A knob chip test seat for a circuit board testing machine

CN224921884UActive Publication Date: 2026-10-30ZHUHAI BOJAY ELECTRONICS
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Patent Information

Application Number
CN202522067906.1
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-09-25
Publication Date
2026-10-30
Estimated Expiration
2035-09-25

AI Technical Summary

Technical Problem

以往在使用上述平台对芯片进行测试时,都是直接将芯片老化测试座固定安装在平台的下针板上,主要通过老化测试固定座本身的下压部与芯片压爪之间的联动,应对不同尺寸芯片的测试需要,但由于芯片老化测试固定座本身的尺寸也很小,下压部的下压距离有限,因此无法适用所有芯片的测试要求,而芯片老化测试固定座与Agilent3070平台下针板之间的安装连接精密度要求很高,如因芯片尺寸问题而对固定座进行反复拆装更换,容易影响最终的测试精确度,整台芯片老化固定座频繁进行更换的操作也相对复杂,十分影响生产测试的效率

Benefits of technology

[0012]与现有技术相比,本实用新型的有益效果是:本实用新型旨在将Agilent3070电路板测试机台应用于芯片性能测试,提供一种具有可拆卸的模块化结构的芯片测试底座,操作人员可以根据不同芯片尺寸,对芯片测试座中的浮动探针组件和限位浮动板进行更换,以适应不同尺寸不同型号的芯片的测试要求,同时也便于对设备的探针等结构进行维护保养;通过手动旋转旋钮,驱动限位浮动板下压,利用芯片定位压板在浮动腔内的行程、辅助定位板在下压盖内的行程,以及在第二浮动弹簧和第三浮动弹簧的作用下,对待测芯片起到辅助定位的作用,同时保护芯片以免被压坏;辅助限位板在第一浮动弹簧的作用下覆盖探针尖端,对探针起到保护作用,在芯片被芯片定位压板下压时,第一浮动弹簧同时被压缩,探针尖端露出与芯片接触,从而进行检测。因此,本实用新型采用模块化设计、便于对浮动板和探针板进行更换,并有效保护探针。

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Abstract

The utility model provides a kind of knob chip test seat for circuit board testing machine, which is modularly designed, convenient to replace floating plate and probe plate, and effectively protects the probe. It comprises a fixed base and a knob lower pressing cover. The fixed base is detachably embedded with a floating probe assembly. The top of the floating probe assembly is provided with a chip slot. The knob lower pressing cover comprises a pressing cover, a knob and a limiting floating plate. The pressing cover is rotatably connected to either side end of the fixed base. The limiting floating plate is detachably embedded in the pressing cover. The bottom of the knob is movably connected to the pressing cover through threads, and abuts against the top of the limiting floating plate. The utility model is suitable for chip performance testing equipment technical field.
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Description

Technical Field

[0001] This utility model relates to the technical field of chip performance testing equipment, and in particular to a knob chip testing socket for a circuit board testing machine. Background Technology

[0002] The Agilent 3070 platform is a circuit board testing machine designed and manufactured by Agilent Technologies, Inc. The equipment consists of three main modules: a test head, a computer, and a power supply unit. It employs pneumatic locking and vacuum adsorption technology to achieve precise positioning of the test fixture. Previously, when testing chips using this platform, the chip aging test fixture was directly fixed to the lower probe plate of the platform. The testing of chips of different sizes was handled primarily by the linkage between the pressing part of the aging test fixture and the chip clamps. However, due to the small size of the chip aging test fixture itself and the limited pressing distance of the pressing part, it could not meet the testing requirements of all chips. Furthermore, the installation and connection between the chip aging test fixture and the lower probe plate of the Agilent 3070 platform requires high precision. Repeated disassembly and replacement of the fixture due to chip size issues can easily affect the final test accuracy. Frequent replacement of the entire chip aging fixture is also relatively complex, significantly impacting production testing efficiency. Utility Model Content

[0003] To address the aforementioned issues, this invention provides a modular design for a rotary chip tester used in circuit board testing equipment. This design facilitates the replacement of the floating plate and probe plate, and effectively protects the probes.

[0004] The technical solution adopted by this utility model is as follows: This utility model includes a fixed base and a knob lower cover. The fixed base is detachably built with a floating probe assembly. The floating probe assembly is provided with a chip slot on its top. The knob lower cover includes a lower cover, a knob, and a limiting floating plate. The lower cover is rotatably connected to either side of the fixed base. The limiting floating plate is detachably built into the lower cover. The bottom of the knob is movably connected to the lower cover by a thread and abuts against the top of the limiting floating plate.

