A voltage resistance acquisition device for battery storage test

Abstract

The utility model belongs to the technical field of collection equipment, concretely relates to a voltage internal resistance collection device for electric core storage test, including constant temperature test box, the inside of constant temperature test box is provided with testing mechanism, the outside of constant temperature test box is provided with internal resistance voltage tester, testing mechanism includes the top plate, pressing plate, fixed clamp and bottom plate that set up in turn along the height direction, the top plate is installed with driver, the output of driver is connected in pressing plate, the bottom of pressing plate is provided with a plurality of top pin for connecting electric core, the fixed clamp is provided with a plurality of recesses for placing electric core, the fixed clamp is fixed on the bottom plate, the top pin and constant temperature test box are connected through the collection line.

Description

Technical Field

[0001] This utility model belongs to the technical field of data acquisition equipment, specifically relating to a voltage internal resistance acquisition device for battery cell storage testing. Background Technology

[0002] Today, lithium-ion batteries, as a new type of rechargeable battery, have advantages such as high energy density and power density, high operating voltage, light weight, small size, long cycle life, good safety, and environmental friendliness. They have broad application prospects in portable electrical appliances, power tools, large-scale energy storage, and electric transportation power sources.

[0003] Internal resistance and voltage of lithium-ion batteries are key parameters affecting battery power output performance. Current research on the DC internal resistance of batteries mainly focuses on the detection and identification of the ohmic internal resistance component, studying its changing trend with the battery cycle aging process.

[0004] In the process of realizing this utility model, the inventors discovered that the prior art has at least the following problems:

[0005] In the current structure, the temperature chamber needs to be opened for each measurement to measure the battery voltage and internal resistance, which is inefficient and causes changes in the internal temperature of the temperature chamber, affecting the accuracy of the measurement. Utility Model Content

[0006] The purpose of this invention is to address the shortcomings of existing technologies by providing a voltage and internal resistance acquisition device for battery cell storage testing. By optimizing the acquisition device, the problem of having to open the temperature chamber for each measurement is solved, which helps to improve testing efficiency.

[0007] To achieve the above objectives, the present invention adopts the following technical solution:

[0008] A voltage and internal resistance acquisition device for battery cell storage testing includes a constant temperature test chamber. A testing mechanism is located inside the test chamber, and an internal resistance voltage tester is located outside the test chamber. The testing mechanism includes a top plate, a pressure plate, a fixing clamp, and a bottom plate arranged sequentially along the height direction. A driver is mounted on the top plate, and the output end of the driver is connected to the pressure plate. Multiple pins for connecting battery cells are provided at the bottom of the pressure plate. The fixing clamp has multiple grooves for placing battery cells and is fixed to the bottom plate. The pins and the internal resistance voltage tester are connected via acquisition lines. The acquisition lines are connected to the upper ends of the pins and pass through a first through hole and a second through hole to the internal resistance voltage tester.

[0009] In some possible implementations, a plurality of support rods are provided between the top plate and the bottom plate, and screw holes that mate with the support rods are provided around the top plate and the bottom plate.

[0010] In some possible implementations, the pressure plate is provided with through holes around its perimeter to cooperate with the support rod, and a support sleeve is fitted on the outer wall of the support rod, with the outer edge of the support sleeve being fixedly connected to the pressure plate.

[0011] In some possible implementations, the pressure plate is provided with a plurality of through holes that mate with the ejector pin, the top end of the ejector pin is positioned above the through holes, the bottom end of the ejector pin is positioned below the through holes, and a spring is provided between the bottom end of the ejector pin and the through holes, the spring being sleeved on the outer wall of the bottom end of the ejector pin.

[0012] In some possible implementations, a first threading hole is provided in the middle of the top plate, the first threading hole extends along the length direction, and the first threading hole and the projection portion of the pin in the height direction overlap.

[0013] In some possible implementations, the outer wall of the constant temperature test chamber is provided with a second wire hole, and one end of the acquisition line passes through the second wire hole and is connected to the internal resistance voltage tester.

[0014] In some possible implementations, a switch, relay, or acquisition card is provided between the acquisition line and the internal resistance voltage tester.

