An aging test rack for solar products

Abstract

This application relates to the field of aging testing technology, and provides an aging testing rack for solar energy products, including a frame, multiple placement plates, and multiple first aging testing devices; the multiple placement plates and the multiple first aging testing devices are all vertically spaced on the frame; each first aging testing device includes a heat dissipation mounting plate, multiple mounting bolts, multiple mounting nuts, a first test circuit board, and multiple first connection ports; the heat dissipation mounting plate is disposed on the frame, the multiple mounting bolts are spaced apart on the lower side of the heat dissipation mounting plate, each mounting nut is threaded to the lower end of each mounting bolt, and the first test circuit board overlaps the upper end of each mounting nut; the multiple first connection ports are spaced apart on the first test circuit board. Based on this, the effect of product aging testing can be improved.

Description

Technical Field

[0001] This application relates to the field of aging testing, and in particular to an aging testing rack for solar energy products. Background Technology

[0002] Currently, some solar energy products, such as energy storage devices and charging equipment, require aging tests after production to ensure product quality before shipment. These aging tests are conducted using an aging testing rack designed for solar energy products.

[0003] In related technologies, an aging test rack for solar products includes a frame, multiple placement plates, and multiple mounting bases. The placement plates and mounting bases are arranged vertically at intervals, with each mounting base positioned above a placement plate. The aging test equipment is mounted on a mounting base, and a power outlet is placed on a placement plate. During operation, the product is placed on the placement plate and plugged into the power outlet, and the aging test equipment performs aging tests on each product.

[0004] However, in practical applications, the heat dissipation effect of aging test equipment is poor, which affects the effect of product aging test, and therefore needs to be improved. Utility Model Content

[0005] To improve the effectiveness of product aging testing, this application provides an aging testing rack for solar energy products.

[0006] The aging test rack for solar energy products provided in this application adopts the following technical solution:

[0007] An aging test rack for solar energy products includes a frame, multiple placement plates, and multiple first aging test devices; the multiple placement plates and the multiple first aging test devices are all arranged vertically at intervals on the frame;

[0008] The first aging test equipment includes a heat dissipation mounting plate, multiple mounting bolts, multiple mounting nuts, a first test circuit board, and multiple first connection ports. The heat dissipation mounting plate is disposed on the frame, the multiple mounting bolts are spaced apart on the lower side of the heat dissipation mounting plate, each mounting nut is threaded to the lower end of each mounting bolt, and the first test circuit board overlaps the upper end of each mounting nut. The multiple first connection ports are spaced apart on the first test circuit board.

[0009] By adopting the above technical solution, in practical applications, the first test circuit board is connected to each mounting nut of each mounting bolt by thread to realize the installation of the first test circuit board. Multiple first connection ports are provided on the first test circuit board, and the first connection ports are used for product connection to realize the aging test of the product. Since the first test circuit board is exposed and under the heat dissipation effect of the heat dissipation mounting plate, the heat dissipation effect of the first aging test equipment can be effectively improved, thereby improving the effect of product aging test.

[0010] Preferably, there is a gap between each of the heat dissipation mounting plates and the placement plate above it.

[0011] By adopting the above technical solution, and by setting a gap between each heat dissipation mounting plate and the upper placement plate, the heat dissipation performance of the heat dissipation mounting plate is improved.

[0012] Preferably, the first aging test device further includes a plurality of first heat dissipation fin boxes, which are spaced apart along the length of the first test circuit board. The first heat dissipation fin boxes are located on the upper side of the first test circuit board and abut against the heat dissipation mounting plate.

[0013] By adopting the above technical solution and setting multiple first heat dissipation fin boxes, heat dissipation of the first test circuit board is further achieved, thereby improving the heat dissipation effect of the first aging test equipment.

[0014] Preferably, a plurality of the first aging test devices are spaced apart along the width direction of the frame.

[0015] By adopting the above technical solution and setting multiple first aging test devices spaced along the width of the frame, more products can be tested on each layer of the placement plate, thereby improving the product testing efficiency.