[0005] Furthermore, the floating probe assembly includes a base plate, a probe stage, and an auxiliary limiting plate. The probe stage is detachably disposed at the center of the base plate. Several floating guide posts are also disposed on the base plate around the outer periphery of the probe stage. The auxiliary limiting plate can be offset in the vertical direction by slidingly engaging with the floating guide posts. Several first floating springs are also disposed between the base plate and the auxiliary limiting plate. The chip slot is disposed on the upper surface of the auxiliary limiting plate.

[0006] Furthermore, the auxiliary limiting plate is provided with a plurality of arrayed limiting slots and positioning holes on the outer periphery of the chip slot, and the auxiliary limiting plate is also provided with four sets of corner clearance slots corresponding to the corners of the chip slot.

[0007] Furthermore, the limiting floating plate includes a first lower pressure plate, a second lower pressure plate, a chip positioning pressure plate, and an auxiliary positioning plate stacked sequentially from top to bottom. The upper surface of the first lower pressure plate abuts against the bottom of the knob. The auxiliary positioning plate is fixedly disposed on the lower surface of the second lower pressure plate. The second lower pressure plate has an opening adapted to the chip positioning pressure plate. The lower end face of the first lower pressure plate, the opening, and the upper end face of the auxiliary positioning plate together form a floating cavity. The chip positioning pressure plate is placed in the floating cavity and slides through the second lower pressure plate and the auxiliary positioning plate. A plurality of second floating springs are also disposed between the first lower pressure plate and the second lower pressure plate.

[0008] Furthermore, the chip positioning plate is composed of an integrally formed connecting block and a chip pressing block arranged perpendicularly to each other. Several third floating springs are arranged in an array between the upper surface of the connecting block and the lower surface of the first lower pressing plate, and between the lower surface of the connecting block and the upper surface of the auxiliary positioning plate. The chip pressing block penetrates the auxiliary positioning plate.

[0009] Furthermore, the lower surface of the auxiliary positioning plate is also provided with a limiting block and a positioning rod that are respectively adapted to the limiting groove and the positioning hole.

[0010] Furthermore, the knob consists of a nut and a screw, which is threadedly connected to the lower pressure cover. The bottom of the screw abuts against the upper surface of the first lower pressure plate. A limit rod is also provided on the upper surface of the lower pressure cover, and an arc-shaped opening and closing groove adapted to the limit rod is provided on the lower surface of the nut.

[0011] Finally, the lower pressure cover is rotatably connected to the fixed base via a rotating shaft and a torsion spring. A locking buckle is also provided on the other side of the lower pressure cover corresponding to the rotating shaft, and the locking buckle is detachably connected to the fixed base.

[0012] Compared with existing technologies, the advantages of this invention are as follows: This invention aims to apply the Agilent 3070 circuit board testing machine to chip performance testing, providing a chip testing base with a detachable modular structure. Operators can replace the floating probe assembly and limiting floating plate in the chip testing base according to different chip sizes to adapt to the testing requirements of chips of different sizes and models. It also facilitates maintenance of the probes and other structures of the equipment. By manually rotating the knob, the limiting floating plate is driven to press down. The travel of the chip positioning plate within the floating cavity, the travel of the auxiliary positioning plate within the lower pressure cover, and the action of the second and third floating springs assist in positioning the chip under test, while protecting the chip from damage. The auxiliary limiting plate, under the action of the first floating spring, covers the probe tip, protecting the probe. When the chip is pressed down by the chip positioning plate, the first floating spring is simultaneously compressed, exposing the probe tip for contact with the chip, thus enabling testing. Therefore, this invention adopts a modular design, facilitates the replacement of the floating plate and probe plate, and effectively protects the probes. Attached Figure Description

[0013] Figure 1 This is a schematic diagram of the overall structure of this utility model; Figure 2 This is an exploded view of the floating probe assembly; Figure 3 This is an exploded structural diagram of the lower cover of the knob. Detailed Implementation

[0014] like Figures 1 to 3 As shown, this utility model includes a fixed base 1 and a knob lower pressure cover 2. The fixed base 1 has a detachable floating probe assembly 3 built into it. The floating probe assembly 3 has a chip slot 4 on its top. The knob lower pressure cover 2 includes a lower pressure cover 20, a knob 21, and a limiting floating plate 22. The lower pressure cover 20 is rotatably connected to either side of the fixed base 1. The limiting floating plate 22 is detachably built into the lower pressure cover 20. The bottom of the knob 21 is movably connected to the lower pressure cover 20 by threads and abuts against the top of the limiting floating plate 22. The lower pressure cover 20 is rotatably connected to the fixed base 1 by a rotating shaft 27 and a torsion spring 28. A locking buckle 29 is also provided on the other side of the lower pressure cover 20 corresponding to the rotating shaft 27, and is detachably connected to the fixed base 1 by the locking buckle 29.

