, traditional testing equipment typically only places probes on one side. However, power modules have multiple signal pins and power pins, which are not on the same side. Traditional testing equipment cannot meet the current testing needs of power modules. Utility Model Content

[0003] In view of this, the purpose of this utility model is to provide a testing device that makes electrical contact with the test points of the product under test from both sides through a first probe and a second probe, so as to achieve accurate detection of the electrical performance of the product under test.

[0004] This utility model provides a testing device for testing a product under test. The product under test includes pins, each pin including an upper test point and a lower test point. The testing device includes: a support structure configured to hold the product under test; a first probe disposed on the support structure and electrically contacting the lower test point of the product under test from below; and a second probe disposed on the support structure and electrically contacting the upper test point of the product under test from above.

[0005] Preferably, the testing device further includes an upper cover, which is movably mounted on the supporting structure.

[0006] Preferably, the testing device further includes: a movable component, which is movably disposed on the supporting structure and movably connected to the upper cover, and the movable component is provided with the second probe.

[0007] Preferably, the top cover is configured to move between a first position and a second position; wherein, when the top cover moves to the first position, it causes the second probe to move away from the support structure, and when the top cover moves to the second position, it causes the second probe to make electrical contact with the product under test from above.

[0008] Preferably, the upper cover is provided with a first guide portion; the movable part is provided with a first mating portion, and the first mating portion matches the first guide portion.

[0009] Preferably, the movable component includes: a rotating part rotatably connected to the bearing structure, the rotating part having the first mating part; and a supporting part extending from the rotating part toward one side, the supporting part having the second probe mounted on it.

[0010] Preferably, the testing device further includes a reset member disposed between the support structure and the upper cover, and configured to drive the upper cover to move to the second position.

[0011] Preferably, there are four reset components, which are spaced apart between the support structure and the top cover.

[0012] Preferably, the testing apparatus further includes a locking element disposed on the support structure and configured to lock the product to be tested.

[0013] Preferably, the locking member is rotatably mounted on the supporting structure and movably connected to the upper cover; wherein, when the upper cover moves to the first position, it causes the locking member to disengage from the product under test, and when the upper cover moves to the second position, it causes the locking member to lock the product under test.

[0014] Preferably, the locking member is provided with a second guide portion; the upper cover is provided with a second mating portion, and the second mating portion matches the second guide portion.

[0015] Preferably, the locking member includes: a main body portion, which is rotatably connected to the load-bearing structure, and the main body portion is provided with a second guide portion; and a hook portion, which extends from the main body portion toward the product to be tested.

[0016] Preferably, the supporting structure is provided with a limiting groove, which accommodates the product to be tested.

[0017] Preferably, the supporting structure is provided with a third guide portion; the upper cover is provided with a third mating portion, and the third mating portion matches the third guide portion.

[0018] Preferably, the product under test is a power module, which includes several signal pins and several power pins.

[0019] Preferably, the power pins include a DC positive pin, a DC negative pin, and an AC pin.

[0020] Preferably, the power module includes an upper bridge power unit and a lower bridge power unit, the upper bridge power unit and the lower bridge power unit are in the same package, and the DC positive pin is located at the top of the power module.

[0021] Preferably, the first probe makes electrical contact with the DC positive pin of the power pin.

[0022] Preferably, the second probe includes a first set of probes and a second set of probes, wherein the first set of probes makes electrical contact with the AC pins in the power pins, and the second set of probes makes electrical contact with the signal pins in the upper bridge power unit.

[0023] Preferably, the signal pin includes one or more of the following: gate pin, source pin, Kelvin pin, and temperature sampling pin.

[0024] Preferably, the second probe includes a third set of probes and a fourth set of probes, wherein the third set of probes electrically contacts the DC negative pin in the power pin, and the fourth set of probes electrically contacts the signal pin in the lower bridge power unit.

[0025] Preferably, the signal pin includes one or more of the following: gate pin, source pin, Kelvin pin, and temperature sampling pin.

[0026] Preferably, the two power modules respectively form an upper bridge power unit and a lower bridge power unit. The upper bridge power unit includes a first power pin, a second power pin, and a signal pin, and the lower bridge power unit includes a first power pin, a second power pin, and a signal pin.

