High temperature reverse bias tester

Abstract

The utility model discloses a high temperature reverse bias test machine, including test machine body, be provided with several groups modularization clamping mechanism on test machine body test cavity installation surface, each modularization clamping mechanism includes modularization chuck and chuck base, the modularization chuck includes the seat, the seat upper surface is equipped with several with corresponding pin groove of corresponding measured piece pin number and distribution, each pin groove one side inner wall all is provided with electrically conductive contact, the seat upper surface still is provided with positioning guide structure and limiting mechanism, the seat lower surface is provided with the conversion plug of electric connection with several electrically conductive contact, the chuck base includes the bottom plate, the bottom plate upper surface is provided with the electrically conductive slot of corresponding conversion plug, the electrically conductive slot with test machine body inside detection module electricity is connected, through modularization chuck and chuck base detachable cooperation structure, only replace the adaptation different modularization chuck, realize the adaptation to multiple measured piece.

Description

Technical Field

[0001] This utility model relates to the field of electronic technology, and more specifically, to a high-temperature reverse bias tester. Background Technology

[0002] The fixtures of existing high-temperature reverse bias testers are mostly non-modular structures. A fixture can usually only be used for a single package of test devices. When changing test devices with different pin counts or distributions, the entire fixture needs to be replaced, which is extremely cumbersome and has high testing costs.

[0003] How to invent a high-temperature reverse bias tester to improve these problems has become an urgent issue for those skilled in the art. Utility Model Content

[0004] To overcome the above shortcomings, this utility model provides a high-temperature reverse bias tester, which aims to improve the problems of non-modular fixtures, poor adaptability, and cumbersome operation and high cost when changing different packaged test components in existing testers.

[0005] This utility model is implemented as follows: A high-temperature reverse bias tester includes a tester body. Several sets of modular clamping mechanisms are arranged on the test cavity mounting surface of the tester body. Each modular clamping mechanism includes a modular chuck and a chuck base. The modular chuck includes a placement seat. The upper surface of the placement seat has several pin slots corresponding to the number and distribution of pins on the corresponding test piece. A conductive contact is provided on one inner wall of each pin slot. The upper surface of the placement seat also has a positioning guide structure and a limiting mechanism. The lower surface of the placement seat has a conversion plug electrically connected to the several conductive contacts. The chuck base includes a base plate. The upper surface of the base plate has a conductive slot corresponding to the conversion plug. The conductive slot is electrically connected to the internal detection module of the tester body. The base plate is detachably mounted on the test cavity mounting surface of the tester body.

[0006] In a preferred embodiment of this utility model, the positioning guide structure includes two positioning guide blocks. The two positioning guide blocks are integrally disposed at both ends of the upper surface of the placement base and are symmetrically distributed. The distance between the two positioning guide blocks is consistent with the length of the corresponding test piece. The opposite side surface of the two positioning guide blocks consists of a guide slope and a limiting plane from the top to the bottom.

[0007] In a preferred embodiment of this utility model, the limiting mechanism includes a clamping frame, which has a grid-shaped structure. One end of the clamping frame is rotatably connected to the top of one of the positioning guide blocks. The other end of the clamping frame has a limiting protrusion on its surface. The top surface of the other positioning guide block has a groove corresponding to the end structure of the clamping frame. The inner walls on both sides of the groove have limiting grooves corresponding to the limiting protrusion. The limiting protrusion is engaged inside the limiting groove.

[0008] In a preferred embodiment of this utility model, an extension plate is integrally provided on the clamping frame, a sliding hole is provided on the surface of the extension plate, a sliding rod is slidably installed in the sliding hole, a mounting plate is fixedly connected to the bottom end of the sliding rod, an insulating pressure block corresponding to the number and position of the pin slots is fixedly installed at the bottom of the mounting plate, a spring is fixedly connected between the bottom surface of the extension plate and the top surface of the mounting plate, the spring is sleeved on the outside of the sliding rod, and a pull rod is also provided at the end of the sliding rod.

[0009] In a preferred embodiment of this utility model, the periphery of the base plate is integrally formed with a plurality of assembly parts, and each assembly part is provided with an assembly hole.

[0010] In a preferred embodiment of this utility model, the number and position distribution of the plurality of pin slots are consistent with the number and position distribution of the corresponding pins of the device under test.

