Structured light projection device, three-dimensional measuring apparatus, and three-dimensional imaging measuring system

Abstract

The utility model discloses a kind of structured light projection device, three-dimensional imaging measurement equipment and three-dimensional measurement system, it is related to machine vision field, the structured light projection device includes first laser emission module and galvanometer, the light projection device is formed with light outlet, the galvanometer is set in one side of the light outlet, the first emission module is set in one side of the galvanometer, and it is used to emit first light beam to the galvanometer, the structured light projection device further includes second laser emission module, the second laser emission module is set in one side of the galvanometer, and it is used to emit second light beam to the galvanometer, the first light beam and second light beam are different types of light beam, the first laser emission module and second laser emission module alternatively emit corresponding light beam to the galvanometer, the galvanometer is used to reflect the light beam of corresponding projection module to the light outlet.The utility model has higher applicability, reduces production cost.

Description

Technical Field

[0001] This utility model relates to the field of machine vision technology, specifically to a structured light projection device, a three-dimensional measurement device, and a three-dimensional imaging measurement system. Background Technology

[0002] With the development of robotics technology, industrial automation and intelligence have been integrated into all aspects of factory manufacturing and production. In complex and unstructured scenarios, such as palletizing, loading / unloading, and material sorting, automation cannot be achieved solely through robot programming. Three-dimensional measurement and imaging systems can provide more 3D pose information about the product, thereby replacing manual labor to achieve industrial intelligence and automation.

[0003] In the implementation of 3D measurement and imaging systems, 3D imaging systems based on laser galvanometer structured light have become the mainstream solution. This system includes a structured light projection device and an image acquisition system. The structured light projection device projects specific structured light onto the object being measured. The image acquisition system acquires structured light images of the object within a preset time period, and generates 3D data of the object after 3D reconstruction processing.

[0004] The light projection devices in related technologies are poorly suited for complex application environments and are costly. Utility Model Content

[0005] This invention aims to address one of the technical problems in related technologies to a certain extent. To this end, this invention provides a structured light projection device, a three-dimensional imaging measurement system, and a three-dimensional measurement device, which have greater applicability and reduce production costs.

[0006] To achieve the above objectives, a first aspect of this utility model discloses a structured light projection device, which includes a first laser emitting module and a galvanometer. The projection device has a light outlet, and the galvanometer is disposed on one side of the light outlet. The first laser emitting module is disposed on one side of the galvanometer and is used to emit a first light beam toward the galvanometer. The structured light projection device also includes a second laser emitting module, which is disposed on one side of the galvanometer and is used to emit a second light beam toward the galvanometer. The first light beam and the second light beam are light beams of different types. The first laser emitting module and the second laser emitting module selectively emit a corresponding light beam toward the galvanometer. The galvanometer is used to reflect the light beam emitted by the corresponding projection module back to the light outlet.

[0007] This technical solution integrates a first laser emitting module and a second laser emitting module capable of generating different types of structured light into one unit. In actual use, the first laser emitting module and the second laser emitting module can be switched according to different application scenarios, thereby selecting a more suitable type of structured light to adapt to different application environments, improving measurement accuracy. Moreover, when changing different structured lights, it is not necessary to replace the entire light projection device; only the different modules inside the light projection device need to be switched, which greatly reduces production costs.

[0008] Furthermore, the structured light projection device includes an optical path conversion unit, which is disposed on one side of the galvanometer. The optical path conversion unit is used to receive the emitted beams from the first laser emitting module and the second laser emitting module, and guide the corresponding beams to the galvanometer. The first laser emitting module and the second laser emitting module selectively emit beams to the optical path conversion unit.

[0009] Furthermore, the optical path transformation unit includes a beam combiner, which includes a beam splitting surface and multiple incident surfaces. The beam splitting surface is opposite to the emitting surface of the galvanometer, and the multiple incident surfaces are oriented in different directions. The first laser emitting module and the second laser emitting module each correspond to one of the incident surfaces. The first laser emitting module and the second laser emitting module can emit corresponding structured light to the corresponding incident surfaces. The beam combiner emits light rays that enter from the incident surfaces from the beam splitting surface to the reflecting surface of the galvanometer.

[0010] Furthermore, one of the first laser emitting module and the second laser emitting module is turned on, and the one of the first laser emitting module and the second laser emitting module that is turned on emits corresponding structured light to the beam combiner.

