A new power supply test fixture

Abstract

The utility model provides a novel power test fixture which is simple in structure, low in manufacturing and maintenance cost and convenient to operate. The utility model discloses a current voltage tester, base plate, test table who sets on one side of base plate, pull rod subassembly who sets on base plate with test table same side and guide component and test component who set on the other side of base plate, the guide component includes the spacer plate and is connected in the spacer plate between the guide rod, the test component includes test board and telescopic probe module who installs on test board, the four corners of test board slide fit on the guide rod, the output of pull rod subassembly with test board fixed connection makes test board along guide rod sliding, the position of telescopic probe module with test table corresponds. The utility model relates to power product test fixture technical field.

Description

Technical Field

[0001] This utility model relates to the field of power supply product testing fixture technology, and in particular to a novel power supply testing fixture. Background Technology

[0002] Existing power supply test fixtures generally suffer from problems in practical applications, such as complex structure, large size, high manufacturing and maintenance costs, insufficient positioning accuracy, and inconvenient operation. Traditional fixtures often require multiple test stands and corresponding probe modules, resulting in a large number of parts, cumbersome installation and debugging processes, and a large space occupation, making them unsuitable for flexible use in laboratory environments or small-batch production. At the same time, due to the high design and manufacturing precision requirements, their manufacturing costs and subsequent maintenance expenses are relatively high, making them uneconomical and cost-effective for R&D and testing scenarios that only require testing of single products.

[0003] Over long-term use, dimensional tolerances between the various components of the fixture gradually accumulate, easily causing deviations in the contact position between the test board and the product under test. This affects the alignment stability and contact reliability of the probe and port, leading to fluctuations in test results and reducing detection accuracy and consistency. Furthermore, existing fixtures also have shortcomings in operation. Operators often need to repeatedly adjust the contact position between the product and the probe, making the loading and unloading process complex, increasing operational intensity and difficulty, and making it difficult to maintain high work efficiency in single-test scenarios.

[0004] Therefore, existing power supply test fixtures have significant shortcomings in applications such as R&D, small-batch production, and spot checks. There is an urgent need to propose a new solution that is simple in structure, low in manufacturing and maintenance costs, and easy to operate, in order to improve the reliability and practicality of testing. Utility Model Content

[0005] To address the shortcomings of the existing technology, this utility model provides a novel power supply testing fixture, which aims to solve the problems of numerous test device components, cumbersome installation and debugging process, large space occupation, and high manufacturing and maintenance costs in the existing technology. At the same time, it overcomes the problem of unreliable test results caused by inaccurate alignment and unstable contact between the probe and the product under test due to accumulated dimensional tolerances.

[0006] To achieve the above objectives, the technical solution adopted by this utility model is as follows: a novel power supply testing fixture, comprising a current and voltage tester, a substrate, a test stage disposed on one side of the substrate, a pull rod assembly disposed on the substrate and on the same side as the test stage, and a guide assembly and a testing assembly disposed on the other side of the substrate. The guide assembly includes a limiting plate and a guide rod connected between the limiting plates. The testing assembly includes a test plate and a telescopic probe module mounted on the test plate. The four corners of the test plate are slidably fitted onto the guide rod. The output end of the pull rod assembly is fixedly connected to the test plate, allowing the test plate to slide along the guide rod. The position of the telescopic probe module corresponds to the test stage.

[0007] Based on the above, this utility model simplifies the overall structure, reduces the number of parts, and decreases the device size while ensuring testing stability. The test plate, guided by the guide rod, maintains stable linear movement, avoiding poor contact caused by positional misalignment and improving the accuracy and reliability of probe alignment with the test product's port. The pull rod assembly, fixedly connected to the test plate, provides a simple driving method, allowing operators to achieve contact between the test product and the probe with less force, reducing operational difficulty. The corresponding arrangement of the telescopic probe module and the test plate ensures the consistency and accuracy of electrical parameter acquisition, further enhancing the stability of test results. The overall device has a compact structure and intuitive operation, reducing manufacturing and maintenance costs while improving ease of use and testing reliability. It is particularly suitable for R&D, small-batch production, and sampling inspection applications requiring high precision.