[0027] Preferably, the second power pin of the upper bridge power unit is connected to the first power pin of the lower bridge power unit as an AC pin, and the first probe makes electrical contact with the AC pin.

[0028] Preferably, the second probe includes a first set of probes and a second set of probes, the first set of probes electrically contacting the first power pin of the upper bridge power unit, and the second set of probes electrically contacting the signal pin of the upper bridge power unit.

[0029] Preferably, the signal pin includes one or more of the following: gate pin, source pin, Kelvin pin, and temperature sampling pin.

[0030] Preferably, the second probe includes a third set of probes and a fourth set of probes, the third set of probes electrically contacting the second power pin of the lower bridge power unit, and the fourth set of probes electrically contacting the signal pin of the lower bridge power unit.

[0031] Preferably, the signal pin includes one or more of the following: gate pin, source pin, Kelvin pin, and temperature sampling pin.

[0032] This invention provides a testing device for testing a product under test. The product under test includes pins, with upper and lower test points. The testing device includes a support structure and a first probe and a second probe disposed on the support structure. The support structure holds the product under test. The first probe makes electrical contact with the lower test point of the product under test from below, and the second probe makes electrical contact with the upper test point of the product under test from above. Thus, the testing device achieves stable electrical contact with the upper and lower test points of the product under test from both sides, enabling accurate detection of the electrical performance of the product under test.

[0033] In addition, the testing device includes a top cover and a movable component movably mounted on the support structure. The movable component is movably connected to the top cover and has a second probe. The movable component has a first mating part, and the top cover has a first guide part that matches the first mating part. When the top cover moves to the first position, it drives the second probe away from the support structure. When the top cover moves to the second position, it drives the second probe to make electrical contact with the product under test from above, thereby achieving automatic closing of the second probe to complete the test through the linkage between the top cover and the movable component. Simultaneously, the testing device also includes a locking component, which is rotatably mounted on the support component and movably connected to the top cover. When the top cover moves to the first position, it drives the locking component to disengage from the product under test. When the top cover moves to the second position, it drives the locking component to lock the product under test, thereby preventing displacement of the product under test during testing and ensuring testing efficiency and accuracy. On the other hand, the product under test is a power module. The power module has several signal pins. The test device is used for high-temperature aging reverse bias test or insulation test of the power module. During the test, the test device makes electrical contact with the DC positive pin of the power pin through the first probe, and makes electrical contact with the AC pin and DC negative pin of the power pin through the second probe. After the test device is connected to the power module, a voltage is applied between the first probe and the second probe, thereby realizing the test of the power module with a specific structure. Attached Figure Description

[0034] The above and other objects, features, and advantages of the present invention will become clearer from the following description of embodiments of the present invention with reference to the accompanying drawings, in which: Figure 1 This is a schematic diagram of the structure of the testing device provided in this embodiment of the utility model; Figure 2 This is another structural schematic diagram of the testing device provided in this embodiment of the utility model; Figure 3 This is a cross-sectional schematic diagram of the testing device provided in this embodiment of the utility model; Figure 4 This is another cross-sectional schematic diagram of the testing device provided in this embodiment of the utility model; Figure 5 This is another cross-sectional schematic diagram of the testing device provided in this embodiment of the utility model; Figure 6 This is a schematic diagram of the first state of the testing device provided in this embodiment of the present invention; Figure 7 This is a schematic diagram of the second state of the testing device provided in this embodiment of the present invention; Figure 8 This is a schematic diagram of the third state of the testing device provided in this embodiment of the present invention.

[0035] Explanation of reference numerals in the attached figures: 1-Bearing structure; 11-First probe; 12-Limiting groove; 13-Third guide part; 2-Top cover; 21-First guide part; 22-Second mating part; 23-Third mating part; 3-Moving part; 31-Second probe; 32-First mating part; 33-Rotating part; 34-Support part; 35-First rotating shaft; 4-Reset part; 5-Locking part; 51-Second guide part; 52-Main body part; 53-Hook part; 54-Second rotating shaft; A-Product to be tested. Detailed Implementation

[0036] The present application is described below based on embodiments, but it is not limited to these embodiments. In the detailed description of the present application below, certain specific details are described in detail. Those skilled in the art can fully understand the present application without these details. To avoid obscuring the substance of the present application, well-known methods, processes, flows, elements, and circuits are not described in detail.

