IGBT module testing device

Abstract

This utility model discloses an IGBT module testing device, including a testing fixture and a testing control board. The testing fixture includes a test box, a limiting seat, a guide rod, a cylinder, and a pressure plate. The limiting seat is located above the test box and is used to place and limit the IGBT module under test. The test box is a metal structure, and the testing control board is located within the test box. The cylinder is fixed to the test box, and the piston end of the cylinder is connected to the pressure plate. The guide rod is located above the test box, and the pressure plate slides with the guide rod to press the IGBT module, making the IGBT under test electrically connected to the testing control board. A test pin plate is also provided between the testing control board and the limiting seat, and the test pin plate is electrically connected to the testing control board. The test pin plate has a male terminal and a flexible pin. The male terminal is used to transmit drive signals, and the flexible pin is used to transmit power signals. This utility model aims to improve the stability of the testing environment and meet the needs of mass production testing.

Description

Technical Field

[0001] This utility model relates to the technical field of IGBT performance testing devices, and in particular to an IGBT module testing device. Background Technology

[0002] As the core power switching device in power electronic systems, the reliability of Insulated Gate Bipolar Transistor (IGBT) modules directly determines the overall efficiency and lifespan of the system. Therefore, rigorous dynamic performance testing of IGBT modules is essential before shipment or during application screening, including tests for parameters such as switching characteristics, on-state voltage drop, and reverse recovery. This type of dynamic performance testing requires applying high-frequency drive control signals and large-amplitude power currents to the IGBT modules. Therefore, establishing a stable and interference-resistant electrical connection between the testing equipment and the module is crucial for ensuring the accuracy and repeatability of test data. Traditional testing methods typically rely on manual wiring, which is inefficient, susceptible to errors due to unstable interference environments, and cannot meet the needs of mass production testing.

[0003] To improve testing efficiency, some existing technologies employ testing solutions using dedicated test fixtures. However, these solutions do not address the issues of interference resistance and test environment stability, making the testing process prone to abnormal data, leading to distorted test results that fail to accurately reflect the performance of the IGBT module. Utility Model Content

[0004] The purpose of this invention is to provide an IGBT module testing device, which aims to improve the stability of the testing environment and meet the needs of mass production testing.

[0005] To achieve this objective, the present invention adopts the following technical solution:

[0006] An IGBT module testing device includes a testing fixture and a testing control board;

[0007] The testing fixture includes a test box, a limit seat, a guide rod, a cylinder, and a pressure plate;

[0008] The limiting seat is located above the test box and is used to place and limit the IGBT module under test; the test box is a metal structure, and the test control board is located in the test box; the cylinder is fixed to the test box, and the piston end of the cylinder is connected to the pressure plate; the guide rod is located above the test box, and the pressure plate and the guide rod are slidably engaged to press the IGBT module, so that the IGBT under test is electrically connected to the test control board;

[0009] A test pin plate is also provided between the test control board and the limiting seat, and the test pin plate is electrically connected to the test control board; the test pin plate has a male terminal and a flexible pin; the male terminal is used to transmit drive signals, and the flexible pin is used to transmit power signals.

[0010] In one embodiment, the limiting seat has a receiving cavity for placing the IGBT module, and the receiving cavity has symmetrically arranged clearance positions for loading and unloading the IGBT module.

[0011] In one embodiment, the limiting seat is further provided with a sensing module, which is used to check the installation position of the IGBT module, and the sensing module is connected to the cylinder signal.

[0012] In one embodiment, the test fixture further includes stop blocks, which are disposed on both sides of the limiting seat and are used to limit the pressure plate.

[0013] In one embodiment, the test fixture further includes a protective plate; the protective plate is disposed at the end of the guide rod to limit the height of the device; wherein the protective plate is made of a transparent material.

[0014] In one embodiment, the test control board has a drive signal output terminal, a DC bus output terminal, a power input terminal, and a command signal receiving terminal;

[0015] The drive interface of the IGBT module is connected to the drive signal output terminal through a female connector and a male connector; the power interface of the IGBT module is connected to the DC bus output terminal through a metal contact and a flexible pin; the power input terminal is used to connect to the power grid; and the command signal receiving terminal is used to connect to the host computer.

