A varistor aging test device

Abstract

This utility model relates to a varistor aging test device, including an aging test chamber. The chamber contains a support plate that can be operated for removal and replacement. The support plate has multiple insertion sockets with multiple spaced-apart ports. Each port has a conductive clamping component. The multiple insertion sockets on the support plate are connected in parallel to allow the varistor's leads to be inserted into the ports and clamped and fixed by the clamping components, achieving electrical connection for testing. The varistor of this utility model can be quickly replaced, greatly reducing manual operation time and significantly improving testing efficiency. The ports accommodate lead insertion of different outer diameters, supporting various models of varistors without the need for fixture replacement. It is suitable for aging tests at 200℃ without structural deformation or melting. The modular assembly of the support plate maximizes the filling volume of the aging chamber, resulting in high space utilization. It is suitable for mass production testing, allowing manufacturers to use it in batches and improve aging screening efficiency.

Description

Technical Field

[0001] This utility model relates to the field of lightning protection product testing technology, and in particular to an aging test device for varistors used in high-temperature environments. Background Technology

[0002] Varistors are electronic components commonly used for overvoltage protection and are widely used in power supplies, communication equipment, and home appliances. To ensure their long-term stability and reliability, aging tests are required. This typically involves placing multiple varistors in a high-temperature environment and applying their rated voltage for a certain period (e.g., 1000 hours) to observe whether their electrical performance deteriorates or fails.

[0003] Current varistor aging test equipment and methods have the following main problems: 1. Outdated wiring methods: Traditional methods often involve manual soldering or connecting multiple varistors in parallel using screw terminals before power is applied. This method is not only inefficient but also cannot meet the needs of quickly changing test samples in laboratories or production lines. 2. Simple structure and lack of versatility: Most existing devices are customized for specific models of varistors, with poor adaptability, which is not conducive to testing different specifications and models of products in laboratories or manufacturers. 3. Inefficient use of space: When multiple varistors are arranged in ordinary test fixtures, the internal space of the aging chamber is often not fully utilized, resulting in a limited number of test samples per unit volume and low test efficiency. 4. Unable to guarantee electrical connection stability: During the 1000-hour long-term power-on process, some devices may have problems such as increased contact resistance or loosening, which may affect the reliability of the aging test. Summary of the Invention

[0004] The purpose of this invention is to provide a varistor aging test device that is quick to plug and unplug, highly versatile, compatible with high-temperature aging chambers, and capable of withstanding long-term energized varistor aging tests.

[0005] To achieve the above objectives, the present invention adopts the following technical solution: A varistor aging test device includes an aging test chamber. The aging test chamber has a support plate that can be operated to be removed and put back. The support plate has multiple plug-in sockets with multiple spaced-apart ports. Each port has a conductive clamping component. The multiple plug-in sockets on the support plate are connected in parallel so that the pins of the varistor can be inserted into the port and clamped and fixed by the clamping component to achieve electrical connection and realize the power-on test.

[0006] The above-mentioned solution is further described as follows: the clamping assembly has two symmetrically arranged metal plates, which are fixed to the socket by implantation or injection molding. One end of the metal plate extends into the socket and is bent to form a spring arm, while the other end of the metal plate extends out of the socket to form a welding foot. The spring arm has an inclined guide section and a clamping section. The inclined guide section is inclined towards the center of the socket, and the clamping section connects to the end of the inclined guide section and extends along the insertion direction of the varistor pin. The clamping sections of the two metal plates are close to each other or have a gap between them, and the gap is smaller than the outer diameter of the varistor pin, so that the clamping section can clamp and fit the pin.

[0007] A further improvement of the above solution is that the carrier board uses a busbar structure or PCB copper strip busbar to connect multiple plug-in sockets in parallel and then connect them to a unified power line.

[0008] The above-mentioned solution further includes a base plate and a boss that protrudes upward from the base plate. The socket is recessed inward from the upper end of the boss, and there is a partition wall separating adjacent sockets. The welding foot extends out from the base plate.

[0009] A further improvement in the above scheme is that the sockets are three in number and arranged in a row.

[0010] Furthermore, the above-mentioned solution is that the plug-in socket is T-shaped, and the base plate also has mounting holes, so that the plug-in socket can be screwed onto the support plate through the mounting holes.

[0011] A further improvement of the above scheme is that the edge of the bearing plate has a splicing part, so that multiple bearing plates can be selected and spliced ​​together for testing.