[0037] Furthermore, those skilled in the art should understand that the accompanying drawings provided herein are for illustrative purposes only and are not necessarily drawn to scale.

[0038] Unless otherwise expressly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0039] For ease of explanation, spatially related terms such as “inside,” “outside,” “below,” “below,” “lower,” “above,” “upper,” etc., are used herein to describe the relationship between one element or feature illustrated in the figure and another. It will be understood that spatially related terms may be intended to encompass different orientations of the device in use or operation besides those depicted in the figure. For example, if the device in the figure is flipped, an element described as “below” or “below” another element or feature would then be positioned “above” that other element or feature. Thus, the exemplified term “below” can encompass both above and below orientations. The device may be oriented in other ways (rotated 90 degrees or in other orientations), and the spatially related descriptive terms used herein should be interpreted accordingly.

[0040] Unless the context explicitly requires it, words such as "including" or "contains" throughout the application should be interpreted as including rather than exclusive or exhaustive; that is, meaning "including but not limited to".

[0041] In the description of this application, it should be understood that the terms "first," "second," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance. Furthermore, in the description of this application, unless otherwise stated, "a plurality of" means two or more.

[0042] Figure 1 This is a schematic diagram of the structure of the testing device provided in this embodiment of the utility model. Figure 2 This is another structural schematic diagram of the testing device provided in this embodiment of the utility model. Figure 3 This is a cross-sectional schematic diagram of the testing device provided in this embodiment of the utility model. Figure 4 This is another cross-sectional schematic diagram of the testing device provided in this embodiment of the utility model, combined with... Figures 1 to 4 As shown, the testing device includes a supporting structure 1, a top cover 2, and a movable component 3. Specifically, the supporting structure 1 supports the entire testing device and is used to place the product A to be tested. A first probe 11 is provided on the supporting structure 1. When the product A to be tested is placed on the supporting structure 1, the first probe 11 makes electrical contact with the product A from below. On the other hand, the top cover 2 is movably mounted on the supporting structure 1 and configured to move between a first position and a second position. The movable component 3 is rotatably mounted on the supporting structure 1 and movably connected to the top cover 2. Figure 3 As shown, the upper cover 2 abuts against the supporting structure 1, that is, the upper cover 2 is in the first position, at which time the movable part 3 opens outward. Figure 5 This is another cross-sectional schematic diagram of the testing device provided in this embodiment of the utility model, as shown below. Figure 5As shown, the upper cover 2 is detached from the supporting structure 1, that is, the upper cover 2 is in the second position, at which time the movable part 3 closes inward. Further, the movable part 3 is provided with a second probe 31. Specifically, when the upper cover 2 moves to the first position, it causes the second probe 31 to move away from the supporting structure 1; when the upper cover 2 moves to the second position, it causes the second probe 31 to make electrical contact with the product under test A from above. It should be noted that the product under test A includes a plastic-encapsulated single-tube product with pins, including upper and lower test points. The testing device performs tests on the product under test A, including but not limited to dynamic and static tests and aging tests, and is suitable for accurate evaluation of the product's electrical parameters, aging, and other conditions.

[0043] Figure 6 This is a schematic diagram of the first state of the testing device provided in this embodiment of the present invention, in conjunction with... Figure 3 and Figure 6 As shown, when the testing device is in the first state, the upper cover 2 abuts against the supporting structure 1. At this time, the upper cover 2 is in the first position, and the movable part 3 rotates to the open state under the action of the upper cover 2, thereby driving the second probe 31 away from the supporting structure 1 so as to place the product A to be tested. Figure 7 This is a schematic diagram of the second state of the testing device provided in this embodiment of the present invention, in conjunction with... Figure 4 and Figure 7 As shown, when the upper cover 2 moves from the first position to the second position, the testing device is in the second state. At this time, the upper cover 2 gradually moves away from the support structure 1, and the movable part 3 rotates under the action of the upper cover 2 so that the second probe 31 gradually approaches the support structure 1, that is, gradually approaches the product A to be tested placed on the support structure 1. Figure 8 This is a schematic diagram of the third state of the testing device provided in this embodiment of the utility model, combined with... Figure 5 and Figure 8 As shown, when the testing device is in the first state, the upper cover 2 is away from the supporting structure 1, and the upper cover 2 is in the second position. The movable part 3 rotates to the closed state under the action of the upper cover 2, thereby driving the second probe 31 to make electrical contact with the product under test A from above. The second probe 31 then cooperates with the first probe 11 to complete the test. Thus, the testing device, through the cooperation of the upper cover 2 and the movable part 3, automatically closes the second probe 31, thereby achieving precise electrical contact and stable conduction between the second probe 31 and the product under test A, and thus achieving accurate detection of the product's electrical performance. At the same time, the testing device is easy to operate and allows for easy handling of the product under test A.

