Test device and test system for solid state disks

Abstract

The application discloses a test device and a test system of a solid state disk. The test device is configured to be connected to a test host, and comprises a controller, a power supply interface and a hard disk slot. A first communication interface of the controller is connected to the test host, and a first serial communication interface is connected to a second serial communication interface of the hard disk slot. A power supply interface of the hard disk slot is connected to the power supply interface. The hard disk slot is configured to access input pins, output pins and power supply pins of a to-be-tested hard disk. A third serial communication interface of the hard disk slot is connected to the input pins and the output pins, and the power supply pins are configured to supply power to the to-be-tested hard disk after the power supply interface accesses an external power supply. The to-be-tested hard disk is configured to automatically execute a test program after being powered and send a test result to the controller via the second serial communication interface. The controller is configured to upload the test result to the test host. The application can improve the corresponding test efficiency.

Description

Technical Field

[0001] This application relates to the field of hard disk testing technology, specifically to a testing device and system for solid-state drives. Background Technology

[0002] After solid-state drives (SSDs) are manufactured, reliability verification testing (RDT) is typically performed to verify their performance. This involves inserting the SSD into a slot such as an M.2 socket, placing it in the corresponding test environment, and powering the slot (e.g., M.2 socket) to allow the SSD to execute the test program automatically. The SSD is then manually transferred to an M.2 socket on a computer to obtain the test results. This type of testing only supports a single device per round; batch verification requires repeated insertion and removal. Furthermore, the manual transfer process is prone to electrostatic discharge damage or physical impacts, affecting the yield rate. Utility Model Content

[0003] In view of this, this application provides a testing device and system for solid-state drives (SSDs) to solve the problem that the efficiency of traditional SSD testing schemes can easily affect the yield rate.

[0004] This application provides a solid-state drive (SSD) testing device, which is configured to connect to a test host and includes a controller, a power interface, and a hard drive slot. The controller's first communication interface is connected to the test host, and its first serial communication interface is connected to the hard disk slot's second serial communication interface; the hard disk slot's power supply interface is connected to the power supply interface. The hard drive slot is configured to connect to the input pin, output pin, and power supply pin of the hard drive under test. The third serial communication interface of the hard drive slot is connected to the input pin and the output pin. The power supply pin is configured to supply power to the hard drive under test after an external power source is connected to the power supply interface. The hard disk under test is configured to automatically execute the test program after receiving power, and send the test results to the controller via the second serial communication interface; The controller is configured to upload the test results to the test host.

[0005] Optionally, the first serial communication interface of the controller includes a transmitting end and a receiving end; the transmitting end of the controller is respectively connected to the receiving end of the second serial communication interface in multiple hard disk slots, and the receiving end of the controller is respectively connected to the transmitting end of the second serial communication interface in multiple hard disk slots.

[0006] Optionally, the testing equipment further includes diodes corresponding to each of the hard drive slots; the anode of the diode is connected to the receiving end of the controller, and the cathode is connected to the transmitting end of the corresponding hard drive slot.

[0007] Optionally, the test device further includes a pull-up resistor; the first end of the pull-up resistor is connected to the receiver of the controller and the anode of the diode, and the second end is configured to be connected to an external voltage; when the output pin of the hard disk under test is at a high level, the diode is cut off, and the external voltage connected to the pull-up resistor causes the receiver of the controller to receive a high level; when the output pin of the hard disk under test is at a low level, the diode is turned on, and the current formed by the external voltage connected to the pull-up resistor flows to the output pin, so that the receiver of the controller receives a low level.

[0008] Optionally, the test host is configured to send a burning file and a burning instruction to the controller; the controller is further configured to receive the burning file and the burning instruction, and burn the hard drive under test connected to the hard drive slot according to the burning file.

[0009] Optionally, the testing device further includes a switching transistor corresponding to each of the hard disk slots; the first end of the switching transistor is connected to the transmitting end of the controller, the second end is connected to the receiving end of the corresponding hard disk slot, and the control end is connected to the preset end of the controller; the switching transistor is configured to control the connection and disconnection between the transmitting end of the controller and the receiving end of the corresponding hard disk slot according to the control signal sent by the controller.