[0015] In this invention, the floating probe assembly 3 includes a base plate 30, a probe stage 31, and an auxiliary limiting plate 32. The probe stage 31 is detachably mounted at the center of the base plate 30. A plurality of floating guide posts 33 are also arranged around the outer periphery of the probe stage 31 on the base plate 30. The auxiliary limiting plate 32 can be offset vertically by slidingly engaging with the floating guide posts 33. A plurality of first floating springs 34 are also arranged between the base plate 30 and the auxiliary limiting plate 32. The chip slot 4 is disposed on the upper surface of the auxiliary limiting plate 32. Under the action of the first floating springs 34, the auxiliary limiting plate 32 floats on the probe tip, protecting the probe. When the operator rotates the knob 21, driving the limiting floating plate 22 to press down and fix the chip in the chip slot 4, the auxiliary limiting plate 32 moves downward and compresses the first floating springs 34. The probe tip on the probe stage 31 protrudes outside the auxiliary limiting plate 32 and contacts the chip.

[0016] The auxiliary limiting plate 32 is provided with a plurality of arrayed limiting slots 35 and positioning holes 36 on the outer periphery of the chip slot 4. The auxiliary limiting plate 32 also has four sets of corner clearance slots 37 corresponding to the corners of the chip slot 4. The lower surface of the auxiliary positioning plate 223 is provided with limiting blocks 2230 and positioning rods 2231 that respectively adapt to the limiting slots 35 and positioning holes 36. The corner clearance slots 37 are used to prevent damage to the four corners of the square chip during testing. The matching of the limiting blocks 2230 with the limiting slots 35 and the matching of the positioning rods 2231 with the positioning holes 36 ensures perfect assembly of the knob cover 2 and the fixed base 1, thereby ensuring that the chip is accurately placed in the chip slot 4 for testing.

[0017] The limiting floating plate 22 includes a first lower pressure plate 220, a second lower pressure plate 221, a chip positioning pressure plate 222, and an auxiliary positioning plate 223 stacked sequentially from top to bottom. The upper surface of the first lower pressure plate 220 abuts against the bottom of the knob 21. The auxiliary positioning plate 223 is fixedly disposed on the lower surface of the second lower pressure plate 221. The second lower pressure plate 221 has an opening 224 adapted to the chip positioning pressure plate 222. The lower end face of the first lower pressure plate 220, the opening 224, and the upper end face of the auxiliary positioning plate 223 together form a floating cavity. The chip positioning pressure plate 222 is placed in the floating cavity and slides through the second lower pressure plate 221 and the auxiliary positioning plate 223. A plurality of second floating springs 225 are also disposed between the first lower pressure plate 220 and the second lower pressure plate 221. In this invention, by utilizing the action of the second floating spring 225, there is a certain amount of displacement between the first lower pressure plate 220 and the second lower pressure plate 221, so as to prevent the auxiliary positioning plate 223 from damaging the chip.

[0018] The chip positioning plate 222 is composed of an integrally formed connecting block 2220 and a chip pressing block 2221 arranged perpendicularly to each other. A plurality of third floating springs 226 are arrayed between the upper surface of the connecting block 2220 and the lower surface of the first lower pressing plate 220, and between the lower surface of the connecting block 2220 and the upper surface of the auxiliary positioning plate 223. The chip pressing block 2221 penetrates the auxiliary positioning plate 223. In this invention, the displacement of the chip positioning plate 222 within the floating cavity, along with the buffering effect of the third floating springs 226, provides secondary protection for the chip.

[0019] The knob 21 consists of a knob cap 23 and a screw 24. The screw 24 is threadedly connected to the lower pressure cover 20. The bottom of the screw 24 abuts against the upper surface of the first lower pressure plate 220. A limiting rod 25 is also provided on the upper end face of the lower pressure cover 20. The lower end face of the knob cap 23 is provided with an arc-shaped opening and stopping groove 26 that matches the limiting rod 25. In this invention, when the operator rotates the knob cap 23, the displacement of the limiting rod 25 from its starting point to its ending point in the arc-shaped opening and stopping groove 26 matches the displacement of the chip positioning plate 222 in the floating cavity. This prevents the operator from excessively rotating the knob cap 23, which could cause the chip positioning plate 222 to move excessively downward and damage the chip.

[0020] This invention aims to apply the Agilent 3070 circuit board tester to chip performance testing, providing a chip test base with a detachable modular structure. Operators can replace the floating probe assembly 3 and the limiting floating plate 22 in the chip test base according to different chip sizes to adapt to the testing requirements of chips of different sizes and models. This also facilitates maintenance of the equipment's probes and other structures. By manually rotating the knob 21, the limiting floating plate 22 is driven to press down. The chip positioning plate 222's stroke within the floating cavity, the auxiliary positioning plate 223's stroke within the lower pressure cover 20, and the action of the second floating spring 225 and the third floating spring 226 assist in positioning the chip under test, while protecting the chip from damage. The auxiliary limiting plate 32, under the action of the first floating spring 34, covers the probe tip, protecting it. When the chip is pressed down by the chip positioning plate 222, the first floating spring 34 is simultaneously compressed, exposing the probe tip for contact with the chip, thus enabling testing.

