Positive-to-negative integrated circuit full parameter automatic test device

Abstract

The utility model discloses a kind of positive pressure conversion negative pressure integrated circuit full parameter automation testing device, it is related to electronic component testing technical field, including host computer, floating voltage current source module and test circuit, floating voltage current source module is connected with the integrated circuit to be tested by test circuit;Host computer is integrated test program in, so that host computer is given specified input and load by test program control floating voltage current source module to the integrated circuit to be tested in test circuit;Floating voltage current source samples and feeds back to host computer to the input, output of the integrated circuit to be tested, so that host computer is handled and analyzed to complete test by test program to sampling data.The utility model can test the full parameter of positive pressure conversion negative voltage stabilizing integrated circuit, betterly reflect the working performance of positive pressure conversion negative voltage stabilizing integrated circuit, test the full parameter of positive pressure conversion negative voltage stabilizing integrated circuit by host computer program control, so that testing process is simple and fast.

Description

Technical Field

[0001] This utility model relates to the field of electronic component testing technology, and in particular to an automated testing device for all parameters of integrated circuits that converts positive voltage to negative voltage. Background Technology

[0002] All parameters of a positive-to-negative voltage regulator integrated circuit are crucial indicators for its evaluation. If even one parameter fails to meet specifications, the integrated circuit's performance will not meet requirements. While automated testing of this type of circuit is currently possible, it has the following drawbacks:

[0003] The test parameter coverage is low; currently, although this positive-to-negative voltage regulator IC can achieve automated testing, it can only test parameters including VOUT1, VOUT2, and IQ, and cannot achieve automated testing of all parameters. Testing and verifying parameters that cannot be automated requires a significant amount of time and manpower.

[0004] Therefore, developing a fully automated testing device for positive-to-negative voltage regulator integrated circuits has significant practical implications. Utility Model Content

[0005] The purpose of this invention is to provide an automated testing device for all parameters of integrated circuits that converts positive voltage to negative voltage, so as to solve the problems mentioned in the background art.

[0006] To achieve the above objectives, this utility model provides the following technical solution: an automated testing device for all parameters of a positive-to-negative voltage integrated circuit, comprising a host computer, a floating voltage and current source module, and a testing circuit, wherein the floating voltage and current source module is connected to the integrated circuit to be tested installed in the testing circuit through the testing circuit;

[0007] The host computer integrates a test program, which enables the host computer to control the floating voltage and current source module to provide specified inputs and loads to the integrated circuit under test in the test circuit through the test program.

[0008] The floating voltage and current source samples the input and output of the integrated circuit under test and feeds it back to the host computer, so that the host computer can process and analyze the sampled data through the test program to complete the full parameter test of the positive voltage to negative voltage regulator integrated circuit.

[0009] Preferably, the test circuit is connected to the integrated circuit under test via a fixture, so that the test circuit provides a working environment for the integrated circuit under test.

[0010] Preferably, the host computer and the floating voltage and current source are powered by 220V AC power.

[0011] Preferably, the floating voltage and current source module is connected to the host computer via a cable, and the floating voltage and current source module is connected to the two inputs, two outputs, enable, and ground plane of the integrated circuit under test through the interface on the test circuit.

[0012] Preferably, the floating voltage and current source module is provided with three voltage sources, namely two input channels and one enable channel, which are used to provide the input voltage value of the integrated circuit under test, provide the enable signal, and monitor and test the input voltage and enable signal and the current.

[0013] Preferably, the floating voltage and current source module is provided with two current sources, which are two input paths used to provide the load current value of the integrated circuit to be tested and to monitor the output load current and test the output voltage.

[0014] The technical effects and advantages of this utility model are as follows:

[0015] The fully automated testing device for positive-to-negative voltage regulator integrated circuits provided by this utility model can control a floating voltage and current source module through a host computer to provide specified inputs and loads to the integrated circuit under test. The floating voltage and current source module then samples the inputs and outputs of the integrated circuit under test. The sampled data is processed by a program with given parameters to realize fully automated testing of positive-to-negative voltage regulator integrated circuits. The entire testing process is simple and fast, which can reduce the investment of time and manpower costs, and can more intuitively evaluate the performance of positive-to-negative voltage regulator integrated circuits. Attached Figure Description

[0016] Figure 1 This is a block diagram of the fully automated testing device for the positive-to-negative voltage regulator integrated circuit in this utility model.

[0017] Figure 2 This is a test flowchart of the fully automated test device for positive-to-negative voltage regulator integrated circuits in this utility model. Detailed Implementation

[0018] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0019] This utility model provides, for example Figures 1-2The device described is an automated testing device for all parameters of a positive-to-negative voltage integrated circuit, comprising a host computer, a floating voltage and current source module, and a test circuit. The floating voltage and current source module is connected to the integrated circuit under test (positive-to-negative voltage regulator integrated circuit) installed in the test circuit through the test circuit. The host computer and the floating voltage and current source module constitute the test module, while the test current and the current of the integrated circuit under test constitute the circuit under test module. The test circuit is connected to the integrated circuit under test through a fixture, providing a working environment for the integrated circuit under test for subsequent testing. The floating voltage and current source module is connected to the host computer via a cable, and the floating voltage and current source module is connected to the two inputs (VIN and VC), two outputs (VOUT1 and VOUT2), one enable (EN), and the ground plane of the integrated circuit under test through an interface on the test circuit.

