A test tool for integrated circuit chips

Abstract

The utility model relates to integrated circuit chip test technical field, and disclose a kind of test tool for integrated circuit chip, including test box, telescopic push rod one, U-shaped seat and limit strip, telescopic push rod one is fixedly connected on the inner top wall of test box.This kind of test tool for integrated circuit chip, test box is as bearing main body, provides stable installation space and protection environment for internal component, avoid external interference;Its bottom four corners rubber pad foot can absorb test vibration, reduce equipment and the rigid collision of placement surface, both protect structural stability, also reduce the influence of external vibration on test result;The sliding clamping of the rail in the bottom of test box and the clamping groove in the bottom of U-shaped seat makes U-shaped seat can move stably along the direction of rail, it is convenient to adjust position according to chip size or test demand, improve tool versatility;When U-shaped seat moves to target position, position is locked quickly by inserting plug, avoid deviation caused by accidental shaking in test process.

Description

Technical Field

[0001] This utility model relates to the field of integrated circuit chip testing technology, specifically to a testing fixture for integrated circuit chips. Background Technology

[0002] In today's era of rapid advancements in electronic technology, integrated circuit chips, as core components of various electronic devices, are crucial for quality and performance control. From everyday electronic products like smartphones and computers to specialized fields with extremely high reliability requirements, such as aerospace and medical equipment, the applications of integrated circuit chips are wide-ranging and critical. However, due to the complexity of manufacturing processes and the extremely high precision requirements, various potential defects are inevitable during chip production, such as short circuits, open circuits, and component damage. If these defects are not detected in time, they will seriously affect the normal operation and safe use of the product.

[0003] Traditional chip testing methods often rely on large, expensive specialized testing equipment. While these devices are powerful, they are bulky, complex to operate, and typically only usable in specific laboratory environments. They lack the flexibility and convenience for small electronics manufacturers, R&D studios, or rapid on-site testing scenarios. Furthermore, traditional testing fixtures often employ rudimentary or simplistic methods for fixing, positioning, and applying test pressure to the chip under test, making it difficult to guarantee the stability of the testing process and the accuracy of the results. For example, the chip may shift during testing due to insecure fixing, leading to poor contact of the test probes; or the applied pressure may be uneven, affecting the reliability of the test data.

[0004] Therefore, it is necessary to propose a test fixture for integrated circuit chips. Utility Model Content

[0005] To address the shortcomings of existing technologies, this utility model provides a testing fixture for integrated circuit chips, which has the advantages of being able to adapt to the testing needs of chips of different specifications, being easy to operate, having low cost, and effectively ensuring test quality, thus overcoming the defects of existing technologies mentioned in the background art.

[0006] This utility model provides the following technical solution: a testing fixture for integrated circuit chips, comprising a test box, a telescopic push rod one, a U-shaped seat, and limiting strips. The telescopic push rod one is fixedly connected to the inner top wall of the test box. An installation head is fixedly connected to the bottom end of the telescopic push rod one, and a test probe is fixedly installed at the bottom end of the installation head. The U-shaped seat is disposed inside the test box. A telescopic push rod two is fixedly connected to the inner bottom of the U-shaped seat. A receiving plate is fixedly connected to the top end of the telescopic push rod two, and the receiving plate is located directly above the test probe. There are two limiting strips, which are respectively fixedly connected to the top ends of the two side walls of the U-shaped seat. A sliding groove is formed on the inner side wall of the limiting strip. A slider is slidably engaged inside the sliding groove. A clamp is fixedly connected to one end of the slider, and the clamp is located directly above the receiving plate.

[0007] Preferably, the test box is fixedly connected to four corners at the bottom with pads made of rubber.

[0008] Preferably, the inner bottom of the test box is fixedly connected to a retaining rail, and the bottom end of the U-shaped seat is provided with a retaining groove, which is slidably engaged with the retaining rail.