[0015] In some possible implementations, a support frame is also included, which is disposed outside the constant temperature test chamber, and the internal resistance voltage tester is disposed on top of the support frame.

[0016] In some possible implementations, a host computer is also included, to which the constant temperature test chamber, the driver, and the internal resistance voltage tester are connected.

[0017] In some possible implementations, the constant temperature test chamber includes a cabinet body and a cabinet door installed on the cabinet body, and casters are installed around the bottom of the constant temperature test chamber.

[0018] One of the above technical solutions has the following beneficial effects:

[0019] This invention optimizes the data acquisition device by designing a testing mechanism inside a constant temperature test chamber. A driver drives the pins under the pressure plate to contact the positive and negative terminals of the battery cell on the fixed fixture. Voltage and internal resistance signals are transmitted through the acquisition lines connected to the pins. These signals are then transmitted to an internal resistance voltage tester outside the constant temperature test chamber, eliminating the need for manual opening of the chamber for measurement. This improves testing efficiency and avoids changes in the battery cell testing environment caused by frequent manual opening of the chamber, thus enhancing the accuracy of the test data. Attached Figure Description

[0020] The features, advantages and technical effects of exemplary embodiments of the present invention will now be described with reference to the accompanying drawings.

[0021] Figure 1 This is a schematic diagram of the structure of this utility model.

[0022] Figure 2 This is a schematic diagram of the testing mechanism of this utility model.

[0023] Figure 3 This is a schematic diagram of the structure of the pressure plate of this utility model.

[0024] Figure 4 This is a circuit connection diagram of the present invention.

[0025] The reference numerals in the attached figures are explained as follows:

[0026] 1-Constant temperature test chamber; 11-Second wiring hole; 12-Cabinet door; 13-Pulley;

[0027] 2-Internal resistance voltage tester;

[0028] 3-Top plate; 31-First wire hole;

[0029] 4-Pressure plate; 41-Through hole; 42-Through hole;

[0030] 5-Fixing clamp; 51-Groove;

[0031] 6-Base plate;

[0032] 7-Drive;

[0033] 8-Ejector pin; 81-Spring;

[0034] 9-Support rod; 91-Support sleeve;

[0035] 10-Support frame;

[0036] A - Length direction;

[0037] H - Height direction. Detailed Implementation

[0038] If certain terms are used in the specification and claims to refer to specific components, those skilled in the art will understand that hardware manufacturers may use different names to refer to the same component. This specification and claims do not distinguish components based on differences in name, but rather on differences in function. The term "comprising" as used throughout the specification and claims is an open-ended term and should be interpreted as "comprising but not limited to." "Approximately" means that within an acceptable margin of error, those skilled in the art can solve the technical problem and substantially achieve the technical effect within a certain margin of error.

[0039] Furthermore, the terms "first," "second," etc., are used for descriptive purposes only and should not be interpreted as indicating or implying relative importance.

[0040] In this utility model, unless otherwise explicitly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0041] The present invention will be further described in detail below with reference to the accompanying drawings, but this is not intended to limit the present invention.

[0042] Example 1

[0043] Because the existing structure requires opening the temperature chamber for each measurement to measure the battery's voltage and internal resistance, it is inefficient and causes changes in the internal temperature of the temperature chamber, affecting the accuracy of the measurement.

[0044] like Figures 1-4As shown, the voltage internal resistance acquisition device for battery cell storage testing of this utility model includes a constant temperature test chamber 1. The constant temperature test chamber 1 has a test mechanism inside and an internal resistance voltage tester 2 outside. The test mechanism includes a top plate 3, a pressure plate 4, a fixing clamp 5, and a bottom plate 6 arranged sequentially along the height direction H. A driver 7 is installed on the top plate 3. The output end of the driver 7 is connected to the pressure plate 4. The bottom of the pressure plate 4 is provided with a plurality of pins 8 for connecting battery cells. The fixing clamp 5 is provided with a plurality of grooves 51 for placing battery cells and is fixed on the bottom plate 6. The pins 8 and the internal resistance voltage tester 2 are connected by a data acquisition line. This invention optimizes the data acquisition device by designing a testing mechanism inside the constant temperature test chamber 1. The driver 7 drives the pins 8 under the pressure plate 4 to contact the positive and negative terminals of the battery cell on the fixing fixture 5. The voltage and internal resistance signals are transmitted through the acquisition line connected to the pins 8. The voltage and internal resistance signals are then transmitted to the internal resistance voltage tester 2 outside the constant temperature test chamber 1 via the acquisition line. This eliminates the need for manual opening of the temperature chamber for measurement, which helps improve testing efficiency. At the same time, it avoids the situation where frequent manual opening of the temperature chamber causes changes in the battery cell testing environment, which helps improve the accuracy of the test data.

