A tool for measuring the response time of an LCOS chip liquid crystal.

By using a laser and an adjustable base structure to measure the response time of LCOS chips, the problems of synchronization error and human error in traditional testing methods have been solved, and high-precision measurement of LCOS chip response time has been achieved.

CN224945609UActive Publication Date: 2026-11-06CHONGQING JINGFAN OPTOELECTRONICS TECHNOLOGY CO LTD
View PDF 0 Cites 0 Cited by

Patent Information

Application Number
CN202521395779.1
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-07-03
Publication Date
2026-11-06
Estimated Expiration
2035-07-03

AI Technical Summary

Technical Problem

Traditional LCOS chip response time testing methods suffer from voltage abrupt changes and optical detection synchronization errors, leading to time offsets and errors introduced by human judgment, resulting in significant deviations in the final estimate.

Method used

The measurement tool, consisting of a laser, an LCOS chip driver board, a PBS polarizing beam splitter, a photodetector, a data acquisition card, and a processor, achieves response time measurement of the LCOS chip by providing a periodic square wave drive signal and precise photoelectric signal conversion, combined with an adjustable base structure.

Benefits of technology

It effectively reduces voltage surges and time shifts in optical detection, accurately identifies the start/end point of waveforms, improves the accuracy and consistency of response time testing, and reduces errors.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN224945609U_ABST
    Figure CN224945609U_ABST
Patent Text Reader

Abstract

This utility model relates to the field of chip testing, specifically disclosing a tool for measuring the liquid crystal response time of an LCOS chip. The tool includes a laser; an LCOS chip driver board; a fixture; a PBS polarizing beam splitter, the laser beam emitted by the laser being directed onto the PBS polarizing beam splitter, which reflects the laser onto the LCOS chip under test; a photodetector receiving the light transmitted from the PBS polarizing beam splitter; a data acquisition card electrically connected to the photodetector; a processor loaded with response time testing software, electrically connected to the data acquisition card; and a base, on which the laser, fixture, PBS polarizing beam splitter, and photodetector are all mounted; a support assembly is provided between the PBS polarizing beam splitter and the base. This solution effectively reduces voltage fluctuations and optical detection time offsets, while also accurately identifying the start / end point of the waveform, reducing the acquisition error of rise and fall times, and thus reducing the response time error of the LCOS chip under test.
Need to check novelty before this filing date? Find Prior Art

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, and in particular to a tool for measuring the response time of an LCOS chip liquid crystal. Background Technology

[0002] LCOS (Liquid Crystal on Silicon) is a novel reflective display technology. Its principle involves using an LCOS panel to control light. A CMOS chip serves as the circuit substrate and reflective layer. Liquid crystal is injected between the CMOS integrated circuit chip and a transparent glass substrate. Light passes through the glass substrate and the liquid crystal material, and after dimming, is reflected from the chip surface. By injecting different types of liquid crystal and setting different operating modes, amplitude and phase modulation of different wavelengths of light can be achieved. Because LCOS possesses high contrast, high resolution, high light utilization, and wide-amplitude wavelength adjustment capabilities, it has a wide range of market applications; therefore, it is particularly suitable for applications requiring high resolution, low power consumption, and integration into confined spaces.

[0003] LCOS chips require response time testing, which typically involves measuring the time it takes for a pixel to transition from black to white (rise time) and from white to black (fall time). Response time is an important indicator of image transformation speed and the smoothness of moving images, and is generally better the lower it is. By accurately measuring these time parameters, the performance of the LCOS chip can be optimized, motion blur can be reduced, and display quality can be improved.

[0004] Traditional response time testing methods involve applying a voltage step (e.g., from 0V to saturation voltage) to drive liquid crystal molecules to twist, while a photodetector records the change in transmittance over time to calculate the response time. However, the following problems are prone to occur during this testing process:

[0005] 1. Voltage surges and synchronization errors in optical detection can cause time shifts, making it difficult to synchronize the step start point;

[0006] 2. When testers manually mark the start / end point by observing the oscilloscope waveform or the software interface, they rely on subjective judgment. After the testers see the waveform change, they move the cursor. The reaction time may introduce additional errors, and there is poor consistency between different operators.

[0007] The combination of these errors will lead to a significant deviation in the final valuation. Utility Model Content

[0008] To address the shortcomings of existing technologies, this invention provides a tool for measuring the response time of LCOS chips, thereby solving the problem that traditional response time testing methods can lead to significant deviations in the final response time estimate.

