A fast programming and testing socket for a Bluetooth chip

Abstract

This utility model discloses a rapid programming and testing socket for Bluetooth chips, including a base, a test socket, a fixing base, and a top cover. The test socket is located on the upper end of the base, and a test platform is located in the middle of the upper end of the test socket. A test slot is formed at the upper end of the test platform for placing the Bluetooth chip. The fixing base is located on the upper end of the test socket, and a slot hole is formed in the middle of the fixing base. The test platform is fitted into the slot hole. The top cover is hinged to one side edge of the fixing base, and a latching mechanism is fixedly connected to the opposite side of the top cover. A slot is formed on one side edge of both the fixing base and the test socket, and one end of the latching mechanism is snapped into the slot. The purpose of this utility model is to provide a programming and testing socket with high reliability, fast testing efficiency, and stable testing.

Description

Technical Field

[0001] This utility model relates to the field of chip programming and testing technology, specifically a fast programming and testing socket for Bluetooth chips. Background Technology

[0002] With the rapid development of the Internet of Things and smart terminal devices, the market demand for Bluetooth chips, as core wireless communication modules, has exploded. During mass production, chips must undergo firmware flashing and functional testing before leaving the factory, which places extremely high demands on the efficiency, reliability, and stability of the flashing and testing equipment.

[0003] Traditional chip programming and testing methods often employ simple sockets or adapters, which have several drawbacks: First, chip fixation relies heavily on simple covers or manual pressing, and uneven pressure can easily lead to poor contact between chip pins and test terminals, resulting in test failures or misjudgments and affecting yield. Second, chips generate significant heat during high-speed programming; if heat cannot be dissipated in time, the chip junction temperature may rise, potentially causing performance degradation or even hardware damage, and traditional structures lack effective active heat dissipation methods. Third, traditional socket structures are often loose, with insufficient positioning accuracy for each component, making them prone to wear and misalignment during frequent opening, closing, and replacement operations, affecting lifespan. Finally, the entire chip replacement process is cumbersome, with low locking and unlocking efficiency, severely restricting the improvement of production testing cycle time.

[0004] Therefore, there is an urgent need in the existing technology for a dedicated test socket that can achieve rapid clamping, ensure stable electrical contact, and integrate efficient heat dissipation. Utility Model Content

[0005] In view of the above-mentioned shortcomings in the existing technology, the purpose of this utility model is to provide a programming test socket with high reliability, fast testing efficiency and stable testing.

[0006] The technical solution adopted by this utility model to achieve the above objectives is as follows: a Bluetooth chip rapid programming and testing socket, including a base, a test socket, a fixing base, and a top cover. The base serves as the base of the entire socket and provides mounting points for the test socket. A test socket is provided on the upper end of the base. The test socket is a core functional module with embedded conductive terminals that directly connect to the chip pins. A test platform is provided in the middle of the upper end of the test socket, and a test slot is provided on the upper end of the test platform for placing the Bluetooth chip. The upper end of the test socket is provided with... The device includes a mounting base for positioning and supporting the upper cover, which is fixed to the lower structure with screws to form an integral frame. A slot hole is provided in the center of the mounting base, and the test platform is fitted into the slot hole. The upper cover is hinged to one side edge of the mounting base, and a latching mechanism is fixedly connected to the opposite side of the upper cover. A slot is provided on one side edge of both the mounting base and the test platform, and one end of the latching mechanism is snapped into the slot. By using the latching mechanism in conjunction with the slot on the mounting base / test platform, one-click engagement and unlocking are achieved, greatly improving the efficiency of chip replacement.

[0007] In the above technical solution, the test base has through holes at its four corners, threaded holes on the base on one side of the through holes, and mounting holes on the fixed base opposite the through holes. One end of the screw passes through the mounting hole and the through hole in sequence and is threaded into the threaded hole.

[0008] In the above technical solution, a rotating block is fixedly connected to the upper middle part of the top cover, a knob cover is rotatably connected to the rotating block, a threaded rod is fixedly connected inside the knob cover, the threaded rod is threadedly connected to the threaded sleeve, a sliding sleeve hole is opened in the rotating block, the threaded sleeve is slidably connected to the sliding sleeve hole, a receiving groove is opened at the bottom of the top cover, the receiving groove is connected to the sliding sleeve hole, a pressing block is slidably connected in the receiving groove, and the upper middle part of the pressing block is fixedly connected to the threaded sleeve.

[0009] In the above technical solution, a cooling channel is provided inside the pressing block, and the two ends of the cooling channel are respectively connected to the water inlets on both sides of the pressing block.

[0010] In the above technical solution, the test socket is connected to several terminals, one end of which protrudes from the bottom surface of the test slot, and the other end of which protrudes from the bottom of the base.