[0010] Optionally, the control signal includes an on signal and an off signal; the programming instruction includes the identification information of the hard disk to be programmed; the controller is further configured to send an on signal to the corresponding switching transistor and an off signal to other switching transistors according to the identification information of the hard disk to be programmed, and to program the test program to each currently connected hard disk according to the programming file.

[0011] Optionally, the solid-state drive testing equipment further includes a temperature detection module; the temperature detection module is connected to the controller and configured to detect the ambient temperature and send the ambient temperature to the controller; the controller is configured to associate the ambient temperature with the corresponding test result.

[0012] Optionally, the input pin is a first custom pin in the hard disk under test, which is configured as the receiving end of the UART interface; the output pin is a second custom pin in the hard disk under test, which is configured as the output end of the UART interface.

[0013] This application also provides a solid-state drive (SSD) testing system, including a test host and the SSD testing equipment described in any of the above embodiments. In the testing equipment and system for solid-state drives described in this application, the first serial communication interface of the controller can be connected to the input and output pins of the hard drive under test (DUT) through the second serial communication interface of the hard drive slot. This enables serial communication such as UART between the controller and the DUT connected to the hard drive slot. After receiving external power from the power supply interface of the hard drive slot, the DUT can automatically execute the test program and perform tests such as RDT (Reliability Test). The test results obtained are transmitted to the controller through the third serial communication interface and the second serial communication interface of the hard drive slot, so that the controller can upload the test results to the test host, thereby improving the corresponding test efficiency. Attached Figure Description

[0014] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0015] Figure 1 This is a schematic diagram of the test system structure of a solid-state drive according to an embodiment of this application; Figure 2 This is a schematic diagram of the test device structure for a solid-state drive according to an embodiment of this application; Figure 3 This is a schematic diagram of the test device structure for a solid-state drive according to another embodiment of this application; Figure 4 This is a schematic diagram of the test device structure for a solid-state drive according to another embodiment of this application; Figure 5 This is a schematic diagram of the test device structure for a solid-state drive according to another embodiment of this application; Figure 6 This is a schematic diagram of the test device structure for a solid-state drive according to another embodiment of this application. Detailed Implementation

[0016] The technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application. In the absence of conflict, the following embodiments and their technical features can be combined with each other.

[0017] This application provides a testing device for solid-state drives (SSDs), which can be installed within an SSD testing system. The SSD testing system may include devices such as a test host. (See reference...) Figure 1 As shown, the solid-state drive testing device 100 is configured to connect to the testing host 210 to test the connected hard drive 310 under the control of the testing host 210.

[0018] refer to Figure 2 As shown, the solid-state drive (SSD) testing device 100 includes a controller 110, a power interface 120, and a hard drive slot 130. The controller 110 can be implemented using a chip such as an MCU. The hard drive slot 130 may include slots such as M.2 slots for connecting SSDs.

[0019] The first communication interface of the controller 110 is connected to the test host 210, and the first serial communication interface of the controller 110 is connected to the second serial communication interface of the hard disk slot 130. Optionally, the first communication interface of the controller 110 includes a USB interface to establish a stable communication connection with the test host 210 via the USB interface. The first and second serial communication interfaces can be implemented using UART (Universal Asynchronous Receiver / Transmitter) interfaces, which can include a transmitting end (TX port) and a receiving end (RX port). The power supply interface of the hard drive slot 130 is connected to the power interface 120 to access an external power source. Optionally, the external power source may include a 3.3V power supply.

[0020] The hard drive slot 130 is configured to connect to the input pins, output pins, and power supply pins of the hard drive under test (DUT) 310. Optionally, the hard drive slot 130 also includes a third serial communication interface, which is correspondingly connected to the second serial communication interface to form a serial communication channel inside the hard drive slot 130, enabling the controller 110 and the DUT 310 to communicate through this serial communication channel. Specifically, the third serial communication interface includes a UART interface, which connects to the input pins and output pins of the DUT 310. Optionally, the third serial communication interface may include a transmitter and a receiver; the transmitter of the third serial communication interface is connected to the input pins of the DUT 310, and the receiver of the third serial communication interface is connected to the output pins of the DUT 310. The power supply pins of the hard drive slot 130 are configured to supply power to the DUT 310 after an external power supply is connected to the power supply interface.