[0009] To achieve the above objectives, the basic solution of this utility model is as follows: A tool for measuring the response time of an LCOS chip liquid crystal, comprising:

[0010] Laser;

[0011] An LCOS chip driver board that provides periodic square wave drive signals to the LCOS chip under test;

[0012] A fixture for holding the LCOS chip under test;

[0013] A PBS polarization beam splitter is used to direct a laser beam emitted by a laser source onto the PBS polarization beam splitter, which then reflects the laser beam onto the LCOS chip under test.

[0014] A photodetector that receives light transmitted from a PBS polarizing beam splitter.

[0015] The data acquisition card is electrically connected to the photodetector.

[0016] The processor is equipped with response time testing software and is electrically connected to the data acquisition card.

[0017] The base, laser, fixture, PBS polarizing beam splitter and photodetector are all mounted on the base with adjustable position and height;

[0018] A support assembly is provided between the PBS polarizing beam splitter and the base. The support assembly includes a support column, a sliding seat, three fixed seats, and a sliding component that controls the horizontal movement of the sliding seat. The sliding component includes a lead screw and a ball nut. The support column is vertically arranged, and the PBS polarizing beam splitter is mounted on the top of the support column. The sliding seat is welded to the lower end of the support column. The four fixed seats are arranged sequentially from bottom to top, with the sliding seat located on the top fixed seat. At the same time, the lead screw is horizontally arranged, and both ends of the lead screw are rotatably connected to the top fixed seat. The ball nut is coaxially mounted and fitted on the lead screw, and the outer wall of the ball nut is welded to the sliding seat.

[0019] The technical principle of this invention is as follows: Before performing response time testing on the LCOS chip under test, the laser, LCOS chip driver board, fixture, PBS polarization beam splitter, photodetector, and data acquisition card are arranged and installed on the base according to the requirements of the response time test. During this process, the position and height of the laser, fixture, PBS polarization beam splitter, and photodetector can be adjusted so that the position of the laser, fixture, and photodetector is adapted to the position of the PBS polarization beam splitter, which facilitates subsequent response time testing. The increased adjustability of the laser, fixture, PBS polarization beam splitter, and photodetector on the base can improve the test accuracy during subsequent response time testing.

[0020] During testing, the laser power is switched on, and then the LCOS chip driver board and photodetector power are turned on. The laser beam emitted by the laser shines directly onto the PBS polarization beam splitter. The PBS polarization beam splitter reflects the incoming laser beam onto the LCOS chip under test. The liquid crystal of the LCOS chip under test modulates the laser light, and the light is reflected back to the PBS polarization beam splitter. This portion of the laser light is then transmitted to the photodetector, where the optical signal is converted into an electrical signal. The data acquisition card converts the analog electrical signal into a digital signal, which is then transmitted to the processor. The rise time and fall time are read from the response time testing software. By measuring the rise time and fall time, the response time of the LCOS chip under test can be obtained. In this process, voltage surges and optical detection time offsets can be effectively reduced, and the start / end point of the waveform can be accurately identified, reducing the acquisition error of rise time and fall time, thereby reducing the response time error of the LCOS chip under test.

[0021] The support column and several fixed seats can stably support the PBS polarizing beam splitter. When it is necessary to fine-tune the position of the PBS polarizing beam splitter, the position of the support column and the sliding seat on the top fixed seat can be adjusted by sliding the component. This allows the PBS polarizing beam splitter to also have the ability to adjust its horizontal position, making the LCOS chip liquid crystal response time measurement tool more adjustable and more adaptable to use.

[0022] When adjusting the position of the PBS polarizing beam splitter, the lead screw is rotated. The rotational force of the lead screw is converted into the force that drives the sliding seat to move horizontally along the axis of the lead screw under the action of the ball nut. This allows for fine adjustment of the horizontal position of the support column, the sliding seat and the PBS polarizing beam splitter, which is convenient.

[0023] Furthermore, both the LCOS chip driver board and the data acquisition card are mounted on the base in adjustable positions.

[0024] The above settings allow for a more compact integration of all components in the LCOS chip liquid crystal response time measurement tool onto the base, and also facilitate a neater arrangement of the LCOS chip driver board and data acquisition card on the base.

[0025] Furthermore, the base has several vertically penetrating mounting holes, through which the laser, fixture, PBS polarizing beam splitter, photodetector, LCOS chip driver board, and data acquisition card can be detachably connected.

[0026] The above-mentioned configuration, including the installation of several mounting holes, makes the installation and adjustment of the laser, fixture, PBS polarizing beam splitter, photodetector, LCOS chip driver board, and data acquisition card with the base more convenient and reliable.