[0009] Preferably, the U-shaped seat has limit grooves on both side walls, and the test box has damping cylinders fixedly connected to both side walls. A plug is slidably inserted into the inside of the damping cylinder, and the end of the plug matches the model and specification of the limit groove.

[0010] Preferably, the inner bottom of the U-shaped seat is fixedly connected to a guide rod, the top end of the guide rod is fixedly connected to the bottom end of the limiting strip, and the edge of the receiving plate is slidably sleeved on the surface of the guide rod.

[0011] Preferably, a threaded rod is fixedly connected to one side surface of the slider, the threaded rod is slidably inserted into the end of the limiting strip, a spring is movably sleeved on the surface of the threaded rod, one end of the spring abuts against the side of the slider, the other end of the spring abuts against the groove wall of the slide, and a nut is threadedly sleeved on the surface of the threaded rod, the nut being located outside the limiting strip.

[0012] Compared with the prior art, the present invention has the following beneficial effects:

[0013] This type of testing fixture for integrated circuit chips uses a test chamber as the main support, providing a stable installation space and protective environment for internal components to avoid external interference. Rubber feet at the four corners of the bottom absorb testing vibrations, reducing rigid collisions between the equipment and the placement surface, thus protecting structural stability and minimizing the impact of external vibrations on test results. The sliding engagement between the inner bottom rail of the test chamber and the slot at the bottom of the U-shaped base allows the U-shaped base to move smoothly along the rail direction, facilitating position adjustments according to chip size or testing requirements and improving the fixture's versatility. When the U-shaped base moves to the target position, its side limit slots cooperate with the damping cylinders and plugs on the sides of the test chamber, quickly locking the position by inserting the plugs to prevent accidental shaking and displacement during testing. The damping cylinders provide cushioning for the plug insertion operation, reducing difficulty and protecting components. The guide rod on the inner bottom of the U-shaped base slides and engages with the edge of the receiving plate, providing precise guidance for the vertical movement of the receiving plate and ensuring that it moves only in the vertical direction, avoiding test errors caused by offset. Together with the receiving plate driven by the second telescopic push rod, it can provide auxiliary support for the chip under test. Working in conjunction with the test probe driven by the first telescopic push rod, it completes bidirectional pressure testing, enhancing the comprehensiveness of the test. The limiting strip slides and connects to the slider via grooves on both sides, providing horizontal guidance for the chuck and ensuring precise contact between the chuck and the chip edge. A threaded rod on one side of the slider slides into the end of the limiting strip. A spring fitted on the surface abuts against the slider at one end and against the groove wall at the other. Adjusting the extension length of the threaded rod with an external nut allows for flexible adjustment of the spring compression, thereby controlling the clamping force of the chuck. The spring's elastic cushioning prevents excessive compression that could damage the chip, while ensuring compatibility with chips of different sizes and improving fixation reliability. Attached Figure Description

[0014] To more clearly illustrate the technical solutions of the embodiments of this utility model, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0015] Figure 1 This is a schematic diagram of the overall structure of the device of this utility model;

[0016] Figure 2 This is a schematic diagram of the test box structure of this utility model;

[0017] Figure 3 This is a schematic diagram of the U-shaped seat structure of this utility model;

[0018] Figure 4 This is a cross-sectional view of the limiting strip structure of this utility model.

[0019] The attached diagram lists the components represented by each number as follows:

[0020] 100. Test box; 101. Foot pad; 102. Rail clamp; 103. Damping cylinder; 104. Bolt;

[0021] 200. Telescopic push rod one; 201. Mounting head; 202. Test probe;

[0022] 300. U-shaped seat; 301. Slot; 302. Limiting slot; 303. Guide rod; 304. Telescopic push rod II; 305. Receiving plate;

[0023] 400. Limiting bar; 401. Slide groove; 402. Slider; 403. Clamp; 404. Threaded rod; 405. Spring; 406. Nut. Detailed Implementation

