Tensile testing apparatus for multi-chip devices

Abstract

This utility model relates to the field of tensile testing technology for chip devices, specifically disclosing a tensile testing device for multi-chip devices. The device includes a tensile machine body, a tensile mold, and a tensile connecting assembly. The tensile machine body is equipped with an upper clamp and a lower clamp. The tensile connecting assembly includes a tensile connecting block disposed within the tensile mold, with a tensile rod connected to the connecting block. The tensile connecting assembly also includes an adjustment assembly, which is equipped with a locking assembly. The adjustment assembly includes a lateral adjustment component and a longitudinal adjustment component, with the longitudinal adjustment component located above the lateral adjustment component. A connecting rod is fixed to the lower end of the lateral adjustment component. The lateral adjustment component includes a fixing frame. By using the adjustment assembly and the locking assembly, the lateral and longitudinal adjustment components of the adjustment assembly adjust the position of the SiP chip to be tested on the device substrate. Then, the locking assembly locks and fixes the lateral and longitudinal positions of the support platform, facilitating position adjustment and improving operational efficiency.

Description

Technical Field

[0001] This utility model relates to the field of tensile testing technology for chip devices, and in particular to a tensile testing device for multi-chip devices. Background Technology

[0002] A tensile testing apparatus for multi-chip devices, with publication number CN 222800504 U, describes a process where the device substrate is bonded to a movable platform of a tensile testing machine using an adhesive. Several tensile dies are then placed around the corresponding SiP chip. The inner walls of the tensile dies are adhered with transparent tape or other non-adhesive materials for easy removal after the adhesive cures. Next, epoxy adhesive is poured into the tensile dies to create a horizontal surface, and a tensile connecting block is fixed to the adhesive. After the adhesive cures, the tensile dies are removed. Nuts are loosened, the movable platform is moved, and the relative position of the SiP chip to be stretched and the upper clamp of the tensile testing machine is adjusted so that the SiP chip is directly below the upper clamp. The lower end of a tensile rod is fixedly connected to the corresponding tensile connecting block, and the upper clamp of the tensile testing machine holds the upper end of the tensile rod, forming a tensile loading chain for the tensile operation. This completes the tensile test of the current SiP chip. The tensile rod is then removed, the relative position of the next SiP chip is adjusted, and the tensile rod is reinstalled and the tensile operation is performed again. Repeat the above steps to complete the tensile test on the remaining SiP chips in sequence. However, when adjusting the position of the chips at different locations before tensile testing, the nuts on the bolts need to be loosened and then tightened again after the position adjustment. This process is cumbersome, and the position of the movable platform may shift during the tightening process, which may cause changes in the verticality of the stretching and make it inconvenient to use. Utility Model Content

[0003] The purpose of this invention is to provide a tensile testing device for multi-chip devices in order to solve the above-mentioned problems.

[0004] This utility model achieves the above objectives through the following technical solutions: A tensile testing apparatus for multi-chip devices includes a tensile machine body, a tensile die, and a tensile connecting assembly. The tensile machine body is provided with an upper clamp and a lower clamp. The tensile connecting assembly includes a tensile connecting block disposed within the tensile die, and a tensile rod connected to the tensile connecting block. The tensile connecting assembly also includes an adjusting assembly, which is provided with a locking assembly. The adjusting assembly includes a transverse adjusting component and a longitudinal adjusting component. The longitudinal adjusting component is located above the transverse adjusting component, and a connecting rod is fixed to the lower end of the transverse adjusting component. The transverse adjusting component includes a fixed frame with a through slot extending horizontally through it. A transverse lead screw is disposed horizontally on the fixed frame, and the transverse adjusting frame is mounted on the transverse lead screw. A boss that inserts into the through slot is provided at the lower end of the transverse adjusting frame. The longitudinal adjusting component includes a longitudinal lead screw and a slide rail disposed on the transverse adjusting frame. A support platform is mounted on the longitudinal lead screw and the slide rail. The locking assembly is respectively mounted on the support platform and the transverse adjusting frame.