[0027] Furthermore, a first lifting rod adjustment rod is provided between the laser and the base. The first lifting rod adjustment rod is set vertically, the laser is installed at the top of the first lifting rod adjustment rod, and the lower end of the first lifting rod adjustment rod is detachably connected to the mounting hole of the base.

[0028] With the above settings, the first lifting rod adjustment rod can adjust the lifting height of the laser, making the relative position of the laser and the PBS polarization beam splitter more precise.

[0029] Furthermore, a second lifting rod adjustment rod is provided between the clamp and the base. The second lifting rod adjustment rod is set vertically, and the clamp is installed at the top of the second lifting rod adjustment rod. The lower end of the second lifting rod adjustment rod is detachably connected to the mounting hole of the base.

[0030] With the above settings, the second lifting rod adjustment rod can adjust the lifting height of the clamp and the LCOS chip under test, so that the relative position of the LCOS chip under test and the PBS polarization beam splitter is more accurate.

[0031] Furthermore, a third lifting rod is provided between the photodetector and the base. The third lifting rod is set vertically, and the photodetector is installed at the top of the third lifting rod. The lower end of the third lifting rod is detachably connected to the mounting hole of the base.

[0032] With the above settings, the third lifting rod adjustment rod can adjust the lifting height of the photodetector and the LCOS chip under test, making the relative position of the photodetector and the PBS polarization beam splitter more accurate.

[0033] Furthermore, a protrusion and a groove for the protrusion on the adjacent fixed seat are fixedly provided between two adjacent fixed seats.

[0034] The above settings facilitate the matching installation of protrusions and grooves when several fixed seats overlap and fit together. The matching of protrusions and grooves can limit the overlapping installation of several fixed seats, making the matching between several fixed seats more precise.

[0035] Furthermore, a USB interface module connects the data acquisition card to the processor.

[0036] The above settings facilitate the transmission of digital signals acquired by the data acquisition card via the USB interface module, which offers high compatibility. Attached Figure Description

[0037] Figure 1 This is a schematic diagram of the axial side structure of an LCOS chip liquid crystal response time measuring tool according to an embodiment of the present invention.

[0038] Figure 2This is an interface diagram of the response time testing software in an LCOS chip liquid crystal response time measurement tool according to an embodiment of this utility model.

[0039] Figure 3 for Figure 1 Enlarged view of the PBS polarizing beam splitter and support assembly.

[0040] In the above figures: base 10, mounting hole 101, laser 20, first lifting rod adjustment rod 201, LCOS chip driver board 30, fixture 40, second lifting rod adjustment rod 401, PBS polarizing beam splitter 50, photodetector 60, third lifting rod 601, data acquisition card 70, clamping screw 80, support column 901, sliding seat 902, fixed seat 903, protrusion 904, groove 905, lead screw 906, ball nut 907. Detailed Implementation

[0041] The technical solution of this utility model will be further described below with reference to the accompanying drawings and embodiments.

[0042] This embodiment is basically as follows: Figure 1 , Figure 2 and Figure 3 As shown, this utility model embodiment proposes an LCOS chip liquid crystal response time measurement tool, including a laser 20, an LCOS chip driver board 30, a clamp 40 for holding the LCOS chip under test, a PBS polarizing beam splitter 50, a photodetector 60, a data acquisition card 70, a base 10, a processor loaded with response time testing software, and a display. Figure 1 As shown, the laser beam emitted by laser 20 can be directed onto PBS polarization beam splitter 50, which can reflect the laser beam onto the LCOS chip under test. Photodetector 60 receives the light emitted from the LCOS chip under test and transmitted through PBS polarization beam splitter 50. Data acquisition card 70 is electrically connected to photodetector 60. Processor is electrically connected to data acquisition card 70 and display. A USB interface module is connected between data acquisition card 70 and processor.

[0043] like Figure 1 As shown, the laser 20, fixture 40, PBS polarizing beam splitter 50 and photodetector 60 are all mounted on the base 10 with adjustable position and height. The LCOS chip driver board 30 and data acquisition card 70 are also mounted on the base 10 with adjustable position.