[0044] like Figure 3As shown, in one embodiment, the upper cover 2 is provided with a first guide portion 21. It should be noted that the movable member 3 is rotatably mounted on the supporting structure 1 via a first rotating shaft 35, and the first guide portion 21 forms an arc-shaped groove around the first rotating shaft 35. Correspondingly, the movable member 3 is provided with a first mating portion 32. It should be noted that the first mating portion 32 is configured as a cylindrical protrusion that matches the first guide portion 21. Furthermore, the first mating portion 32 extends into the first guide portion 21 and can conform to the two side walls of the first guide portion 21 to achieve relative movement with the first guide portion 21. It should be noted that when the upper cover 2 is in the first position, the first mating portion 32 is located at the uppermost end within the first guide portion 21; when the upper cover 2 is in the second position, the first mating portion 32 is located at the lowermost end within the first guide portion 21. In other words, when the upper cover 2 moves from the first position to the second position, the sidewall of the first guide portion 21 applies a force to the first mating portion 32, forcing the first mating portion 32 to move along the first guide portion 21 to its lowest point, thereby causing the movable part 3 to rotate around the first pivot 35 to close. Correspondingly, when the upper cover 2 moves from the second position to the first position, the sidewall of the first guide portion 21 applies a force to the first mating portion 32, forcing the first mating portion 32 to move along the first guide portion 21 to its highest point, thereby causing the movable part 3 to rotate around the first pivot 35 to open. Thus, the movement of the upper cover 2 can trigger the linkage of the movable part 3. Optionally, the first pivot 35 is set as a pin.

[0045] like Figure 3 As shown, in one embodiment, the movable part 3 includes a rotating part 33 and a supporting part 34. Specifically, the rotating part 33 is rotatably connected to the bearing structure 1 via a first rotating shaft 35, and a first mating part 32 is disposed on the rotating part 33. Further, the supporting part 34 extends from the rotating part 33 to one side, and a second probe 31 is mounted on the supporting part 34. It should be noted that the number of movable parts 3 can be set according to the test requirements, and the number of first rotating shafts 35 is the same as the number of movable parts 3. For example, there are two movable parts 3 and two first rotating shafts 35, and the two movable parts 3 are located on both sides of the product A to be tested and are symmetrically arranged. It should be further noted that the number of second probes 31 mounted on each movable part 3 can also be set according to the test requirements, for example, one, two or more second probes 31 can be provided on each movable part 3.

[0046] like Figure 4As shown, in one embodiment, the testing device further includes a reset member 4. Optionally, the reset member 4 is configured as a spring. Specifically, the reset member 4 is disposed between the support structure 1 and the upper cover 2, and is configured to drive the upper cover 2 to move to a second position. That is, when the upper cover 2 is in the first position, the reset member 4 is in a compressed state. It is easy to understand that when testing the product A to be tested, a downward external force is first applied to the upper cover 2 to move the upper cover 2 from the second position to the first position and compress the reset member 4, thereby opening the movable member 3 under the action of the upper cover 2 to insert the product A to be tested. Then, the external force is removed, causing the upper cover 2 to move upward to the second position under the action of the reset member 4, thereby closing the movable member 3 under the action of the upper cover 2, thereby achieving electrical contact between the first probe 11 and the second probe 31 for testing of the product A to be tested. After the test is completed, an external force can be applied to the upper cover 2 to remove the product. In addition, the reset member 4 can also limit the stroke of the upper cover 2. For example, the stroke of the upper cover 2 is set to 4.6 mm.

[0047] In one embodiment, four reset members 4 are spaced apart between the support structure 1 and the top cover 2. Optionally, the support structure 1 and the top cover 2 are configured as cuboid structures, and the product A to be tested is placed in the central area of ​​the support structure 1 and the top cover 2. The four reset members 4 are distributed at the four corners of the support structure 1 and the top cover 2 to ensure the stability of the movement of the top cover 2.