[0021] The hard disk under test 310 is configured to automatically execute the test program after receiving power, and send the test results to the controller 110 via the third serial communication interface and the second serial communication interface of the hard disk slot 130.

[0022] The controller 110 is configured to upload test results to the test host 210 so that the test host 210 can obtain the test results of the hard disk 310 under test.

[0023] In the aforementioned solid-state drive testing device 100, the first serial communication interface of the controller 110 can be connected to the input and output pins of the hard drive under test 310 through the second and third serial communication interfaces of the hard drive slot 130, so that serial communication such as UART can be realized between the controller 110 and the hard drive under test 310 connected to the hard drive slot 130. In this way, after the hard drive under test 310 receives external power from the power supply interface of the hard drive slot 130, it can automatically execute the test program and perform tests such as RDT (Reliability Verification Test). The test results obtained are transmitted to the controller 110 through the third and second serial communication interfaces of the hard drive slot 130, so that the controller 110 can upload the test results to the test host 210, which can improve the corresponding test efficiency.

[0024] In some embodiments, the first serial communication interface of the controller 110 includes a transmitter (such as...) Figure 2 (as shown in TX) and receiver (e.g.) Figure 2 (as shown in RX).

[0025] In the controller 110, the transmitting end of the first serial communication interface is connected to the receiving end of the second serial communication interface, and the receiving end of the first serial communication interface is connected to the transmitting end of the second serial communication interface, so that the communication connection between the first serial communication interface and the second serial communication interface is reliable, and the controller 110 can stably read the corresponding content from the hard disk 310 under test connected to the hard disk slot 130.

[0026] Optionally, refer to Figure 3 As shown, the controller 110 connects to multiple hard drive slots 130 simultaneously, so that the hard drives 310 under test connected to the multiple hard drive slots 130 can simultaneously execute corresponding test jobs and obtain their respective test results. The controller 110 can read each test result in sequence to further improve test efficiency.

[0027] Specifically, the transmitting end of the controller 110 is connected to the receiving end of the second serial communication interface in multiple hard disk slots 130, and the receiving end of the controller 110 is connected to the transmitting end of the second serial communication interface in multiple hard disk slots 130, so that the controller 110 can simultaneously establish a serial communication channel directly with each hard disk slot 130.

[0028] The inventors studied the scheme where the controller 110 is connected to the corresponding hard disk 310 under test through multiple hard disk slots 130. They found that when the controller 110 sends information, since the transmitting end of the first serial communication interface in the controller 110 is connected to the receiving end of multiple solid-state drives (i.e., the first serial communication interface), and the receiving end of each solid-state drive is in the receiving state, they can all receive the information sent by the transmitting end in the controller 110 normally. However, when the solid-state drives send test data (such as test results), since the transmitting ends of multiple solid-state drives are connected together, when one solid-state drive transmitting end sends information, the transmitting end of another solid-state drive does not send information. The transmitting end of the solid-state drive that does not send information is in an idle state and is at a high level, which will affect the solid-state drive that sends information, causing the solid-state drive that needs to send information to be unable to send information to the receiving end of the controller 110.

[0029] Based on the above research, in some examples, reference Figure 4 As shown, the solid-state drive testing device 100 also includes diodes D corresponding to each hard drive slot 130. The anode of diode D is connected to the receiving end of controller 110, and the cathode of diode D is connected to the transmitting end of the corresponding hard drive slot 130, so that the level signal of the receiving end of controller 110 can follow the level signal at the transmitting end of the corresponding hard drive slot 130.

[0030] Furthermore, the solid-state drive test apparatus 100 also includes a pull-up resistor R. The first end of the pull-up resistor R is connected to the receiver of the controller 110 and the anode of the diode D, and the second end of the pull-up resistor R is configured to connect to an external voltage. This external voltage can be a voltage provided by an external power supply such as a 3.3V power supply.