[0021] Finally, it should be emphasized that the above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. For those skilled in the art, the present utility model can have various changes and modifications. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A rotary chip test socket for a circuit board testing machine, characterized in that: The device includes a fixed base (1) and a knob lower cover (2). The fixed base (1) has a floating probe assembly (3) detachably built into it. The floating probe assembly (3) has a chip slot (4) on its top. The knob lower cover (2) includes a lower cover (20), a knob (21), and a limiting floating plate (22). The lower cover (20) is rotatably connected to either side of the fixed base (1). The limiting floating plate (22) is detachably built into the lower cover (20). The bottom of the knob (21) is movably connected to the lower cover (20) by a thread and abuts against the top of the limiting floating plate (22).

2. The knob chip test socket for a circuit board testing machine according to claim 1, characterized in that: The floating probe assembly (3) includes a base plate (30), a probe stage (31), and an auxiliary limiting plate (32). The probe stage (31) is detachably disposed at the center of the base plate (30). Several floating guide posts (33) are also disposed around the outer periphery of the probe stage (31) on the base plate (30). The auxiliary limiting plate (32) can be offset in the vertical direction by sliding with the floating guide posts (33). Several first floating springs (34) are also disposed between the base plate (30) and the auxiliary limiting plate (32). The chip slot (4) is disposed on the upper surface of the auxiliary limiting plate (32).

3. A knob chip test socket for a circuit board testing machine according to claim 2, characterized in that: The auxiliary limiting plate (32) is provided with a number of arrayed limiting grooves (35) and positioning holes (36) on the outer periphery of the chip slot (4). The auxiliary limiting plate (32) is also provided with four sets of corner clearance grooves (37) corresponding to the corners of the chip slot (4).

4. A knob chip test socket for a circuit board testing machine according to claim 3, characterized in that: The limiting floating plate (22) includes a first lower pressure plate (220), a second lower pressure plate (221), a chip positioning pressure plate (222), and an auxiliary positioning plate (223) stacked from top to bottom. The upper surface of the first lower pressure plate (220) abuts against the bottom of the knob (21). The auxiliary positioning plate (223) is fixedly disposed on the lower surface of the second lower pressure plate (221). The second lower pressure plate (221) has an opening (224) adapted to the chip positioning pressure plate (222). The lower end face of the first lower pressure plate (220), the opening (224), and the upper end face of the auxiliary positioning plate (223) together form a floating cavity. The chip positioning pressure plate (222) is placed in the floating cavity and slides through the second lower pressure plate (221) and the auxiliary positioning plate (223). A plurality of second floating springs (225) are also disposed between the first lower pressure plate (220) and the second lower pressure plate (221).

5. A knob chip test socket for a circuit board testing machine according to claim 4, characterized in that: The chip positioning plate (222) is composed of an integrally formed connecting block (2220) and a chip pressing block (2221) arranged perpendicularly to each other. A plurality of third floating springs (226) are arranged in an array between the upper surface of the connecting block (2220) and the lower surface of the first lower pressing plate (220), and between the lower surface of the connecting block (2220) and the upper surface of the auxiliary positioning plate (223). The chip pressing block (2221) penetrates the auxiliary positioning plate (223).

6. A knob chip test socket for a circuit board testing machine according to claim 5, characterized in that: The lower surface of the auxiliary positioning plate (223) is also provided with a limiting block (2230) and a positioning rod (2231) that are adapted to the limiting groove (35) and the positioning hole (36), respectively.

7. A knob chip test socket for a circuit board testing machine according to claim 6, characterized in that: The knob (21) consists of a knob cap (23) and a screw (24). The screw (24) is threadedly connected to the lower pressure cover (20). The bottom of the screw (24) abuts against the upper surface of the first lower pressure plate (220). A limit rod (25) is also provided on the upper end face of the lower pressure cover (20). An arc-shaped opening and closing groove (26) adapted to the limit rod (25) is provided on the lower end face of the knob cap (23).

8. A knob chip test socket for a circuit board testing machine according to claim 7, characterized in that: The lower pressure cover (20) is rotatably connected to the fixed base (1) via a rotating shaft (27) and a torsion spring (28). A locking buckle (29) is also provided on the other side of the lower pressure cover (20) corresponding to the rotating shaft (27), and is detachably connected to the fixed base (1) via the locking buckle (29).