[0008] Furthermore, the pull rod assembly includes a support base fixed on the base plate, a handle, a pair of connecting pieces, a guide sleeve, and a connecting rod. One end of the support base is hinged to the bottom of the handle, and the other end is fixedly provided with a guide sleeve. The guide sleeve is a hollow sleeve. The connecting rod passes through and slides in cooperation with the inner hole of the guide sleeve. The two connecting pieces are respectively arranged parallel to each other on the left and right sides of the connecting rod. One end of each connecting piece is hinged to the middle of the handle, and the other end is hinged to the connecting rod. The other end of the connecting rod that is hinged to the connecting piece is fixedly connected to the test plate. When the handle is pulled relative to the support base, the two connecting pieces drive the connecting rod to slide horizontally in the guide sleeve, thereby driving the test plate to slide along the axial direction of the guide rod.

[0009] Based on the above structural design, by setting a test stage on one side of the substrate and a corresponding guide component and test component on the other side, the test board can achieve smooth linear sliding under the constraint of the guide rod, ensuring precise alignment between the telescopic probe module and the test stage. The pull rod component is fixedly connected to the test board. When the operator drives it with the handle, the test board can move smoothly under the guidance of the guide component, so that the probe can quickly and reliably contact the product under test. This design not only simplifies the overall structure, reduces the number of parts and the difficulty of installation and debugging, but also effectively avoids the alignment deviation caused by the accumulation of tolerances in traditional fixtures, improving the accuracy and stability of the test. At the same time, the operation process is intuitive and convenient, reducing the time and effort required for manual adjustment, further improving the reliability and work efficiency. Therefore, this utility model can play a good application value in research and development, small-batch production and sampling inspection.

[0010] Furthermore, the test bench includes a power supply carrier board, two positioning blocks located on the upper part of the power supply carrier board near the front edge, and two limiting blocks located on the upper part of the power supply carrier board near the rear edge.

[0011] Furthermore, the power supply carrier board is provided with a groove located between two positioning blocks, and the upper surface of the positioning blocks is provided with an inclined groove, which is arranged towards the center of the power supply carrier board.

[0012] Based on the above, the test bench, by setting a positioning block at the front edge of the power supply carrier board and a limiting block at the rear edge, can effectively limit the front and rear positions of the product during placement, ensuring the stability and repeatability of the product under test during the testing process. At the same time, the grooves on the power supply carrier board and the inclined grooves on the positioning blocks work together to provide guidance and correction functions for the product, enabling the product to smoothly enter the predetermined position and achieve precise positioning during placement. This not only improves the alignment accuracy of the testing process but also avoids contact deviations caused by inaccurate manual placement, thereby enhancing the overall reliability of the test and the convenience of operation.

[0013] Furthermore, the guide assembly includes two sets of limiting plates, which are respectively fixed on the base plate and located at both ends of the sliding path of the test assembly. Two guide rods are installed in parallel between each set of limiting plates. The two sets of guide rods are parallel to each other and extend along the sliding direction of the test assembly. The length of the guide rods is a fixed length to maintain the straightness and guiding accuracy of the test assembly during the sliding process and to avoid the test plate posture deviation caused by the change of the guide rod length.

[0014] Furthermore, the telescopic probe module includes a front connecting part, a spring, and a rear connecting part. The front connecting part is provided with a first limiting part and a second limiting part. When there is a gap between the first limiting part and the second limiting part, the spring is in a compressed state. When the first limiting part and the second limiting part are in contact with each other, the spring is in a stretched state and restricts the displacement of the front connecting part.

[0015] Furthermore, the rear connection portion of the telescopic probe module is connected to the detection port of the current and voltage tester via a wire.

[0016] Based on the above, the telescopic probe module, with the cooperation of the front connecting part, the spring, and the rear connecting part, can effectively buffer the movement of the probe during the test. This ensures that the probe maintains a stable fit when in contact with the port of the product under test, while also preventing port damage due to excessive pressure. This guarantees the reliability of the contact and the durability of the product. At the same time, the rear connecting part is connected to the current and voltage tester through wires, enabling the probe to accurately transmit electrical signals to the tester while in contact with the product port. This ensures the real-time performance and accuracy of the test data, further improving the stability and reliability of the entire test fixture. Attached Figure Description

[0017] Figure 1 This is a schematic diagram of the structure of this utility model; Figure 2 This is a top view of the present invention; Figure 3 This is a schematic diagram of the structure of the pull rod module of this utility model; Figure 4 This is a cross-sectional view of the telescopic probe of this utility model. Detailed Implementation

[0018] like Figures 1-4 As shown, a novel power supply testing fixture includes a current and voltage tester 1, a base plate 2, a test stage 3 disposed on one side of the base plate 2, a pull rod assembly 4 disposed on the base plate 2 and on the same side as the test stage 3, and a guide assembly 5 and a test assembly 6 disposed on the other side of the base plate 2. The guide assembly 5 includes a limiting plate 51 and a guide rod 52 connected between the limiting plates 51. The test assembly 6 includes a test plate 61 and a telescopic probe module 62 mounted on the test plate 61. The four corners of the test plate 61 are slidably fitted onto the guide rod 52. The output end of the pull rod assembly 4 is fixedly connected to the test plate 61, allowing the test plate 61 to slide along the guide rod 52. The position of the telescopic probe module 62 corresponds to that of the test stage 3.