[0031] When the output pin of the hard drive under test 310 is at a high level, diode D is cut off, and the external voltage connected to the pull-up resistor R causes the receiver of controller 110 to receive a high level. When the output pin of the hard drive under test 310 is at a low level, diode D is turned on, and the current formed by the external voltage connected to the pull-up resistor R flows to the output pin of the hard drive under test 310, causing the receiver of controller 110 to receive a low level. In this way, the signal received by the receiver of controller 110 is consistent with the signal at the output pin of the hard drive under test 310, and the signal at the receiver of the first serial communication interface in controller 110 can accurately represent the signal at the corresponding output pin of the hard drive under test 310 (i.e., the signal at the transmitter of hard drive slot 130).

[0032] Specifically, with Figure 4The test equipment for the solid-state drive (SSD) illustrates the signal changes at each terminal during actual operation: When the SSD 310 is not sending information, its output pin is high, the transmitter of the hard drive slot 130 is also high, and the receiver of the controller 110 is weakly pulled up, allowing it to follow the high-level state of the transmitter of the hard drive slot 130. At this time, the receiver of the controller 110 is in a waiting-to-receive state. When the SSD 310 outputs information, a low-level signal is first sent from its output pin. At this time, diode D conducts, i.e., 3.3V (external voltage) - R - diode anode - diode cathode - output pin, the voltage at the output pin T is 0V. Therefore, the voltage received by the receiver of the controller 110 is 0V plus the voltage drop across diode D (or 0.3V). Thus, the receiver of the controller 110 can correctly receive the low-level signal.

[0033] Optionally, diode D is a Schottky diode, which has the advantages of low forward voltage drop and fast response speed, thereby improving the signal response efficiency of controller 110.

[0034] In some embodiments, the test host 210 is configured to send a burning file and a burning instruction to the controller. The controller 110 is also configured to receive the burning file and the burning instruction, and burn the hard drive under test 310 connected to the hard drive slot 130 according to the burning file, so that the controller 110 can burn the test program to the hard drive under test 310 in real time under the control of the test host 210.

[0035] In some examples, reference Figure 5 As shown, the solid-state drive testing device 100 also includes a switching transistor Q corresponding to each hard drive slot 130. The first end of the switching transistor Q is connected to the transmitting end of the controller 110, the second end of the switching transistor Q is connected to the receiving end of the corresponding hard drive slot 130, and the control end of the switching transistor Q is connected to the preset end of the controller 110.

[0036] The switching transistor Q is configured to control the connection and disconnection between the transmitting end of the controller 110 and the receiving end of the corresponding hard disk slot 130 according to the control signal sent by the controller 110. When it is necessary to program one or more hard disk slots 130 connected to the hard disk 130 under test, the corresponding switching transistor Q is turned on by the control signal and other switching transistors Q are turned off, so as to achieve selective programming of the hard disk 130 under test.

[0037] The switching transistor Q can be a MOSFET, and the control terminal of the switching transistor Q can be the gate of the MOSFET. The first terminal of the switching transistor Q is one of the source and drain terminals of the MOSFET, and the second terminal of the switching transistor Q is the other of the source and drain terminals of the MOSFET. Optionally, the preset terminal of the controller 110 can be a GPIO port, and the corresponding control signals include an on signal (such as a high level) and an off signal (such as a low level). In this case, the controller 110 can send a high level to the switching transistor Q corresponding to the hard disk under test 130 that needs to be programmed, and send a low level to other switching transistors Q.

[0038] In some examples, the control signals include on and off signals; the programming instructions include the identification information of the hard drive to be programmed. The controller 110 is also configured to send an on signal to the corresponding switch Q and an off signal to other switch Qs based on the identification information of the hard drive to be programmed, and to program the test program to each currently connected hard drive according to the programming file, thereby accurately programming the corresponding hard drive based on its identification information and improving the reliability of the programming process.

[0039] In some embodiments, the solid-state drive testing device 100 can pre-program the test program from the test host 210, and automatically test it after powering on and placing it in the corresponding test environment.

[0040] In some examples, the solid-state drive (SSD) test device 100 also includes a temperature detection module 140. The temperature detection module 140 is connected to the controller 110 and can be positioned near the SSD 310 under test to detect the ambient temperature of the SSD 310 in real time during testing. The temperature detection module 140 is configured to detect the ambient temperature of the SSD 310 and send the ambient temperature data to the controller 110.