[0024] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0025] Reference Figures 1-4As shown, a testing fixture for integrated circuit chips includes a test chamber 100, a telescopic push rod 200, a U-shaped base 300, and a limiting strip 400. The telescopic push rod 200 is fixedly connected to the inner top wall of the test chamber 100. A mounting head 201 is fixedly connected to the bottom end of the telescopic push rod 200, and a test probe 202 is fixedly mounted on the bottom end of the mounting head 201. The U-shaped base 300 is disposed inside the test chamber 100, and the telescopic push rod 200 is fixedly connected to the inner bottom of the U-shaped base 300. 304. The top of the telescopic push rod 304 is fixedly connected to a receiving plate 305. The receiving plate 305 is located directly above the test probe 202. There are two limiting strips 400, which are fixedly connected to the top of the two side walls of the U-shaped seat 300 respectively. The inner side wall of the limiting strip 400 is provided with a sliding groove 401. The sliding groove 401 is slidably engaged with a slider 402. One end of the slider 402 is fixedly connected to a clamp 403, which is located directly above the receiving plate 305. The test chamber 100, as the main structural support, provides a stable installation space and protective environment for the internal functional components, avoiding the influence of external interference on the testing process. The telescopic push rod 200, through its telescopic structural design, can drive the mounting head 201 and the test probe 202 to move up and down, achieving precise pressure on the chip, ensuring uniform and stable test pressure, and improving the reliability of test results. The U-shaped seat 300, as the core carrier for chip positioning and support, has a telescopic push rod 304 and a receiving plate 305 inside, which can provide vertical auxiliary support for the chip under test. Together with the test probe 202, it completes bidirectional pressure testing, enhancing the comprehensiveness of the testing process. The limiting strip 400, set at the top of the two side walls, together with the internal sliding groove 401 and slider 402, provides horizontal sliding guidance for the clamp 403, ensuring that the clamp 403 can accurately fit the edge of the chip, achieving rapid fixation and positioning.

[0026] Preferably, each of the four corners of the bottom of the test chamber 100 is fixedly connected with a foot 101, which is made of rubber. The rubber foot 101 can effectively absorb the vibration generated during the test, reduce the rigid collision between the equipment and the placement surface, protect the overall structural stability of the test fixture, reduce the interference of external vibration on the test results, and extend the service life of the equipment.

[0027] Preferably, the inner bottom of the test chamber 100 is fixedly connected to a rail 102, and the bottom end of the U-shaped base 300 is provided with a slot 301, which is slidably engaged with the rail 102. This slidable engagement between the rail 102 and the slot 301 allows the U-shaped base 300 to move smoothly along the rail 102 within the inner bottom of the test chamber 100, facilitating adjustment of the U-shaped base 300's position according to chip size or testing requirements, and improving the versatility and adaptability of the testing fixture.

[0028] In a further preferred embodiment, both side walls of the U-shaped base 300 are provided with limiting grooves 302, and both side walls of the test chamber 100 are fixedly connected with damping cylinders 103. A plug 104 is slidably inserted into the inside of the damping cylinder 103, and the end of the plug 104 matches the model and specifications of the limiting groove 302. When the U-shaped base 300 moves to the target position, the limiting groove 302, damping cylinder 103, and plug 104 can quickly lock the position of the U-shaped base 300 by inserting the plug 104 into the corresponding limiting groove 302, preventing position displacement due to accidental shaking during the test. The damping cylinder 103 provides a buffer for the insertion and removal of the plug 104, reducing the difficulty of operation and protecting the component structure.

[0029] Preferably, a guide rod 303 is fixedly connected to the inner bottom of the U-shaped base 300. The top end of the guide rod 303 is fixedly connected to the bottom end of the limiting strip 400, and the edge of the receiving plate 305 is slidably sleeved on the surface of the guide rod 303. The guide rod 303 provides precise guidance for the vertical movement of the receiving plate 305 through the sliding sleeve between the guide rod 303 and the edge of the receiving plate 305, ensuring that the receiving plate 305 moves only in the vertical direction, avoiding test errors caused by offset, and improving the stability of the chip support.