[0048] Combination Figure 3 and Figure 4 As shown, in one embodiment, the testing device further includes a locking member 5. Specifically, the locking member 5 is rotatably mounted on the supporting structure 1 and movably connected to the upper cover 2. Further, when the upper cover 2 moves to the first position, it causes the locking member 5 to disengage from the product under test A; when the upper cover 2 moves to the second position, it causes the locking member 5 to lock the product under test A. It is easy to understand that when the upper cover 2 moves from the second position to the first position under the action of an external force, the movable member 3 and the locking member 5 open synchronously to pick up and put down the product under test A, adapting to batch testing requirements; when the upper cover 2 moves from the first position to the second position under the action of the reset member 4, the locking member 5 locks the product under test A, while the movable member 3 closes to allow the second probe 31 to contact the product under test A for testing. Optionally, there are two locking members 5 and they are distributed on both sides of the product under test A. For example, the opening angle of the two movable members 3 is set to 42 degrees, and the opening angle of the two locking members 5 is set to 54 degrees. Therefore, the locking element 5 can lock the product under test A to prevent the product under test A from moving during the test, thereby ensuring that the second probe 31 can accurately contact the predetermined position of the product under test A, thus improving the test efficiency and accuracy.

[0049] like Figure 3As shown, in one embodiment, the locking member 5 is provided with a second guide portion 51. It should be noted that the locking member 5 is rotatably mounted on the supporting structure 1 via a second rotating shaft 54, and the second guide portion 51 is located on the side of the second rotating shaft 54 ​​away from the product A to be tested and is configured as a groove structure. Correspondingly, the upper cover 2 is provided with a second mating portion 22. It should be noted that the second mating portion 22 is configured as a cylindrical protrusion structure that matches the second guide portion 51. Furthermore, the second mating portion 22 extends into the second guide portion 51 and can conform to the two side walls of the second guide portion 51 to achieve relative movement with the second guide portion 51. It should be noted that when the upper cover 2 moves between the first position and the second position, the second mating portion 22 moves within the second guide portion 51, simultaneously driving the locking member 5 to rotate around the second rotating shaft 54 ​​to lock or unlock the product A to be tested. Therefore, the movement of the upper cover 2 can trigger the linkage of the locking element 5. The coordinated action of the reset element 4 and the locking element 5 can achieve accurate mechanical stroke control. The automatic alignment of the moving part 3 and the locking element 5 by the reset element 4 helps to improve the reliability and operational efficiency of the test circuit. Optionally, the second rotating shaft 54 ​​is set as a pin.

[0050] like Figure 3 As shown, in one embodiment, the locking member 5 includes a main body 52 and a hook portion 53. Specifically, the main body 52 is rotatably connected to the supporting structure 1, and a second guide portion 51 is disposed on the main body 52. ​​Further, the hook portion 53 extends from the main body 52 to one side. It is readily understood that the hook portion 53 is configured as a hook-shaped structure, which helps to lock the product A to be tested.

[0051] like Figure 4 As shown, in one embodiment, the supporting structure 1 is provided with a limiting groove 12. Specifically, the limiting groove 12 is used to accommodate the product A to be tested. It should be noted that the limiting groove 12 matches the product A to be tested in order to position and place the product A to be tested. Further, the first probe 11 makes electrical contact with the product A to be tested through the limiting groove 12.

[0052] Combination Figures 6 to 8 As shown, in one embodiment, the supporting structure 1 is provided with a third guide portion 13. It should be noted that the third guide portion 13 is located on the outer side of the supporting structure 1 and is formed as a groove structure along the movement direction of the upper cover 2, that is, it is arranged in the vertical direction. Correspondingly, the upper cover 2 is provided with a third mating portion 23. It should be noted that the third mating portions 23 protrude from the upper cover 2 in the vertical direction, and their number and position match those of the third guide portions 13. Furthermore, the third mating portions 23 extend into the third guide portion 13. Thus, when the upper cover 2 moves vertically under the action of an external force or the reset member 4, the third mating portions 23 move along the third guide portion 13 to achieve guiding and limiting functions.

