Film and display device for function test of external lead

Abstract

The utility model relates to notebook computer technical field especially, more particularly to a film membrane and display equipment of external lead function test, the structure of film membrane of external lead function test includes film membrane main part, film membrane main part includes effective area and invalid area, and effective area is connected with invalid area, effective area pin is set in the effective area of film membrane main part, invalid area pin is set in the invalid area of film membrane main part, and invalid area pin is used for contacting with test needle plate, and lead-out wire, the both ends of lead-out wire are connected effective area pin and invalid area pin respectively, and lead-out wire is provided with narrowing part at the junction of effective area and invalid area. The film membrane and display equipment of external lead function test can solve the problem that the film membrane of current GMF product is easily wounded and leads to product function abnormality when carrying out function test.

Description

Technical Field

[0001] This application relates to the field of notebook computer technology, and in particular to a film and display device for external sensing function testing. Background Technology

[0002] As times continue to develop, people have higher and higher requirements for the visual experience of electronic products. HDR (High Dynamic Range) technology restores the light and shadow levels in nature by improving peak brightness, reducing black level brightness, and expanding color gamut, so that users can see both the dazzling light spots and the details of moss under the shade of trees on the screen at the same time.

[0003] Currently, the film (polyethylene terephthalate film) thickness of GMF (capacitive touchscreen composite) products is 50µm, which is insufficient to meet the requirements of HDR testing. A common industry solution is to reduce the film thickness to 20µm to meet HDR testing requirements.

[0004] During the manufacturing process, the method for functional testing of film products involves contacting the bonding pins with a pin plate to test the resistance of the channel and determine whether an open circuit or short circuit has occurred. However, the 20µm thick film material has poor cushioning, making it easy to damage the pins during functional testing, leading to product malfunction or failure. While reducing the test pressure can decrease the damage rate, it can result in insufficient contact and false readings. Utility Model Content

[0005] In view of this, the purpose of this application is to provide a film and display device for external functional testing, so as to solve the problem that the film of existing GMF products is easily punctured during functional testing, which leads to abnormal product function.

[0006] According to a first aspect of the present invention, a film for external probe function testing is provided, wherein the film for external probe function testing comprises: a film body, the film body including an effective area and an ineffective area, the effective area being connected to the ineffective area; an effective area pin disposed within the effective area of ​​the film body; an ineffective area pin disposed within the ineffective area of ​​the film body, the ineffective area pin being used to contact a test probe plate; and a lead wire, the two ends of the lead wire being respectively connected to the effective area pin and the ineffective area pin, the lead wire having a narrowing portion provided at the junction of the effective area and the ineffective area.

[0007] Preferably, there are multiple active area pins, and the number of inactive area pins is equal to the number of active area pins. The multiple active area pins and the multiple inactive area pins are connected one-to-one through multiple leads.

[0008] Preferably, a strip-shaped cut portion is formed within the film body, and the narrowed portions of the plurality of lead wires are aligned within the cut portion, wherein the extending direction of the cut portion is perpendicular to the extending direction of the narrowed portion.

[0009] Preferably, the narrowing portion is located in the middle of the lead-out line, and the width of the narrowing portion is smaller than the width of the rest of the lead-out line.

[0010] Preferably, the width of the narrowed portion is 10µm to 20µm.

[0011] Preferably, the length of the narrowed portion within the effective region is 0.2 mm to 0.4 mm, and the length of the narrowed portion within the ineffective region is 0.2 mm to 0.4 mm.

[0012] Preferably, when the plurality of active area pins and the plurality of inactive area pins are aligned in the extension direction, the plurality of leads are arranged parallel to each other.

[0013] Preferably, when the plurality of active region pins and the plurality of inactive region pins are not aligned in the extension direction, the lead includes: a first extension portion connected to the active region pin, the first extension portion extending in the same direction as the active region pin, the first extension portion extending into the inactive region, the narrowing portion disposed on the first extension portion, and the first extension portions of the plurality of lead are arranged parallel to each other; and a second extension portion connected to the first extension portion, the second extension portion being bent and connected to the inactive region pin.