[0011] The beneficial effects of this utility model are:

[0012] This invention achieves one-button quick opening and closing and locking of the top cover through the cooperation of the latch mechanism and the slot, combined with the hinge connection on one side, which greatly simplifies the chip picking and putting operation and significantly improves the efficiency of production testing.

[0013] This invention converts rotational motion into vertical linear motion of the clamping block by rotating a knob to drive the threaded rod and threaded sleeve. This applies uniform and stable vertical downward pressure to the chip, ensuring reliable contact between all chip pins and test terminals and effectively preventing test failures due to poor contact.

[0014] This invention integrates a cooling channel system within the clamping block, which can directly guide the coolant to the top of the chip for efficient heat exchange, quickly removing the large amount of heat generated during programming and testing, effectively preventing chip damage due to overheating, and ensuring the stability of the high-speed programming process and the accuracy of the test results.

[0015] This utility model adopts a modular design, which uses screws to firmly connect the base, test seat and fixed seat into an integral rigid frame. The structure is compact and stable, with strong resistance to vibration and interference, ensuring positioning accuracy and durability under long-term repeated use.

[0016] The test terminal of this utility model adopts a spring bow structure design, which has a certain elastic stroke. It can not only ensure good contact with the chip pin, but also avoid damaging the pin due to excessive pressure. At the same time, its solder end extends downward, which is convenient for connection with external test equipment, and the signal transmission path is short and reliable. Attached Figure Description

[0017] Figure 1 This is a three-dimensional structural diagram of the present invention;

[0018] Figure 2 This is a schematic diagram of the disassembled structure of this utility model;

[0019] Figure 3 This is a schematic diagram of the cross-sectional structure of the test seat of this utility model;

[0020] Figure 4 This is a schematic diagram of the cross-sectional connection structure of the top cover of this utility model.

[0021] In the diagram: 1. Base, 2. Test socket, 3. Fixing base, 4. Top cover, 5. Test platform, 6. Test slot, 7. Slot hole, 8. Tongue mechanism, 9. Slot, 10. Through hole, 11. Threaded hole, 12. Mounting hole, 13. Rotating block, 14. Knob cover, 15. Threaded rod, 16. Threaded sleeve, 17. Sliding sleeve hole, 18. Receiving groove, 19. Clamping block, 20. Cooling channel, 21. Terminal. Detailed Implementation

[0022] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0023] Please see Figure 1-4 A rapid programming and testing socket for a Bluetooth chip includes a base 1, a test socket 2, a fixing base 3, and a top cover 4. The base 1 serves as the base of the entire socket and provides mounting points for the test socket 2. The test socket 2 is located on the upper part of the base 1. The test socket 2 is a core functional module with embedded conductive terminals 21, which directly connect to the chip pins. A test platform 5 is located in the middle of the upper part of the test socket 2. A test slot 6 is formed on the upper part of the test platform 5 for placing the Bluetooth chip. The fixing base 3 is located on the upper part of the test socket 2. The upper cover 4 is positioned and supported, and is fixed to the lower structure with screws to form an overall frame. The middle of the fixing base 3 has a slot hole 7, and the test platform 5 is fitted into the slot hole 7. The upper cover 4 is hinged to one side edge of the fixing base 3, and a latch mechanism 8 is fixedly connected to the opposite side of the upper cover 4. The fixing base 3 and the test platform 2 have a slot 9 on one side edge. One end of the latch mechanism 8 is snapped into the slot 9. The latch mechanism 8 and the slot 9 on the fixing base 3 cooperate to realize one-click locking and unlocking, which greatly improves the efficiency of chip replacement.

[0024] In the above technical solution, the four corners of the test base 2 are provided with through holes 10, the base 1 on one side of the through hole 10 is provided with threaded holes 11, and the fixed base 3 opposite to the through hole 10 is provided with mounting holes 12. One end of the screw passes through the mounting hole 12 and the through hole 10 in sequence and is threaded into the threaded hole 11 to fix the base 1, the test base 2 and the fixed base 3 to form an integral frame.

[0025] In the above technical solution, a rotating block 13 is fixedly connected to the upper middle part of the top cover 4, and a knob cover 14 is rotatably connected to the rotating block 13. A threaded rod 15 is fixedly connected inside the knob cover 14, and the threaded rod 15 is threadedly connected to the threaded sleeve 16. A sliding sleeve hole 17 is opened in the rotating block 13, and the threaded sleeve 16 is slidably connected to the sliding sleeve hole 17. A receiving groove 18 is opened at the bottom of the top cover 4, and the receiving groove 18 is connected to the sliding sleeve hole 17. A pressing block 19 is slidably connected in the receiving groove 18, and the upper middle part of the pressing block 19 is fixedly connected to the threaded sleeve 16. Rotating the knob cover 14 at the top of the top cover 4 drives the internal threaded rod 15 to rotate. The rotational motion of the threaded rod 15 is converted into linear motion through the threaded sleeve 16 that meshes with it. The threaded sleeve 16 is confined within the sliding hole 17 of the rotating block 13, allowing it to slide only up and down. The bottom of the threaded sleeve 16 is connected to the clamping block 19, thereby driving the clamping block 19 to move vertically within the receiving groove 18. This design ensures that vertical and uniform pressure is applied to the chip, guaranteeing good contact between all pins and the test terminal 21.