[0041] The controller 110 is configured to associate the ambient temperature with the corresponding test results so that the test results can carry the ambient temperature when the corresponding hard drive 310 under test is performing the test, which is more complete and especially suitable for reliability testing and other test work that requires recording the ambient temperature.

[0042] Specifically, reliability testing can be conducted at different temperatures. When reliability testing is performed, the controller 110 detects the ambient temperature of the hard drive 310 under test through the temperature detection module 140 and records the ambient temperature data to the test results of the hard drive 310 under test. This ensures that the test results can be attributed to the corresponding test temperature conditions, improves the orderliness of the recorded test results, and avoids confusion in subsequent test data.

[0043] In some embodiments, the input pin is a first custom pin in the hard disk under test 310. The first custom pin can be configured as the receiver of the UART interface (such as RX) so that the hard disk under test 310 receives data sent by the controller 110 through its first serial communication interface via the third serial communication interface and the second serial communication interface of the hard disk slot 130.

[0044] The output pin is the second custom pin in the hard disk under test 310. The second custom pin is configured as the output terminal of the UART interface (such as TX) so that the hard disk under test 310 can send test results and other data to the controller 110 through the third serial communication interface and the second serial communication interface of the hard disk slot 130.

[0045] It should be noted that the first custom pin and the second custom pin are reserved pins for M.2 interface solid-state drives, and the user can define the use of these pins.

[0046] In this embodiment, the hard disk under test 310 can interact with the controller 110 via UART to transmit test results and other data, which can further improve the testing efficiency of the hard disk under test 310.

[0047] In the solid-state drive testing device 100 described above, the first serial communication interface of the controller 110 can be connected to the input and output pins of the hard drive under test 310 through the second serial communication interface of the hard drive slot 130, so that serial communication such as UART can be realized between the controller 110 and the hard drive under test 310 connected to the hard drive slot 130. In this way, after the hard drive under test 310 is powered by the external power supply connected to the power supply interface of the hard drive slot 130, it can automatically execute the test program and perform tests such as RDT (Reliability Verification Test). The test results obtained are transmitted to the controller 110 through the third serial communication interface and the second serial communication interface of the hard drive slot 130, so that the controller 110 can upload the test results to the test host 210, which can improve the corresponding test efficiency.

[0048] This application also provides a solid-state drive (SSD) testing system, including a test host and the SSD testing equipment described in any of the above embodiments. The above-mentioned solid-state drive testing system, including the solid-state drive testing equipment described in any of the above embodiments, has all the beneficial effects of the solid-state drive testing equipment described in any of the above embodiments, and will not be repeated here.

[0049] Although this application has been shown and described with respect to one or more implementations, equivalent variations and modifications will occur to those skilled in the art based on a reading and understanding of this specification and the accompanying drawings. This application includes all such modifications and variations and is limited only by the scope of the appended claims. In particular, with respect to the various functions performed by the aforementioned components, the terminology configured to describe such components is intended to correspond to any component (unless otherwise indicated) that performs the specified function of said component (e.g., is functionally equivalent to it), even if structurally not equivalent to the disclosed structure performing the functions in the exemplary implementations of this specification shown herein.

[0050] That is, the above description is only an embodiment of this application and does not limit the patent scope of this application. Any equivalent structural or procedural changes made using the content of this application’s specification and drawings, such as the combination of technical features between different embodiments, or direct or indirect application in other related technical fields, are similarly included within the patent protection scope of this application.

[0051] Furthermore, it should be understood that in the description of this application, the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," and "outer," etc., indicating the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application. Additionally, for structural elements with the same or similar characteristics, this application may use the same or different reference numerals for identification. Moreover, the terms "first" and "second" are configured only for descriptive purposes and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, features defined with "first" and "second" may explicitly or implicitly include one or more features. In the description of this application, "multiple" means two or more, unless otherwise explicitly specified.