[0020] The host computer and the floating voltage and current source are powered by 220V AC. The host computer controls the floating voltage and current source module through a program, thereby controlling the power supply voltage, input voltage, and load current of the integrated circuit under test in the test circuit connected to the floating voltage and current source module, thus achieving various test conditions for the integrated circuit under test. At the same time, the floating voltage and current source samples the input and output of the integrated circuit under test and feeds it back to the host computer, enabling the host computer to process and analyze the sampled data through a test program with given parameters, realizing automated testing of all parameters of the positive voltage to negative voltage regulator integrated circuit. When testing the positive voltage to negative voltage regulator integrated circuit, a corresponding test program needs to be given for each parameter, thereby realizing automated testing of each parameter of the positive voltage to negative voltage regulator integrated circuit and comparison of test results. The entire testing process is simple and fast, which can reduce the investment of time and manpower costs, and at the same time, it can more intuitively evaluate the performance of the positive voltage to negative voltage regulator integrated circuit.

[0021] The floating voltage and current source module comprises five channels, each capable of functioning as both a voltage and current source. All five channels can be controlled by a host computer to achieve different functions. When used as a voltage source, it can test the current value of that channel. Similarly, when used as a current source, it can test the voltage value of that channel. In this embodiment, the floating voltage and current source module includes three voltage sources and two current sources. The three voltage sources are VIN, VC, and EN terminals, used to provide the input voltage value of the integrated circuit under test, provide the enable signal, and monitor and test the current of the input voltage and enable signal. The two current sources are VOUT1 and VOUT2, used to provide the load current value of the integrated circuit under test, monitor the output load current, and test the output voltage.

[0022] In addition, the test circuit in this embodiment is an improved version of the test circuit of the traditional positive voltage to negative voltage regulator integrated circuit. Specifically, a pre-charge circuit is added to the normal test circuit to increase the stability of the positive voltage to negative voltage regulator integrated circuit during the entire test process and ensure that the test proceeds normally.

[0023] like Figure 2 The specific process for testing the positive-to-negative voltage regulator integrated circuit is as follows: The host computer implements different test procedures according to the parameter test program. One or more parameters correspond to one test procedure. After each test procedure is completed, the sampled value is returned to the host computer. The host computer compares the sampled data with the parameter range given in the program. If it exceeds the parameter range, the test procedure for that erroneous parameter will be terminated, ending the test of the integrated circuit under test, and no further test procedures will be continued. If the test parameters are within the parameter range, the next test procedure will be continued until all test parameters have been tested.

[0024] The entire test process begins with whether the EN terminal is enabled. If the EN terminal is not enabled, the high and low levels of the EN terminal signal will be tested. During the testing of the EN terminal signal's high and low levels, a new judgment criterion is added to prevent the test program from failing to exit the loop due to malfunction of the IC under test, thus preventing the program from freezing. If the EN terminal is enabled, other parameter test procedures will be executed, with different parameter test procedures implemented depending on the selected parameters. VIN serves as the input to VOUT1 of the positive-to-negative voltage regulator IC and also as the power supply voltage for the entire IC. A working voltage is required at VIN for VOUT1, VC, and VOUT2 to function normally. Therefore, in parameter tests with the EN terminal enabled, a normal working voltage must be input to VIN, and the voltage input to VC should not exceed VIN. When the EN terminal is enabled, the host computer will check whether the input voltage or current exceeds the maximum value of the IC under test. If it exceeds the maximum withstand voltage and current value of the IC under test, the test process will exit before the input voltage and current are applied to the IC under test, ending the entire test and preventing damage to the IC under test due to overvoltage or overcurrent. At this point, a warning message indicating that the input voltage and current have exceeded the upper limit can be seen on the host computer.

[0025] Based on the VOUT1, VOUT2, and IQ test programs, additional test programs for IQ_OFF, IENH, IENL, VENH, VENL, SI1, SI2, and PSRR have been added, covering all test parameters of the chip. During testing, the integrated circuit under test (ICD) is placed in the device, the test program is loaded onto the host computer, and the full parameter testing and analysis of the ICD can be completed simply by clicking "Test" on the host computer's test interface, automatically generating output test data.

[0026] Finally, it should be noted that the above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Although the present utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A fully automated testing device for all parameters of an integrated circuit, characterized in that, It includes a host computer, a floating voltage and current source module, and a test circuit. The floating voltage and current source module is connected to the integrated circuit to be tested installed in the test circuit through the test circuit. The host computer integrates a test program, which enables the host computer to control the floating voltage and current source module to provide specified inputs and loads to the integrated circuit under test in the test circuit through the test program. The floating voltage and current source samples the input and output of the integrated circuit under test and feeds it back to the host computer, so that the host computer can process and analyze the sampled data through the test program to complete the full parameter test of the positive voltage to negative voltage regulator integrated circuit.

2. The fully automated testing device for positive-to-negative voltage integrated circuit parameters according to claim 1, characterized in that, The test circuit is connected to the integrated circuit under test via a fixture, thereby providing a working environment for the integrated circuit under test.

3. The fully automated testing device for positive-to-negative voltage integrated circuit parameters according to claim 1, characterized in that, The host computer and the floating voltage and current source are powered by 220V AC power.

4. The fully automated testing device for positive-to-negative voltage integrated circuit parameters according to claim 1, characterized in that, The floating voltage and current source module is connected to the host computer via a cable. The floating voltage and current source module is connected to the two inputs, two outputs, enable, and ground plane of the integrated circuit under test through the interface on the test circuit.

5. The fully automated testing device for positive-to-negative voltage integrated circuit parameters according to claim 1, characterized in that, The floating voltage and current source module is equipped with three voltage sources, namely two input paths and one enable path, which are used to provide the input voltage value of the integrated circuit under test, provide the enable signal, and monitor and test the input voltage and enable signal and the current.

6. The fully automated testing device for positive-to-negative voltage integrated circuit parameters according to claim 1, characterized in that, The floating voltage and current source module is equipped with two current sources, which are two input paths used to provide the load current value of the integrated circuit under test and to monitor the output load current and test the output voltage.

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