[0030] In a further preferred embodiment, a threaded rod 404 is fixedly connected to one side surface of the slider 402. The threaded rod 404 is slidably inserted into the end of the limiting strip 400. A spring 405 is movably sleeved on the surface of the threaded rod 404. One end of the spring 405 abuts against the side of the slider 402, and the other end of the spring 405 abuts against the groove wall of the slide groove 401. A nut 406 is threadedly sleeved on the surface of the threaded rod 404, and the nut 406 is located outside the limiting strip 400. By rotating the nut 406, the extension length of the threaded rod 404 at the end of the limiting strip 400 can be adjusted, thereby changing the compression degree of the spring 405 and realizing flexible adjustment of the clamping force of the chuck 403. The elastic buffering effect of the spring 405 can prevent the chuck 403 from being damaged by excessive compression of the chip, while ensuring the adaptability of the chuck 403 to chips of different sizes and improving the fixation reliability.

[0031] In the description of this utility model, it should be understood that the terms "coaxial", "bottom", "one end", "top", "middle", "other end", "upper", "side", "top", "inner", "front", "center", "both ends", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.

[0032] In this utility model, unless otherwise explicitly specified and limited, the terms "installation", "setting", "connection", "fixing", "screw connection", etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal connection of two components or the interaction between two components. Unless otherwise explicitly limited, those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0033] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A testing fixture for integrated circuit chips, comprising a test box (100), a telescopic push rod (200), a U-shaped base (300), and a limiting strip (400), characterized in that: The first telescopic push rod (200) is fixedly connected to the inner top wall of the test chamber (100). An installation head (201) is fixedly connected to the bottom end of the first telescopic push rod (200). A test probe plate (202) is fixedly installed at the bottom end of the installation head (201). The U-shaped seat (300) is located inside the test chamber (100). A second telescopic push rod (304) is fixedly connected to the bottom of the U-shaped seat (300). A receiving plate (305) is fixedly connected to the top end of the second telescopic push rod (304). The receiving plate (305) is located directly above the test probe plate (202). There are two limiting strips (400), which are fixedly connected to the top of the two side walls of the U-shaped seat (300). The inner side wall of the limiting strip (400) is provided with a sliding groove (401). A slider (402) is slidably engaged inside the sliding groove (401). One end of the slider (402) is fixedly connected to a clamp (403), which is located directly above the receiving plate (305).

2. The testing fixture for integrated circuit chips according to claim 1, characterized in that: The test box (100) is fixedly connected to four corners at the bottom with feet (101), and the feet (101) are made of rubber.

3. The testing fixture for integrated circuit chips according to claim 1, characterized in that: The inner bottom of the test box (100) is fixedly connected to a rail (102), and the bottom end of the U-shaped seat (300) is provided with a slot (301), which is slidably engaged with the rail (102).

4. The testing fixture for integrated circuit chips according to claim 1, characterized in that: The U-shaped seat (300) has limit grooves (302) on both sides of its sidewalls. The test box (100) has damping cylinders (103) fixedly connected to both sides of its sidewalls. A plug (104) is slidably inserted into the inside of the damping cylinder (103). The end of the plug (104) matches the model and specifications of the limit groove (302).

5. A testing fixture for integrated circuit chips according to claim 1, characterized in that: The inner bottom of the U-shaped seat (300) is fixedly connected to a guide rod (303), the top end of the guide rod (303) is fixedly connected to the bottom end of the limiting strip (400), and the edge of the receiving plate (305) is slidably sleeved on the surface of the guide rod (303).

6. A test fixture for integrated circuit chips according to claim 1, characterized in that: A threaded rod (404) is fixedly connected to one side surface of the slider (402). The threaded rod (404) is slidably inserted into the end of the limiting strip (400). A spring (405) is movably sleeved on the surface of the threaded rod (404). One end of the spring (405) abuts against the side of the slider (402), and the other end of the spring (405) abuts against the groove wall of the slide (401). A nut (406) is threaded onto the surface of the threaded rod (404), and the nut (406) is located outside the limiting strip (400).

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