[0052] In this application, the term "exemplary" is used to mean "serving as an example, illustration, or description." Any embodiment described as "exemplary" in this application is not necessarily to be construed as more preferred or advantageous than other embodiments. This application has been provided above to enable any person skilled in the art to make and use it. Various details have been set forth in the above description for purposes of explanation. It should be understood that those skilled in the art will recognize that this application can be implemented without using these specific details. In other embodiments, well-known structures and processes are not described in detail to avoid obscuring the description of this application with unnecessary detail. Therefore, this application is not intended to be limited to the embodiments shown, but is consistent with the broadest scope of the principles and features disclosed in this application.

Claims

1. A testing device for solid-state drives, the testing device being configured to connect to a testing host, characterized in that, The testing equipment includes a controller, a power interface, and a hard drive slot; The controller's first communication interface is connected to the test host, and its first serial communication interface is connected to the hard disk slot's second serial communication interface; the hard disk slot's power supply interface is connected to the power supply interface. The hard drive slot is configured to connect to the input pin, output pin, and power supply pin of the hard drive under test. The third serial communication interface of the hard drive slot is connected to the input pin and the output pin. The power supply pin is configured to supply power to the hard drive under test after an external power source is connected to the power supply interface. The hard disk under test is configured to automatically execute the test program after receiving power, and send the test results to the controller via the second serial communication interface; The controller is configured to upload the test results to the test host.

2. The testing equipment for solid-state drives according to claim 1, characterized in that, The controller's first serial communication interface includes a transmitter and a receiver; The transmitting end of the controller is connected to the receiving end of the second serial communication interface in multiple hard disk slots, and the receiving end of the controller is connected to the transmitting end of the second serial communication interface in multiple hard disk slots.

3. The testing equipment for solid-state drives according to claim 2, characterized in that, The testing equipment also includes diodes corresponding to each of the hard drive slots; The anode of the diode is connected to the receiver of the controller, and the cathode is connected to the transmitter of the corresponding hard disk slot.

4. The testing equipment for solid-state drives according to claim 3, characterized in that, The test equipment also includes pull-up resistors; The first end of the pull-up resistor is connected to the receiver of the controller and the anode of the diode, and the second end is configured to be connected to an external voltage. When the output pin of the hard disk under test is set to a high level, the diode is cut off, and the external voltage connected to the pull-up resistor causes the receiver of the controller to receive a high level. When the output pin of the hard disk under test is set to a low level, the diode is turned on, and the current formed by the external voltage connected to the pull-up resistor flows to the output pin so that the receiver of the controller receives a low level.

5. The testing equipment for solid-state drives according to claim 2, characterized in that, The test host is configured to send burning files and burning instructions to the controller; The controller is also configured to receive the burning file and the burning instruction, and to burn the hard drive under test connected to the hard drive slot according to the burning file.

6. The testing equipment for solid-state drives according to claim 5, characterized in that, The testing equipment also includes switching transistors corresponding to each of the hard drive slots; The first end of the switching transistor is connected to the transmitting end of the controller, the second end is connected to the receiving end of the corresponding hard disk slot, and the control end is connected to the preset end of the controller. The switching transistor is configured to control the connection and disconnection between the transmitting end of the controller and the receiving end of the corresponding hard disk slot according to the control signal sent by the controller.

7. The testing equipment for solid-state drives according to claim 6, characterized in that, The control signals include an on signal and an off signal; the burning command includes the identification information of the hard disk to be burned. The controller is also configured to send an on signal to the corresponding switching transistor and an off signal to other switching transistors according to the identification information of the hard disk to be burned, and to burn the test program to each hard disk to be burned to the currently connected hard disk according to the burning file.

8. The testing equipment for solid-state drives according to claim 1, characterized in that, The testing equipment for the solid-state drive also includes a temperature detection module; The temperature detection module is connected to the controller and is configured to detect the ambient temperature and send the ambient temperature to the controller. The controller is configured to associate the ambient temperature with the corresponding test results.

9. The testing equipment for solid-state drives according to claim 1, characterized in that, The input pin is the first custom pin in the hard disk under test, and the first custom pin is configured as the receiving end of the UART interface; The output pin is the second custom pin in the hard drive under test, and the second custom pin is configured as the output terminal of the UART interface.

10. A testing system for solid-state drives, characterized in that, The test device includes a test host and a solid-state drive as described in any one of claims 1 to 9.

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