[0044] like Figure 1As shown, the base 10 has several vertically penetrating mounting holes 101. The laser 20, clamp 40, PBS polarizing beam splitter 50, photodetector 60, LCOS chip driver board 30, and data acquisition card 70 are all detachably connected to the mounting holes 101 of the base 10 by screws. A first lifting rod adjustment rod 201 is provided between the laser 20 and the base 10. The first lifting rod adjustment rod 201 is vertically arranged, and the laser 20 is mounted on the top of the first lifting rod adjustment rod 201. The lower end of the first lifting rod adjustment rod 201 is detachably connected to the mounting holes 101 of the base 10 by screws. The clamp 40... A second lifting rod adjusting rod 401 is provided between the base 10 and the base 10. The second lifting rod adjusting rod 401 is set vertically. The clamp 40 is installed on the top of the second lifting rod adjusting rod 401. The lower end of the second lifting rod adjusting rod 401 is detachably connected to the mounting hole 101 of the base 10 by screws. A third lifting rod 601 adjusting rod is provided between the photodetector 60 and the base 10. The third lifting rod 601 adjusting rod is set vertically. The photodetector 60 is installed on the top of the third lifting rod 601 adjusting rod. The lower end of the third lifting rod 601 adjusting rod is detachably connected to the mounting hole 101 of the base 10 by screws.

[0045] At the same time, such as Figure 1 As shown, the structures of the first lifting rod adjusting rod 201, the second lifting rod adjusting rod 401, and the third lifting rod 601 are all the same, and each of the first lifting rod adjusting rod 201, the second lifting rod adjusting rod 401, and the third lifting rod 601 is provided with a locking screw 80 of the specified length at the middle part.

[0046] like Figure 1 and Figure 3 As shown, a support assembly is provided between the PBS polarizing beam splitter 50 and the base 10. The support assembly includes a support column 901, a sliding seat 902, three fixed seats 903, and a sliding component that controls the horizontal movement of the sliding seat 902. The sliding component includes a lead screw 906 and a ball nut 907. The support column 901 is vertically arranged, and the PBS polarizing beam splitter 50 is mounted on the top of the support column 901. The sliding seat 902 is welded to the lower end of the support column 901. The four fixed seats 903 are arranged sequentially from bottom to top, with the sliding seat 902 located on the top fixed seat 903. Meanwhile, as shown... Figure 3 As shown, the lead screw 906 is horizontally set, and both ends of the lead screw 906 are rotatably connected to the top fixed seat 903; the ball nut 907 is coaxially mounted on the lead screw 906, and the outer wall of the ball nut 907 is welded to the sliding seat 902.

[0047] like Figure 3 As shown, a protrusion 904 and a groove 905 for the protrusion 904 on the adjacent fixed base 903 are fixedly provided between two adjacent fixed bases 903.

[0048] In addition, such as Figure 1 As shown, the fixture 40 is a fixed frame, and the inner wall of the fixed frame is in the shape of stepped through holes, which makes it easy to embed the LCOS chip under test into the fixed frame.

[0049] In this embodiment, an LCOS chip liquid crystal response time measuring tool is used by first aligning the laser 20, LCOS chip driver board 30, fixture 40, PBS polarizing beam splitter 50, photodetector 60, data acquisition card 70, first lifting rod adjustment rod 201, second lifting rod adjustment rod 401, and third lifting rod adjustment rod 601 as follows: Figure 1 The installation is arranged as shown, with screws installed at the lower ends of the first lifting rod adjusting rod 201, the second lifting rod adjusting rod 401, and the third lifting rod 601 at the mounting holes 101 of the base 10.

[0050] Then, according to the requirements of the response time test and the installation height of the PBS polarizing beam splitter 50, the heights of the first lifting rod 201, the second lifting rod 401, and the third lifting rod 601 are adjusted, thereby synchronously adjusting the heights of the laser 20, the fixture 40, and the photodetector 60, so that the positions of the laser 20, the fixture 40, and the photodetector 60 are adapted to the position of the PBS polarizing beam splitter 50, which facilitates subsequent response time testing.

[0051] The LCOS chip under test is then mounted onto the fixture 40, and the LCOS chip under test is connected to the LCOS chip driver board 30. The LCOS chip driver board 30 provides a periodic square wave drive signal to the LCOS chip under test.

[0052] During the response time test, the power supply to the laser 20 is turned on, and the optical path is adjusted so that the light spot is approximately centered on the surface of the LCOS chip under test and the surface of the photodetector 60. Then, the power supplies to the LCOS chip driver board 30 and the photodetector 60 are turned on, and the data acquisition card 70 is connected to the processor via the USB interface module. The response time test software is then started, and the display shows the following: Figure 2 The response time test software interface is shown. During the entire test, the laser beam emitted by the laser 20 shines directly onto the PBS polarization beam splitter 50. The PBS polarization beam splitter 50 reflects the incident laser beam onto the LCOS chip under test. After the liquid crystal of the LCOS chip under test modulates the laser light, it is reflected back to the PBS polarization beam splitter 50. This part of the laser light is then transmitted to the photodetector 60, which converts the optical signal into an electrical signal. The data acquisition card 70 converts the analog electrical signal into a digital signal, which is then transmitted to the processor via the USB interface module. The rise time and fall time are read through the response time test software interface on the display screen. Finally, the waveform is read through the response time test software, and the response time of the LCOS chip under test can be obtained by measuring the rise time and fall time.