[0016] Preferably, the aging test rack for solar products further includes a plurality of second aging test devices, which are arranged at intervals along the vertical direction. Each second aging test device includes a mounting tube, a second test circuit board, and a plurality of second connection ports. The mounting tube is disposed on the rack, the second test circuit board is disposed on the mounting tube, and the plurality of second connection ports are arranged at intervals on the second test circuit board.

[0017] By adopting the above technical solution and setting up multiple secondary aging test devices, the aging test rack for solar products can be applied to the testing of different products, thereby improving the applicability of the aging test rack for solar products.

[0018] Preferably, the second aging test device further includes a plurality of second heat sink fin boxes, which are disposed on the second test circuit board.

[0019] By adopting the above technical solution and setting multiple second heat dissipation fin boxes, the heat dissipation of the second aging test equipment can be guaranteed.

[0020] Preferably, the aging test rack for solar products further includes multiple limiting components, which are disposed on each of the placement plates. Each limiting component includes a limiting frame, which is disposed on the placement plate and used to limit the position of the product.

[0021] By adopting the above technical solution and setting multiple limiting components, the product is placed in the limiting frame to limit the placement of the product and minimize the risk of the product falling onto the placement plate and being damaged.

[0022] Preferably, the limiting component further includes a limiting plate and a connecting rod, the limiting plate being slidably connected to the limiting frame, and one end of the limiting frame being rotatably connected to both the limiting plate and the limiting frame.

[0023] By adopting the above technical solution, by setting a limiting plate and a connecting rod, rotating the connecting rod can drive the limiting plate to slide, so that the product is limited between the limiting plate and the limiting frame, thereby improving the stability of the limiting and being applicable to products of different sizes.

[0024] In summary, this application includes at least one of the following beneficial technical effects:

[0025] 1. The first test circuit board is connected to the mounting nuts of each mounting bolt by thread to realize the installation of the first test circuit board. Multiple first connection ports are provided on the first test circuit board, and the first connection ports are used for product connection to realize the aging test of the product. Since the first test circuit board is exposed and under the heat dissipation of the heat dissipation mounting plate, the heat dissipation effect of the first aging test equipment can be effectively improved, thereby improving the effect of product aging test.

[0026] 2. By setting up multiple first heat sink fin boxes, heat dissipation is further achieved for the first test circuit board, thereby improving the heat dissipation effect of the first aging test equipment;

[0027] 3. By setting a limiting plate and a connecting rod, rotating the connecting rod can drive the limiting plate to slide, so that the product is limited between the limiting plate and the limiting frame, thereby improving the stability of the limiting and making it suitable for products of different sizes. Attached Figure Description

[0028] Figure 1 This is a schematic diagram of the overall structure of the aging test rack for solar products in Embodiment 1 of this application;

[0029] Figure 2 This is a schematic diagram of the overall structure of the first aging test device in Embodiment 1 of this application;

[0030] Figure 3 This is a schematic diagram of the overall structure of the second aging test device in Embodiment 1 of this application;

[0031] Figure 4 This is a schematic diagram of the overall structure of the aging test rack for solar products in Embodiment 2 of this application;

[0032] Figure 5 This is a schematic diagram of the overall structure of the limiting component in Embodiment 2 of this application.

[0033] Reference numerals: 1. Frame; 2. Placement plate; 3. First aging test equipment; 31. Heat dissipation mounting plate; 32. Mounting bolt; 33. Mounting nut; 34. First test circuit board; 35. First connection port; 36. First heat dissipation fin box; 4. Caster wheel; 5. Second aging test equipment; 51. Mounting tube; 52. Second test circuit board; 53. Second connection port; 54. Second heat dissipation fin box; 6. Limiting assembly; 61. Limiting frame; 62. Limiting plate; 63. Connecting rod. Detailed Implementation

[0034] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains; the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the application; the terms “comprising” and “having”, and any variations thereof, in the specification, claims, and foregoing description of the drawings are intended to cover non-exclusive inclusion.

[0035] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0036] The following is in conjunction with the appendix Figure 1-5 This application will be described in further detail.

[0037] This application discloses an aging test rack for solar energy products.

[0038] Example 1:

[0039] Reference Figure 1The aging test rack for solar products includes a frame 1, multiple placement plates 2, and multiple first aging test devices 3. The frame 1 is placed on the ground by multiple casters 4 to facilitate its movement. The multiple placement plates 2 are fixedly connected to the frame 1 and are evenly spaced along the vertical direction.