[0005] Further configuration: Grooves are provided on the side wall of the support platform and the front wall of the transverse adjustment frame. The locking assembly is installed in the groove. The locking assembly includes a mounting shaft that is rotatably set in the groove. A cam is fixed on the mounting shaft. A handle is fixed on the side wall of the cam. A tensioning rod is vertically set on the lower side of the cam. A dome is set on the upper end of the tensioning rod. A spring is sleeved on the tensioning rod inside the groove.

[0006] Further configuration: The top tension rod on the support platform is slidably connected to the support platform, and the top tension rod on the lateral adjustment frame is slidably connected to the lateral adjustment frame.

[0007] Further details: There are two parallel through slots, and a limit plate is installed at the lower end of the transverse adjustment frame. The upper surface of the limit plate is flush with the lower surface of the fixed frame.

[0008] Further configuration: The transverse lead screw is rotatably connected to the fixed frame, a handwheel is provided at one end of the transverse lead screw, the transverse lead screw is threadedly connected to the transverse adjustment frame, and the transverse adjustment frame is slidably connected to the fixed frame.

[0009] Further configuration: The longitudinal lead screw is rotatably connected to the transverse adjustment frame, the support platform is threadedly connected to the longitudinal lead screw, the support platform is slidably connected to the slide rail, and a handwheel is provided at the front end of the longitudinal lead screw.

[0010] Further settings: The end of the connecting rod near the lower clamp and the end of the tension rod near the upper clamp are both set to a directional shape.

[0011] Compared with the prior art, the beneficial effects of this utility model are as follows: By adjusting the settings of the components and locking components, the lateral lead screw of the lateral adjustment component drives the lateral adjustment frame to move under the limit of the through slot, while the longitudinal lead screw of the longitudinal adjustment component rotates to drive the support platform to move under the limit of the slide rail, thereby adjusting the position of the SiP chip to be tested. Then, the lateral and longitudinal positions of the support platform are locked and fixed by the locking components, which facilitates the position adjustment and fixation and improves the efficiency of operation. Attached Figure Description

[0012] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0013] Figure 1 This is a partial structural diagram of a tensile testing device for multi-chip devices according to the present invention; Figure 2 yes Figure 1 Another perspective structural diagram; Figure 3 yes Figure 1 Schematic diagram of the structure in its decomposed state; Figure 4 yes Figure 1 A partial structural diagram of the locking assembly; Figure 5 yes Figure 4 A schematic diagram of the structure under local decomposition.

[0014] The annotations in the attached figures are explained as follows: 1. Stretching die; 2. Fixing frame; 21. Through slot; 22. Transverse lead screw; 23. Transverse adjustment frame; 24. Limiting plate; 25. Longitudinal lead screw; 26. Slide rail; 27. Support platform; 31. Mounting shaft; 32. Cam; 33. Handle; 34. Tightening rod; 35. Dome; 36. Spring; 6. Connecting rod; 7. Stretching connecting block; 8. Stretching rod. Detailed Implementation

[0015] In the description of this utility model, it should be understood that the terms "center," "longitudinal," "lateral," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," and "outer," etc., indicating orientation or positional relationships based on the orientation or positional relationships shown in the accompanying drawings, are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. Furthermore, the terms "first," "second," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, features defined with "first," "second," etc., may explicitly or implicitly include one or more of that feature. In the description of this utility model, unless otherwise stated, "a plurality of" means two or more.

[0016] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.

[0017] The present invention will be further described below with reference to the accompanying drawings: like Figures 1-5 As shown, a tensile testing device for multi-chip devices includes a tensile machine body, a tensile mold 1, and a tensile connecting assembly. The tensile machine body is provided with an upper clamp and a lower clamp (not shown in the figure). The tensile machine body, the upper clamp, and the lower clamp are all prior art and will not be described in detail here. The tensile connecting assembly includes a tensile connecting block 7 disposed in the tensile mold 1, and a tensile rod 8 is connected to the tensile connecting block 7. The tensile connecting assembly also includes an adjustment assembly, and a locking assembly is provided on the adjustment assembly. The adjustment assembly includes a transverse adjustment component and a longitudinal adjustment component. The longitudinal adjustment component is located above the transverse adjustment component, and a connecting rod 6 is fixed to the lower end of the transverse adjustment component. The end of the connecting rod 6 near the lower clamp and the end of the tensile rod 8 near the upper clamp are both oriented in a directional manner.

