A chip testing fixture based on a circuit board testing machine

Abstract

The utility model provides a kind of chip test fixture based on circuit board testing platform for Agilent 3070 circuit board testing platform is used to carry out chip test, while it is convenient to replace parts, maintain probe and adapt to a kind of chip of multiple size.The utility model discloses a kind of chip test fixture based on circuit board testing platform, including lower needle plate and a plurality of array settings chip test seat on lower needle plate, chip test seat is composed of adapter plate, fixed base and knob lower press cover, adapter plate is electrically connected with lower needle plate, fixed base is detachably set on the upper surface of adapter plate and is electrically connected with it, fixed base detachably has built-in floating probe assembly, floating probe assembly top is provided with chip slot, knob lower press cover includes press cover, knob and limit floating plate, press cover is rotatably connected on any side end of fixed base, limit floating plate is detachably built in press cover, and knob bottom is movably connected with press cover by screw thread, and with limit floating plate top abuts.

Description

Technical Field

[0001] This utility model relates to the field of chip performance testing equipment technology, and in particular to a chip testing fixture based on a circuit board testing machine. Background Technology

[0002] The Agilent 3070 platform is a circuit board testing machine designed and manufactured by Agilent Technologies, Inc. The equipment consists of three main modules: a test head, a computer, and a power supply unit. It employs pneumatic locking and vacuum adsorption technology to achieve precise positioning of the test fixture. Previously, when testing chips using this platform, the chip aging test fixture was directly fixed to the lower probe plate of the platform. The testing of chips of different sizes was handled primarily by the linkage between the pressing part of the aging test fixture and the chip clamps. However, due to the small size of the chip aging test fixture itself and the limited pressing distance of the pressing part, it could not meet the testing requirements of all chips. Furthermore, the installation and connection between the chip aging test fixture and the lower probe plate of the Agilent 3070 platform requires high precision. Repeated disassembly and replacement of the fixture due to chip size issues can easily affect the final test accuracy. Frequent replacement of the entire chip aging fixture is also relatively complex, significantly impacting production testing efficiency. Utility Model Content

[0003] To address the aforementioned problems, this utility model provides a chip testing fixture based on a circuit board testing machine.

[0004] The technical solution adopted by this utility model is as follows: This utility model includes a lower needle plate and several chip test sockets arranged in an array on the lower needle plate. The chip test socket is composed of an adapter plate, a fixed base, and a knob lower pressure cover. The adapter plate is electrically connected to the lower needle plate. The fixed base is detachably disposed on the upper surface of the adapter plate and electrically connected to it. The fixed base detachably houses a floating probe assembly. The top of the floating probe assembly is provided with a chip slot. The knob lower pressure cover includes a lower pressure cover, a knob, and a limiting floating plate. The lower pressure cover is rotatably connected to either side of the fixed base. The limiting floating plate is detachably housed inside the lower pressure cover. The bottom of the knob is movably connected to the lower pressure cover by a thread and abuts against the top of the limiting floating plate.

[0005] Furthermore, the floating probe assembly includes a base plate, a probe stage, and an auxiliary limiting plate. The probe stage is detachably disposed at the center of the base plate. Several floating guide posts are also disposed on the base plate around the outer periphery of the probe stage. The auxiliary limiting plate can be offset in the vertical direction by slidingly engaging with the floating guide posts. Several first floating springs are also disposed between the base plate and the auxiliary limiting plate. The chip slot is disposed on the upper surface of the auxiliary limiting plate.

[0006] Furthermore, the auxiliary limiting plate is provided with a plurality of arrayed limiting slots and positioning holes on the outer periphery of the chip slot, and the auxiliary limiting plate is also provided with four sets of corner clearance slots corresponding to the corners of the chip slot.

[0007] Furthermore, the limiting floating plate includes a first lower pressure plate, a second lower pressure plate, a chip positioning pressure plate, and an auxiliary positioning plate stacked sequentially from top to bottom. The upper surface of the first lower pressure plate abuts against the bottom of the knob. The auxiliary positioning plate is fixedly disposed on the lower surface of the second lower pressure plate. The second lower pressure plate has an opening adapted to the chip positioning pressure plate. The lower end face of the first lower pressure plate, the opening, and the upper end face of the auxiliary positioning plate together form a floating cavity. The chip positioning pressure plate is placed in the floating cavity and slides through the second lower pressure plate and the auxiliary positioning plate. A plurality of second floating springs are also disposed between the first lower pressure plate and the second lower pressure plate.

[0008] Furthermore, the chip positioning plate is composed of an integrally formed connecting block and a chip pressing block arranged perpendicularly to each other. Several third floating springs are arranged in an array between the upper surface of the connecting block and the lower surface of the first lower pressing plate, and between the lower surface of the connecting block and the upper surface of the auxiliary positioning plate. The chip pressing block penetrates the auxiliary positioning plate.