[0011] In a preferred embodiment of this invention, each conductive contact in the pin slot is electrically connected to the adapter plug via a wire, and the conductive slot is electrically connected to the test module of the test machine body via a wire.

[0012] The beneficial effects of this utility model are as follows: The high-temperature reverse bias tester obtained by the above design can be used to adapt to multiple types of test devices by simply replacing the modular chuck with a modular chuck base that is compatible with different pin numbers, distributions and package forms of the test devices. Unlike traditional non-modular fixtures, it does not require a complete replacement of the fixture, which simplifies the operation process when switching between different test devices. The chuck can be replaced quickly without complicated tools, shortening the time spent switching test devices and improving the efficiency of the test operation. At the same time, it does not require the separate design and manufacture of a complete set of fixtures for each test device. Only the corresponding modular chuck needs to be developed, which effectively reduces the manufacturing and maintenance costs of the fixtures and lowers the overall cost of testing multiple types of test devices. Attached Figure Description

[0013] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this utility model and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained from these drawings without creative effort.

[0014] Figure 1 This is a schematic perspective view of the overall structure provided by the embodiment of this utility model; Figure 2 A perspective view illustrating the overall structure of this utility model; Figure 3 A perspective view illustrating the overall structure of this utility model; Figure 4 A three-dimensional schematic view of the overall structure provided for the embodiment of this utility model.

[0015] In the diagram: 1-Modular chuck; 2-Chuck base; 3-Testing machine body; 4-Test piece; 101-Placement seat; 102-Pin slot; 103-Adapter plug; 104-Positioning guide block; 105-Clamping frame; 106-Limiting protrusion; 107-Limiting groove; 108-Extension plate; 109-Sliding rod; 110-Mounting plate; 111-Insulating pressure block; 112-Spring; 113-Pull rod; 201-Base plate; 202-Conductive slot; 203-Assembly hole. Detailed Implementation

[0016] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model.

[0017] Please see Figures 1 to 4This utility model provides a technical solution: a high-temperature reverse bias tester, including a tester body 3. Several sets of modular clamping mechanisms are provided on the test cavity mounting surface of the tester body 3. Each modular clamping mechanism includes a modular chuck 1 and a chuck base 2. The modular chuck 1 includes a placement seat 101. The upper surface of the placement seat 101 is provided with several pin slots 102 corresponding to the number and distribution of pins of the corresponding test piece 4. Each pin slot 102 has a conductive contact on one side of its inner wall. The upper surface of the placement seat 101 is also provided with a positioning guide structure and a limiting mechanism. The lower surface of the placement seat 101 is provided with a conversion plug 103 electrically connected to several conductive contacts. The chuck base 2 includes a base plate 201. The upper surface of the base plate 201 is provided with a conductive slot 202 corresponding to the conversion plug 103. The conductive slot 202 is electrically connected to the internal detection module of the tester body 3. The base plate 201 is detachably mounted on the test cavity mounting surface of the tester body 3.

[0018] The mounting surface of the internal test chamber of the test machine body 3 is equipped with pre-set screw holes or slots, allowing for the detachable installation of several modular clamping mechanisms in an array layout. Each modular clamping mechanism consists of a modular chuck 1 and a chuck base 2, which are mechanically connected and conduct electrical signals simultaneously through the cooperation of a converter plug 103 and a conductive slot 202. The placement base 101 in the modular chuck 1 is made of high-temperature resistant and insulating PEEK material as the core support substrate. The number and position of the pin slots 102 on the upper surface of the placement base 101 are strictly matched to the pins of the test piece 4. For example, when the test piece is an SOP8 package, there are 8 pin slots 102, 4 symmetrically distributed on each side; if it is a TO-220 package, there are 3 pin slots arranged in a straight line. A gold-plated phosphor bronze conductive contact is embedded in the inner wall of one side of each pin slot 102. The positioning guide structure on the upper surface of the placement base 101 is used for quick positioning and alignment of the test piece 4, while the limiting mechanism ensures stable clamping of the test piece in high-temperature environments. The adapter plug 103 on the lower surface of the mounting base 101 uses a gold-plated copper pin array to lead the electrical signal from the conductive contacts to the chuck base 2. The base plate 201 of the chuck base 2 is made of epoxy glass cloth. The conductive slot 202 on its upper surface is electrically connected to the reverse bias module, data acquisition module, and other detection modules inside the test machine body 3 through high-temperature resistant Teflon wires, ensuring stable transmission of the reverse bias and leakage current acquisition signals. The base plate 201 can be detachably installed on the test chamber mounting surface of the test machine body 3 through the mounting holes 203 and fasteners, facilitating the flexible addition, removal, or replacement of the chuck base 2 according to testing needs.

