Adjusting structure of precision test cover

Abstract

The utility model discloses a kind of adjusting structure of precision test cover, it relates to chip processing technical field, the adjusting structure of this precision test cover, including shell cover, the inside of shell cover is installed with a threaded shaft, and the top of threaded shaft is fixedly installed with knob, multiple screw holes are passed in the inside of knob, screw is fixedly installed in the inside of screw hole, and the knob is fixedly connected with threaded shaft by screw;The lower portion of shell cover is installed with base plate, and push block is arranged between shell cover and base plate;The utility model, chip detection groove bottom and test head stable contact, by rotating knob, threaded shaft moves downward under the action of rotating knob at this time, push block at its bottom moves downward along the central position of guide column, so that push block bottom is inverted trapezoidal boss structure Slowly exert pressure on the chip inside chip detection groove, observe knob mark line and depth degree simultaneously, make push block press-fit product to specified height, carry out testing process.

Description

Technical Field

[0001] This utility model specifically relates to the field of chip processing technology, and more specifically to an adjustment structure for a precision test cover. Background Technology

[0002] In existing technologies, conventional test covers are often simple snap-fit ​​or ordinary spinning structures, lacking adjustment methods and structures, or with limited adjustment methods and structures. There are indispensable assembly gaps between the assembled parts, resulting in a large error range in the product pressing height. This can easily lead to uneven force on the tested product, making it impossible to meet and guarantee high-precision testing requirements.

[0003] With the widespread application of various products in electronics, industry, IoT, and smart devices, product testing has always been a focus for developers. Over time, product target functions become more diverse, testing becomes more varied, and precision requirements gradually increase. In the past, products were primarily used in electronics and industrial fields. However, as products gradually enter new application areas, each end market has unique needs, and the usage methods and conditions differ, leading to more factors affecting product functionality and quality than before. To ensure effective and reliable product functionality and stable quality, all products must undergo comprehensive testing of all functions before development and application. Therefore, we propose an adjustable structure for a precision test cover to address the aforementioned issues. Utility Model Content

[0004] The purpose of this invention is to provide an adjustment structure for a precision test cover. During testing, the bottom of the chip detection slot is in stable contact with the test head. By rotating the knob, the threaded shaft moves downward, pushing the push block at its bottom downward along the center of the guide post. This causes the inverted trapezoidal protrusion structure at the bottom of the push block to slowly apply pressure to the chip inside the chip detection slot. Simultaneously, the knob markings and depth are observed, allowing the push block to press the product to the specified height for testing. This addresses the technical problems mentioned in the background section.

[0005] To achieve the above objectives, this utility model provides the following technical solution: An adjustment structure for a precision test cover includes a shell cover, inside which a threaded shaft is installed, and a knob is fixedly installed at the top end of the threaded shaft. The knob has multiple threaded holes through which screws are fixedly installed, and the knob is fixedly connected to the threaded shaft by the screws. A base plate is installed below the cover, and a push block is provided between the cover and the base plate. Spring latches are provided at symmetrical positions on both sides of the cover, and the cover is fixedly connected to the base plate through the spring latches.

[0006] As a further technical solution of this utility model, a threaded hole is opened through the center of the inner part of the shell cover, and the inner wall of the threaded hole is matched and connected with the threaded shaft. The shell cover is provided with knob markings and depth markings at the outer edge of the threaded hole.

[0007] As a further technical solution of this utility model, guide holes are provided through the four corners of the shell cover, ball bushings are installed inside the guide holes, and guide posts are movably installed inside the ball bushings.

[0008] As a further technical solution of this utility model, the substrate is provided with a positioning hole at the position corresponding to the guide post, and the inside of the positioning hole matches and is installed with the bottom of the guide post.

[0009] As a further technical solution of this utility model, a chip detection groove is formed at the center of the substrate, and the chip detection groove has an inverted trapezoidal boss structure.

[0010] As a further technical solution of this utility model, the top of the push block is a plate-like structure and the bottom is an inverted trapezoidal protrusion structure, and the inverted trapezoidal protrusion structure at the bottom of the push block matches the chip detection slot.

[0011] As a further technical solution of this utility model, the base plate is integrally formed with a spring hook at the position corresponding to the spring hook, and the spring hook and the spring hook are matched and connected.