[0009] Furthermore, the lower surface of the auxiliary positioning plate is also provided with a limiting block and a positioning rod that are respectively adapted to the limiting groove and the positioning hole.

[0010] Furthermore, the knob consists of a nut and a screw, which is threadedly connected to the lower pressure cover. The bottom of the screw abuts against the upper surface of the first lower pressure plate. A limit rod is also provided on the upper surface of the lower pressure cover, and an arc-shaped opening and closing groove adapted to the limit rod is provided on the lower surface of the nut.

[0011] Furthermore, the lower pressure cover is rotatably connected to the fixed base via a rotating shaft and a torsion spring. A locking buckle is also provided on the other side of the lower pressure cover corresponding to the rotating shaft, and the locking buckle is detachably connected to the fixed base.

[0012] Finally, handles are also provided at both ends of the lower needle plate.

[0013] Compared with the prior art, the beneficial effects of this utility model are as follows: This utility model aims to apply the Agilent 3070 circuit board tester to chip performance testing, and makes targeted improvements to the lower probe plate of the Agilent 3070 circuit board tester. Several sets of chip test sockets are arrayed on the lower probe plate, allowing multiple sets of chips to be tested simultaneously. By utilizing a detachable modular design, operators can replace the floating probe assembly and limiting floating plate in the chip test socket according to different chip sizes to adapt to the testing requirements of chips of different sizes and models. It also facilitates the maintenance of the probes and other structures of the equipment. By manually rotating the knob, the limiting floating plate is driven to press down. The stroke of the chip positioning plate in the floating cavity, the stroke of the auxiliary positioning plate in the lower pressure cover, and the action of the second and third floating springs play an auxiliary positioning role for the chip under test, while protecting the chip from being crushed. The auxiliary limiting plate covers the probe tip under the action of the first floating spring, protecting the probe. When the chip is pressed down by the chip positioning plate, the first floating spring is compressed at the same time, and the probe tip is exposed to contact the chip, thereby performing the test. Attached Figure Description

[0014] Figure 1 This is a schematic diagram of the overall structure of this utility model; Figure 2 This is a schematic diagram of the structure of the chip test socket; Figure 3 This is an exploded view of the floating probe assembly; Figure 4 This is an exploded structural diagram of the lower cover of the knob. Detailed Implementation

[0015] like Figures 1 to 4As shown, this utility model includes a lower needle plate 1 and several chip test sockets 2 arranged in an array on the lower needle plate 1. The chip test socket 2 consists of an adapter plate 3, a fixed base 4, and a knob lower pressure cover 5. The adapter plate 3 is electrically connected to the lower needle plate 1. The fixed base 4 is detachably disposed on the upper surface of the adapter plate 3 and electrically connected to it. The fixed base 4 is detachably equipped with a floating probe assembly 40. The top of the floating probe assembly 40 is provided with a chip slot 400. The knob lower pressure cover 5 includes a lower pressure cover 50, a knob 51, and a limiting floating plate 52. The lower pressure cover 50 is rotatably connected to either side of the fixed base 4. The limiting floating plate 52 is detachably disposed inside the lower pressure cover 50. The bottom of the knob 51 is movably connected to the lower pressure cover 50 by a thread and abuts against the top of the limiting floating plate 52. The lower pressure cover 50 is rotatably connected to the fixed base 4 via a rotating shaft 500 and a torsion spring 501. A locking buckle 502 is also provided on the other side of the lower pressure cover 50 corresponding to the rotating shaft 500, and is detachably connected to the fixed base 4 via the locking buckle 502. Handles 6 are also provided at both ends of the lower needle plate 1.

[0016] In this utility model, the floating probe assembly 40 includes a base plate 401, a probe stage 402, and an auxiliary limiting plate 403. The probe stage 402 is detachably disposed at the center of the base plate 401. A plurality of floating guide posts 404 are also disposed around the outer periphery of the probe stage 402 on the base plate 401. The auxiliary limiting plate 403 can be offset in the vertical direction by slidingly engaging with the floating guide posts 404. A plurality of first floating springs 405 are also disposed between the base plate 401 and the auxiliary limiting plate 403. The chip slot 400 is disposed on the upper surface of the auxiliary limiting plate 403. Under the action of the first floating spring 405, the auxiliary limiting plate 403 floats on the probe tip, protecting the probe. When the operator rotates the knob 5, the limiting floating plate 52 is driven to press down, fixing the chip in the chip slot 400. The auxiliary limiting plate 403 moves downward and compresses the first floating spring 405. The probe tip on the probe stage 402 protrudes out of the auxiliary limiting plate 403 and contacts the chip.

