An LED chip testing device

Abstract

The utility model relates to a kind of LED chip testing device, including main control unit, pick-and-place component, the rack of storing LED chip, three-station rotary table, three load plates and camera and testing machine;Pick-and-place component is placed in three-station rotary table side;Rack is placed in the range of pick-and-place component accessible;Three load plates are correspondingly set in the three stations of three-station rotary table;Pick-and-place component is set in the first station vicinity;Camera is set in the second station vicinity;Testing machine is set in the third station vicinity;Pick-and-place component, three-station rotary table, camera and testing machine are electrically connected with main control unit, by setting a three-station rotary table, each station places a load plate, load plate stores LED chip, scans the LED chip of last station when testing, the LED chip of next station carries out test, synchronously, shorten waiting time, improve efficiency.

Description

Technical Field

[0001] This utility model relates to an LED chip testing device. Background Technology

[0002] The LED chip testing machine includes a camera and two carrier trays. During testing, the LED chip needs to be taken out of the rack and placed into the carrier tray. First, the LED chip is photographed and scanned to determine the position of the PN electrodes of the LED chip. Then, it is transported to the bottom of the testing machine for testing. After the test is completed, the LED chip is removed.

[0003] Current LED chip testing machines use a single camera and dual-disc structure. While one chip is being tested, the next chip waits in the waiting area without any action. Since the scanning time and testing time of the testing machine are close, there is significant room for optimization in this part of the time. Therefore, our company provides an LED chip testing device to improve efficiency. Utility Model Content

[0004] The purpose of this invention is to address the shortcomings of existing technologies by proposing an LED chip testing device.

[0005] To achieve the above objectives, the present invention adopts the following technical solution: an LED chip testing device, comprising a main control unit, a pick-and-place component, a rack for storing LED chips, a three-station rotary table, three carrier trays, a camera, and a testing machine; The pick-and-place assembly is placed on one side of the three-station rotary table; The material rack is placed within the reach of the pick-and-place assembly; The three carrier disks are respectively arranged in the three stations of the three-station rotary table; The pick-and-place component is located near the first workstation; The camera is positioned near the second workstation, with the workstation located directly below the camera body. The testing machine is set near the third station, and the station is located within the travel range of the testing probe; The pick-and-place assembly, the three-station rotary table, the camera, and the testing machine are all electrically connected to the main control unit.

[0006] Furthermore, the pick-and-place assembly includes a robotic arm and a gripper mounted on the end effector of the robotic arm; The fixture includes a mounting arm connected to a robotic arm, a gripping plate disposed at the gripping front end of the mounting arm, the front end of the gripping plate being a gripping nozzle area, a gripping block disposed at the top of the gripping nozzle area, the gripping block being driven by a drive mechanism to move up and down, and the LED chip being gripped by the action of the gripping block and the gripping nozzle area.

[0007] Furthermore, the driving mechanism includes a rear cylinder, a push block connected to the push rod of the cylinder, and a lifting block connected to the rear of the clamping block. The contact surface between the push block and the lifting block is a lifting inclined surface. A cover is provided outside the lifting block. The top of the lifting block is a plane. A guide rod is erected on the plane. The guide rod penetrates the cover upward and slides with it. A spring is sleeved on the outside of the guide rod. The top of the spring abuts against the top of the inner wall of the cover. The cylinder pushes the push block to open and close the clamping block and the clamping mouth area, thereby achieving grasping and placement.

[0008] Furthermore, the three-station rotary table includes a base, the top of which is provided with a housing, the housing having an inner cavity with a top opening, a stepper motor being disposed in the inner cavity, and a drive gear being mounted on the spindle of the stepper motor; A driven gear is provided at the center of the inner cavity, and the driven gear meshes with the driving gear; The driven gear is connected to the bottom of the cavity of the housing via a first connector, and a bearing supporting the rotation of the driven gear is provided on the outer side of the first connector; A support ring is provided below the driven gear to support the driven gear; A turntable is disposed on top of the driven gear, and the turntable is connected to the driven gear by a plurality of second connecting members; The upper surface of the turntable is evenly distributed with three workstations, each with a carrier plate.

[0009] Compared with the prior art, the advantages and positive effects of this utility model are as follows: By setting up a three-station rotary table, with a tray at each station holding LED chips, the LED chips at the previous station are scanned during testing, and the LED chips at the next station are tested simultaneously, shortening the waiting time and improving efficiency.

[0010] It can be used with a robotic arm to achieve automatic loading and unloading. Attached Figure Description

[0011] Figure 1 This is a logic diagram of the present invention; Figure 2 This is a three-dimensional schematic diagram of the components of this utility model; Figure 3 This is a schematic diagram of the pick-and-place component of this utility model; Figure 4 This is a schematic diagram of the clamp of the pick-and-place component of this utility model; Figure 5 for Figure 4 A schematic diagram of the drive mechanism of the clamp; Figure 6 This is a sectional view of a three-station rotary table; Figure 7 This is a schematic diagram of the testing machine used in this application; Figure 8 This is a schematic diagram of the camera used in this application.