[0016] In one embodiment, the test control board includes a power supply circuit, a detection circuit, a control circuit, and a drive circuit;

[0017] The power supply circuit is connected to the power input terminal and the DC bus output terminal, and is used to generate a DC bus power signal that matches the IGBT module.

[0018] The detection circuit is connected to the power supply circuit and is used to collect and detect the DC bus power signal generated by the power supply circuit.

[0019] The control circuit is connected to the detection circuit and the instruction signal receiving terminal, and is used to generate the driving logic of the IGBT module according to the power signal collected by the detection circuit and the instruction of the host computer.

[0020] The drive circuit is connected to the control circuit and the drive signal output terminal, and is used to receive the drive logic of the control circuit and convert the drive logic into a dynamic performance control signal to realize the dynamic performance on / off control of the IGBT module.

[0021] The test control board is a hybrid integrated circuit board, and the power supply circuit is printed on the test control board. The detection circuit, the control circuit, and the drive circuit are packaged in a chip and soldered to the test control board through the chip pins.

[0022] In one embodiment, the control circuit is an MCU chip, and the power supply circuit, detection circuit and drive circuit are all arranged as discrete circuits on the substrate of the test control board.

[0023] Compared with the prior art, the present invention has the following beneficial effects:

[0024] This utility model's technical solution effectively solves the problem of interference between high-voltage, high-current, high-power signals and precision drive signals when a single type of wiring simultaneously transmits drive and power signals. The test pin plate physically separates the transmission paths of drive and power signals; the male terminal is dedicated to drive signal transmission, and the elastic pin is dedicated to power signal transmission. This fundamentally eliminates electromagnetic interference from high-current power signals to precision drive signals. Simultaneously, the test control board is built into the test chamber, whose metal structure provides excellent electromagnetic shielding for the internal test control board and connecting circuitry, further ensuring signal transmission stability. Furthermore, the cylinder-driven pressure plate slides down via a guide rod, ensuring the consistency and reliability of electrical connections during each test, thus collectively achieving accuracy and high repeatability in IGBT module dynamic performance testing. Attached Figure Description

[0025] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0026] The structures, proportions, sizes, etc., shown in the accompanying drawings of this specification are only for the purpose of assisting those skilled in the art in understanding and reading the content disclosed in the specification, and are not intended to limit the implementation conditions of this utility model. Therefore, they have no substantial technical significance. Any modifications to the structure, changes in the proportions, or adjustments to the size, without affecting the effects and purposes that this utility model can produce, should still fall within the scope of the technical content disclosed in this utility model.

[0027] Figure 1 This is a schematic diagram of the structure of an embodiment of the technical solution of this utility model;

[0028] Figure 2 for Figure 1 Reference image in another state;

[0029] Figure 3 This is a structural block diagram of an embodiment of the test control board of this utility model;

[0030] Illustrations: 100, IGBT module testing device; 110, testing fixture; 111, test box; 112, limit seat; 112a, receiving cavity; 112b, clearance position; 113, guide rod; 114, cylinder; 115, pressure plate; 116, test pin plate; 116a, male terminal; 116b, elastic PIN pin; 117, sensing module; 118, stop block; 119, protective plate; 140, test control board; 141, drive signal output terminal; 142, DC bus output terminal; 143, power input terminal; 144, command signal receiving terminal; 145, power circuit; 146, detection circuit; 147, control circuit; 148, drive circuit; 200, IGBT module. Detailed Implementation

[0031] To make the technical objectives, features, and advantages of this utility model more apparent and understandable, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the embodiments described below are only some embodiments of this utility model, and not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model.

[0032] In the description of this utility model, it should be understood that the terms "upper," "lower," "top," "bottom," "inner," and "outer," etc., indicating the orientation or positional relationship are based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. It should be noted that when a component is considered to be "connected" to another component, it can be directly connected to the other component or there may be a component centrally located at the same time.

[0033] The technical solution of this utility model will be further described below with reference to the accompanying drawings and specific embodiments.

[0034] This utility model provides an IGBT module testing device 100.

[0035] Please see Figures 1 to 3 The IGBT module testing device 100 includes a testing fixture 110 and a testing control board 140.

