Chip detection jig

Abstract

The utility model discloses a kind of chip detection fixture, the detection fixture includes fixed base plate and several measurement components;The center position of fixed base plate is equipped with antiskid pad for placing chip;Several fixed hole positions are evenly provided on fixed base plate;Several measurement components are distributed along the periphery of chip center;Each measurement component includes stud, terminal, probe, spring, two nuts and three flat pads;Stud is installed on one fixed hole position by one nut upside down and passes through corresponding terminal and extends above fixed base plate;First flat pad, probe, second flat pad, spring, third flat pad, second nut are sequentially installed from below to above in stud extension above fixed base plate;Probe has the sliding slot that stud can slide on, and the end of probe away from chip is in contact with terminal;Terminal is crimped with wire on it.The utility model can improve detection efficiency, and can avoid soldering tin to chip point.

Description

Technical Field

[0001] This utility model relates to the field of chip fixture technology, specifically to a chip testing fixture. Background Technology

[0002] After the chips are procured, they need to undergo performance testing. According to the testing requirements, multiple points on the chip are simultaneously powered on, and a wire is soldered to each point. These wires are then connected to a measuring instrument, establishing a connection between the chip and the instrument. After testing, the soldered wires are removed, and the chip points are cleaned. This process of soldering wires to the corresponding points on the chip is repeated for each chip tested, followed by wire removal. The chip points are small, making soldering difficult and time-consuming. Solder can contaminate the chip points, affecting subsequent chip assembly; therefore, cleaning of the points is necessary.

[0003] Therefore, a fixture needs to be designed to solve the above problems and improve measurement efficiency. Utility Model Content

[0004] In view of the technical problems existing in the background art, this utility model provides a chip testing fixture that can improve testing efficiency and avoid solder contamination of chip points. To achieve the above objectives, this utility model provides the following technical solution: A chip testing fixture includes a fixed base plate and several measuring components; An anti-slip pad for placing the chip is installed at the center of the fixed base plate; the fixed base plate is evenly provided with several fixing holes; the fixed base plate is made of anti-static insulating resin board; the anti-slip pad is an anti-static silicone pad; several measuring components are distributed around the center of the chip; each measuring component includes a stud, a terminal, a probe, a spring, two nuts, and three flat washers; the stud is inverted and installed in a fixing hole through a nut and extends out of the fixed base plate through the corresponding terminal; the first flat washer, probe, second flat washer, spring, third flat washer, and second nut are installed sequentially from bottom to top above the stud extending out of the fixed base plate; the probe has a groove for the stud to slide, and the end of the probe away from the chip abuts against the terminal; a wire is crimped onto the terminal; The probe tip is pressed onto the point on the chip that needs to be tested. The chip point is connected to the external measuring instrument through the probe on the corresponding measuring component and the wire on the terminal block.

[0005] Preferably, the stud, terminal block, flat washer, and nut are made of copper.

[0006] Preferably, the spring and probe are made of stainless steel.

[0007] The beneficial effects of this utility model are: 1. This utility model uses the tip of the probe to make elastic contact with the point on the chip, replacing the original method of making the wires contact with the point by soldering. This greatly shortens the detection time, improves the detection efficiency, and avoids the contamination of the chip point by the solder. 2. By reserving more fixing holes on the base plate, this device can accommodate the measurement requirements of various chips by increasing or decreasing the number of measuring components, thus saving measurement costs. Attached Figure Description

[0008] Figure 1 This is a schematic diagram of the structure of the chip testing fixture of this utility model; Figure 2 This is a schematic diagram of the installation of the measuring component in this utility model; Figure 3 This is a schematic diagram of the probe structure in this utility model; In the diagram, 1-fixed base plate, 101-fixed hole, 2-anti-slip pad, 3-spring, 4-stud, 5-terminal block, 6-probe, 7-flat washer, 8-nut, 9-chip, 10-wire, 11-measuring component. Detailed Implementation

[0009] In existing technologies, after chips are purchased, they need to undergo performance testing. According to the testing requirements, multiple points on the chip are simultaneously powered, and a wire is soldered to each point. These wires are then connected to a measuring instrument, linking the chip to the instrument. After testing, the soldered wires are removed, and the chip points are cleaned. This process of soldering wires to the corresponding points on the chip and then removing them is repeated for each chip tested. The small size of the chip points makes soldering difficult and time-consuming. Solder can contaminate the chip points, affecting subsequent formal chip assembly, necessitating cleaning of the points.