[0019] The pull rod assembly 4 includes a support base 41 fixed on the base plate 2, a handle 42, a pair of connecting pieces 43, a guide sleeve 44, and a connecting rod 45. One end of the support base 41 is hinged to the bottom of the handle 42, and the other end is fixedly provided with a guide sleeve 44. The guide sleeve 44 is a hollow sleeve. The connecting rod 45 passes through and slides in cooperation with the inner hole of the guide sleeve 44. The two connecting pieces 43 are respectively arranged parallel to each other on the left and right sides of the connecting rod 45. One end of the connecting piece 43 is hinged to the middle of the handle 42, and the other end is hinged to the connecting rod 45. The other end of the connecting rod 45, which is hinged to the connecting piece, is fixedly connected to the test plate 61. When the handle 42 is pulled relative to the support base 41, the two connecting pieces 43 drive the connecting rod 45 to slide horizontally in the guide sleeve 44, thereby driving the test plate 61 to slide along the axial direction of the guide rod 52.

[0020] The test bench 3 includes a power supply carrier board 31, two positioning blocks 32 located on the upper part of the power supply carrier board 31 near the front edge, and two limiting blocks 33 located on the upper part of the power supply carrier board 31 near the rear edge.

[0021] The power carrier board 31 is provided with a groove 34 located between two positioning blocks 32, and the upper surface of the positioning block 32 is provided with an inclined groove 35, which is arranged towards the center of the power carrier board 31.

[0022] The guide assembly 5 includes two sets of limiting plates 51. The two sets of limiting plates 51 are respectively fixed on the base plate 2 and located at both ends of the sliding path of the test assembly 6. Two guide rods 52 are installed in parallel between each set of limiting plates 51. The two sets of guide rods 52 are parallel to each other and extend along the sliding direction of the test assembly 6. The length of the guide rods 52 is a fixed length to maintain the straightness and guiding accuracy of the test assembly 6 during the sliding process and avoid the attitude deviation of the test plate 61 caused by the change of the guide rod length.

[0023] The telescopic probe module 62 includes a front connecting part 621, a spring 622, and a rear connecting part 623. The front connecting part 621 is provided with a first limiting part 624 and a second limiting part 625. When there is a gap between the first limiting part 624 and the second limiting part 625, the spring 622 is in a compressed state. When the first limiting part 624 and the second limiting part 625 are in contact with each other, the spring 622 is in a stretched state and restricts the displacement of the front connecting part 621.

[0024] The rear connection part 623 of the telescopic probe module 62 is connected to the detection port of the current and voltage tester 1 via a wire 7.

[0025] In summary, the specific implementation of this utility model is as follows: In actual use, the operator first manually adjusts the number and position of the telescopic probes in the telescopic probe module 62 according to the number and distribution of the ports of the power supply product under test, so that they correspond one-to-one with the test ports of the product under test. Then, the power supply product under test is placed on the power carrier plate 31 of the test bench 3. Under the action of the two positioning blocks 32 and the two limiting blocks 33, the front and rear positions of the product under test are effectively limited, and automatic correction and precise positioning are achieved under the guidance of the groove 34 and the inclined groove 35, thereby ensuring the accuracy of the contact between the product and the probe.

[0026] After adjustment, the operator holds the handle 42 on the pull rod assembly 4 and pulls it outward, causing the handle 42 to swing relative to the support base 41. Through the linkage between the connecting piece 43 and the connecting rod 45, the connecting rod 45 slides horizontally in the guide sleeve 44, and drives the test plate 61 fixedly connected to it to move smoothly along the axial direction of the guide rod 52. As the test plate 61 moves, the telescopic probe module 62 installed on it gradually contacts the port of the power supply product.

[0027] When the front connecting part 621 of the telescopic probe module 62 contacts the port of the product under test, the spring 622 is compressed or stretched under the force. The change in the gap between the first limiting part 624 and the second limiting part 625 effectively controls the probe stroke, so that the probe has a buffer and rebound function while ensuring reliable contact, avoiding damage to the port of the product under test. After the probe makes stable contact with the port, the rear connecting part 623 of the telescopic probe module 62 is connected to the detection port of the current and voltage tester 1 through the wire 7. The current and voltage tester 1 collects and analyzes the electrical performance parameters of the product under test in real time to obtain the test results. After the test is completed, the operator releases the handle 42, and the test plate 61 returns to the initial position under the constraint of the guide component 5. The probe is removed from the port of the product under test, and the entire test process ends.