[0036] The test fixture 110 includes a test box 111, a limit seat 112, a guide rod 113, a cylinder 114, and a pressure plate 115;

[0037] The limiting seat 112 is located above the test box 111 and is used to place and limit the IGBT module 200 under test. The test box 111 is a metal structure, and the test control board 140 is located in the test box 111. The cylinder 114 is fixed to the test box 111, and the piston end of the cylinder 114 is connected to the pressure plate 115. The guide rod 113 is located above the test box 111, and the pressure plate 115 and the guide rod 113 are slidably engaged to press the IGBT module 200, so that the IGBT under test is electrically connected to the test control board 140.

[0038] A test pin plate 116 is also provided between the test control board 140 and the limiting seat 112. The test pin plate 116 is electrically connected to the test control board 140. The test pin plate 116 has a male terminal 116a and a flexible pin 116b. The male terminal 116a is used to transmit drive signals, and the flexible pin 116b is used to transmit power signals.

[0039] It is understood that the technical solution of this embodiment effectively solves the problem of interference between high-voltage, high-current high-power signals and precision drive signals when a single type of wiring transmits both drive signals and power signals simultaneously, through the test pin plate 116 and its integrated male terminal 116a and elastic PIN pin 116b. The test pin plate 116 physically separates the transmission paths of drive signals and power signals; the male terminal 116a is dedicated to transmitting drive signals, and the elastic PIN pin 116b is dedicated to transmitting power signals. This fundamentally eliminates electromagnetic interference from high-current power signals to precision drive signals. Simultaneously, the test control board 140 is built into the test box 111. The metal structure of the test box 111 provides a good electromagnetic shielding environment for the internal test control board 140 and connecting lines, further ensuring the stability of signal transmission. Furthermore, the cylinder 114 drives the pressure plate 115 to slide down via the guide rod 113, ensuring the consistency and reliability of the electrical connection during each test, thus jointly achieving the accuracy and high repeatability of the IGBT module 200 dynamic performance test.

[0040] Specifically, the test box 111 serves as a basic support and housing structure. It can be a box structure made of metal. The metal test box 111 not only provides sufficient structural strength but also acts as electromagnetic shielding, isolating the internal test control board 140 and its circuitry from the complex external electromagnetic environment to a certain extent, reducing interference and ensuring the quality of the test signal. The limiting seat 112 is fixedly installed on the upper surface of the test box 111, and its main function is to accurately position and accommodate the IGBT module 200 under test. It can be a modular block with a groove of a specific contour, the shape of which matches the shape of the IGBT module 200 under test, to ensure that the module can only be placed in the correct direction and position. The limiting seat 112 is preferably made of insulating material to prevent electrical short circuits; it can also be made of metal but with an insulating coating or insulating gasket added to the surface in contact with the IGBT module 200. The guide rods 113 are typically two or more parallel, vertically fixed optical axes on the test box 111, providing precise sliding tracks for guiding the pressure plate 115.

[0041] Optionally, the pressure plate 115 is provided with a linear bearing or bushing that cooperates with the guide rod 113, thereby ensuring that the pressure plate 115 moves smoothly up and down in the vertical direction under the drive of the cylinder 114, preventing tilting or jamming, and ensuring that the downward pressure is applied evenly to the IGBT module 200.

[0042] Furthermore, the cylinder 114, as a driving component, can be implemented in other ways besides the aforementioned cylinder 114 form, such as a hydraulic cylinder, an electric actuator, or a servo motor-driven screw-slider mechanism. Its core function is to provide controllable and sufficient downward pressure. Specifically, the cylinder 114 is fixed to the test chamber 111 via its mounting plate, typically located inside the test chamber 111, with its piston rod extending upwards from the top surface of the test chamber 111. The pressure plate 115 is connected to the cylinder 114 via a threaded connection or welding, ultimately transmitting the thrust of the cylinder 114 to the upper surface of the IGBT module 200.

[0043] Optionally, the lower surface of the pressure plate 115 may be designed with a contoured structure or have added elastic cushioning material to better fit the module housing and avoid damaging the IGBT module 200.