[0053] In one embodiment, the product under test, A, is a power module, which includes several signal pins and several power pins. Further, the power pins include a DC positive pin, a DC negative pin, and an AC pin. The power module includes an upper-bridge power unit and a lower-bridge power unit, which are housed in the same package, with the DC positive pin located at the top of the power module. A first probe electrically contacts the DC positive pin among the power pins. Optionally, a second probe includes a first group of probes and a second group of probes. The first group of probes electrically contacts the AC pin among the power pins, and the second group of probes electrically contacts the signal pins in the upper-bridge power unit. The signal pins include one or more of a gate pin, a source pin, a Kelvin pin, and a temperature sampling pin. Optionally, the second probe includes a third group of probes and a fourth group of probes. The third group of probes electrically contacts the DC negative pin among the power pins, and the fourth group of probes electrically contacts the signal pins in the lower-bridge power unit. The signal pins include one or more of a gate pin, a source pin, a Kelvin pin, and a temperature sampling pin.

[0054] In one embodiment, the product under test A is a power module, which includes several signal pins and several power pins. Further, two power modules respectively form an upper-bridge power unit and a lower-bridge power unit. The upper-bridge power unit includes a first power pin, a second power pin, and a signal pin, and the lower-bridge power unit includes a first power pin, a second power pin, and a signal pin. The second power pin of the upper-bridge power unit is connected to the first power pin of the lower-bridge power unit as an AC pin, and a first probe electrically contacts the AC pin. Optionally, the second probe includes a first set of probes and a second set of probes. The first set of probes electrically contacts the first power pin of the upper-bridge power unit, and the second set of probes electrically contacts the signal pin of the upper-bridge power unit. The signal pin includes one or more of a gate pin, a source pin, a Kelvin pin, and a temperature sampling pin. Optionally, the second probe includes a third set of probes and a fourth set of probes. The third set of probes electrically contacts the second power pin of the lower-bridge power unit, and the fourth set of probes electrically contacts the signal pin of the lower-bridge power unit. The signal pin includes one or more of a gate pin, a source pin, a Kelvin pin, and a temperature sampling pin.

[0055] This utility model provides a testing device, which includes a supporting structure, a top cover, and a movable component. The supporting structure is used to place the product to be tested and has a first probe on it. The first probe makes electrical contact with the product to be tested from below. The top cover is movably mounted on the supporting structure and configured to move between a first position and a second position. The movable component is rotatably mounted on the supporting structure and movably connected to the top cover, and has a second probe on it. When the top cover moves to the first position, it moves the second probe away from the supporting structure; when the top cover moves to the second position, it moves the second probe to make electrical contact with the product to be tested from above. Thus, the testing device, through the cooperation of the top cover and the movable component, automatically closes the second probe, achieving stable electrical contact with the upper and lower test points of the product to be tested from both sides. This ensures precise electrical contact and stable conduction between the second probe and the product to be tested, thereby enabling accurate detection of the product's electrical performance. Furthermore, the testing device is easy to operate and allows for easy handling of the product. In addition, the testing device has a compact structure, low cost, and is easy to manufacture and maintain.

[0056] The above description is merely a preferred embodiment of this application and is not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A testing apparatus for testing a product under test, the product under test including pins, the pins including upper test points and lower test points, characterized in that, The testing apparatus includes: A support structure configured to hold the product to be tested; A first probe, disposed on the supporting structure, electrically contacts the lower test point of the product under test from below; and The second probe is disposed on the support structure and makes electrical contact with the upper test point of the product under test from above.

2. The testing apparatus according to claim 1, characterized in that, The testing apparatus also includes: The upper cover is movably mounted on the supporting structure.

3. The testing apparatus according to claim 2, characterized in that, The testing apparatus also includes: A movable component is movably mounted on the supporting structure and movably connected to the upper cover, and the movable component is provided with the second probe.

4. The testing apparatus according to claim 3, characterized in that, The top cover is configured to move between a first position and a second position; When the top cover moves to the first position, it causes the second probe to move away from the supporting structure. When the top cover moves to the second position, it causes the second probe to make electrical contact with the product under test from above.

5. The testing apparatus according to claim 4, characterized in that, The upper cover is provided with a first guide portion; The movable part is provided with a first mating part, which matches the first guide part.