[0040] Reference Figure 1 and Figure 2 The number of first aging test devices 3 is one less than the number of placement plates 2, and multiple first aging test devices 3 are arranged vertically at intervals on the frame 1. Specifically, the first aging test device 3 includes a heat dissipation mounting plate 31, multiple mounting bolts 32, multiple mounting nuts 33, a first test circuit board 34, and multiple first connection ports 35. The heat dissipation mounting plate 31 is a metal plate and is fixedly connected to the frame 1. Multiple mounting bolts 32 are fixedly connected at intervals to the lower side of the heat dissipation mounting plate 31. The number of mounting nuts 33 is the same as the number of mounting bolts 32, and each mounting nut 33 is threaded to the lower end of each mounting bolt 32. The first test circuit board 34 overlaps the upper end of each mounting nut 33, and multiple first connection ports 35 are fixedly connected at intervals to the upper side of the first test circuit board 34 to realize the electrical connection between each first connection port 35 and the first test circuit board 34.

[0041] In practical applications, the first test circuit board 34 is attached to each mounting nut 33 threaded to each mounting bolt 32 to realize the installation of the first test circuit board 34. Multiple first connection ports 35 are electrically connected to the first test circuit board 34. The product is placed on each placement plate 2 and connected to the first connection port 35, so that the aging test of the product can be realized. Since the first test circuit board 34 is exposed and the heat dissipation effect of the heat dissipation mounting plate 31 can effectively improve the heat dissipation effect of the first aging test equipment 3, thereby improving the effect of product aging test.

[0042] In some embodiments, there is a certain gap between each heat dissipation mounting plate 31 and the placement plate 2 located above it, so as to improve the heat dissipation performance of the heat dissipation mounting plate 31, thereby improving the heat dissipation effect of the first aging test device 3.

[0043] In some embodiments, the first aging test device 3 further includes a plurality of first heat dissipation fin boxes 36. The plurality of first heat dissipation fin boxes 36 are evenly spaced along the length direction of the first test circuit board 34 and fixedly connected to the upper side of the first test circuit board 34. There is a gap between the first heat dissipation fin box 36 and the upper side of the first test circuit board 34 and it abuts against the lower side of the heat dissipation mounting plate 31. The first heat dissipation fin box 36 is formed by connecting a plurality of heat dissipation fins, thereby dissipating heat from the first test circuit board 34 and improving the heat dissipation effect of the first aging test device 3.

[0044] In some embodiments, a plurality of first aging test devices 3 are arranged at intervals along the width direction of the frame 1. Taking two first aging test devices 3 as an example, two first aging test devices 3 are arranged in the width direction of the frame 1, so that each layer of placement plate 2 can test more products, thereby improving the product testing efficiency.

[0045] Reference Figure 1 and Figure 3 In some embodiments, the aging test rack for solar products further includes multiple second aging test devices 5, which are evenly spaced vertically and located between two first aging test devices 3. Specifically, each second aging test device 5 includes a mounting tube 51, a second test circuit board 52, and multiple second connection ports 53. The mounting tube 51 is fixedly connected to the frame 1, the second test circuit board 52 is fixedly connected to one side of the mounting tube 51, and the multiple second connection ports 53 are fixedly spaced to the second test circuit board 52 to achieve electrical connection between the second connection ports 53 and the second test circuit board 52. Similarly, the product is inserted into the second connection port 53, and the second test circuit board 52 is different from the first test circuit board 34, so that the aging test rack for solar products can be used for testing different products, thereby improving the applicability of the aging test rack for solar products. Of course, a second test circuit board 52 is also installed on the other side of the mounting tube 51.

[0046] In some embodiments, the second aging test device 5 further includes a plurality of second heat dissipation fin boxes 54, which are fixedly connected to the second test circuit board 52 at intervals to ensure the heat dissipation of the second aging test device 5.