[0012] Compared with the prior art, the beneficial effects of this utility model are: In this utility model, during the testing operation, the bottom of the chip detection slot is in stable contact with the test head. By rotating the knob, the threaded shaft moves downward under the action of rotating the knob, pushing the push block at its bottom to move downward along the center position of the guide post. This causes the inverted trapezoidal protrusion structure at the bottom of the push block to slowly apply pressure to the chip inside the chip detection slot. At the same time, the knob mark and the depth of penetration are observed, so that the push block presses the product to the specified height and the testing process is carried out. This invention features a simple structure and convenient operation, enabling precise adjustment of the chip bonding height. Furthermore, the overall structure is composed of parts, making the product readily available and cost-effective. Attached Figure Description

[0013] Figure 1 This is a schematic diagram of the overall structure of this utility model.

[0014] Figure 2 This utility model Figure 1 Floor plan.

[0015] Figure 3 This is a utility model Figure 2 Sectional view at point AA.

[0016] Figure 4 This utility model Figure 1 Exploded view.

[0017] 1-Baseboard, 2-Shell cover, 3-Guide post, 4-Ball bushing, 5-Threaded shaft, 6-Spring latch, 7-Knob, 8-Push block, 9-Screw. Detailed Implementation

[0018] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0019] Please see Figure 1-4 This utility model embodiment provides an adjustment structure for a precision test cover, including a shell cover 2. A threaded shaft 5 is installed inside the shell cover 2, and a knob 7 is fixedly installed at the top of the threaded shaft 5. Multiple threaded holes are opened through the inside of the knob 7, and screws 9 are fixedly installed inside the threaded holes. The knob 7 is fixedly connected to the threaded shaft 5 by the screws 9. A base plate 1 is installed below the cover 2, and a push block 8 is provided between the cover 2 and the base plate 1. Spring buckles 6 are provided at symmetrical positions on both sides of the cover 2, and the cover 2 is fixedly connected to the base plate 1 through the spring buckles 6. By adopting the above technical solution, the cover 2 is equipped with a spring latch 6, which, when engaged with the spring latch hook of the substrate 1, tightly connects the cover 2 and the substrate 1 together.

[0020] In this example, a threaded hole is formed through the center of the inner part of the cover 2, and the inner wall of the threaded hole is matched and connected with the threaded shaft 5. The cover 2 is provided with knob markings and depth markings at the outer edge of the threaded hole. By adopting the above technical solution, the threaded shaft 5 is installed on the cover 2 through the external thread, and the threaded shaft 5 can be moved axially by rotating the threaded shaft 5; the knob 7 is fixed on the threaded shaft 5 with screws 9, which facilitates manual rotation and calibration of the initial position. Furthermore, the threaded shaft 5 has a precision thread with a small thread pitch and the threads are densely arranged along the axial direction. During the rotation, the end face of the threaded shaft 5 moves only a small distance upward or downward for each rotation. Meanwhile, on the mounting end face of the knob 7 of the threaded shaft 5, there are two or more screw mounting holes. The mounting holes are densely arranged. Each time the position of a mounting hole is adjusted, the end face of the threaded shaft 5 moves only 5µm upwards or downwards. Finally, the cover 2 is provided with a rotation scale corresponding to the axial movement distance, and the knob 7 is provided with multiple sets of optional mounting holes and alignment marks; after adjusting to the required axial height by rotating the threaded shaft 5, align the knob mark with the 0 scale, select the 4 holes of the aligned group 1, and lock the screw 9 to fix the threaded shaft 5 and the knob 7 together.

[0021] In this example, guide holes are provided at the four corners of the shell cover 2, ball bushings 4 are installed inside the guide holes, and guide posts 3 are movably installed inside the ball bushings 4.

[0022] In this example, the substrate 1 is provided with a positioning hole at the position corresponding to the guide post 3, and the inside of the positioning hole matches the bottom of the guide post 3 for installation. By adopting the above technical solution, the guide post 3 in the shell cover 2 and the ball bushing 4 on the base plate 1 fit together precisely in the upper and lower parts to ensure that the vertical movement is maintained.

[0023] In this example, a chip detection groove is formed at the center of the substrate 1, and the chip detection groove has an inverted trapezoidal boss structure.

[0024] In this example, the top of the push block 8 is a plate-like structure, and the bottom is an inverted trapezoidal bump structure. The inverted trapezoidal bump structure at the bottom of the push block 8 matches the chip detection slot. By adopting the above technical solution, during the test operation, the bottom of the chip detection slot is in stable contact with the test head. By rotating the knob 7, the threaded shaft 5 moves downward under the action of rotating the knob 7, pushing the push block 8 at its bottom to move downward along the center position of the guide post 3. This causes the bottom of the push block 8, which has an inverted trapezoidal protrusion structure, to slowly apply pressure to the chip inside the chip detection slot. At the same time, the knob mark and the depth of entry are observed, so that the push block presses the product to the specified height and the test process is carried out.