[0012] Legend: 1-Pick-and-place assembly, 2-Material rack, 3-Three-station rotary table, 4-Carrier tray, 5-Testing machine, 6-Camera; 11-Robot arm, 12-Gripper 121-Mounting arm, 122-Clamping plate, 123-Drive mechanism, 124-Gripper area 14, 125-Clamping block; 1231-Cylinder, 1232-Push block, 1233-Cover, 1234-Guide rod, 1235-Spring, 1236-Lifting block; 31-Base, 32-Housing shell, 33-Stepper motor, 34-Driving gear, 35-Driven gear, 36-Turntable, 37-Bearing, 38-First connector, 39-Support ring, 310-Second connector; 51 - Camera body; 61 - Test probe. Detailed Implementation

[0013] Please see Figures 1 to 2 And refer to Figure 7 and Figure 8 This utility model provides a technical solution: an LED chip testing device, including a main control unit, a pick-and-place component 1, a material rack for storing LED chips 2, a three-station rotary table 3, three carrier plates 4, a camera 5, and a testing machine 6; The main control unit in this application uses a common PLC control system. Please see Figure 2 The pick-and-place assembly 1 is placed on one side of the three-station rotary table 3; The material rack 2 is located within the reach of the picking and placing component 1. The material rack 2 includes a support frame and a material box. The material box has a multi-layer structure for placing multiple LED chips. As can be seen in the figure, the LED chips are placed horizontally. The three carrier trays 4 are respectively arranged in the three stations of the three-station rotary table 3, and are named the first station, the second station, and the third station according to the forward rotation direction (clockwise); The pick-and-place component 1 is located near the first workstation; The camera 5 is positioned near the second work station, with the work station located directly below the camera body 51; The testing machine 6 is set near the third station and is located within the travel range of the testing probe 61. The testing machine 6 contains a module that drives the testing probe 61 to adjust its position. The adjustment is made according to the contact position of the LED chip obtained by the camera 5, so that the testing probe 61 and the contact position of the LED chip are aligned. The camera 5 and tester 6 shown in the figure are simplified illustrations and belong to existing technology. The equipment structure is based on the LDM-150-SF flip-chip LED tester from Silicon Electronics Semiconductor Equipment (Shenzhen) Co., Ltd. The pick-and-place assembly 1, the three-station rotary table 3, the camera 5, and the testing machine 6 are all electrically connected to the main control unit.

[0014] During use, the pick-and-place component 1 takes the first LED chip from the rack 2 and places it into the first station. Then, the rotary table 3 of the three stations rotates 120° to transport the first LED chip to the camera 5 for scanning. At the same time as scanning, the pick-and-place component 1 takes the second LED chip from the rack 2 and places it into the second station. After the scan is complete, the rotary table 3 of the three stations continues to rotate 120°, so that the first station is located below the tester 6 for testing, and the second LED chip of the second station is sent to the camera 5 for scanning. At the same time, the tester 6 also performs testing. Meanwhile, the third station rotates to the vicinity of the pick-and-place component 1, and the pick-and-place component 1 takes the third LED chip from the material rack 2 and puts it into the third station. After the camera 5 completes scanning of the second LED chip and the tester 6 completes testing of the first LED chip, the rotary table 3 of the three stations continues to rotate 120°. At this time, the first station rotates to the vicinity of the pick-and-place component 1. The pick-and-place component 1 removes the first LED chip from the first station and puts it back into the material rack 2, and picks up a new LED chip and puts it into the first station, and so on.

[0015] Comparison Table Calculations show that this solution can save nearly 50% of the time compared to the previous method when conducting tests on 25 samples.

[0016] This solution uses a three-station rotary table 3, with a tray 4 placed at each station to store LED chips. During testing, the LED chips at the previous station are scanned, and the LED chips at the next station are tested simultaneously, shortening the waiting time and improving efficiency.

[0017] Please see Figures 3 to 5In one embodiment of the pick-and-place assembly 1, the pick-and-place assembly 1 includes a robotic arm 11 and a gripper 12 mounted on the end of the robotic arm 11. The clamp 12 includes a mounting arm 121 connected to a robotic arm 11, a clamping plate 122 disposed at the gripping front end of the mounting arm 121, the front end of the clamping plate 122 being a gripping area 124, a clamping block 125 disposed at the top of the gripping area 124, the clamping block 125 being driven by a drive mechanism 123 to move up and down, and the LED chip is clamped by the action of the clamping block 125 and the gripping area 124.