[0044] Furthermore, the test control board 140 is a functional board that integrates electronic circuits such as power output, signal generation, and data acquisition. As the brain of the IGBT module test device 100, placing it inside the test box 111 saves space and is protected and shielded by the test box 111.

[0045] Furthermore, the test pin plate 116 serves as an adapter plate for the electrical interface, used to transmit different types of signals. The male terminal 116a matches the corresponding female connector terminal on the IGBT module 200 for transmitting drive signals. Understandably, drive signals are low-voltage, low-current control signals, sensitive to noise; using this connector maximizes signal integrity. The spring-loaded pin 116b refers to a spring-loaded probe (Pogo Pin) or similar axially elastic conductive pin group; used to transmit power signals. Understandably, power signals are high-current, high-voltage signals, requiring the connector to have low contact resistance and high current carrying capacity. The spring-loaded pin 116b retracts under pressure from the pressure plate 115, ensuring tight and reliable contact with the power terminals of the IGBT module 200, preventing poor contact or terminal damage.

[0046] Please see Figure 2 In one embodiment, the limiting seat 112 has a receiving cavity 112a for placing the IGBT module 200, and the receiving cavity 112a has symmetrically arranged clearance positions 112b, which are used for loading and unloading the IGBT module 200.

[0047] Specifically, the receiving cavity 112a is a recess that matches the shape of the IGBT module 200. A step can be designed at the bottom of the cavity to prevent excessive collision or premature contact between the interface terminals and the test probe plate 116. The clearance 112b can be a notch on the side wall of the receiving cavity 112a; it is used for loading and unloading the IGBT module 200. This provides operating space for the operator's fingers or the gripper of the robotic arm. This greatly simplifies the loading and unloading of the IGBT module 200, effectively avoiding potential damage to the module due to inconvenient operation during loading and unloading, and more importantly, improving the usability, safety, and production efficiency of the entire testing device.

[0048] In one embodiment, the limiting seat 112 is further provided with a sensing module 117, which is used to check the installation position of the IGBT module 200, and the sensing module 117 is signal connected to the cylinder 114.

[0049] Understandably, the sensing module 117 monitors the installation status of the IGBT module 200 in real time, using it as a prerequisite for starting the cylinder 114. This fundamentally eliminates the possibility of product damage or test pin plate 116 damage caused by direct starting of the crimping process due to improper placement, tilting, or omission of the IGBT module 200. This improves the safety of the entire testing process and ensures the safety of the equipment and the device under test.

[0050] Preferably, the test fixture 110 further includes a stop block 118, which is disposed on both sides of the limiting seat 112 and is used to limit the pressure plate 115.

[0051] Specifically, the stop block 118 is preferably made of elastic plastic material, which meets certain hardness requirements to achieve physical protection of the limit seat 112, effectively preventing excessive pressure accidents caused by cylinder 114 failure, and significantly improving the safety of the device.

[0052] Please see Figure 1 In one embodiment, the test fixture 110 further includes a protective plate 119; the protective plate 119 is disposed at the end of the guide rod 113 to limit the height of the device; wherein the protective plate 119 is made of a transparent material.

[0053] Understandably, the protective plate 119 can effectively prevent mechanical injury accidents; at the same time, the transparent material ensures that operators can visually monitor the testing process without sacrificing safety, thus facilitating the quick detection of installation errors, test abnormalities, and other situations.

[0054] Please continue reading. Figures 1 to 3In a specific embodiment of this utility model, the test control board 140 has a drive signal output terminal 141, a DC bus output terminal 142, a power input terminal 143, and a command signal receiving terminal 144.

[0055] The drive interface of the IGBT module 200 is connected to the drive signal output terminal 141 through the female terminal and the male terminal 116a; the power interface of the IGBT module 200 is connected to the DC bus output terminal 142 through the metal contact and the elastic pin 116b; the power input terminal 143 is used to connect to the power grid; and the command signal receiving terminal 144 is used to connect to the host computer.

[0056] It is understood that this embodiment clearly defines the external interface of the test control board 140 and its specific connection method with the IGBT module 200, constructing two independent transmission paths with completely separated physical and electrical characteristics. This achieves complete isolation between the drive signal and the power signal, effectively eliminating electromagnetic interference from high voltage to low voltage, and ensuring the purity and accuracy of the drive waveform during dynamic testing. Moreover, through the standardized and specialized external structural design of the test control board 140, the entire test connection process becomes extremely fast, simple, and reliable, significantly improving test efficiency and the consistency of results.

