A test fixture and burn-in apparatus for chips

Abstract

The utility model provides a kind of test fixture and ageing equipment for chip, it is related to chip testing technical field.The bottom plate of test fixture has multiple mounting positions for installing measured chip, spring piece assembly has multiple spring pieces, and each mounting position corresponds at least one spring piece.When the cover plate is in the locking state with the bracket adhering, the spring piece is tightly pressed with the measured chip on the corresponding mounting position.When the cover plate is in the unlocking state with the bracket separating, the spring piece is separated with the measured chip on the corresponding mounting position.The floating assembly is used to connect the cover plate, bracket, spring piece assembly and bottom plate, and the floating assembly is set to float under external force, so that the cover plate is switched between the locking state and the unlocking state.The above technical solution cancels the scheme of frequently disassembling and assembling screw in the prior art to compress the cover plate, and the cover plate is loosened and compressed by the floating of floating assembly, so that the spring piece clamps or loosens the measured chip, there is no risk of chip contamination and slip, and the service life of test fixture can be improved.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, and in particular to a test fixture and aging device for chips. Background Technology

[0002] In existing technologies, a herringbone clamp is typically used to hold the chip in place for aging tests. The herringbone clamp consists of multiple stacked plates, one of which has bent spring clips. The plates are connected by screws, and tightening applies pressure to the spring clips, causing them to clamp the chip. After testing, the screws are removed to release the spring clips and allow the chip to be removed from the herringbone clamp. Throughout the chip testing process, the screws need to be repeatedly removed and reinstalled, which can lead to stripped screws, chip breakage, and tedious disassembly. Utility Model Content

[0003] One objective of this invention is to provide a test fixture for chips, which solves the technical problems in the prior art where repeated disassembly and assembly of screws can easily lead to stripping, chipping, and other issues, as well as the cumbersome disassembly process.

[0004] A further objective of this invention is to improve the ease of chip installation and removal.

[0005] Another objective of this invention is to provide an aging device having the aforementioned test fixture.

[0006] Specifically, this utility model provides a test fixture for chips, including a fishbone fixture, the fishbone fixture comprising: The base plate has multiple mounting positions for mounting the chip under test. A spring clip assembly, located above the base plate, has multiple spring clips, with each mounting position corresponding to at least one spring clip; A bracket, located above the spring assembly; A cover plate, located above the bracket, having a locked state that is engaged with the bracket and an unlocked state that is disengaged from the bracket; Multiple floating components are provided to connect the cover plate, the bracket, the spring assembly, and the base plate, and are configured to float under external force, so that the cover plate switches between a locked state and an unlocked state; when the cover plate is in the locked state, the spring abuts against the chip under test at the corresponding mounting position; when the cover plate is in the unlocked state, the spring separates from the chip under test at the corresponding mounting position.

[0007] Optionally, each of the floating components includes: A base, the base being positioned on the base and extending through the spring assembly and the bracket; A connector that penetrates the cover plate and is connected to the base; An elastic element is sleeved on the base and limited between the bracket and the base; when the bracket is subjected to a downward force, the elastic element is compressed, the bracket moves downward, and the cover plate switches from a locked state to an unlocked state.

[0008] Optionally, the bracket has a plurality of first step holes, each first step hole corresponding to one of the floating components and having a first step surface; the base of the floating component passes through the first step hole and has a flange protruding in the circumferential direction, one end of the elastic element of the floating component abuts against the flange and the other end abuts against the first step surface.

[0009] Optionally, the base plate has a plurality of second step holes, each second step hole corresponding to one of the floating components and having a second step surface, the base of the floating component passing through the second step hole, and the flange of the base being limited at the second step surface.

[0010] Optionally, the cover plate has a plurality of third-step holes, each of the third-step holes corresponding to one of the floating components and having a third-step surface, and the connector passes through the third-step hole; The connector includes a limiting portion and a connecting portion. The limiting portion is limited at the third step surface, and the connecting portion passes through the third step hole to connect with the base.

[0011] Optionally, the mounting position is a mounting slot; The mounting slot is provided on the base plate; or The base plate includes a positioning plate, and the mounting groove is disposed on the positioning plate.