[0012] Compared with the prior art, the varistor aging test device of this utility model has the following advantages: 1. Significantly improves testing efficiency: The pins of the varistor are inserted into the socket and clamped and fixed by the clamping component, and the connection is made, which can be quickly replaced, greatly reducing manual operation time; 2. High versatility: The socket accommodates pins of different outer diameters and supports various types of varistors without the need to change fixtures; 3. Stable operation at high temperatures over long periods: It can withstand aging tests at 200℃ without structural deformation or melting; 4. High space utilization: The modular assembly method of the bearing plate can maximize the filling volume of the aging chamber; 5. High contact reliability: No contact problems during power-on, improving the reliability of test data; 6. Suitable for mass production testing: Manufacturers can use it in batches to improve the efficiency of aging screening. Attached Figure Description

[0013] Appendix Figure 1 This is a schematic diagram of one embodiment of the present utility model; Appendix Figure 2 for Figure 1 A schematic diagram of the plug-in socket structure; Appendix Figure 3 for Figure 2 A schematic diagram of the cross-sectional structure of the plug-in socket. Detailed Implementation

[0014] The following will further explain the concept, specific structure and technical effects of this utility model in conjunction with the accompanying drawings, so as to fully understand the purpose, features and effects of this utility model.

[0015] It should be noted that in the description of this utility model, the terms "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., indicating the direction or positional relationship are based on the direction or positional relationship shown in the drawings. This is only for the convenience of description and does not indicate or imply that the device or element must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, it should not be construed as a limitation of this utility model.

[0016] Figure 1 , 2 As shown in Figure 3, the varistor aging test device provided by this utility model includes an aging test chamber 1, which provides a corresponding aging test environment. The aging test chamber 1 has a support plate 2 that can be operated to be removed and placed back in. The support plate 2 has multiple plug-in sockets 3, achieving a modular design for convenient aging test operations. Each plug-in socket 3 has multiple spaced-apart ports 31, each port having a conductive clamping component 5. The multiple plug-in sockets 3 on the support plate 2 are connected in parallel so that the leads 41 of the varistor 4 can be inserted into the ports of the plug-in sockets and clamped and fixed by the clamping components 5, achieving a conductive connection for the power-on test. This plug-in connection eliminates the need for manual soldering or screw terminal connections, enabling rapid plug-in replacement and greatly reducing manual operation time.

[0017] The clamping assembly 5 has two symmetrically arranged metal plates 51, which can be formed by elastic copper springs or beryllium copper stamping. The metal plates 51 are fixed to the plug-in socket 3 by implantation or injection molding. One end of the metal plate extends into the socket and is bent to form a spring arm, while the other end of the metal plate extends out of the plug-in socket 3 to form a welding foot 511 for connecting the power supply circuit to meet the test requirements. The spring arms of the two metal plates 51 are close to each other to form a clamping posture and have corresponding expansion and contraction properties, which is conducive to clamping the pin 41 of the varistor 4. It can also adapt to clamping pins with different outer diameters, supporting multiple models of varistors without the need to change the fixture. The spring arm has an inclined guide section 512 and a clamping section 513. The inclined guide section 512 is inclined towards the center of the socket, and the inclined guide sections 512 of the two spring arms form a V-shape, which facilitates the centering of the pin 4 of the varistor 4 when it is inserted, with low insertion force and convenient operation. The clamping section 513 connects to the end of the inclined guide section 512 and extends along the insertion direction of the pin 41 of the varistor 4. The clamping sections 513 of the two metal sheets 51 are close to each other or have a gap, and the gap is smaller than the outer diameter of the pin 41 of the varistor 4, so that the clamping section 513 can clamp and fit the pin 41, resulting in a stable connection and good electrical conductivity, which is beneficial for power-on testing. The metal sheets 51 are suitable for high-temperature aging tests at 200℃, with no structural deformation or melting, thus improving service life.

[0018] In this embodiment, the plug-in socket 3 includes a base plate 32 and a boss 33 protruding upward from the base plate. The socket 31 is recessed inward from the upper end of the boss 33. Adjacent sockets are separated by a partition wall 34 to prevent short circuits. The structure is simple and can be integrally molded from insulating material. The welding foot 511 extends from the base plate 32, facilitating assembly on the upper plate. Furthermore, the plug-in socket 3 is T-shaped and small in size, making it easy to arrange in an array on the support plate, making full use of space and improving the effectiveness of aging tests. The base plate 32 also has mounting holes 321, allowing the plug-in socket 3 to be screwed onto the support plate 2 through the mounting holes 321, facilitating assembly and maintenance. In this embodiment, there are three sockets 31 arranged in a row. Different sockets can be selected for use to meet the aging tests of two-pin or three-pin varistor 4. The pin insertion end of the varistor 4 can be supported by the inner bottom of the socket 31, while the clamping component 5 clamps the upper part of the pin, obtaining multi-point support, stable connection, and also helps to maintain electrical conductivity connection, ensuring the operation of the power-on test.