[0011] Furthermore, the structured light projection device includes a switching unit and a galvanometer. The switching unit is movably disposed on one side of the galvanometer. The first laser emitting module and the second laser emitting module are disposed on the switching unit. The switching unit is used to switch one of the first laser emitting module and the second laser emitting module to a projection position opposite to the reflective surface of the galvanometer. The first laser emitting module and the second laser emitting module in the projection position can emit corresponding structured light to the galvanometer. The galvanometer is used to reflect the corresponding structured light to the object under test.

[0012] Furthermore, the switching unit switches the positions of the first laser emitting module and the second laser emitting module by sliding or rotating.

[0013] Furthermore, the first laser emitting device and the second laser emitting device respectively include at least one of a speckle laser, a single-line laser, and a multi-line laser. The beams emitted by the first laser emitting device and the second laser emitting device are projected into corresponding speckle structured light, stripe-coded structured light, and line-scanned structured light after passing through the galvanometer.

[0014] The second aspect of this application discloses a three-dimensional measurement device, including an image acquisition system and a structured light projection device. The structured light projection device includes the structured light projection device of the first aspect. The structured light projection device is used to project corresponding structured light from the light outlet onto the object under test. The image acquisition system is used to acquire the structured light pattern on the object under test and generate a structured light image, and to reconstruct the object under test in three dimensions based on the structured light image.

[0015] Furthermore, the image acquisition system includes two cameras, which are respectively positioned on opposite sides of the light projection device.

[0016] The third aspect of this application discloses a three-dimensional imaging measurement system, including multiple three-dimensional measurement devices, at least one of which adopts the three-dimensional measurement device of the second aspect.

[0017] The reasoning process for the beneficial effects of the three-dimensional imaging measurement system and three-dimensional measurement equipment provided by this utility model is similar to that of the aforementioned light projection device, and will not be repeated here.

[0018] These features and advantages of this utility model will be disclosed in detail in the following specific embodiments and accompanying drawings. The preferred embodiments or means of this utility model will be shown in detail in conjunction with the accompanying drawings, but this is not intended to limit the technical solution of this utility model. In addition, each of these features, elements and components appearing in the following text and drawings is multiple and is labeled with different symbols or numbers for convenience, but all represent parts with the same or similar structure or function. Attached Figure Description

[0019] The present invention will be further described below with reference to the accompanying drawings: Figure 1 This is a schematic diagram of a three-dimensional imaging measurement system (including a beam combiner) according to one embodiment of the present invention. Figure 2 This is a schematic diagram of a three-dimensional imaging measurement system (including a sliding switching unit) according to one embodiment of the present invention. Figure 3 This is a schematic diagram of a three-dimensional imaging measurement system (including a sliding switching unit) according to one embodiment of the present invention. Figure 4 This is a schematic diagram of a three-dimensional imaging measurement system (including a rotating switching unit) according to one embodiment of the present invention.

[0020] in, 10. Structured light projection device; 11. First laser emitting module; 12. Second laser emitting module; 13. Galvanometer; 14. Beam combiner; 15. Switching unit; 21. Camera; 30. Object to be tested. Detailed Implementation

[0021] The embodiments of this utility model are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described are intended to explain this utility model and should not be construed as limiting it.

[0022] The terms "an embodiment," "example," or "trademark" used in this specification refer to a particular feature, structure, or characteristic described in connection with the embodiment itself that may be included in at least one embodiment disclosed in this utility model. The phrase "in an embodiment" appearing in various places throughout the specification does not necessarily refer to the same embodiment.

[0023] The structured light schemes for optical projection devices in related technologies mainly include three types: speckle structured light, stripe-coded structured light, and line-scan structured light. Each type of structured light has different advantages and disadvantages. Specifically: speckle structured light has a fast measurement speed but low accuracy; stripe-coded structured light has high accuracy but moderate speed and low robustness; line-scan structured light has high accuracy and robustness but low speed. In actual operation, these three structured light schemes are implemented using different laser projectors: speckle structured light requires a speckle laser projector in conjunction with a galvanometer for scanning; stripe-coded structured light requires a single-line laser in conjunction with a galvanometer for scanning; and line-scan structured light requires a multi-line laser in conjunction with a galvanometer for scanning. Optical projection devices in related technologies generally only include one type of laser projector, meaning that only one type of structured light can be projected after galvanometer scanning. Therefore, when encountering different application environments, the entire optical projection device usually needs to be replaced with one that can generate more suitable structured light. Obviously, this complete replacement method results in high overall cost and inconvenience, and has low applicability to complex application environments.