[0045] It should be noted that the top of the ejector pin 8 is connected to the data acquisition line, which is connected to the internal resistance voltage tester 2 through the first wire hole 31 and the second wire hole 11. By having the ejector pin 8 contact the positive and negative terminals of the battery cell and measuring the resistance voltage using the internal resistance voltage tester 2, the objectivity and accuracy of the collected data are improved compared to manual measurement with a multimeter. The fixing clamp 5 is fixedly connected to the base plate 6 by screws. The grooves 51 on the fixing clamp 5 are arranged sequentially at intervals along the length direction A. The ejector pins 8 on the pressure plate 4 are also arranged sequentially at intervals along the length direction A. Each battery cell has two ejector pins 8 corresponding to its positive and negative terminals. The number of ejector pins 8 is approximately twice the number of battery cells. The constant temperature test chamber 1 can be set and maintained at a preset storage temperature, including but not limited to 25°C, 45°C, and 55°C. The driver 7 can be a motor or a cylinder; there are no restrictions here, as long as it can drive the pressure plate 4 to move.

[0046] In the voltage and internal resistance acquisition device for battery cell storage testing according to this utility model, a plurality of support rods 9 are provided between the top plate 3 and the bottom plate 6. Screw holes that mate with the support rods 9 are provided around the top plate 3 and the bottom plate 6. Through holes 41 that mate with the support rods 9 are provided around the pressure plate 4. A support sleeve 91 is fitted onto the outer wall of the support rod 9, and the outer edge of the support sleeve 91 is fixedly connected to the pressure plate 4. In this embodiment, the support rods support the top plate 3, preventing the driver 7 on the top plate 3 from shifting or shaking. They also create a space for testing the battery cell between the top plate 3 and the bottom plate 6. The through holes 41 around the pressure plate 4 fit onto the outer wall of the support rods 9. Simultaneously, the support sleeve 91 between the mating through holes 41 and the outer wall of the support rods 9 helps improve the stability of the pressure plate 4 when it rises or falls, ensuring that the pins 8 under the pressure plate 4 apply uniform pressure. This helps improve the stability of the contact between the pins 8 and the battery cell, preventing uneven force on the positive and negative electrodes of the battery cell from affecting the accuracy of the test. Among them, the outer edge of the support sleeve 91 is the part that extends horizontally from the top of the support sleeve 91. The outer edge is set around the top of the support sleeve 91, and the outer edge is designed with holes that correspond to the holes of the pressure plate 4. The two are fixedly connected by screws.

[0047] In the voltage internal resistance acquisition device for battery cell storage testing according to this utility model, the pressure plate 4 is provided with a plurality of through holes 42 that cooperate with the ejector pin 8. The top end of the ejector pin 8 is positioned above the through hole 42, and the bottom end of the ejector pin 8 is positioned below the through hole 42. A spring 81 is provided between the bottom end of the ejector pin 8 and the through hole 42, and the spring 81 is sleeved on the outer wall of the bottom end of the ejector pin 8. In this embodiment, the ejector pin 8 passes through the through hole 42, with the top end of the ejector pin 8 located above the through hole 42 and the bottom end of the ejector pin 8 located below the through hole 42. The bottom end of the ejector pin 8 and the spring 81 are combined, and with the compressible and resettable function of the spring 81, the ejector pin 8 can extend and retract vertically, avoiding damage to the battery due to excessive stress when the ejector pin 8 is pressed down.