[0012] Optionally, the cover plate has at least one through hole arranged vertically, and the test fixture further includes: The disassembly assembly includes a first plate and a second plate. The first plate has a plurality of upwardly protruding first protrusions, and each floating component corresponds to at least one first protrusion. The second plate is located above the cover plate and has at least one second protrusion, and each second protrusion corresponds to at least one through hole. When the second plate is subjected to a downward external force, the second boss pushes the bracket, the spring assembly and the base plate to move downward, causing the cover plate to separate from the bracket.

[0013] Optionally, the bracket has at least one upwardly protruding third boss, each of the third bosses passing through one of the through holes and corresponding to one of the second bosses.

[0014] Optionally, the second plate is provided with at least one first limiting post, which passes through the cover plate, the bracket, the spring assembly and the base plate to limit the second plate and the fishbone clamp.

[0015] In particular, this invention also provides an aging device for chips, including the aforementioned test fixture.

[0016] The test fixture of this invention includes a base plate, a spring clip assembly, a bracket, and a cover plate stacked from bottom to top. The base plate has multiple mounting positions for mounting the chip under test (DUT), and the spring clip assembly has multiple spring clips, with each mounting position corresponding to at least one spring clip. When the cover plate is in a locked state, fitting against the bracket, the spring clips abut against the DUT at the corresponding mounting position. When the cover plate is in an unlocked state, separated from the bracket, the spring clips separate from the DUT at the corresponding mounting position. A floating assembly connects the cover plate, bracket, spring clip assembly, and base plate. The floating assembly is configured to float under external force, allowing the cover plate to switch between a locked and unlocked state. This technical solution eliminates the need for frequent screw removal and tightening of the cover plate in existing technologies. By using the floating assembly to loosen and tighten the cover plate, the spring clips can clamp or loosen the DUT, eliminating the risk of debris contamination and stripping, thus improving the service life of the test fixture.

[0017] Furthermore, in this invention, the cover plate has at least one through hole arranged vertically, and the test fixture also includes a disassembly assembly. The first plate of the disassembly assembly has multiple upwardly protruding first bosses, with each floating component corresponding to at least one first boss. The second plate of the disassembly assembly is located above the cover plate and has at least one second boss, with each second boss corresponding to at least one through hole. When the second plate is subjected to a downward external force, the second bosses push the bracket, spring assembly, and base plate downwards, causing the cover plate to separate from the bracket. The above technical solution utilizes the downward pressure of the second plate to achieve the separation of the cover plate from the bracket. After the chip under test is removed and the next batch of chips to be tested is placed in, releasing the second plate completes the clamping of the chip under test. The operation is simple and can improve the convenience of chip installation and removal.

[0018] The above and other objects, advantages and features of this utility model will become more apparent to those skilled in the art from the following detailed description of specific embodiments of this utility model in conjunction with the accompanying drawings. Attached Figure Description

[0019] The following sections will describe some specific embodiments of the present invention in a detailed manner by way of example and not limitation, with reference to the accompanying drawings. The same reference numerals in the drawings denote the same or similar parts or components. Those skilled in the art should understand that these drawings are not necessarily drawn to scale. In the drawings: Figure 1 This is a schematic structural diagram of a test fixture according to an embodiment of the present utility model; Figure 2 This is a schematic structural diagram of a fishbone clamp according to an embodiment of the present utility model; Figure 3 This is a schematic diagram showing the spring clip and the chip under test being pressed together according to one embodiment of the present invention; Figure 4 This is a schematic structural diagram of a positioning plate according to an embodiment of the present utility model; Figure 5 This is a schematic cross-sectional view of a test fixture according to an embodiment of the present invention; Figure 6 yes Figure 5 A schematic enlarged view of part A in the middle; Figure 7 This is a schematic structural diagram of a cover plate according to an embodiment of the present utility model; Figure 8 This is a schematic structural diagram of a floating component according to an embodiment of the present invention; Figure 9 This is a schematic structural diagram of a disassembly and assembly component according to an embodiment of the present utility model.