[0024] To facilitate understanding, some technical terms used in this application will be explained first: Structured light: Structured light projection devices project specific patterns (such as speckles, stripes, or more complex shapes) onto the object being measured to assist in three-dimensional measurement.

[0025] Structured light image: The camera captures the structured light pattern on the object under test and generates a structured light image.

[0026] 3D reconstruction: Through processes such as depth data acquisition, preprocessing, point cloud registration and fusion, and surface generation, the real scene is depicted as a mathematical model that conforms to computer logic.

[0027] Beam combiner: An optical element used to combine two or more light beams into a single beam. When multiple light beams are incident on the surface of the beam combiner, some of the light is reflected and some is transmitted, ultimately combining into a single beam.

[0028] Galvanometer: A high-performance optical scanning component consisting of a mirror, a motor, and a control system, which can guide a laser beam by rapidly and precisely rotating the mirror.

[0029] See appendix Figures 1 to 4 The first aspect of this utility model discloses a structured light projection device 10, which includes a first laser emitting module 11 and a galvanometer 13. The projection device has a light outlet, and the galvanometer 13 is disposed on one side of the light outlet. The first laser emitting module is disposed on one side of the galvanometer 13 and is used to emit a first light beam toward the galvanometer 13. The structured light projection device 10 also includes a second laser emitting module 12, which is disposed on one side of the galvanometer 13 and is used to emit a second light beam toward the galvanometer 13. The first light beam and the second light beam are structured lights of different types. The first laser emitting module 11 and the second laser emitting module 12 selectively emit the corresponding light beam toward the galvanometer 13, and the galvanometer 13 is used to emit the corresponding light beam out of the light outlet.

[0030] The structured light projection device 10 in this embodiment is generally used in three-dimensional measurement equipment. During the measurement operation, the structured light projection device 10 projects a specific pattern (such as speckle, stripe or more complex shape) onto the object to be measured through the first laser emitting module 11 and the second laser emitting module 12 under the scanning action of the galvanometer, in order to assist in three-dimensional measurement.

[0031] The structured light projection device 10 in this embodiment includes a first laser emitting module 11 and a second laser emitting module 12 capable of emitting different types of light beams. In specific operation, the first laser emitting module 11 and the second laser emitting module 12 can be selected individually as needed to adapt to different application scenarios.

[0032] Although this embodiment only specifies the first laser emitting module 11 and the second laser emitting module 12, it does not mean that this embodiment can only have two different laser modules. This embodiment does not specifically limit the number of laser emitting modules in the structured light projection device 10. In actual setup, this embodiment may also include a third laser emitting module, a fourth laser emitting module, ... or more laser emitting modules. These laser emitting modules can emit different types of structured light. It can be seen that any scheme with two laser emitting modules capable of emitting different types of beams should be considered to fall within the protection scope of this application.

[0033] In this embodiment, no specific limitation is made on how the first laser emitting module 11 and the second laser emitting module 12 are switched during actual use. In actual setup, different control modes can be used to switch the working state between the first laser emitting module 11 and the second laser emitting module 12. Specifically, this can be achieved through electronic control, mechanical methods, or a combination of electronic and mechanical control methods. In actual operation, it is sufficient to select one of the first laser emitting module 11 and the second laser emitting module 12 to project suitable structured light onto the object under the scanning action of the galvanometer.

[0034] In this invention, the specific types of the first beam and the second beam are not specifically limited. In actual setup, the first laser emitting module 11 and the second laser emitting module 12, together with the galvanometer, can be configured to project a single type of structured light, such as speckle structured light, stripe-coded structured light, line-scan structured light, or other more complex structured light. Of course, it can also be configured to emit some composite types of structured light, such as a composite beam of speckle structured light and stripe-coded structured light.

[0035] In one embodiment of this utility model, one of the first laser emitting module 11 and the second laser emitting module 12 is turned on, and the one of the first laser emitting module 11 and the second laser emitting module 12 that is turned on projects a beam of a corresponding type onto the object under test.