[0014] Preferably, the plurality of invalid region pins are arranged in a row in a first direction, and the distance between the invalid region pin at the first end and the invalid region pin at the last end is less than the length of the test pin plate.

[0015] According to a second aspect of the present invention, a display device is provided, wherein the display device includes a film for external contact function testing as described above.

[0016] The film and display device for external lead function testing according to this utility model embodiment include an effective area and an ineffective area connected to each other. The effective area pins are located within the effective area of ​​the film body. The ineffective area pins are located within the ineffective area of ​​the film body and are used to contact the test probe plate. The two ends of the lead wire are connected to the effective area pins and the ineffective area pins, respectively, and a narrowing section is provided at the junction of the effective and ineffective areas. This design eliminates the need for the test probe plate to reduce pressure during contact with the ineffective area pins, thus avoiding false tests due to insufficient contact. After testing, the operator can use a laser to cut away the ineffective area, retaining only the effective area and effective area pins of the film body. The narrowing section prevents the molten film from wrapping around the ends of the lead wires after cutting, thus avoiding large-scale uneven deformation. This effectively solves the problem that existing GMF product films are easily damaged during functional testing, leading to product malfunctions.

[0017] To make the above-mentioned objectives, features and advantages of this application more apparent and understandable, preferred embodiments are described below in detail with reference to the accompanying drawings. Attached Figure Description

[0018] To more clearly illustrate the technical solutions of the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this application and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0019] Figure 1 This is a schematic diagram of a first embodiment of a film used for external excitation function testing according to the present invention.

[0020] Figure 2 This is a schematic diagram of a portion of the structure of a film according to a first embodiment of the external excitation function test of this utility model.

[0021] Figure 3 This is a schematic diagram of a second embodiment of the film used for external excitation function testing according to the present invention.

[0022] Reference numerals: 1-film body; 10-edge of effective area; 11-effective area; 12-ineffective area; 2-effective area pin; 3-ineffective area pin; 4-lead; 40-narrowing section; 41-first extension; 42-second extension; 5-cut section. Detailed Implementation

[0023] The following detailed embodiments are provided to help the reader gain a comprehensive understanding of the methods, apparatus, and / or systems described herein. However, various changes, modifications, and equivalents of the methods, apparatus, and / or systems described herein will be apparent after understanding the disclosure of this application. For example, the order of operations described herein is merely illustrative and is not limited to the order set forth herein; changes that will be apparent after understanding the disclosure of this application are possible, except for operations that must occur in a specific order. Furthermore, for clarity and brevity, descriptions of features known in the art may be omitted.

[0024] The features described herein may be implemented in different forms and should not be construed as being limited to the examples described herein. Rather, the examples described herein have been provided merely to illustrate some of the many feasible ways of implementing the methods, apparatus, and / or systems described herein that will be apparent upon understanding the disclosure of this application.

[0025] Throughout the specification, when an element (such as a layer, region, or substrate) is described as being "on" another element, "connected to" another element, "bonded to" another element, "on" another element, or "covering" another element, it may be directly "on" another element, "connected to" another element, "bonded to" another element, "on" another element, or "covering" another element, or there may be one or more other elements in between. In contrast, when an element is described as being "directly on" another element, "directly connected to" another element, "directly bonded to" another element, "directly on" another element, or "directly covering" another element, there may be no other elements in between.

[0026] As used herein, the term “and / or” includes any one of the relevant items listed and any combination of any two or more items.

[0027] Although terms such as “first,” “second,” and “third” may be used herein to describe individual components, assemblies, regions, layers, or parts, these components, assemblies, regions, layers, or parts are not limited by these terms. Rather, these terms are used only to distinguish one component, assembly, region, layer, or part from another. Therefore, without departing from the teachings of the examples described herein, the first component, assembly, region, layer, or part referred to as the second component, assembly, region, layer, or part may also be referred to as the second component, assembly, region, layer, or part.