[0025] In this example, the base plate 1 has a spring hook integrally formed at the position corresponding to the spring hook 6, and the spring hook 6 and the spring hook are matched and connected.

[0026] The working principle of this utility model is as follows: Before use, the installation height of the push block 8 needs to be determined and adjusted according to the size of the product. First, the guide post 3 and the spring hook are installed on the base plate 1. The spring hook 6 and the ball bushing 4 are installed on the cover 2. Then, the cover 2 is partially inserted into the guide post 3, the spring hook 6 is fastened, and the threaded shaft 5 is rotated repeatedly to adjust the height of the push block 8 to the required height. At this time, the position of the threaded shaft 5 is kept still, the knob 7 is placed on the threaded shaft 5, rotated and adjusted to align the mark and the 0 mark, and the aligned mounting holes are observed. Then, the knob 7 and the threaded shaft 5 are fastened together with screws 9 through the aligned set of holes, thus completing the adjustment.

[0027] During testing, first open the spring latch 6 and remove the cover 2 and its components; install the substrate 1 and guide post 3 on the test table, place the product in the chip detection slot below the opening in the middle of the substrate 1, then put the cover 2 and its components into the guide post 3, fasten the spring latch 6, rotate the knob 7 and rotate the knob mark and the depth of the entry, so that the push block 8 presses the product to the specified height, keep the product in stable contact with the test head, and carry out the test; After a period of use, the product may experience a decrease in pressing error due to the drying of grease, friction, and reciprocating stroke. If insufficient pressing accuracy occurs, the parts of the product should be cleaned, reassembled, and adjusted before continued use.

[0028] It will be apparent to those skilled in the art that this invention is not limited to the details of the exemplary embodiments described above, and that it can be implemented in other specific forms without departing from the spirit or essential characteristics of this invention. Therefore, the embodiments should be considered illustrative and non-limiting in all respects, and the scope of this invention is defined by the appended claims rather than the foregoing description. Thus, it is intended that all variations falling within the meaning and scope of equivalents of the claims be included within this invention. No reference numerals in the claims should be construed as limiting the scope of the claims.

[0029] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

Claims

1. An adjustment structure for a precision test cover, characterized in that: Includes a cover (2), inside which a threaded shaft (5) is installed, and a knob (7) is fixedly installed at the top of the threaded shaft (5). Multiple screw holes are opened through the inside of the knob (7), and screws (9) are fixedly installed inside the screw holes. The knob (7) is fixedly connected to the threaded shaft (5) by the screws (9). A base plate (1) is installed below the cover (2), and a push block (8) is provided between the cover (2) and the base plate (1). Spring buckles (6) are provided at symmetrical positions on both sides of the cover (2), and the cover (2) is fixedly connected to the base plate (1) through the spring buckles (6).

2. The adjustment structure of the precision test cover according to claim 1, characterized in that: A threaded hole is provided through the center of the inner part of the cover (2), and the inner wall of the threaded hole is matched and connected with the threaded shaft (5). The cover (2) is provided with knob markings and depth markings at the outer edge of the threaded hole.

3. The adjustment structure of the precision test cover according to claim 2, characterized in that: Guide holes are provided at the four corners of the shell cover (2), and ball bushings (4) are installed inside the guide holes. Guide posts (3) are movably installed inside the ball bushings (4).

4. The adjustment structure of the precision test cover according to claim 3, characterized in that: The substrate (1) is provided with a positioning hole at the position corresponding to the guide post (3), and the inside of the positioning hole is matched and installed with the bottom of the guide post (3).

5. The adjustment structure of the precision test cover according to claim 1, characterized in that: A chip detection groove is provided at the center of the substrate (1), and the chip detection groove has an inverted trapezoidal boss structure.

6. The adjustment structure of the precision test cover according to claim 1, characterized in that: The top of the push block (8) is a plate-like structure, and the bottom is an inverted trapezoidal bump structure. The inverted trapezoidal bump structure at the bottom of the push block (8) matches the chip detection slot.

7. The adjustment structure of the precision test cover according to claim 1, characterized in that: The base plate (1) has an integrally formed spring hook at the position corresponding to the spring hook (6), and the spring hook (6) is matched and connected with the spring hook.

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