[0020] Figure label: 100-Test fixture, 200-Chip under test, 10-Cover plate, 20-Bracket, 30-Base plate, 40-Spring assembly, 50-Floating assembly, 60-Disassembly assembly, 11-Through hole, 12-Third step hole, 13-Limiting hole, 21-Third boss, 22-First step hole, 31-Mounting position, 32-Second step hole, 33-Positioning plate, 41-Spring, 51-Connector, 511-Limiting part, 512-Connecting part, 52-Base, 521-Flange, 53-Elastic element, 61-First plate, 62-Second plate, 621-Second boss, 622-First limiting post, 611-Second limiting post, 612-First boss. Detailed Implementation

[0021] The embodiments of this utility model are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain this utility model, and should not be construed as limiting this utility model.

[0022] In the description of this utility model, it should be understood that the terms "upper", "lower", "left", "right", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.

[0023] The terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature, that is, include one or more of that feature. In the description of this utility model, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified. When a feature "includes or contains" one or more of the features it encompasses, unless otherwise specifically described, this indicates that other features are not excluded and may be further included.

[0024] Unless otherwise expressly specified and limited, the terms "connection," "installation," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art should be able to understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0025] Unless otherwise specified, all terms (including technical and scientific terms) used in the description of this embodiment have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains.

[0026] Figure 1 This is a schematic structural diagram of a test fixture 100 according to an embodiment of the present invention. Figure 2 This is a schematic structural diagram of a fishbone clamp according to an embodiment of the present invention. Figure 3 This is a schematic diagram showing the spring 41 and the chip 200 under test being pressed together according to one embodiment of the present invention. Figure 4 This is a schematic structural diagram of the positioning plate 33 according to an embodiment of the present invention. Figure 5 This is a schematic cross-sectional view of a test fixture 100 according to an embodiment of the present invention. Figure 6 yes Figure 5 A schematic enlarged view of part A in the middle. Figure 7This is a schematic structural diagram of the cover plate 10 according to an embodiment of the present invention. Figure 8 This is a schematic structural diagram of a floating component 50 according to an embodiment of the present invention. Figure 9 This is a schematic structural diagram of the disassembly and assembly component 60 according to an embodiment of the present utility model.

[0027] like Figures 1 to 9 As shown, in one specific embodiment, the test fixture 100 for the chip includes a fishbone fixture, which includes a base plate 30, a spring assembly 40, a support 20, a cover plate 10, and multiple floating components 50. The base plate 30 has multiple mounting positions 31 for mounting the chip under test 200. The spring assembly 40 is located above the base plate 30 and has multiple springs 41, with each mounting position 31 corresponding to at least one spring 41. The support 20 is located above the spring assembly 40. The cover plate 10 is located above the support 20 and has a locked state that is engaged with the support 20 and an unlocked state that is disengaged from the support 20. The multiple floating components 50 are used to connect the cover plate 10, the support 20, the spring assembly 40, and the base plate 30; the floating components 50 are configured to float under external force, causing the cover plate 10 to switch between the locked and unlocked states. When the cover plate 10 is in the locked state, the springs 41 abut against the chip under test 200 on the corresponding mounting position 31. When the cover plate 10 is in the unlocked state, the spring 41 separates from the chip under test 200 on the corresponding mounting position 31. Here, the chip under test 200 is a COS / COC chip. The mounting position 31 is a mounting slot. In one embodiment, the mounting slot is directly disposed on the base plate 30. In another embodiment, the base plate 30 includes a positioning plate 33, and the mounting slot is disposed on the positioning plate 33. When the cover plate 10 is pressed down, the spring 41 undergoes elastic deformation, thereby pushing the chip under test 200 against the side wall of the mounting slot.

[0028] This embodiment eliminates the need for frequent disassembly and reassembly of screws to tighten the cover plate 10 in the prior art. The cover plate 10 is loosened and tightened by the floating component 50, so that the spring 41 clamps or loosens the chip under test 200. There is no risk of screw debris contamination or screw stripping, which can improve the service life of the test fixture 100.

[0029] In some embodiments, the spring assembly 40 includes a spring plate having a plurality of outwardly extending springs 41, each spring 41 corresponding to a mounting position 31.

[0030] In some embodiments, the plurality of spring contacts 41 are divided into two groups of spring contacts, each group including a plurality of spring contacts 41 extending along the width direction of the spring contact plate, and the plurality of spring contacts 41 are arranged at intervals, with one group of spring contacts arranged on each of the opposite sides of the spring contact plate. That is, a plurality of spring contacts 41 are arranged at intervals along their extension direction on the opposite sides of the spring contact plate, see [reference]. Figure 2 .