[0018] In this embodiment: the lateral adjustment component includes a fixed frame 2, on which a through groove 21 is opened horizontally, and a lateral lead screw 22 is arranged horizontally on the fixed frame 2. A lateral adjustment frame 23 is installed on the lateral lead screw 22. A boss that inserts into the through groove 21 is provided at the lower end of the lateral adjustment frame 23. Two through grooves 21 are arranged in parallel. A limit plate 24 is installed at the lower end of the lateral adjustment frame 23. The upper end face of the limit plate 24 is flush with the lower end face of the fixed frame 2. The lateral lead screw 22 is rotatably connected to the fixed frame 2. A handwheel is provided at one end of the lateral lead screw 22. The lateral lead screw 22 is threadedly connected to the lateral adjustment frame 23. The lateral adjustment frame 23 is slidably connected to the fixed frame 2. By rotating the lateral lead screw 22, the lateral lead screw 22 drives the lateral adjustment frame 23 to move and adjust its lateral position under the limit of the through groove 21.

[0019] The longitudinal adjustment component includes a longitudinal lead screw 25 and a slide rail 26 mounted on the transverse adjustment frame 23. A support platform 27 is mounted on the longitudinal lead screw 25 and the slide rail 26. The longitudinal lead screw 25 is rotatably connected to the transverse adjustment frame 23, the support platform 27 is threadedly connected to the longitudinal lead screw 25, and the support platform 27 is slidably connected to the slide rail 26. A handwheel is provided at the front end of the longitudinal lead screw 25. By rotating the longitudinal lead screw 25, the longitudinal lead screw 25 drives the support platform 27 to move and adjust its longitudinal position under the limit of the slide rail 26.

[0020] Locking components are respectively installed on the support platform 27 and the transverse adjustment frame 23; grooves are provided on the side wall of the support platform 27 and the front wall of the transverse adjustment frame 23, and the locking components are installed in the grooves. The locking components include a mounting shaft 31 rotatably disposed in the groove, a cam 32 fixed on the mounting shaft 31, a handle 33 fixed on the side wall of the cam 32, a tensioning rod 34 vertically disposed on the lower side of the cam 32, a dome 35 disposed on the upper end of the tensioning rod 34, and a spring 36 sleeved on the tensioning rod 34 inside the groove, the spring 36 causing the tensioning rod 34 to... The dome 35 at the end is always in contact with the cam 32; the clamping rod 34 on the support platform 27 is slidably connected to the support platform 27, and the clamping rod 34 on the transverse adjustment frame 23 is slidably connected to the transverse adjustment frame 23. By rotating the handle 33 on the transverse adjustment frame 23 and the support platform 27, the handle 33 drives the cam 32 on the mounting shaft 31 to rotate. The cam 32 pushes the clamping rod 34 downward, so that the two clamping rods 34 contact the lower fixed frame 2 and the transverse adjustment frame 23 respectively, thereby limiting and fixing the transverse adjustment frame 23 and the support platform 27.

[0021] The working principle and usage process of this utility model are as follows: After fixing the stretching mold 1 and the stretching connecting block 7 onto the SiP chip to be stretched, the device substrate is bonded to the upper surface of the support platform 27, so that the lower clamp is connected and fixed to the connecting rod 6. The transverse screw 22 of the transverse adjustment component is rotated, so that the transverse screw 22 drives the transverse adjustment frame 23 to move under the limit of the through groove 21. At the same time, the longitudinal screw 25 of the longitudinal adjustment component is rotated, so that the longitudinal screw 25 drives the support platform 27 to move under the limit of the slide rail 26. The SiP chip to be tested is moved to the lower side of the lower clamp. The stretching rod 8 is installed on the stretching connecting block 7 at the corresponding position. The handle 33 on the transverse adjustment frame 23 and the support platform 27 is rotated, so that the handle 33 drives the cam 32 on the mounting shaft 31 to rotate. The cam 32 pushes the clamping rod 34 downward, so that the two clamping rods 34 contact the lower fixing frame 2 and the transverse adjustment frame 23 respectively, and limit and fix the transverse adjustment frame 23 and the support platform 27. Then, the upper clamp is connected to the stretching rod 8 for testing.