[0019] Please see Figures 2 to 4The positioning guide structure includes two positioning guide blocks 104. The two positioning guide blocks 104 are integrally set at both ends of the upper surface of the placement base 101 and are symmetrically distributed. The distance between the two positioning guide blocks 104 is consistent with the length of the corresponding test piece 4. The opposite side surface of the two positioning guide blocks 104 consists of a guide slope and a limiting plane from the top to the bottom.

[0020] The positioning and guiding structure consists of two positioning guide blocks 104, which are integrally formed with the placement base 101 and symmetrically distributed at both ends of the upper surface of the placement base 101. The distance between the two positioning guide blocks 104 is strictly matched with the length of the corresponding test piece 4. On the opposite side of each positioning guide block 104, from top to bottom, there are a guide ramp and a limiting plane: the inclination angle of the guide ramp is designed to be 30°, which facilitates the operator or automated equipment to quickly slide the test piece 4 between the two positioning guide blocks 104 along the ramp; the limiting plane is in close contact with the side of the test piece 4, restricting the movement of the test piece 4 in the horizontal direction and ensuring that the test piece 4 falls into the preset position corresponding to the pin and pin slot.

[0021] Furthermore, the limiting mechanism includes a clamping frame 105, which has a grid-shaped structure. One end of the clamping frame 105 is rotatably connected to the top of one of the positioning guide blocks 104. The other end of the clamping frame 105 has a limiting protrusion 106. The top surface of the other positioning guide block 104 has a groove corresponding to the end structure of the clamping frame 105. The inner walls on both sides of the groove have limiting grooves 107 corresponding to the limiting protrusion 106. The limiting protrusion 106 is engaged inside the limiting groove 107.

[0022] The clamping frame 105 of the limiting mechanism is made of stainless steel and has an overall grid-like structure, which ensures structural strength while reducing weight and facilitating operator rotation. One end of the clamping frame 105 is rotatably connected to the top of one of the positioning guide blocks 104 via a rotating shaft, and the other end has a hemispherical limiting protrusion 106 integrally formed on its surface. The top surface of the other positioning guide block 104 has a groove that matches the end structure of the clamping frame 105, and the limiting grooves 107 on both sides of the groove are arc-shaped grooves that fit with the limiting protrusion 106. When it is necessary to fix the test piece 4, the operator rotates the clamping frame 105 downward around the rotating shaft until the lower surface of the clamping frame 105 is in contact with the upper surface of the test piece 4. The clamping force is controlled to ensure clamping stability and avoid damage to the test piece packaging. At the same time, the limiting protrusion 106 is engaged in the limiting groove 107 to achieve mechanical locking of the clamping frame 105 and prevent the clamping frame from loosening due to material creep at high temperatures.

[0023] Furthermore, an extension plate 108 is integrally provided on the clamping frame 105. A sliding hole is provided on the surface of the extension plate 108. A sliding rod 109 is slidably installed in the sliding hole. A mounting plate 110 is fixedly connected to the bottom end of the sliding rod 109. An insulating pressure block 111 corresponding to the number and position of the pin slots 102 is fixedly installed at the bottom of the mounting plate 110. A spring 112 is fixedly connected between the bottom surface of the extension plate 108 and the upper surface of the mounting plate 110. The spring 112 is sleeved on the outside of the sliding rod 109. A pull rod 113 is also provided at the end of the sliding rod 109.