[0018] The drive mechanism 123 includes a rear cylinder 1231, a push block 1232 connected to the push rod of the cylinder 1231, and a lifting block 1236 connected to the rear of the clamping block 125. The contact surface of the push block 1232 and the lifting block 1236 is a lifting inclined surface. A cover 1233 is provided outside the lifting block 1236. The top of the lifting block 1236 is a plane. A guide rod 1234 is erected on the plane. The guide rod 1234 penetrates the cover 1233 upward and slides with it. A spring 1235 is sleeved on the outside of the guide rod 1234. The top of the spring 1235 abuts against the top of the inner wall of the cover 1233. The cylinder 1231 pushes the push block 1232 to open and close the clamping block 125 and the clamping area 124 to achieve grasping and placement.

[0019] Please see Figure 6 An embodiment of a three-station rotary table 3 is provided, wherein the three-station rotary table 3 includes a base 31, the top of the base 31 is provided with a housing 32, the housing 32 has an inner cavity with a top opening, a stepper motor 33 is provided in the inner cavity, and the main shaft of the stepper motor 33 is equipped with a drive gear 34. A driven gear 35 is provided at the center of the inner cavity, and the driven gear 35 meshes with the driving gear 34; The driven gear 35 is connected to the bottom of the cavity of the housing 32 through the first connector 38, and the outer side of the first connector 38 is provided with a bearing 37 to support the rotation of the driven gear 35. A support ring 39 is provided below the driven gear 35 to support the driven gear 35, and the driven gear 35 rotates on the top of the support ring 39; A turntable 36 is disposed on top of the driven gear 35, and the turntable 36 is connected to the driven gear 35 by a plurality of second connectors 310; The upper surface of the turntable 36 is provided with three workstations, each of which is equipped with a carrier plate 4.

[0020] The stepper motor 33 is configured to rotate only 120° clockwise at a time to achieve process changeover.

[0021] The foregoing has shown and described the basic principles, main features, and advantages of this utility model. Those skilled in the art should understand that this utility model is not limited to the above embodiments. The embodiments and descriptions in the specification are merely preferred examples and are not intended to limit the utility model. Variations and modifications made without departing from the spirit and scope of this utility model fall within the scope of the claims. The scope of protection of this utility model is defined by the appended claims and their equivalents.

Claims

1. An LED chip testing device, characterized in that: It includes a main control unit, a pick-and-place assembly, a rack for storing LED chips, a three-station rotary table, three trays, a camera, and a testing machine; The pick-and-place assembly is placed on one side of the three-station rotary table; The material rack is placed within the reach of the pick-and-place assembly; The three carrier disks are respectively arranged in the three stations of the three-station rotary table; The pick-and-place component is located near the first workstation; The camera is positioned near the second workstation, with the workstation located directly below the camera body. The testing machine is set near the third station, and the station is located within the travel range of the testing probe; The pick-and-place assembly, the three-station rotary table, the camera, and the testing machine are all electrically connected to the main control unit.

2. The LED chip testing device according to claim 1, characterized in that: The pick-and-place assembly includes a robotic arm and a gripper mounted on the end effector of the robotic arm; The fixture includes a mounting arm connected to a robotic arm, a gripping plate disposed at the gripping front end of the mounting arm, the front end of the gripping plate being a gripping nozzle area, a gripping block disposed at the top of the gripping nozzle area, the gripping block being driven by a drive mechanism to move up and down, and the LED chip being gripped by the action of the gripping block and the gripping nozzle area.

3. The LED chip testing device according to claim 2, characterized in that: The drive mechanism includes a rear cylinder, a push block connected to the push rod of the cylinder, and a lifting block connected to the rear of the clamping block. The contact surface between the push block and the lifting block is a lifting inclined surface. A cover is provided outside the lifting block. The top of the lifting block is a plane. A guide rod is erected on the plane. The guide rod penetrates the cover upward and slides with it. A spring is sleeved on the outside of the guide rod. The top of the spring abuts against the top of the inner wall of the cover. The cylinder pushes the push block to open and close the clamping block and the clamping mouth area, thereby achieving grasping and placement.

4. An LED chip testing device according to any one of claims 1-3, characterized in that: The three-station rotary table includes a base, a housing on the top of the base, an inner cavity with a top opening, a stepper motor in the inner cavity, and a drive gear mounted on the spindle of the stepper motor. A driven gear is provided at the center of the inner cavity, and the driven gear meshes with the driving gear; The driven gear is connected to the bottom of the cavity of the housing via a first connector, and a bearing supporting the rotation of the driven gear is provided on the outer side of the first connector; A support ring is provided below the driven gear to support the driven gear; A turntable is disposed on top of the driven gear, and the turntable is connected to the driven gear by a plurality of second connecting members; The upper surface of the turntable is evenly distributed with three workstations, each with a carrier plate.

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