[0028] For ease of description, spatial relation terms such as “above,” “upper,” “below,” and “lower” are used herein to describe the relationship between one element and another, as shown in the accompanying drawings. Such spatial relation terms are intended to include not only the orientation depicted in the drawings but also different orientations of the device during use or operation. For example, if the device in the drawings is flipped, an element described as being “above” or “upper” relative to another element will subsequently be “below” or “lower” relative to that other element. Therefore, the term “above” includes both “above” and “below” orientations depending on the spatial orientation of the device. The device may also be positioned in other ways (e.g., rotated 90 degrees or in other orientations), and the spatial relation terms used herein will be interpreted accordingly.

[0029] The terminology used herein is for the purpose of describing various examples only and is not intended to limit the examples. Unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. The terms “comprising,” “including,” and “having” enumerate the stated features, quantities, operations, components, elements, and / or combinations thereof, but do not exclude the presence or addition of one or more other features, quantities, operations, components, elements, and / or combinations thereof.

[0030] Variations in the shapes shown in the accompanying drawings may occur due to manufacturing techniques and / or tolerances. Therefore, the examples described herein are not limited to the specific shapes shown in the accompanying drawings, but include changes in shape that may occur during manufacturing.

[0031] The features of the examples described herein can be combined in various ways that will be apparent upon understanding the disclosure of this application. Furthermore, although the examples described herein have a wide variety of constructions, other constructions are possible, as will be apparent upon understanding the disclosure of this application.

[0032] like Figures 1 to 3 As shown, according to a first aspect of the present invention, a film for external lead function testing is provided. The film for external lead function testing includes a film body 1, an effective area pin 2, an ineffective area pin 3, and a lead wire 4.

[0033] In the following description, reference will be made to Figures 1 to 3 The specific structure of the aforementioned components of the film used for the external excitation function test and the connection relationship of the aforementioned components are described in detail.

[0034] like Figures 1 to 3As shown, in this embodiment, the film body 1 may include an effective area 11 and an ineffective area 12, which are interconnected. The effective area 11 is retained after functional testing, while the ineffective area 12 can be removed after functional testing. The effective area pin 2 is located within the effective area 11 of the film body 1 and is used to achieve normal product function. The ineffective area pin 3 is located within the ineffective area 12 of the film body 1 and is only used to contact the test probe plate to complete the functional test. The two ends of the lead wire 4 are connected to the effective area pin 2 and the ineffective area pin 3, respectively. A narrowing portion 40 may be provided at the junction of the effective area 11 and the ineffective area 12 of the lead wire 4. This configuration eliminates the risk of puncture during contact between the test probe plate and the ineffective area pin 3, thus avoiding false tests due to reduced test pressure. After functional testing, the operator can use a laser to cut away the ineffective area 12, retaining only the effective area 11 and the effective area pin 2 of the film body 1. The narrowing section 40 prevents the molten film from wrapping around the end of the lead wire 4 after the film body 1 is cut, thus avoiding large-scale uneven deformation. This effectively prevents the film from puncturing during functional testing, which could lead to product malfunction.

[0035] Preferred, such as Figures 1 to 3 As shown, in this embodiment, there can be multiple active area pins 2. The number of inactive area pins 3 can be equal to the number of active area pins 2, so that multiple active area pins 2 and multiple inactive area pins 3 can be connected one-to-one through multiple leads 4. When performing functional tests, the operator only needs to use the test probe plate to contact the inactive area pins 3 to determine whether the channel has an open circuit or a short circuit.

[0036] Preferred, such as Figures 1 to 3 As shown, in this embodiment, the lead wire 4 can be a metal wire. The narrowing portion 40 can be located in the middle of the lead wire 4. The width of the narrowing portion 40 can be smaller than the width of the rest of the lead wire 4. During laser cutting, the film body 1 (typically made of polyethylene terephthalate) melts and encapsulates the lead wire 4. Since the lead wire 4 has good thermal conductivity, the effective area edge 10 of the film body 1 will exhibit uneven deformation near the lead wire 4. Typically, the laptop industry does not require point defects <25µm; therefore, if the lead wire 4 is sufficiently thin, the uneven deformation defect of the effective area edge 10 can be ignored.