[0024] The extension plate 108, integrally formed on the clamping bracket 105, has sliding holes on its surface. A sliding rod 109 can slide up and down within these sliding holes, and its bottom end is fixedly connected to a mounting plate 110 via screws. Insulating blocks 111 are fixedly mounted on the bottom of the mounting plate 110 via connectors. The insulating blocks 111 are made of high-temperature resistant silicone, which is both elastic and heat-resistant, preventing damage to the pins. The number and position of the insulating blocks 111 correspond one-to-one with the pin slots 102; for example, an SOP8 package corresponds to eight insulating blocks, each precisely aligned with one pin. A stainless steel spring 112 is fixedly connected between the bottom surface of the extension plate 108 and the upper surface of the mounting plate 110. The spring 112 is sleeved on the outside of the sliding rod 109, serving as a buffer and providing continuous pressure. A pull rod 113 is provided at the top of the sliding rod 109 for easy hand operation. In use, first pull the lever 113 upwards, which will move the sliding rod 109, the mounting plate 110 and the insulating block 111 upwards, compressing the spring 112. At this time, the insulating block 111 is away from the upper surface of the placement seat 101 to avoid obstructing the rotation and locking of the clamping frame 105. After the clamping frame 105 is clamped and fixed by the limiting protrusion 106 and the limiting groove 107, release the lever 113. The spring 112 releases its elastic force and pushes the mounting plate 110 downwards, so that each insulating block 111 is accurately pressed on the corresponding pin of the test piece 4, and the pin is stably pressed onto the conductive contact of the pin slot 102.

[0025] Furthermore, the base plate 201 has several integrally formed assembly parts on its circumferential surface, and each assembly part is provided with an assembly hole 203.

[0026] The base plate 201 has several integrally formed assembly parts around its perimeter, each assembly part having an assembly hole 203. The test chamber mounting surface of the test machine body 3 is pre-machined with threaded holes corresponding to the positions of the assembly holes 203. During installation, screws are passed through the assembly holes 203 and screwed into the threaded holes of the test machine body 3 to achieve a stable fixation of the chuck base 2; during disassembly, the chuck base 2 can be quickly removed simply by unscrewing the screws.

[0027] Furthermore, the number and position distribution of several pin slots 102 are consistent with the number and position distribution of the corresponding pins of the device under test 4.

[0028] The number of pin slots 102 is strictly designed according to the number of pins of the device under test (DUT) 4. For example, when the DUT is in a TO-220 package, there are 3 pin slots 102 arranged in a straight line; if it is in a QFP16 package, there are 16 pin slots arranged on all four sides, and the positional distribution is completely consistent with the actual pin arrangement of the DUT 4. Taking the DUT 4 in an SOP8 package as an example, its pin pitch is 1.27mm and there are 4 pins on each side. At this time, the pin slots 102 on the mounting base 101 are also 4 on each side, and the slot pitch is also 1.27mm. This ensures that after the DUT 4 is placed in the positioning guide structure, each pin can accurately fall into the corresponding pin slot 102 and reliably contact the conductive contacts in the slot.

[0029] Furthermore, the conductive contacts in each pin slot 102 are electrically connected to the adapter plug 103 via wires, and the conductive slot 202 is electrically connected to the test module of the test machine body 3 via wires.

[0030] The conductive contacts within each pin slot 102 are electrically connected to the adapter plug 103 via high-temperature resistant wires. The wires are soldered to the bottom of the conductive contacts and the pins of the adapter plug 103, and are fixed in the wire groove inside the mounting base 101 with high-temperature resistant insulating glue to prevent wire displacement or short circuits. Similarly, the conductive slot 202 is electrically connected to the test modules of the test machine body 3, such as the reverse bias power supply and data acquisition card, via high-temperature resistant wires. One end of the wire is soldered to the metal contact on the inner wall of the conductive slot 202, and the other end is connected to the interface of the test module via a screw terminal, ensuring reliable electrical connections and facilitating wire removal and installation during later maintenance.