[0017] The auxiliary limiting plate 403 is provided with a plurality of arrayed limiting grooves 406 and positioning holes 407 on the outer periphery of the chip slot 400. The auxiliary limiting plate 403 also has four sets of corner clearance grooves 408 corresponding to the corners of the chip slot 400. The lower surface of the auxiliary positioning plate 523 is provided with limiting blocks 5230 and positioning rods 5231 that are adapted to the limiting grooves 406 and positioning holes 407, respectively. The corner clearance grooves 408 are used to prevent damage to the four corners of the square chip during testing. The matching of the limiting blocks 5230 with the limiting grooves 406 and the matching of the positioning rods 5231 with the positioning holes 523 ensures perfect assembly of the knob cover 5 and the fixed base 4, thereby ensuring that the chip is accurately placed in the chip slot 400 for testing.

[0018] The limiting floating plate 52 includes a first lower pressure plate 520, a second lower pressure plate 521, a chip positioning pressure plate 522, and an auxiliary positioning plate 523 stacked sequentially from top to bottom. The upper surface of the first lower pressure plate 520 abuts against the bottom of the knob 51. The auxiliary positioning plate 523 is fixedly disposed on the lower surface of the second lower pressure plate 521. The second lower pressure plate 521 has an opening 524 adapted to the chip positioning pressure plate 522. The lower end face of the first lower pressure plate 520, the opening 524, and the upper end face of the auxiliary positioning plate 523 together form a floating cavity. The chip positioning pressure plate 522 is placed in the floating cavity and slides through the second lower pressure plate 521 and the auxiliary positioning plate 523. A plurality of second floating springs 525 are also disposed between the first lower pressure plate 520 and the second lower pressure plate 521. In this invention, by utilizing the action of the second floating spring 525, there is a certain amount of displacement between the first lower pressure plate 520 and the second lower pressure plate 521, so as to prevent the auxiliary positioning plate 523 from damaging the chip.

[0019] The chip positioning plate 522 is composed of an integrally formed connecting block 5220 and a chip pressing block 5221 arranged perpendicularly to each other. A plurality of third floating springs 5222 are arrayed between the upper surface of the connecting block 5220 and the lower surface of the first lower pressing plate 520, and between the lower surface of the connecting block 5220 and the upper surface of the auxiliary positioning plate 523. The chip pressing block 5221 penetrates the auxiliary positioning plate 523. In this invention, the displacement of the chip positioning plate 522 within the floating cavity, along with the buffering effect of the third floating springs 5222, provides secondary protection for the chip.

[0020] The knob 51 consists of a knob cap 510 and a screw 511. The screw 511 is threadedly connected to the lower pressure cover 50. The bottom of the screw 511 abuts against the upper surface of the first lower pressure plate 520. A limiting rod 512 is also provided on the upper end face of the lower pressure cover 50. An arc-shaped opening and stopping groove 513 adapted to the limiting rod 512 is provided on the lower end face of the knob cap 510. In this utility model, when the operator rotates the knob cap 510, the displacement of the limiting rod 512 from the starting point to the ending point in the arc-shaped opening and stopping groove 513 is adapted to the displacement of the chip positioning plate 522 in the floating cavity, preventing the operator from excessively rotating the knob cap 510, which could cause the chip positioning plate 522 to move excessively downward and damage the chip.

[0021] This invention aims to apply the Agilent 3070 circuit board test bench to chip performance testing, and specifically improves the lower probe plate 1 of the Agilent 3070 circuit board test bench. Several sets of chip test sockets 2 are arrayed on the lower probe plate 1, allowing multiple sets of chips to be tested simultaneously. Through a detachable modular design, operators can replace the floating probe assembly 40 and the limiting floating plate 52 in the chip test socket 2 according to different chip sizes, adapting to the testing requirements of chips of different sizes and models. This also facilitates maintenance of the equipment's probes and other structures. By manually rotating knob 51, the limiting floating plate 52 is driven to press down. Utilizing the stroke of chip positioning plate 522 within the floating cavity, the stroke of auxiliary positioning plate 523 within the lower pressure cover 50, and the action of the second floating spring 525 and the third floating spring 5222, the chip under test is positioned to assist in its positioning while protecting it from damage. The auxiliary limiting plate 403, under the action of the first floating spring 405, covers the probe tip, protecting it. When the chip is pressed down by chip positioning plate 522, the first floating spring 405 is simultaneously compressed, exposing the probe tip to contact the chip for testing.