[0048] In the voltage and internal resistance acquisition device for battery cell storage testing according to this utility model, a first wire-passing hole 31 is provided in the middle of the top plate 3. The first wire-passing hole 31 extends along the length direction A. The projection portion of the first wire-passing hole 31 and the ejector pin 8 in the height direction H overlaps. A second wire-passing hole 11 is provided on the outer wall of the constant temperature test chamber 1. One end of the acquisition wire passes through the second wire-passing hole 11 and is connected to the internal resistance voltage tester 2. In this embodiment, the top end of the ejector pin 8 is connected to the acquisition wire. The acquisition wire passes through the first wire-passing hole 31 in the middle of the top plate 3 and the second wire-passing hole 11 on the outer wall of the constant temperature test chamber 1, and is connected to the internal resistance voltage tester 2. This facilitates the management of the acquisition wire and helps to shorten the length of the acquisition wire, thereby reducing the overall cost of the acquisition device.

[0049] In the voltage and internal resistance acquisition device for battery cell storage testing according to this utility model, a switch, relay, or acquisition card is provided between the acquisition line and the internal resistance voltage tester 2. In this embodiment, the switch, relay, or acquisition card can be designed outside the constant temperature test chamber 1. Since the internal resistance voltage tester 2 can test the voltage and internal resistance of a battery cell, such as... Figure 4 As shown, by closing the switch of the target channel's acquisition line, the voltage and internal resistance of the cell connected to that acquisition line can be measured. After the test is completed, the switch of that acquisition line is opened, and the switch of the next acquisition line is closed for measurement, and so on. In some embodiments, a relay can be used instead of a switch. The relay is a timed cyclic relay. With the timing function of the relay, the cells connected to each acquisition line can be measured sequentially. For example, after measuring the voltage and internal resistance of one cell, the relay automatically opens, and the relay connected to the next cell closes at a set time, thus performing timed cyclic measurements. The principle of the acquisition card can be found in the relay principle. The switches, relays, or acquisition cards are all commercially available models.

[0050] The voltage internal resistance acquisition device for battery cell storage testing according to this utility model also includes a support frame 10, which is disposed outside the constant temperature test chamber 1, and the internal resistance voltage tester 2 is disposed on the top of the support frame 10. In this embodiment, the support frame 10 is disposed below the second wire hole 11, allowing one end of the acquisition line to pass through the second wire hole 11 and connect to the internal resistance voltage tester 2 on the support frame 10.

[0051] The working principle of this utility model is as follows:

[0052] This invention optimizes the data acquisition device by designing a testing mechanism inside the constant temperature test chamber 1. The driver 7 drives the pins 8 under the pressure plate 4 to contact the positive and negative terminals of the battery cell on the fixing fixture 5. The voltage and internal resistance signals are transmitted through the acquisition line connected to the pins 8. The voltage and internal resistance signals are then transmitted to the internal resistance voltage tester 2 outside the constant temperature test chamber 1 via the acquisition line. This eliminates the need for manual opening of the temperature chamber for measurement, which helps improve testing efficiency. At the same time, it avoids the situation where frequent manual opening of the temperature chamber causes changes in the battery cell testing environment, which helps improve the accuracy of the test data.

[0053] Example 2

[0054] Unlike Embodiment 1, this embodiment also includes a host computer, to which the constant temperature test chamber 1, driver 7, and internal resistance voltage tester 2 are connected. The host computer can be a computer, a PLC controller, or an embedded controller. The controller is a PLC controller or an embedded controller. The PLC controller uses a programmable memory to store programs and execute user-oriented instructions such as logic operations, sequential control, timing, counting, and arithmetic operations. It controls various types of machinery or production processes through digital or analog input / output. The embedded controller includes electronic devices or apparatuses controlled by microprocessor chips, timers, sequence generators, or controllers, capable of performing various automated processing tasks such as monitoring and control. Both the PLC controller and the embedded controller are commercially available models.

[0055] The other structures are the same as in Embodiment 1, and will not be described again here.