[0031] In some embodiments, each floating component 50 includes a base 52, a connector 51, and an elastic element 53. The base 52 is positioned on the support 20 and extends through the spring assembly 40 and the bracket 20. The connector 51 extends through the cover plate 10 and is connected to the base 52. The elastic element 53 is sleeved on the base 52 and positioned between the bracket 20 and the base 52. When the bracket 20 is subjected to a downward force, the elastic element 53 is compressed, and the bracket 20 moves downward, causing the cover plate 10 to switch from a locked state to an unlocked state. Here, the connector 51 can be a bolt, and the base 52 can be a nut. When the bracket 20 is subjected to a downward force, the bracket 20, the spring assembly 40, and the base 52 move downward as a whole. If the overall downward movement is about 1 mm, a gap of about 1 mm is created between the bracket 20 and the cover plate 10, allowing the cover plate 10 to be separated.

[0032] Specifically, first, the connector 51 is tightened to the base 52, ensuring a seamless connection between the cover plate 10 and the bracket 20. At this point, the spring 41 on the spring plate 41 is in a deformed and extended state. Then, a downward force is applied to the bracket 20, pushing it downwards to separate it from the cover plate 10, thereby releasing the spring 41. This causes the spring 41 to switch from its deformed and extended state to its initial upward-arched bent state. At this point, the chip under test 200 is placed on the mounting position 31. Then, the force applied to the bracket 20 is removed, and the bracket 20 and cover plate 10 are aligned, allowing the spring 41 to return to its deformed and extended state. The end of the spring 41 abuts against one corner of the chip under test 200. Then, under the push of the spring 41, the chip under test 200 can move within the mounting position 31 until it abuts against the side wall of the mounting position 31, restricting its movement and achieving positioning of the chip under test 200. When the chip under test 200 needs to be replaced after testing, a downward force is continued to be applied to the bracket 20 to release the spring 41 and unlock the positioning of the chip under test 200. This embodiment does not require disassembly of the floating component 50; only a force needs to be applied to the floating component 50 to unlock the chip under test 200, making the operation relatively convenient.

[0033] In some embodiments, the bracket 20 has a plurality of first stepped holes 22, each first stepped hole 22 corresponding to a floating component 50 and having a first stepped surface. The base 52 of the floating component 50 passes through the first stepped hole 22 and has a flange 521 protruding circumferentially. One end of the elastic element 53 of the floating component 50 abuts against the flange 521, and the other end abuts against the first stepped surface. It can be understood that the elastic element 53 passes through the spring assembly 40 and is confined between the bracket 20 and the base 52. Here, the upper diameter of the first stepped hole 22 is smaller than the lower diameter, and the top end of the elastic element 53 is confined at the lower portion. See [reference needed]. Figure 5 .

[0034] In some embodiments, the base plate 30 has a plurality of second stepped holes 32, each second stepped hole 32 corresponding to a floating component 50 and having a second stepped surface. The base 52 of the floating component 50 passes through the second stepped hole 32, and the flange 521 of the base 52 is limited at the second stepped surface. Here, the upper diameter of the second stepped hole 32 is larger than the lower diameter, the flange 521 is limited at the upper part, and the base 52 passes through the second stepped hole 32 from top to bottom. See [reference needed]. Figure 5 .

[0035] In some embodiments, the cover plate 10 has a plurality of third-step holes 12, each third-step hole 12 corresponding to a floating component 50 and having a third-step surface, and the connector 51 passes through the third-step hole 12. See [reference needed] Figure 5 and Figure 6 Here, the upper diameter of the third step hole 12 is larger than the lower diameter, and the connector 51 is inserted into the third step hole 12 from top to bottom.

[0036] In some embodiments, the connector 51 of the floating assembly 50 includes a limiting portion 511 and a connecting portion 512. The limiting portion 511 is limited at the third stepped surface, and the connecting portion 512 passes through the third stepped hole 12 to connect with the base 52. Here, the limiting portion 511 is circular and has a groove for operation. By using a tool to engage with the groove, the connector 51 can be rotated, thereby connecting the connector 51 to the base 52. Specifically, the limiting component is located at the upper part of the third stepped hole 12 and does not protrude from the surface of the cover plate 10 to avoid affecting the function of the disassembly and assembly assembly 60. See [link to relevant documentation]. Figure 2 and Figure 5 .