[0047] The implementation principle of this embodiment is as follows: In practical application, the first test circuit board 34 is connected to each mounting nut 33 threaded to each mounting bolt 32 to realize the installation of the first test circuit board 34. Multiple first connection ports 35 are electrically connected to the first test circuit board 34. The product is placed on each placement plate 2 and connected to the first connection port 35, so that the aging test of the product can be realized. Since the first test circuit board 34 is exposed and under the heat dissipation effect of the heat dissipation mounting plate 31, the heat dissipation effect of the first aging test equipment 3 can be effectively improved, thereby improving the effect of product aging test.

[0048] Example 2:

[0049] Reference Figure 4 and Figure 5This embodiment is the same as the embodiment 1 in other structures, except that the aging test rack for solar products also includes multiple limiting components 6. The multiple limiting components 6 are set on each placement plate 2. Specifically, the limiting component 6 includes a limiting frame 61. The limiting frame 61 is set in a rectangular frame shape and is fixedly connected to the upper side of the placement plate 2. The product is placed in the limiting frame 61 to limit the placement of the product and avoid the product falling off the placement plate 2 and being damaged.

[0050] In some embodiments, the limiting component 6 further includes a limiting plate 62 and a connecting rod 63. The limiting plate 62 is slidably connected to the limiting frame 61, and one end of the connecting rod 63 is rotatably connected to the limiting plate 62 and the limiting frame 61. By rotating the connecting rod 63, the limiting plate 62 can be driven to slide, so that the product abuts against the limiting position between the limiting plate 62 and the limiting frame 61, thereby improving the stability of the limiting and being applicable to products of different sizes.

[0051] The above are all preferred embodiments of this application and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.

Claims

1. An aging test rack for solar energy products, characterized in that, It includes a frame (1), multiple placement plates (2) and multiple first aging test devices (3); the multiple placement plates (2) and the multiple first aging test devices (3) are all arranged vertically at intervals on the frame (1); The first aging test device (3) includes a heat dissipation mounting plate (31), a plurality of mounting bolts (32), a plurality of mounting nuts (33), a first test circuit board (34), and a plurality of first connection ports (35); the heat dissipation mounting plate (31) is disposed on the frame (1), the plurality of mounting bolts (32) are spaced apart on the lower side of the heat dissipation mounting plate (31), each mounting nut (33) is threaded to the lower end of each mounting bolt (32), and the first test circuit board (34) overlaps the upper end of each mounting nut (33), and the plurality of first connection ports (35) are spaced apart on the first test circuit board (34).

2. The aging test rack for solar energy products according to claim 1, characterized in that, There is a gap between each of the heat dissipation mounting plates (31) and the placement plate (2) above it.

3. The aging test rack for solar energy products according to claim 1, characterized in that, The first aging test device (3) further includes a plurality of first heat dissipation fin boxes (36), which are spaced apart along the length of the first test circuit board (34). The first heat dissipation fin boxes (36) are located on the upper side of the first test circuit board (34) and abut against the heat dissipation mounting plate (31).

4. The aging test rack for solar energy products according to claim 1, characterized in that, Multiple first aging test devices (3) are spaced apart along the width direction of the frame (1).

5. The aging test rack for solar energy products according to claim 1, characterized in that, The aging test rack for solar products also includes a plurality of second aging test devices (5), which are arranged at intervals in the vertical direction. Each second aging test device (5) includes a mounting tube (51), a second test circuit board (52), and a plurality of second connection ports (53). The mounting tube (51) is located on the rack (1), the second test circuit board (52) is located on the mounting tube (51), and the plurality of second connection ports (53) are arranged at intervals on the second test circuit board (52).

6. The aging test rack for solar energy products according to claim 5, characterized in that, The second aging test device (5) also includes a plurality of second heat sink fin boxes (54), which are disposed on the second test circuit board (52).

7. The aging test rack for solar energy products according to claim 1, characterized in that, The aging test rack for solar products also includes multiple limiting components (6), which are disposed on each of the placement plates (2). Each limiting component (6) includes a limiting frame (61), which is disposed on the placement plate (2) and is used to limit the product.

8. An aging test rack for solar energy products according to claim 7, characterized in that, The limiting component (6) further includes a limiting plate (62) and a connecting rod (63). The limiting plate (62) is slidably connected to the limiting frame (61). One end of the limiting frame (61) is rotatably connected to the limiting plate (62) and rotatably connected to the limiting frame (61).

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