[0037] Furthermore, preferably, such as Figures 1 to 3As shown, in this embodiment, the width of the narrowing portion 40 can be between 10µm and 20µm. This configuration can prevent the lead wire 4 from breaking when the width of the narrowing portion 40 is less than 10µm; or prevent the deformation of the edge 10 of the effective area of ​​the film body 1 from exceeding 25µm when the width of the narrowing portion 40 is greater than 20µm.

[0038] Preferred, such as Figure 1 and Figure 2 As shown, in this embodiment, a strip-shaped cut portion 5 can be formed within the film body 1. The effective area edge 10 of the film body 1 is located within the cut portion 5. After performing functional testing, an operator can use a laser to cut within the cut portion 5. The narrowing portions 40 of multiple lead wires 4 can be aligned within the cut portion 5. The two ends of the narrowing portions 40 in the extension direction can be located on both sides in the width direction of the cut portion 5. The extension direction of the cut portion 5 (e.g., ...) Figure 1 The horizontal direction shown can be perpendicular to the extension direction of the narrowing portion 40 (e.g., the horizontal direction shown). Figure 1 (The vertical direction shown).

[0039] Furthermore, preferably, such as Figure 1 and Figure 2 As shown, in this embodiment, the length of the narrowing portion 40 within the effective region 11 can be 0.2 mm to 0.4 mm. The length of the narrowing portion 40 within the ineffective region 12 can also be 0.2 mm to 0.4 mm. That is, a cutting precision distance of 0.2 mm to 0.4 mm is reserved above and below the edge 10 of the effective region. Correspondingly, the width of the cutting portion 5 (i.e., the length of the narrowing portion 40) can be 0.4 mm to 0.8 mm. Since the total length of the channel in the film product is greater than 200 mm, the change in resistance of the lead wire 4 due to the narrowing portion 40 is negligible.

[0040] Preferably, in the embodiment, when the plurality of active region pins 2 and the plurality of inactive region pins 3 are aligned in the extension direction, the plurality of leads 4 can be arranged parallel to each other. In this case, the plurality of leads 4 all extend in a straight line.

[0041] Preferred, such as Figures 1 to 3 As shown, in another embodiment, multiple active region pins 2 and multiple inactive region pins 3 are in the extending direction (e.g., Figure 1In the case where the leads 4 are not aligned in the vertical direction (as shown), the leads 4 may include a first extension 41 and a second extension 42. The first extension 41 may be connected to the active area pin 2. The extension direction of the first extension 41 may be the same as the extension direction of the active area pin 2. The first extension 41 extends into the inactive area 12, and a narrowing portion 40 may be provided on the first extension 41. The first extensions 41 of the multiple leads 4 may be arranged parallel to each other to facilitate cutting of the multiple leads 4 by an operator. One end of the second extension 42 may be connected to the first extension 41, and the other end of the second extension 42 may be bent and connected to the inactive area pin 3. Adjacent second extensions 42 may also be arranged parallel to each other for easy arrangement of the leads 4.

[0042] In addition, preferred, such as Figure 3 As shown, in this embodiment, when multiple active area pins 2 are distributed, multiple inactive area pins 3 can be grouped together using lead-out lines 4. The multiple inactive area pins 3 can be arranged in a first direction (e.g., ...). Figure 3 The pins are arranged in a row in the horizontal direction shown, and the distance between the invalid area pins 3 at the first end and the invalid area pins 3 at the last end can be less than the length of the test pin plate, so as to facilitate the operator to perform functional tests.

[0043] In addition, such as Figures 1 to 3 As shown, according to a second aspect of the present invention, a display device is provided, comprising a film for external contact function testing as described above. The film for external contact function testing may be mounted on the display device after laser cutting. Preferably, the display device may be a laptop computer.