[0036] In this embodiment, the operation of the corresponding laser emitting modules is controlled by controlling the on / off state of the first laser emitting module 11 and the second laser emitting module 12. That is, the switching of the working state of the first laser emitting module 11 and the second laser emitting module 12 is achieved by electronic control. For example, the first laser emitting module 11, together with a galvanometer, can project speckle structured light, and the second laser emitting module 12, together with a galvanometer, can project stripe-coded structured light. In actual operation, when the working scene requires the projection of speckle structured light onto the object under test, the first laser emitting module 11 can be turned on and the second laser emitting module 12 can be turned off; when the working scene requires the projection of stripe-coded structured light onto the object under test, the second laser emitting module 12 is turned on and the first laser emitting module 11 is turned off.

[0037] As one embodiment of this utility model, see the appendix. Figure 1 The structured light projection device 10 includes an optical path conversion unit and a galvanometer 13. The optical path conversion unit is disposed on one side of the galvanometer 13. The optical path conversion unit is used to receive the emitted beams of the first laser emitting module 11 and the second laser emitting module 12, and guide the corresponding beams to the reflective surface of the galvanometer 13. The galvanometer 13 can reflect the beams irradiated on the reflective surface to the object under test. The first laser emitting module 11 and the second laser emitting module 12 can selectively emit beams to the optical path conversion unit.

[0038] In this embodiment, the light beams emitted by the first laser emitting module 11 and the second laser emitting module 12 are not directly projected onto the object under test 30. Instead, they are projected onto the object under test 30 after passing through the optical path conversion unit and the galvanometer 13. By setting the optical path conversion unit, the path direction of the light beams emitted by the first laser emitting module 11 and the second laser emitting module 12 can be changed. This avoids the limitations of the placement of the first laser emitting module 11 and the second laser emitting module 12, so that the light emitted by the first laser emitting module 11 and the second laser emitting module 12 at different positions can be successfully projected onto the object under test, making the installation of the first laser emitting module 11 and the second laser emitting module 12 more convenient.

[0039] As one embodiment of this utility model, see the appendix. Figure 1The optical path conversion unit includes a beam combiner 14, which includes a beam splitting surface and multiple incident surfaces. The beam splitting surface is opposite to the emitting mirror of the galvanometer 13. The multiple incident surfaces are oriented in different directions. The first laser emitting module 11 and the second laser emitting module 12 each correspond to one of the incident surfaces. The first laser emitting module 11 and the second laser emitting module 12 can emit corresponding light beams to the corresponding incident surfaces. The beam combiner 14 emits light rays from the incident surfaces from the beam splitting surface to the emitting mirror of the beam combiner 14.

[0040] The structured light projection device 10 in this embodiment includes a beam combiner 14. The first laser emitting module 11 and the second laser emitting module 12 are respectively disposed at different positions of the beam combiner 14. The beam combiner 14 can change the path of the light beam through its own characteristics. In this way, the light beams emitted by the first laser emitting module 11 and the second laser emitting module 12, which are located at different positions of the beam combiner 14, can reach the galvanometer 13 under the action of the beam combiner 14 without changing their own positions (fixed). In actual use, when switching between the first laser emitting module 11 and the second laser emitting module 12, it is only necessary to control the opening and closing state of the first laser emitting module 11 and the second laser emitting module 12 to conveniently realize the switching of the structured light type projected on the object under test, thereby improving the switching efficiency.

[0041] It should be noted that in actual use, the beam combiner 14 in this embodiment does not combine the emitted beams of the first laser emitting module 11 and the second laser emitting module 12, but is used to change the direction of the emitted beam of one of the emitting modules so that it can reach the galvanometer 13 more easily. This simplifies the installation structure of the first laser emitting module 11 and the second laser emitting module 12, and also helps to improve the applicability of the three-dimensional measurement equipment while keeping the size of the three-dimensional imaging measurement system from being too large.

[0042] Of course, it is conceivable that in actual setup, the optical path transformation unit is not limited to the beam combiner 14, but can be set in other forms. For example, multiple mirror structures can be set to cooperate with each other. By setting the relative positions and angles of multiple mirror structures, the beams emitted by the first laser emitting module 11 and the second laser emitting module 12 in different directions can reach the galvanometer 13 smoothly.