[0031] Working principle: The chuck base 2 is detachably installed on the test chamber mounting surface of the test machine body 3 through the assembly hole 203. The placement seat 101 of the modular chuck 1 guides the test piece 4 to quickly enter the position with the guide slope of the two positioning guide blocks 104, and then initially limits it through the limiting plane; then rotate the grid-shaped clamping frame 105 so that the limiting protrusion 106 at its end engages with the limiting groove 107 of the other positioning guide block 104 to complete the locking. At the same time, the operating lever 113 pulls up the insulating pressure block 111 to avoid interference. After the clamping frame 105 is fixed, the lever 113 is released, and the spring 11 2. Push the mounting plate 110 down so that the insulating pressure block 111 can accurately press the pins of the test piece 4 onto the conductive contacts of the corresponding pin slot 102. Finally, the conductive contacts in the pin slot 102 are connected to the adapter plug 103 via wires. The adapter plug 103 is inserted into the conductive slot 202 of the chuck base 2. The conductive slot 202 is then connected to the internal detection module of the test machine body 3 via wires to realize the application of reverse bias voltage and the acquisition of test signals. By replacing different modular chucks 1, it can adapt to test pieces 4 with various pin numbers and distributions for high-temperature reverse bias voltage testing.

[0032] It should be noted that the specific model and specifications of the test machine body 3 need to be selected and determined according to the actual specifications of the device. The specific selection calculation method adopts the existing technology in this field, so it will not be described in detail.

[0033] The power supply and its principle of the test machine body 3 are clear to those skilled in the art, and will not be described in detail here.

[0034] The above description is merely a preferred embodiment of this utility model and is not intended to limit the utility model. Various modifications and variations can be made to this utility model by those skilled in the art. Any modifications, equivalent substitutions, or improvements made within the spirit and principles of this utility model should be included within the protection scope of this utility model.

Claims

1. A high-temperature reverse bias testing machine, characterized in that, The tester includes a main body, on which a plurality of modular clamping mechanisms are provided on the mounting surface of the test cavity. Each modular clamping mechanism includes a modular chuck and a chuck base. The modular chuck includes a placement seat. The upper surface of the placement seat is provided with a plurality of pin slots corresponding to the number and distribution of pins of the corresponding test piece. Each pin slot has a conductive contact on one inner wall. The upper surface of the placement seat is also provided with a positioning guide structure and a limiting mechanism. The lower surface of the placement seat is provided with a conversion plug electrically connected to the plurality of conductive contacts. The chuck base includes a base plate. The upper surface of the base plate is provided with a conductive slot corresponding to the conversion plug. The conductive slot is electrically connected to the internal detection module of the tester. The base plate is detachably mounted on the mounting surface of the test cavity of the tester.

2. The high-temperature reverse bias tester as described in claim 1, characterized in that: The positioning and guiding structure includes two positioning and guiding blocks. The two positioning and guiding blocks are integrally disposed at both ends of the upper surface of the placement base and are symmetrically distributed. The distance between the two positioning and guiding blocks is consistent with the length of the corresponding test piece. The opposite side surface of the two positioning and guiding blocks consists of a guide slope and a limiting plane from the top to the bottom.

3. The high-temperature reverse bias tester as described in claim 2, characterized in that: The limiting mechanism includes a clamping frame, which has a grid-shaped structure. One end of the clamping frame is rotatably connected to the top of one of the positioning guide blocks. The other end of the clamping frame has a limiting protrusion on its surface. The top surface of the other positioning guide block has a groove corresponding to the end structure of the clamping frame. The inner walls on both sides of the groove have limiting grooves corresponding to the limiting protrusion. The limiting protrusion is engaged inside the limiting groove.

4. The high-temperature reverse bias tester as described in claim 3, characterized in that: An extension plate is integrally provided on the clamping frame. A sliding hole is opened on the surface of the extension plate. A sliding rod is slidably installed in the sliding hole. A mounting plate is fixedly connected to the bottom end of the sliding rod. An insulating pressure block corresponding to the number and position of the pin slots is fixedly installed on the bottom of the mounting plate. A spring is fixedly connected between the bottom surface of the extension plate and the top surface of the mounting plate. The spring is sleeved on the outside of the sliding rod. A pull rod is also provided at the end of the sliding rod.

5. The high-temperature reverse bias tester as described in claim 1, characterized in that: The base plate has several integrally formed assembly parts on its periphery, and each assembly part has an assembly hole.

6. The high-temperature reverse bias tester as described in claim 1, characterized in that: The number and position distribution of the pin slots are consistent with the number and position distribution of the corresponding pins of the device under test.

7. The high-temperature reverse bias tester as described in claim 1, characterized in that: Each of the conductive contacts in the pin slot is electrically connected to the adapter plug via a wire, and the conductive slot is electrically connected to the test module of the test machine body via a wire.

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