[0037] In some embodiments, see Figure 2 Multiple floating components 50 are arranged at intervals along the length of the cover plate 10, which can achieve the stability of the connection between the cover plate 10, the bracket 20, the spring assembly 40 and the base plate 30. Each floating component 50 corresponds to a first step hole 22, a second step hole 32 and a third step hole 12.

[0038] In some embodiments, the cover plate 10 has at least one through hole 11 arranged vertically. The test fixture 100 further includes a disassembly assembly 60, which includes a first plate 61 and a second plate 62. The first plate 61 has a plurality of upwardly protruding first bosses 612, and each floating component 50 corresponds to at least one first boss 612. The second plate 62 is located above the cover plate 10 and has at least one second boss 621, each second boss 621 corresponding to at least one through hole 11. When the second plate 62 is subjected to a downward external force, the second bosses 621 push the bracket 20, the spring assembly 40, and the base plate 30 downward, causing the cover plate 10 to separate from the bracket 20. It can be understood that, due to the presence of the first bosses 612, when the fishbone clamp is placed on the first plate 61, the first bosses 612 are arranged in a one-to-one correspondence with the floating components 50, and there will be a gap between the base plate 30 and the first plate 61. Although the second plate 62 is located above the cover plate 10, the second plate 62 does not apply external pressure to the cover plate 10. Instead, it applies a downward force to the support 20 below the cover plate 10 through the through hole 11. At this time, the elastic element 53 is compressed, and the support 20, the spring assembly 40, and the base plate 30 move downward as a whole, causing the cover plate 10 to separate from the support 20.

[0039] In this embodiment, the cover plate 10 and the bracket 20 can be separated by pressing down the second plate 62. After the chip under test 200 is removed and the next batch of chips to be tested is placed in, the second plate 62 can be released to complete the pressing of the chip under test. The operation is simple and can improve the convenience of chip installation and removal.

[0040] In some embodiments, since the first boss 612 needs to be aligned with the third stepped hole 12, the second boss 621 needs to be aligned with the through hole 11, and the third stepped hole 12 and the through hole 11 need to be staggered on the cover plate 10, the first boss 612 and the second boss 621 are staggered.

[0041] In a preferred embodiment, the bracket 20 has at least one upwardly projecting third boss 21, each third boss 21 passing through a through hole 11 and corresponding to a second boss 621. Here, when the second plate 62 pushes the bracket 20, the second boss 621 aligns with the third boss 21 and applies a downward force to the third boss 21, thereby pushing the bracket 20.

[0042] In some embodiments, the second plate 62 is provided with at least one first limiting post 622, which passes through the cover plate 10, the bracket 20, the spring assembly 40, and the base plate 30 to limit the second plate 62 and the fishbone clamp. See [link to documentation]. Figure 5Here, the cover plate 10, the bracket 20, the spring assembly 40 and the base plate 30 are all provided with aligned through holes. When the second plate 62 is above the cover plate 10, the first limiting post 622 passes through the through holes from top to bottom to realize the positioning of the second plate 62 and the fishbone clamp, and then a downward force is applied to the second plate 62.

[0043] In some embodiments, the number of second protrusions 621 is three, and the number of first limiting posts is two. See [link to previous document]. Figure 8 Three second protrusions 621 are spaced apart in the middle of the second plate 62, and two first limiting posts 622 are located on the left and right sides of the three second protrusions 621 respectively.

[0044] In some embodiments, the number of first bosses 612 is four, and the four first bosses 612 are arranged at intervals in the middle position of the first plate 61 and are staggered from the three second bosses 621.