[0043] In one embodiment of this utility model, the structured light projection device 10 includes a switching unit 15 and a galvanometer 13. The switching unit 15 is movably disposed on one side of the galvanometer 13. The first laser emitting module 11 and the second laser emitting module 12 are disposed on the switching unit 15. The switching unit 15 is used to switch one of the first laser emitting module 11 and the second laser emitting module 12 to a projection position opposite to the reflective surface of the galvanometer 13. The first laser emitting module 11 and the second laser emitting module 12 in the projection position can emit corresponding beams to the galvanometer 13, and after being scanned by the galvanometer 13, the corresponding structured light is reflected to the object under test.

[0044] In this embodiment, the light projection device includes a switching unit 15, which is a movable structure. In actual use, the position switching of the first laser emitting module 11 and the second laser emitting module 12 can be realized through a mechanical structure. Only the light beam emitted by the emitting module in the projection position can be projected onto the object to be measured 30 after being scanned by the galvanometer. In actual setup, the position where the emitted light beam is directly opposite the center of the galvanometer 13 can be set as the projection position.

[0045] In actual setup, the switching method between the first laser emitting module 11 and the second laser emitting module 12 can be set to sliding switching, see Appendix. Figure 2 , 3 (The first laser emitting module 11 and the second laser emitting module 12 are mounted on the same sliding bracket, and the sliding bracket can be adjusted so that one of the first laser emitting module 11 and the second laser emitting module 12 is in the projection position); it can also be configured for rotation switching, see appendix. Figure 4 (For example, the first laser emitting module 11 and the second laser emitting module 12 can be mounted on a rotating bracket, and the rotation of the rotating bracket can position one of the first laser emitting module 11 and the second laser emitting module 12 in the projection position) or other switching methods.

[0046] As one embodiment of the present invention, the first laser emitting module 11 and the second laser emitting module 12 respectively include at least one of a speckle laser projector, a single-line laser projector, and a multi-line laser projector.

[0047] In this embodiment, the speckle laser projector, in conjunction with galvanometer scanning, can emit speckle structured light; the single-line laser projector, in conjunction with galvanometer scanning, can emit stripe-coded structured light; and the multi-line laser projector, in conjunction with galvanometer scanning, can emit line-scanned structured light. In actual setup, there is no specific limitation on the number of projectors integrated in each emitting module. There can be only one projector in the same emitting module, or multiple projectors (of the same type) can be set at the same time.

[0048] The second aspect of this application discloses a three-dimensional measurement device, including an image acquisition system and a structured light projection device 10. The structured light projection device 10 includes the structured light projection device 10 of the first aspect. The image acquisition system includes at least one camera 21 and a motherboard assembly. The at least one camera 21 is disposed on one side of the light projection device and is used to acquire structured light images on the object being measured. The motherboard assembly is electrically connected to the structured light projection device 10 and the camera 21 and is used to receive the structured light images and generate three-dimensional data of the object being measured.

[0049] In this embodiment, during production, the image acquisition system and the structured light projection device 10 are generally integrated into the machine body. During use, the structured light projection device 10 and the image acquisition system work together. The motherboard component serves as the main control component. On one hand, it is electrically connected to the structured light projection device 10 and can control the operation of the first laser emitting module 11 and the second laser emitting module 12 in the structured light projection device 10, including their opening and closing and state switching (specifically, which one is working).

[0050] In addition, the motherboard components can also receive structured light images (usually acquired by camera 21) through an image acquisition system and construct a mathematical model through three-dimensional reconstruction.

[0051] The three-dimensional imaging measurement system in this embodiment can be applied to 3D scanners, 3D cameras 21, or other three-dimensional measurement devices.

[0052] As one embodiment of this utility model, see the appendix. Figure 4 The image acquisition system includes two cameras 21, which are respectively arranged on opposite sides of the light projection device.

[0053] In this embodiment, the two cameras 21 are generally set as optical cameras 21. When in use, they form a binocular imaging system, which can adapt to the needs of more complex environments and improve the accuracy of measurement.

[0054] In this embodiment, the 3D measurement device is generally a 3D camera 21 or a 3D scanner. When using the 3D measurement device, if different application scenarios require measurement, it is not necessary to replace the entire 3D imaging measurement system; only the first laser emitting module 11 and the second laser emitting module 12 in the light projection device need to be switched. This allows it to adapt to more complex application scenarios and improves the applicability of the 3D measurement device.

[0055] The third aspect of this application discloses a three-dimensional imaging measurement system, including multiple three-dimensional measurement devices, at least one of which adopts the three-dimensional measurement device of the second aspect.