[0053] Throughout the testing process, the horizontal positions of the laser 20, LCOS chip driver board 30, fixture 40, PBS polarizing beam splitter 50, photodetector 60, and data acquisition card 70 mounted on the base 10 can be precisely adjusted. Simultaneously, the adjustment rods 201, 401, and 601 ensure that the vertical height of the laser 20, the LCOS chip under test, and the photodetector 60 is matched with that of the PBS polarizing beam splitter 50. This makes position adjustment convenient, precise, and reliable, facilitating the acquisition of accurate test data.

[0054] With the cooperation of photodetector 60, data acquisition card 70, response time testing software and processor, laser reception can be effectively converted from optical signal to electrical signal. Then, the rise time and fall time can be accurately read by the response time testing software, which can effectively reduce voltage surges and time offset of optical detection. At the same time, the start / end point of the waveform can be accurately viewed, reducing the acquisition error of rise time and fall time, thereby reducing the response time error of the LCOS chip under test.

[0055] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this utility model and are not intended to limit it. Although this utility model has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of this utility model without departing from the spirit and scope of the technical solutions of this utility model, and all such modifications or substitutions should be covered within the scope of the claims of this utility model.

Claims

1. An LCOS chip liquid crystal response time measurement tool, characterized in that, include: Laser; An LCOS chip driver board that provides periodic square wave drive signals to the LCOS chip under test; A fixture for holding the LCOS chip under test; A PBS polarization beam splitter is used to direct the laser beam emitted by the laser to the PBS polarization beam splitter, which can then reflect the laser beam onto the LCOS chip under test. A photodetector that receives light transmitted from a PBS polarizing beam splitter; A data acquisition card, wherein the data acquisition card is electrically connected to the photodetector; A processor equipped with response time testing software, the processor being electrically connected to a data acquisition card; The laser, fixture, PBS polarizing beam splitter, and photodetector are all mounted on the base with adjustable position and height. A support assembly is provided between the PBS polarizing beam splitter and the base. The support assembly includes a support column, a sliding seat, three fixed seats, and a sliding component that controls the horizontal movement of the sliding seat. The sliding component includes a lead screw and a ball nut. The support column is vertically arranged, and the PBS polarizing beam splitter is mounted on the top of the support column. The sliding seat is welded to the lower end of the support column. The four fixed seats are arranged sequentially from bottom to top, with the sliding seat located on the top fixed seat. At the same time, the lead screw is horizontally arranged, and both ends of the lead screw are rotatably connected to the top fixed seat. The ball nut is coaxially mounted and fitted on the lead screw, and the outer wall of the ball nut is welded to the sliding seat.

2. The LCOS chip liquid crystal response time measurement tool of claim 1, wherein, Both the LCOS chip driver board and the data acquisition card are mounted on the base in adjustable positions.

3. The LCOS chip liquid crystal response time measurement tool of claim 2, wherein, The base has several vertically penetrating mounting holes, and the laser, fixture, PBS polarizing beam splitter, photodetector, LCOS chip driver board and data acquisition card are all detachably connected to the mounting holes of the base.

4. The LCOS chip liquid crystal response time measurement tool of claim 3, wherein, A first lifting rod adjustment rod is provided between the laser and the base. The first lifting rod adjustment rod is set vertically, and the laser is installed at the top of the first lifting rod adjustment rod. The lower end of the first lifting rod adjustment rod is detachably connected to the mounting hole of the base.

5. The LCOS chip liquid crystal response time measurement tool of claim 3, wherein, A second lifting rod adjustment rod is provided between the clamp and the base. The second lifting rod adjustment rod is set vertically, and the clamp is installed at the top of the second lifting rod adjustment rod. The lower end of the second lifting rod adjustment rod is detachably connected to the mounting hole of the base.

6. The LCOS chip liquid crystal response time measurement tool of claim 3, wherein, A third lifting rod is provided between the photodetector and the base. The third lifting rod is set vertically, and the photodetector is installed at the top of the third lifting rod. The lower end of the third lifting rod is detachably connected to the mounting hole of the base.

7. The LCOS chip liquid crystal response time measurement tool of claim 3, wherein, A protrusion and a groove for the protrusion on the adjacent fixed seat to be inserted are fixedly provided between two adjacent fixed seats.

8. The LCOS chip liquid crystal response time measurement tool of any one of claims 1-7, wherein, The data acquisition card is connected to the processor via a USB interface module.