[0057] Further, please refer to Figure 2 and Figure 3 In a specific embodiment, the test control board 140 includes a power supply circuit 145, a detection circuit 146, a control circuit 147, and a drive circuit 148.

[0058] The power supply circuit 145 is connected to the power input terminal 143 and the DC bus output terminal 142, and is used to generate a DC bus power signal that matches the IGBT module 200.

[0059] The detection circuit 146 is connected to the power supply circuit 145 and is used to collect and detect the DC bus power signal generated by the power supply circuit 145.

[0060] The control circuit 147 is connected to the detection circuit 146 and the instruction signal receiving terminal 144, and is used to generate the driving logic of the IGBT module 200 according to the power signal collected by the detection circuit 146 and the instruction from the host computer.

[0061] The drive circuit 148 is connected to the control circuit 147 and the drive signal output terminal 141. It is used to receive the drive logic of the control circuit 147 and convert the drive logic into a dynamic performance control signal to realize the dynamic performance on / off control of the IGBT module 200.

[0062] The test control board 140 is a hybrid integrated circuit board, and the power supply circuit 145 is printed on the test control board 140. The detection circuit 146, the control circuit 147 and the drive circuit 148 are packaged in a chip and soldered to the test control board 140 through the chip pins.

[0063] Specifically, the power supply circuit 145 can convert the AC power input from the external power grid through the power input terminal 143, such as AC220V / 380V, into DC power of a specific specification required for testing, such as DC 600V / 1200V. Specifically, the power supply circuit 145 includes, but is not limited to, a rectifier circuit, a filter capacitor, and a pre-charge circuit.

[0064] Furthermore, the DC bus power signal can be parameters such as voltage and current output by the power supply circuit 145. The detection circuit 146 is used to ensure that the DC bus power signal meets the test requirements and to provide feedback to the control circuit 147. The detection circuit 146 includes, but is not limited to, a voltage sensor, a current sensor, and an analog-to-digital converter.

[0065] Specifically, the control circuit 147 receives real-time data from the detection circuit 146 and commands from the host computer from the command signal receiving terminal 144, and calculates the timing and duty cycle of the drive signals to be sent to the IGBT through an internal algorithm.

[0066] Understandably, the command signals from the host computer could be start test, switching frequency, switching count, etc.

[0067] Optionally, the control circuit 147 may be a microcontroller (MCU), a digital signal processor (DSP), or a field-programmable gate array (FPGA).

[0068] It should also be explained that the drive logic generated by the control circuit 147 is a low-voltage digital signal, which cannot directly drive the IGBT module 200. The drive circuit 148 is responsible for amplifying its power and generating the turn-on and turn-off voltages required by the IGBT module 200 to achieve dynamic on / off control of the IGBT module 200.

[0069] Optionally, the driving circuit 148 is a gate driver IC.

[0070] The detection circuit 146, the control circuit 147, and the drive circuit 148 are packaged in a single chip. This integrates three circuits responsible for signal processing, calculation, and drive into a single application-specific integrated circuit (ASIC) chip or system-on-a-chip (SoC).

[0071] Understandably, the above technical solution achieves optimal isolation between high-voltage and low-voltage circuits, and between interference sources and sensitive circuits, by printing the power supply circuit 145, which is prone to interference and has a large size, onto a circuit board, while highly integrating and packaging the noise-sensitive signal processing, control, and drive circuits 148 into a single chip. This greatly enhances the system's electromagnetic interference resistance and signal integrity. At the same time, this integrated design significantly reduces the number of external connections and components, which not only significantly improves the reliability and stability of the circuit, but also makes the test control board 140 very compact, which is conducive to the miniaturization of the overall device.

[0072] Optionally, in another embodiment, the control circuit 147 is an MCU chip, and the power supply circuit 145, the detection circuit 146 and the drive circuit 148 are all arranged on the substrate of the test control board 140 in the form of discrete circuits.

[0073] Understandably, the design of MCU chips combined with discrete circuits offers extremely high flexibility, low cost, and ease of debugging.