[0056] The above are merely specific embodiments of this utility model, but the scope of protection of this utility model is not limited thereto. Those skilled in the art should understand that this utility model includes, but is not limited to, the contents described in the accompanying drawings and the specific embodiments above. Any modifications that do not depart from the functional and structural principles of this utility model will be included within the scope of the claims.

Claims

1. A structured light projection device (10), comprising a first laser emitting module (11), a galvanometer (13), and a light output port, wherein the galvanometer (13) is disposed on one side of the light output port, and the first laser emitting module (11) is disposed on one side of the galvanometer (13) and is used to emit a first light beam toward the galvanometer (13), characterized in that, The structured light projection device (10) further includes a second laser emitting module (12), which is disposed on one side of the galvanometer (13) and is used to emit a second beam to the galvanometer (13). The first beam and the second beam are different types of beams. The first laser emitting module (11) and the second laser emitting module (12) selectively emit a corresponding beam to the galvanometer (13), and the galvanometer (13) is used to reflect the beam emitted by the corresponding projection module to the light outlet.

2. The structured light projection device according to claim 1, characterized in that, The structured light projection device (10) includes an optical path conversion unit, which is disposed on one side of the galvanometer (13). The optical path conversion unit is used to receive the emitted beams of the first laser emitting module (11) and the second laser emitting module (12) and guide the corresponding beams to the galvanometer (13). The first laser emitting module (11) and the second laser emitting module (12) selectively emit beams to the optical path conversion unit.

3. The structured light projection device according to claim 2, characterized in that, The optical path conversion unit includes a beam combiner (14), which includes a beam splitter and multiple incident surfaces. The beam splitter is opposite to the emitting mirror of the galvanometer (13). The multiple incident surfaces are oriented in different directions. The first laser emitting module (11) and the second laser emitting module (12) each correspond to one of the incident surfaces. The first laser emitting module (11) and the second laser emitting module (12) can emit corresponding structured light to the corresponding incident surfaces. The beam combiner (14) emits light rays from the incident surfaces from the beam splitter to the reflecting mirror of the galvanometer (13).

4. The structured light projection device according to claim 3, characterized in that, One of the first laser emitting module (11) and the second laser emitting module (12) is turned on, and the one of the first laser emitting module (11) and the second laser emitting module (12) that is turned on emits a corresponding beam to the beam combiner (14).

5. The structured light projection device according to claim 1, characterized in that, The structured light projection device (10) includes a switching unit (15), which is movably disposed on one side of the galvanometer (13). The first laser emitting module (11) and the second laser emitting module (12) are disposed on the switching unit (15). The switching unit (15) is used to switch one of the first laser emitting module (11) and the second laser emitting module (12) to a projection position opposite to the reflective surface of the galvanometer (13). The first laser emitting module (11) and the second laser emitting module (12) in the projection position can emit corresponding beams to the galvanometer (13) and reflect the corresponding structured light to the object under test after being scanned by the galvanometer (13).

6. The structured light projection device according to claim 5, characterized in that, The switching unit (15) switches the positions of the first laser emitting module (11) and the second laser emitting module (12) by sliding or rotating.

7. The structured light projection device according to any one of claims 1 to 6, characterized in that, The first laser emitting device and the second laser emitting device each include at least one of a speckle laser, a single-line laser, and a multi-line laser. The beams emitted by the first laser emitting device and the second laser emitting device are projected into corresponding speckle structured light, stripe-coded structured light, and line-scanned structured light after passing through the galvanometer.

8. A three-dimensional measurement device, comprising an image acquisition system and a structured light projection device (10), characterized in that, The structured light projection device (10) includes the structured light projection device (10) according to any one of claims 1 to 7. The structured light projection device (10) is used to project corresponding structured light from the light outlet onto the object under test. The image acquisition system is used to acquire the structured light pattern on the object under test and generate a structured light image, and to reconstruct the object under test in three dimensions based on the structured light image.

9. The three-dimensional measuring device according to claim 8, characterized in that, The image acquisition system includes two cameras (21), which are respectively located on opposite sides of the light projection device.

10. A three-dimensional imaging measurement system, comprising multiple three-dimensional measurement devices, characterized in that, At least one of the three-dimensional measuring devices is the three-dimensional measuring device as described in claim 8 or 9.

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