[0026] In the above technical solution, a cooling channel 20 is provided inside the clamping block 19. The two ends of the cooling channel 20 are connected to the water inlets on both sides of the clamping block 19. During operation, the coolant (usually water) flows through the channel, which can directly and efficiently remove the heat generated by the chip during the burning test, prevent the chip from being damaged due to overheating, and ensure the reliability of high-speed burning and the accuracy of test results.

[0027] In the above technical solution, a number of terminals 21 are connected inside the test base 2. One end of the terminal 21 extends out from the bottom surface of the test slot 6, and the other end of the terminal 21 extends out from the bottom of the base 1. The terminal 21 includes a contact, a spring bow, a fixing plate, and a soldering end. The fixing plate is fixedly connected inside the test base 2. A spring bow is connected to the upper end of the fixing plate. The spring bow is movably connected inside the test base 2. A contact is connected to the end of the spring bow. The contact extends out through a guide hole to the bottom surface of the test slot 6. A soldering end is fixedly connected to the lower end of the fixing plate. The soldering end extends through the base 1 and is connected to an external programming test device.

[0028] In this utility model, the base 1 and the test seat 2, and the test seat 2 and the fixed seat 3 are respectively positioned by positioning pins and positioning pin holes, so as to ensure that the installation positions of the base 1 and the test seat 2, and the test seat 2 and the fixed seat 3 are accurately positioned.

[0029] It will be apparent to those skilled in the art that this invention is not limited to the details of the exemplary embodiments described above, and that it can be implemented in other specific forms without departing from the spirit or essential characteristics of this invention. Therefore, the embodiments should be considered illustrative and non-limiting in all respects, and the scope of this invention is defined by the appended claims rather than the foregoing description. Thus, it is intended that all variations falling within the meaning and scope of equivalents of the claims be included within this invention. No reference numerals in the claims should be construed as limiting the scope of the claims.

[0030] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

Claims

1. A fast programming test socket for a Bluetooth chip, comprising a base (1), a test socket (2), a fixing base (3), and a top cover (4), characterized in that: The base (1) is provided with a test seat (2) at its upper end. The test seat (2) is provided with a test platform (5) at its upper middle part. The test platform (5) is provided with a test slot (6) at its upper end. The test slot (6) is used to place a Bluetooth chip. The test seat (2) is provided with a fixed seat (3) at its upper end. The fixed seat (3) is provided with a slot hole (7) at its middle part. The test platform (5) is fitted into the slot hole (7). The fixed seat (3) is hinged to a top cover (4) on one side edge. The top cover (4) is fixedly connected to a latch mechanism (8) on the opposite side. The fixed seat (3) and the test seat (2) are provided with a slot (9) on one side edge. One end of the latch mechanism (8) is snapped into the slot (9).

2. The Bluetooth chip fast programming test socket according to claim 1, characterized in that: The test base (2) has through holes (10) at its four corners. The base (1) on one side of the through hole (10) has threaded holes (11). The fixed base (3) opposite to the through hole (10) has mounting holes (12). One end of the screw passes through the mounting hole (12) and the through hole (10) in sequence and is then threaded into the threaded hole (11).

3. The Bluetooth chip fast programming and testing socket according to claim 1, characterized in that: A rotating block (13) is fixedly connected to the upper middle part of the upper cover (4). A knob cover (14) is rotatably connected to the rotating block (13). A threaded rod (15) is fixedly connected inside the knob cover (14). The threaded rod (15) is threadedly connected to the threaded sleeve (16). A sliding hole (17) is opened in the rotating block (13). The threaded sleeve (16) is slidably connected in the sliding hole (17). A receiving groove (18) is opened at the bottom of the upper cover (4). The receiving groove (18) is connected to the sliding hole (17). A pressing block (19) is slidably connected in the receiving groove (18). The upper middle part of the pressing block (19) is fixedly connected to the threaded sleeve (16).

4. The Bluetooth chip fast programming and testing socket according to claim 3, characterized in that: The compression block (19) is provided with a supercooling channel (20), and the two ends of the supercooling channel (20) are respectively connected to the water inlets on both sides of the compression block (19).

5. A fast programming and testing socket for a Bluetooth chip according to claim 1, characterized in that: The test socket (2) is connected to several terminals (21). One end of the terminal (21) protrudes from the bottom surface of the test slot (6), and the other end of the terminal (21) protrudes from the bottom of the base (1).

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