[0074] The above-described embodiments are only used to illustrate the technical solutions of this utility model, and are not intended to limit it. Although this utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this utility model.

Claims

1. An IGBT module testing device, characterized in that, This includes test fixtures and test control boards; The testing fixture includes a test box, a limit seat, a guide rod, a cylinder, and a pressure plate; The limiting seat is located above the test box and is used to place and limit the IGBT module under test; the test box is a metal structure, and the test control board is located in the test box; the cylinder is fixed to the test box, and the piston end of the cylinder is connected to the pressure plate; the guide rod is located above the test box, and the pressure plate and the guide rod are slidably engaged to press the IGBT module, so that the IGBT under test is electrically connected to the test control board; A test pin plate is also provided between the test control board and the limiting seat, and the test pin plate is electrically connected to the test control board; the test pin plate has a male terminal and a flexible pin; the male terminal is used to transmit drive signals, and the flexible pin is used to transmit power signals.

2. The IGBT module testing device as described in claim 1, characterized in that, The limiting seat has a receiving cavity for placing the IGBT module, and the receiving cavity has symmetrically arranged clearance positions for mounting and dismounting the IGBT module.

3. The IGBT module testing device as described in claim 2, characterized in that, The limiting seat is also equipped with a sensing module, which is used to check the installation position of the IGBT module. The sensing module is connected to the cylinder signal.

4. The IGBT module testing device as described in claim 2, characterized in that, The testing fixture also includes stop blocks, which are located on both sides of the limiting seat and are used to limit the pressure plate.

5. The IGBT module testing device as described in claim 4, characterized in that, The testing fixture also includes a protective plate; the protective plate is disposed at the end of the guide rod to limit the height of the device; wherein the protective plate is made of a transparent material.

6. The IGBT module testing apparatus according to any one of claims 1 to 5, characterized in that, The test control board has a drive signal output terminal, a DC bus output terminal, a power input terminal, and a command signal receiving terminal; The drive interface of the IGBT module is connected to the drive signal output terminal through a female connector and a male connector; the power interface of the IGBT module is connected to the DC bus output terminal through a metal contact and a flexible pin; the power input terminal is used to connect to the power grid; and the command signal receiving terminal is used to connect to the host computer.

7. The IGBT module testing device as described in claim 6, characterized in that, The test control board includes a power supply circuit, a detection circuit, a control circuit, and a drive circuit. The power supply circuit is connected to the power input terminal and the DC bus output terminal, and is used to generate a DC bus power signal that matches the IGBT module. The detection circuit is connected to the power supply circuit and is used to collect and detect the DC bus power signal generated by the power supply circuit. The control circuit is connected to the detection circuit and the instruction signal receiving terminal, and is used to generate the driving logic of the IGBT module according to the power signal collected by the detection circuit and the instruction of the host computer. The drive circuit is connected to the control circuit and the drive signal output terminal, and is used to receive the drive logic of the control circuit and convert the drive logic into a dynamic performance control signal to realize the dynamic performance on / off control of the IGBT module. The test control board is a hybrid integrated circuit board, and the power supply circuit is printed on the test control board. The detection circuit, the control circuit, and the drive circuit are packaged in a chip and soldered to the test control board through the chip pins.

8. The IGBT module testing device as described in claim 6, characterized in that, The test control board includes a power supply circuit, a detection circuit, a control circuit, and a drive circuit. The power supply circuit is connected to the power input terminal and the DC bus output terminal, and is used to generate a DC bus power signal that matches the IGBT module. The detection circuit is connected to the power supply circuit and is used to collect and detect the DC bus power signal generated by the power supply circuit. The control circuit is connected to the detection circuit and the instruction signal receiving terminal, and is used to generate the driving logic of the IGBT module according to the power signal collected by the detection circuit and the instruction of the host computer. The drive circuit is connected to the control circuit and the drive signal output terminal, and is used to receive the drive logic of the control circuit and convert the drive logic into a dynamic performance control signal to realize the dynamic performance on / off control of the IGBT module. The control circuit is an MCU chip, and the power supply circuit, detection circuit and drive circuit are all set on the substrate of the test control board in the form of discrete circuits.

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