[0010] To solve the above-mentioned technical problems, this utility model proposes a chip 9 detection fixture, including a fixed base plate 1 and a plurality of measuring components 11; An anti-slip pad 2 for placing the chip 9 is installed at the center of the fixed base plate 1; a plurality of fixing holes 101 are evenly provided on the fixed base plate 1; the fixed base plate 1 is made of anti-static insulating resin board; the anti-slip pad 2 is an anti-static silicone pad; a plurality of measuring components 11 are distributed around the center of the chip 9; each measuring component 11 includes a stud 4, a terminal 5, a probe 6, a spring 3, two nuts 8 and three flat washers 7; the stud 4 is installed upside down in a fixing hole 101 by a nut 8 and extends out of the fixed base plate 1 through the corresponding terminal 5; the first flat washer 7, the probe 6, the second flat washer 7, the spring 3, the third flat washer 7 and the second nut 8 are installed sequentially from bottom to top on the part of the stud 4 that extends out of the fixed base plate 1; the probe 6 has a groove for the stud 4 to slide, and the end of the probe 6 away from the chip 9 abuts against the terminal 5; a wire 10 is crimped on the terminal 5; The probe tip of probe 6 is pressed onto the point to be tested on chip 9. The point on chip 9 is connected to the wire 10 on the corresponding measuring component 11 through probe 6, terminal 5, and terminal 5. The wire 10 on terminal 5 can then be connected to the measuring instrument.

[0011] Stud 4, terminal block 5, flat washer 7, and nut 8 are made of copper.

[0012] Spring 3 and probe 6 are made of stainless steel.

[0013] like Figures 1-3 As shown, the working principle and process of this utility model are as follows: Installation process of testing fixtures: (1) such as Figure 1 As shown, install the anti-slip pad 2 into the groove reserved on the fixed base plate 1; (2) For example Figure 2 As shown, the stud 4 is passed through the pre-drilled hole on the base plate 1 from bottom to top, and a nut 8 is used to lock the terminal 5 and the stud 4, so that the stud 4 is fixed on the base plate 1; (3) such as Figure 2 As shown, install the first flat washer 7, probe 6, second flat washer 7, spring 3, third flat washer 7, and second nut 8 onto the stud 4 in sequence. Note that spring 3 is in a compressed state but not fully compressed. Adjust the compression of spring 3 by adjusting the second nut 8. The second nut compresses spring 3 downwards through the third flat washer 7, and then applies pressure to the probe through the second flat washer, thereby adjusting the sliding resistance of probe 6. Figure 3 As shown, after installation, probe 6 can rotate left and right or slide back and forth on stud 4.

[0014] Based on the number of points that need to be measured on the detection chip, install the corresponding number of measurement components, which are evenly distributed around the chip. Test procedure: Place chip 9 in the center on anti-slip pad 2, with the side with the dot facing up; The tension of the spring 3 is adjusted by the second nut 8 so that the probe 6 does not wobble when no external force is applied, and can rotate and slide smoothly when an external force is applied. By rotating and sliding probe 6, the tip of probe 6 is pressed onto the point on the chip that needs to be detected. This chip point is then connected to the wire on the terminal 5 of the corresponding measuring component. The wire on the terminal 5 can then be connected to the measuring instrument.

[0015] After the measurement is complete, remove probe 6 and take out chip 9, thus completing the testing of one chip 9. If another chip of the same model needs to be tested, simply replace it with the next chip 9.

Claims

1. A chip testing fixture, characterized in that: The testing fixture includes a fixed base plate and several measuring components; An anti-slip pad for placing the chip is installed at the center of the fixed base plate; the fixed base plate is evenly provided with several fixing holes; the fixed base plate is made of anti-static insulating resin board; the anti-slip pad is an anti-static silicone pad; several measuring components are distributed around the center of the chip; each measuring component includes a stud, a terminal, a probe, a spring, two nuts, and three flat washers; the stud is installed upside down in a fixing hole by a nut and extends through the corresponding terminal and above the fixed base plate; the first flat washer, probe, second flat washer, spring, third flat washer, and second nut are installed sequentially from bottom to top above the stud extending above the fixed base plate; the probe has a groove for the stud to slide, and the end of the probe away from the chip abuts against the terminal; a wire is crimped onto the terminal; The probe tip is pressed onto the point on the chip that needs to be tested. The chip point is connected to the external measuring instrument through the probe on the corresponding measuring component and the wire on the terminal block.

2. The chip testing fixture according to claim 1, characterized in that: The studs, terminals, flat washers, and nuts are made of copper.

3. The chip testing fixture according to claim 2, characterized in that: The spring and probe are made of stainless steel.

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