[0028] Through the above workflow, this invention not only achieves rapid positioning of the product under test, reliable contact between the probe and the port, and stable testing of electrical performance, but also allows for flexible adjustment of the number and distribution of telescopic probes according to the testing requirements of different products, thereby ensuring the universality and adaptability of the test and improving the efficiency and reliability of the test.

[0029] The above description is only the optimal solution embodiment of this utility model and is not intended to limit this utility model. Various modifications or substitutions made by those skilled in the art to this utility model without departing from the essence and protection scope of this utility model should also be within the protection scope of this utility model.

Claims

1. A novel power supply testing fixture, characterized in that: The test assembly includes a current and voltage tester (1), a substrate (2), a test stage (3) disposed on one side of the substrate (2), a pull rod assembly (4) disposed on the substrate (2) and on the same side as the test stage (3), and a guide assembly (5) and a test assembly (6) disposed on the other side of the substrate (2). The guide assembly (5) includes a limiting plate (51) and a guide rod (52) connected between the limiting plates (51). The test assembly (6) includes a test plate (61) and a telescopic probe module (62) mounted on the test plate (61). The four corners of the test plate (61) slide against the guide rod (52). The output end of the pull rod assembly (4) is fixedly connected to the test plate (61) so that the test plate (61) slides along the guide rod (52). The position of the telescopic probe module (62) corresponds to the test stage (3).

2. The novel power supply testing fixture according to claim 1, characterized in that: The pull rod assembly (4) includes a support base (41) fixed on the base plate (2), a handle (42), a pair of connecting pieces (43), a guide sleeve (44), and a connecting rod (45). One end of the support base (41) is hinged to the bottom of the handle (42), and the other end is fixedly provided with a guide sleeve (44). The guide sleeve (44) is a hollow sleeve. The connecting rod (45) passes through and slides in cooperation with the inner hole of the guide sleeve (44). The two connecting pieces (43) are respectively arranged parallel to the connecting rod. On the left and right sides of (45), one end of the connecting piece (43) is hinged to the middle of the handle (42), and the other end is hinged to the connecting rod (45). The other end of the connecting rod (45) hinged to the connecting piece is fixedly connected to the test plate (61). When the handle (42) is pulled relative to the support base (41), the two connecting pieces (43) drive the connecting rod (45) to slide horizontally in the guide sleeve (44), thereby driving the test plate (61) to slide along the axial direction of the guide rod (52).

3. The novel power supply testing fixture according to claim 1, characterized in that: The test bench (3) includes a power supply board (31), two positioning blocks (32) located on the upper part of the power supply board (31) near the front edge, and two limiting blocks (33) located on the upper part of the power supply board (31) near the rear edge.

4. The novel power supply testing fixture according to claim 3, characterized in that: The power carrier board (31) is provided with a groove (34) located between two positioning blocks (32), and the upper surface of the positioning block (32) is provided with a slanted groove (35), which is set towards the center of the power carrier board (31).

5. A novel power supply testing fixture according to claim 1, characterized in that: The guide assembly (5) includes two sets of limiting plates (51). The two sets of limiting plates (51) are fixed on the base plate (2) and located at both ends of the sliding path of the test assembly (6). Two guide rods (52) are installed in parallel between each set of limiting plates (51). The two sets of guide rods (52) are parallel to each other and extend along the sliding direction of the test assembly (6). The length of the guide rods (52) is a fixed length to maintain the straightness and guiding accuracy of the test assembly (6) during the sliding process and avoid the deviation of the test plate (61) due to the change of the length of the guide rod.

6. A novel power supply testing fixture according to claim 1, characterized in that: The telescopic probe module (62) includes a front connecting part (621), a spring (622) and a rear connecting part (623). The front connecting part (621) is provided with a first limiting part (624) and a second limiting part (625). When there is a gap between the first limiting part (624) and the second limiting part (625), the spring (622) is in a compressed state. When the first limiting part (624) and the second limiting part (625) are in contact with each other, the spring (622) is in a stretched state and restricts the displacement of the front connecting part (621).

7. A novel power supply testing fixture according to claim 6, characterized in that: The rear connection part (623) of the telescopic probe module (62) is connected to the detection port of the current and voltage tester (1) via a wire (7).

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