[0044] During use, the film body 1 includes an effective area 11 and an ineffective area 12 connected to each other. The effective area 11 is retained after functional testing, while the ineffective area 12 is removed after functional testing. The effective area pin 2 is located within the effective area 11 of the film body 1 and is used to achieve normal product function. The ineffective area pin 3 is located within the ineffective area 12 of the film body 1 and is only used to contact the test probe plate to complete the functional test. The two ends of the lead wire 4 are connected to the effective area pin 2 and the ineffective area pin 3, respectively. The lead wire 4 has a narrowing section 40 at the junction of the effective area 11 and the ineffective area 12. This design eliminates the risk of puncture when the test probe plate contacts the ineffective area pin 3, thus avoiding false tests due to reduced test pressure. After the functional test is completed, the operator uses a laser to cut away the ineffective area 12, retaining only the effective area 11 and the effective area pin 2 of the film body 1. The narrowing section 40 prevents the molten film from wrapping around the end of the lead wire 4 after the film body 1 is cut, thus avoiding large-scale uneven deformation. This effectively prevents the film from puncturing during functional testing, which could lead to product malfunction.

[0045] Finally, it should be noted that the above-described embodiments are merely specific implementations of this application, used to illustrate the technical solutions of this application, and not to limit them. The scope of protection of this application is not limited thereto. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that any person skilled in the art can still modify or easily conceive of changes to the technical solutions described in the foregoing embodiments, or make equivalent substitutions for some of the technical features, within the scope of the technology disclosed in this application. Such modifications, changes, or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application, and should all be covered within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A film for external excitation function testing, characterized in that, The film used for the external excitation function test includes: The film body includes an effective area and an ineffective area, and the effective area is connected to the ineffective area; The effective area pins are located within the effective area of ​​the film body. An invalid region pin is disposed within the invalid region of the film body, and the invalid region pin is used to contact the test probe plate; and The lead wire has its two ends connected to the active region pin and the inactive region pin, respectively, and the lead wire has a narrowing section at the junction of the active region and the inactive region.

2. The film for external excitation function testing according to claim 1, characterized in that, The number of valid area pins is multiple, and the number of invalid area pins is equal to the number of valid area pins. The multiple valid area pins and the multiple invalid area pins are connected one-to-one through multiple leads.

3. The film for external excitation function testing according to claim 2, characterized in that, A strip-shaped cut portion is formed within the film body, and the narrowed portions of the plurality of lead wires are aligned and arranged within the cut portion, with the extension direction of the cut portion perpendicular to the extension direction of the narrowed portion.

4. The film for external excitation function testing according to claim 1, characterized in that, The narrowing portion is located in the middle of the lead-out line, and the width of the narrowing portion is smaller than the width of the rest of the lead-out line.

5. The film for external excitation function testing according to claim 4, characterized in that, The width of the narrowed portion is 10µm to 20µm.

6. The film for external excitation function testing according to claim 1, characterized in that, The length of the narrowed portion within the effective region is 0.2 mm to 0.4 mm, and the length of the narrowed portion within the ineffective region is 0.2 mm to 0.4 mm.

7. The film for external excitation function testing according to claim 2, characterized in that, When the plurality of active area pins and the plurality of inactive area pins are aligned in the extension direction, the plurality of leads are arranged parallel to each other.

8. The film for external excitation function testing according to claim 2, characterized in that, When the plurality of active region pins and the plurality of inactive region pins are not aligned in the extension direction, the lead includes: A first extension portion is connected to the active region pin, the extension direction of the first extension portion is the same as the extension direction of the active region pin, the first extension portion extends into the inactive region, the narrowing portion is disposed on the first extension portion, and the first extension portions of the plurality of leads are arranged parallel to each other; and A second extension is connected to the first extension, and the second extension is bent and connected to the invalid region pin.

9. The film for external excitation function testing according to claim 2, characterized in that, The plurality of invalid region pins are arranged in a row in a first direction, and the distance between the invalid region pin at the first end and the invalid region pin at the last end is less than the length of the test pin plate.

10. A display device, characterized in that, The display device includes the film for external excitation function testing as described in any one of claims 1 to 9.

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