[0045] In some embodiments, the first plate 61 is provided with at least one upwardly protruding second limiting post 611, and the fishbone clamp is provided with at least one limiting hole 13 on its side. When the fishbone clamp is placed on the first plate 61, the fishbone clamp is positioned relative to the first plate 61 by the cooperation of the second limiting post 611 and the limiting hole 13. Specifically, there are two second limiting posts 611, which are located on the left and right sides of the four first protrusions 612, respectively. A limiting hole 13 is provided on each of the two opposite sides of the fishbone clamp, and each limiting hole 13 corresponds to one second limiting post 611. In other embodiments, the number of second limiting posts 611 and limiting holes 13 can be determined according to specific design requirements.

[0046] In some embodiments, the present invention also provides an aging apparatus for chips, including the test fixture 100 described above. Details regarding the test fixture 100 are omitted here.

[0047] Therefore, those skilled in the art should recognize that although many exemplary embodiments of the present invention have been shown and described in detail herein, many other variations or modifications conforming to the principles of the present invention can be directly determined or derived from the disclosure of the present invention without departing from the spirit and scope of the present invention. Therefore, the scope of the present invention should be understood and recognized as covering all such other variations or modifications.

Claims

1. A test fixture for chips, characterized in that, Includes a fishbone clamp, the fishbone clamp comprising: A base plate having multiple mounting positions for mounting the chip under test; A spring clip assembly, located above the base plate, has multiple spring clips, with each mounting position corresponding to at least one spring clip; A bracket, located above the spring assembly; A cover plate, located above the bracket, having a locked state that is engaged with the bracket and an unlocked state that is disengaged from the bracket; Multiple floating components are provided to connect the cover plate, the bracket, the spring assembly, and the base plate, and are configured to float under external force, so that the cover plate switches between a locked state and an unlocked state; when the cover plate is in the locked state, the spring abuts against the chip under test at the corresponding mounting position; when the cover plate is in the unlocked state, the spring separates from the chip under test at the corresponding mounting position.

2. The test fixture according to claim 1, characterized in that, Each of the floating components includes: A base, the base being positioned on the base and extending through the spring assembly and the bracket; A connector that penetrates the cover plate and is connected to the base; An elastic element is sleeved on the base and limited between the bracket and the base; when the bracket is subjected to a downward force, the elastic element is compressed, the bracket moves downward, and the cover plate switches from a locked state to an unlocked state.

3. The test fixture according to claim 2, characterized in that, The bracket has a plurality of first step holes, each first step hole corresponding to a floating component and having a first step surface; the base of the floating component passes through the first step hole and has a flange protruding in the circumferential direction, one end of the elastic element of the floating component abuts against the flange and the other end abuts against the first step surface.

4. The test fixture according to claim 3, characterized in that, The base plate has a plurality of second step holes, each second step hole corresponding to one of the floating components and having a second step surface. The base of the floating component passes through the second step hole, and the flange of the base is limited at the second step surface.

5. The test fixture according to claim 4, characterized in that, The cover plate has a plurality of third-step holes, each of the third-step holes corresponding to one of the floating components and having a third-step surface, and the connector passes through the third-step hole; The connector of the floating component includes a limiting part and a connecting part. The limiting part is limited at the third step surface, and the connecting part passes through the third step hole to connect with the base.

6. The test fixture according to any one of claims 1-5, characterized in that, The mounting position is a mounting slot; The mounting slot is provided on the base plate; or The base plate includes a positioning plate, and the mounting groove is disposed on the positioning plate.

7. The test fixture according to any one of claims 1-5, characterized in that, The cover plate has at least one through hole arranged vertically, and the test fixture further includes: The disassembly assembly includes a first plate and a second plate. The first plate has a plurality of upwardly protruding first protrusions, and each floating component corresponds to at least one first protrusion. The second plate is located above the cover plate and has at least one second protrusion, and each second protrusion corresponds to at least one through hole. When the second plate is subjected to a downward external force, the second boss pushes the bracket, the spring assembly and the base plate to move downward, causing the cover plate to separate from the bracket.

8. The test fixture according to claim 7, characterized in that, The bracket has at least one upwardly protruding third boss, each of the third bosses passing through a through hole and corresponding to a second boss.

9. The test fixture according to claim 8, characterized in that, The second plate is provided with at least one first limiting post, which passes through the cover plate, the bracket, the spring assembly and the base plate to limit the second plate and the fishbone clamp.

10. An aging device for chips, characterized in that, Includes the test fixture as described in any one of claims 1-9.

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