[0022] The foregoing has shown and described the basic principles, main features, and advantages of this utility model. Those skilled in the art should understand that this utility model is not limited to the above embodiments. The embodiments and descriptions in the specification are merely illustrative of the principles of this utility model. Various changes and modifications can be made to this utility model without departing from its spirit and scope, and all such changes and modifications fall within the scope of the claimed utility model.

Claims

1. A tensile testing apparatus for multi-chip devices, comprising a tensile machine body, a tensile die (1), and a tensile connecting assembly, wherein the tensile machine body is provided with an upper clamp and a lower clamp, and the tensile connecting assembly includes a tensile connecting block (7) disposed within the tensile die (1), wherein a tensile rod (8) is connected to the tensile connecting block (7), characterized in that: The tension connection assembly further includes an adjustment assembly, on which a locking assembly is provided; the adjustment assembly includes a transverse adjustment component and a longitudinal adjustment component, the longitudinal adjustment component is located on the upper side of the transverse adjustment component, and a connecting rod (6) is fixed at the lower end of the transverse adjustment component; the transverse adjustment component includes a fixing frame (2), on which a through groove (21) is opened transversely, a transverse lead screw (22) is arranged transversely on the fixing frame (2), a transverse adjustment frame (23) is installed on the transverse lead screw (22), and a boss inserted into the through groove (21) is provided at the lower end of the transverse adjustment frame (23); the longitudinal adjustment component includes a longitudinal lead screw (25) and a slide rail (26) arranged on the transverse adjustment frame (23), a support platform (27) is installed on the longitudinal lead screw (25) and the slide rail (26), and the locking assembly is respectively installed on the support platform (27) and the transverse adjustment frame (23).

2. The tensile testing apparatus for multi-chip devices according to claim 1, characterized in that: The side wall of the support platform (27) and the front wall of the transverse adjustment frame (23) are both provided with grooves. The locking assembly is installed in the groove. The locking assembly includes a mounting shaft (31) rotatably disposed in the groove. A cam (32) is fixed on the mounting shaft (31). A handle (33) is fixed on the side wall of the cam (32). A top rod (34) is vertically disposed on the lower side of the cam (32). A dome (35) is disposed at the upper end of the top rod (34). A spring (36) is sleeved on the top rod (34) inside the groove.

3. The tensile testing apparatus for multi-chip devices according to claim 2, characterized in that: The top clamping rod (34) on the support platform (27) is slidably connected to the support platform (27), and the top clamping rod (34) on the transverse adjustment frame (23) is slidably connected to the transverse adjustment frame (23).

4. The tensile testing apparatus for multi-chip devices according to claim 1, characterized in that: The through slot (21) is provided in two parallel locations. A limiting plate (24) is installed at the lower end of the transverse adjustment frame (23). The upper surface of the limiting plate (24) is flush with the lower surface of the fixing frame (2).

5. The tensile testing apparatus for multi-chip devices according to claim 4, characterized in that: The transverse lead screw (22) is rotatably connected to the fixed frame (2), and a handwheel is provided at one end of the transverse lead screw (22). The transverse lead screw (22) is threadedly connected to the transverse adjustment frame (23), and the transverse adjustment frame (23) is slidably connected to the fixed frame (2).

6. The tensile testing apparatus for multi-chip devices according to claim 1, characterized in that: The longitudinal lead screw (25) is rotatably connected to the transverse adjustment frame (23), the support platform (27) is threadedly connected to the longitudinal lead screw (25), the support platform (27) is slidably connected to the slide rail (26), and a handwheel is provided at the front end of the longitudinal lead screw (25).

7. The tensile testing apparatus for multi-chip devices according to claim 1, characterized in that: The connecting rod (6) near the lower clamp and the tension rod (8) near the upper clamp are both oriented in a directional manner.

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