[0056] Example 3

[0057] Unlike Embodiment 1, the constant temperature test chamber 1 in this embodiment includes a cabinet body and a cabinet door 12 installed on the cabinet body. The bottom of the constant temperature test chamber 1 is equipped with casters 13, which facilitates the movement of the constant temperature test chamber 1 and helps to improve the user experience.

[0058] The other structures are the same as in Embodiment 1, and will not be described again here.

[0059] Based on the disclosure and teachings of the above specification, those skilled in the art can make changes and modifications to the above embodiments. Therefore, this utility model is not limited to the specific embodiments described above, and any obvious improvements, substitutions, or modifications made by those skilled in the art based on this utility model are within the protection scope of this utility model. Furthermore, although some specific terms are used in this specification, these terms are only for convenience of explanation and do not constitute any limitation on this utility model.

Claims

1. A voltage internal resistance acquisition device for battery cell storage testing, characterized in that, It includes a constant temperature test chamber (1), the inside of which is provided with a test mechanism, and the outside of which is provided with an internal resistance voltage tester (2); The testing mechanism includes a top plate (3), a pressure plate (4), a fixing fixture (5), and a bottom plate (6) arranged sequentially along the height direction. The top plate (3) is equipped with a driver (7), the output end of which is connected to the pressure plate (4). The bottom of the pressure plate (4) is provided with a plurality of pins (8) for connecting the battery cells. The fixing fixture (5) is provided with a plurality of grooves (51) for placing the battery cells. The fixing fixture (5) is fixed on the bottom plate (6). The pin (8) and the internal resistance voltage tester (2) are connected by a data acquisition line.

2. The voltage and internal resistance acquisition device for battery cell storage testing as described in claim 1, characterized in that: A plurality of support rods (9) are provided between the top plate (3) and the bottom plate (6), and screw holes that cooperate with the support rods (9) are provided around the top plate (3) and the bottom plate (6).

3. The voltage internal resistance acquisition device for battery cell storage testing as described in claim 2, characterized in that: The pressure plate (4) is provided with through holes (41) around its perimeter that cooperate with the support rod (9). The outer wall of the support rod (9) is fitted with a support sleeve (91), and the outer edge of the support sleeve (91) is fixedly connected to the pressure plate (4).

4. The voltage and internal resistance acquisition device for battery cell storage testing as described in claim 1, characterized in that: The pressure plate (4) is provided with a plurality of through holes (42) that cooperate with the ejector pin (8). The top end of the ejector pin (8) is located above the through hole (42), and the bottom end of the ejector pin (8) is located below the through hole (42). A spring (81) is provided between the bottom end of the ejector pin (8) and the through hole (42), and the spring (81) is sleeved on the outer wall of the bottom end of the ejector pin (8).

5. The voltage and internal resistance acquisition device for battery cell storage testing as described in claim 1, characterized in that: The top plate (3) has a first thread hole (31) in the middle. The first thread hole (31) extends along the length direction and the projection of the first thread hole (31) and the pin (8) in the height direction overlap.

6. The voltage and internal resistance acquisition device for battery cell storage testing as described in claim 5, characterized in that: The outer wall of the constant temperature test chamber (1) is provided with a second wire hole (11), and one end of the acquisition line passes through the second wire hole (11) and is connected to the internal resistance voltage tester (2).

7. The voltage internal resistance acquisition device for battery cell storage testing as described in claim 1, characterized in that: A switch, relay, or acquisition card is provided between the acquisition line and the internal resistance voltage tester (2).

8. The voltage internal resistance acquisition device for battery cell storage testing as described in claim 1, characterized in that: It also includes a support frame (10), which is located outside the constant temperature test chamber (1), and the internal resistance voltage tester (2) is located on top of the support frame (10).

9. A voltage and internal resistance acquisition device for battery cell storage testing as described in claim 7, characterized in that: It also includes a host computer, and the constant temperature test chamber (1), the driver (7) and the internal resistance voltage tester (2) are connected to the host computer.

10. A voltage and internal resistance acquisition device for battery cell storage testing as described in claim 1, characterized in that: The constant temperature test chamber (1) includes a cabinet body and a cabinet door (12) installed on the cabinet body. The bottom of the constant temperature test chamber (1) is equipped with pulleys (13).

Images