[0022] Finally, it should be emphasized that the above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. For those skilled in the art, the present utility model can have various changes and modifications. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A chip testing fixture based on a circuit board testing machine, characterized in that: The device includes a lower needle plate (1) and several chip test sockets (2) arranged in an array on the lower needle plate (1). The chip test socket (2) consists of an adapter plate (3), a fixed base (4), and a knob pressure cover (5). The adapter plate (3) is electrically connected to the lower needle plate (1). The fixed base (4) is detachably disposed on the upper surface of the adapter plate (3) and electrically connected to it. The fixed base (4) has a detachable floating probe assembly (40) built into it. The component (40) has a chip slot (400) on the top. The knob lower cover (5) includes a lower cover (50), a knob (51) and a limiting floating plate (52). The lower cover (50) is rotatably connected to either side of the fixed base (4). The limiting floating plate (52) is detachably built into the lower cover (50). The bottom of the knob (51) is movably connected to the lower cover (50) by a thread and abuts against the top of the limiting floating plate (52).

2. The chip testing fixture based on a circuit board testing machine according to claim 1, characterized in that: The floating probe assembly (40) includes a base plate (401), a probe stage (402), and an auxiliary limiting plate (403). The probe stage (402) is detachably disposed at the center of the base plate (401). Several floating guide posts (404) are also disposed around the outer periphery of the probe stage (402) on the base plate (401). The auxiliary limiting plate (403) can be offset in the vertical direction by slidingly engaging with the floating guide posts (404). Several first floating springs (405) are also disposed between the base plate (401) and the auxiliary limiting plate (403). The chip slot (400) is disposed on the upper surface of the auxiliary limiting plate (403).

3. A chip testing fixture based on a circuit board testing machine according to claim 2, characterized in that: The auxiliary limiting plate (403) is provided with a plurality of arrayed limiting grooves (406) and positioning holes (407) on the outer periphery of the chip slot (400). The auxiliary limiting plate (403) is also provided with four sets of corner clearance grooves (408) corresponding to the corners of the chip slot (400).

4. A chip testing fixture based on a circuit board testing machine according to claim 3, characterized in that: The limiting floating plate (52) includes a first lower pressure plate (520), a second lower pressure plate (521), a chip positioning pressure plate (522), and an auxiliary positioning plate (523) stacked from top to bottom. The upper surface of the first lower pressure plate (520) abuts against the bottom of the knob (51). The auxiliary positioning plate (523) is fixedly disposed on the lower surface of the second lower pressure plate (521). The second lower pressure plate (521) has an opening (524) adapted to the chip positioning pressure plate (522). The lower end face of the first lower pressure plate (520), the opening (524), and the upper end face of the auxiliary positioning plate (523) together form a floating cavity. The chip positioning pressure plate (522) is placed in the floating cavity and slides through the second lower pressure plate (521) and the auxiliary positioning plate (523). A plurality of second floating springs (525) are also disposed between the first lower pressure plate (520) and the second lower pressure plate (521).

5. A chip testing fixture based on a circuit board testing machine according to claim 4, characterized in that: The chip positioning plate (522) is composed of an integrally formed connecting block (5220) and a chip pressing block (5221) arranged perpendicularly to each other. A plurality of third floating springs (5222) are arranged in an array between the upper surface of the connecting block (5220) and the lower surface of the first lower pressing plate (520), and between the lower surface of the connecting block (5220) and the upper surface of the auxiliary positioning plate (523). The chip pressing block (5221) penetrates the auxiliary positioning plate (523).

6. A chip testing fixture based on a circuit board testing machine according to claim 5, characterized in that: The lower surface of the auxiliary positioning plate (523) is also provided with a limiting block (5230) and a positioning rod (5231) that are adapted to the limiting groove (406) and the positioning hole (407), respectively.

7. A chip testing fixture based on a circuit board testing machine according to claim 6, characterized in that: The knob (51) consists of a knob cap (510) and a screw (511). The screw (511) is threadedly connected to the lower pressure cover (50). The bottom of the screw (511) abuts against the upper surface of the first lower pressure plate (520). A limit rod (512) is also provided on the upper end face of the lower pressure cover (50). An arc-shaped opening and closing groove (513) adapted to the limit rod (512) is provided on the lower end face of the knob cap (510).

8. A chip testing fixture based on a circuit board testing machine according to claim 1, characterized in that: The lower pressure cover (50) is rotatably connected to the fixed base (4) via a rotating shaft (500) and a torsion spring (501). A locking buckle (502) is also provided on the other side of the lower pressure cover (50) corresponding to the rotating shaft (500), and is detachably connected to the fixed base (4) via the locking buckle (502).

9. A chip testing fixture based on a circuit board testing machine according to claim 8, characterized in that: Handles (6) are also provided at both ends of the lower needle plate (1).

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