[0019] In this embodiment, multiple plug-in sockets 3 are connected in parallel on the carrier plate 2 using a busbar structure or PCB copper strip busbar, and then a unified power line is connected. This facilitates wiring and assembly, and the damage to one plug-in socket 3 or the absence of a varistor 4 will not affect the aging test of others. Furthermore, splicing parts can be left on the edge of the carrier plate 2, allowing multiple carrier plates 2 to be selectively spliced ​​together for testing. This modular assembly method can maximize the filling volume of the aging chamber and increase the testing capacity.

[0020] This utility model's varistor aging test device consists of a clamping assembly 5 made of high-temperature resistant material. The sockets can accommodate the pins of varistors of different sizes, and the pins are securely connected via elastic copper springs or beryllium copper contact structures. Power wiring utilizes a busbar structure or PCB copper strip busbars. All sockets are electrically connected in parallel and then connected to a unified power supply line for easy connection to DC or AC aging power. The support plate can be made of high-temperature resistant fiberglass board or ceramic plate, providing stable support and necessary heat dissipation channels to prevent overheating. Multiple support plate modules can be spliced ​​and combined via edge connection structures to adapt to different aging chamber volumes and sample quantity requirements.

[0021] This utility model has the following advantages: 1. Significantly improves testing efficiency: The pins of the varistor are inserted into the socket and clamped and fixed by the clamping component, and the connection is made, which can be quickly replaced, greatly reducing manual operation time; 2. High versatility: The socket accommodates pins of different outer diameters and supports various types of varistors without the need to change fixtures; 3. Stable operation at high temperatures over long periods: It can withstand aging tests at 200℃ without structural deformation or melting; 4. High space utilization: The modular assembly method of the bearing plate can maximize the filling volume of the aging chamber; 5. High contact reliability: No contact problems during power-on, improving the reliability of test data; 6. Suitable for mass production testing: Manufacturers can use it in batches to improve the efficiency of aging screening.

[0022] This invention has a simple structure, few parts, is easy to disassemble and assemble, has low investment costs, and improves the service life and detection performance of the testing system.

[0023] The present invention has been described in detail above with reference to the embodiments. It is only for the purpose of illustrating the technical concept and features of the present invention, and its purpose is to enable those skilled in the art to understand the content of the present invention and implement it. Therefore, all equivalent changes or modifications made in accordance with the spirit and essence of the present invention should be covered within the protection scope of the present invention.

Claims

1. A varistor aging test apparatus, comprising an aging test chamber (1), characterized in that, The aging test chamber (1) is provided with a support plate (2) that can be operated to be removed and put back. The support plate (2) is provided with multiple plug-in sockets (3). The plug-in sockets (3) are provided with multiple sockets (31) arranged at intervals. Each socket is provided with a conductive clamping component (5). The multiple plug-in sockets (3) on the support plate (2) are connected in parallel so that the pins (41) of the varistor (4) can be inserted into the socket and clamped and fixed by the clamping component (5) and connected to conduct electricity to achieve the power-on test.

2. The varistor aging test device according to claim 1, characterized in that: The clamping assembly (5) has two symmetrically arranged metal plates (51). The metal plates (51) are fixed to the plug socket (3) by implantation or injection molding. One end of the metal plate extends into the socket and is bent to form a spring arm. The other end of the metal plate extends out from the plug socket (3) and forms a welding foot (511). The spring arm has an inclined guide section (512) and a clamping section (513). The inclined guide section (512) is inclined towards the center of the socket. The clamping section (513) connects to the end of the inclined guide section (512) and extends along the insertion direction of the pin (41) of the varistor (4). The clamping sections (513) of the two metal plates (51) are close to each other or have a gap. The gap is smaller than the outer diameter of the pin (41) of the varistor (4), so that the clamping section (513) can clamp and fit the pin (41).

3. The varistor aging test device according to claim 1, characterized in that: The carrier plate (2) uses a busbar structure or PCB copper strip busbar to connect multiple plug-in sockets (3) in parallel and then connect the power line to them.

4. A varistor aging test apparatus according to claim 1 or 2, characterized in that: The plug-in socket (3) includes a base plate (32) and a boss (33) protruding upward from the base plate. The socket (31) is recessed from the upper end of the boss (33). There is a partition wall (34) separating adjacent sockets. The welding foot (511) extends from the base plate (32).

5. The varistor aging test apparatus according to claim 4, characterized in that: There are three sockets (31) arranged in a row.

6. The varistor aging test apparatus according to claim 4, characterized in that: The plug-in socket (3) is T-shaped, and the base plate (32) also has a mounting hole (321) so that the plug-in socket (3) can be screwed onto the support plate (2) through the mounting hole (321).

7. A varistor aging test apparatus according to claim 1 or 3, characterized in that: The edge of the bearing plate (2) has a splicing part, so that multiple bearing plates (2) can be selected and spliced ​​together for testing.

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