6. The testing apparatus according to claim 5, characterized in that, The movable component includes: A rotating part, rotatably connected to the bearing structure, wherein the rotating part is provided with the first mating part; and A support portion, which extends to one side from the rotating portion, and the second probe is mounted on the support portion.

7. The testing apparatus according to claim 4, characterized in that, The testing apparatus also includes: A reset element is disposed between the support structure and the upper cover and is configured to drive the upper cover to move to the second position.

8. The testing apparatus according to claim 7, characterized in that, There are four reset components, which are spaced apart between the support structure and the top cover.

9. The testing apparatus according to claim 4, characterized in that, The testing apparatus also includes: A locking element, which is disposed on the support structure and configured to lock the product under test.

10. The testing apparatus according to claim 9, characterized in that, The locking element is rotatably mounted on the bearing structure and movably connected to the upper cover; When the top cover moves to the first position, it causes the locking component to disengage from the product under test; when the top cover moves to the second position, it causes the locking component to lock the product under test.

11. The testing apparatus according to claim 10, characterized in that, The locking component is provided with a second guide portion; The upper cover is provided with a second mating part, which matches the second guide part.

12. The testing apparatus according to claim 11, characterized in that, The locking element includes: The main body is rotatably connected to the supporting structure, and the main body is provided with the second guide portion; and A hook portion that extends from the main body toward the product to be tested.

13. The testing apparatus according to claim 1, characterized in that, The supporting structure is provided with a limiting groove, which accommodates the product to be tested.

14. The testing apparatus according to claim 2, characterized in that, The load-bearing structure is provided with a third guide section; The upper cover is provided with a third mating part, which matches the third guide part.

15. The testing apparatus according to claim 1, characterized in that, The product under test is a power module, which includes several signal pins and several power pins.

16. The testing apparatus according to claim 15, characterized in that, The power pins include a DC positive pin, a DC negative pin, and an AC pin.

17. The testing apparatus according to claim 16, characterized in that, The power module includes an upper bridge power unit and a lower bridge power unit, which are housed in the same package. The DC positive pin is located at the top of the power module.

18. The testing apparatus according to claim 17, characterized in that, The first probe makes electrical contact with the DC positive pin of the power pin.

19. The testing apparatus according to claim 17, characterized in that, The second probe includes a first set of probes and a second set of probes. The first set of probes makes electrical contact with the AC pins in the power pins, and the second set of probes makes electrical contact with the signal pins in the upper bridge power unit.

20. The testing apparatus according to claim 19, characterized in that, The signal pins include one or more of the following: gate pin, source pin, Kelvin pin, and temperature sampling pin.

21. The testing apparatus according to claim 17, characterized in that, The second probe includes a third set of probes and a fourth set of probes. The third set of probes makes electrical contact with the DC negative pin in the power pin, and the fourth set of probes makes electrical contact with the signal pin in the lower bridge power unit.

22. The testing apparatus according to claim 21, characterized in that, The signal pins include one or more of the following: gate pin, source pin, Kelvin pin, and temperature sampling pin.

23. The testing apparatus according to claim 15, characterized in that, The two power modules respectively form an upper bridge power unit and a lower bridge power unit. The upper bridge power unit includes a first power pin, a second power pin, and a signal pin. The lower bridge power unit includes a first power pin, a second power pin, and a signal pin.

24. The testing apparatus according to claim 23, characterized in that, The second power pin of the upper bridge power unit is connected to the first power pin of the lower bridge power unit as an AC pin, and the first probe makes electrical contact with the AC pin.

25. The testing apparatus according to claim 24, characterized in that, The second probe includes a first set of probes and a second set of probes. The first set of probes makes electrical contact with the first power pin of the upper bridge power unit, and the second set of probes makes electrical contact with the signal pin of the upper bridge power unit.

26. The testing apparatus according to claim 25, characterized in that, The signal pins include one or more of the following: gate pin, source pin, Kelvin pin, and temperature sampling pin.

27. The testing apparatus according to claim 24, characterized in that, The second probe includes a third set of probes and a fourth set of probes. The third set of probes makes electrical contact with the second power pin of the lower bridge power unit, and the fourth set of probes makes electrical contact with the signal pin of the lower bridge power unit.

28. The testing apparatus according to claim 27, characterized in that, The signal pins include one or more of the following: gate pin, source pin, Kelvin pin, and temperature sampling pin.

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