Chip testing equipment

Abstract

This utility model relates to the field of chip testing technology, specifically to a chip testing device, including a test box and a testing mechanism for testing the chip under test. The testing mechanism is located inside the test box and includes a limiting structure for clamping and limiting the chip under test, and a pressing structure for pressing the chip under test downwards. A chip body is disposed between two clamping plates, and a dust blowing structure is provided on the front side of the fixing frame for blowing dust off the surface of the chip body. Beneficial effects: The limiting structure clamps and limits the chip body, ensuring stability during testing. Then, the pressing structure presses the chip body downwards for testing. During the downward movement of the chip body, the dust blowing structure blows off and collects the dust adhering to the surface of the chip body, preventing dust from affecting the chip body during testing, thereby improving the accuracy of the test results and reducing damage to the chip body.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, and in particular to a chip testing device. Background Technology

[0002] With the rapid development of technology, electronic devices are facing increasingly stringent requirements for power management. As a key component in electronic devices, the stability and reliability of power IC chips directly affect the overall operating efficiency and safety of the device. Therefore, accurate testing of power IC chips is particularly important.

[0003] By comparing a power IC chip testing device with patent publication number CN222887710U, this solution adjusts the upright or inverted state of the spring contacts to adapt to the testing requirements of power IC chips with different packaging forms such as BGA and LGA, greatly improving the compatibility of the testing device and reducing testing costs and time. However, before testing the chip, due to long-term exposure to the outside world, a certain amount of dust may adhere to the chip surface. This dust may affect the test results, reduce the accuracy of the test results, and in severe cases, may damage the chip during testing. Utility Model Content

[0004] The purpose of this invention is to provide a chip testing device to solve the above-mentioned problems.

[0005] This utility model achieves the above objectives through the following technical solutions: A chip testing apparatus includes a test box and a test mechanism for testing the chip under test, the test mechanism being located inside the test box; The testing mechanism includes a limiting structure for clamping and limiting the chip under test, and a pressing structure for pressing down on the chip under test. The limiting structure includes a fixed frame located inside the rear of the test box. Inside the fixed frame is a pressure plate. Two connecting plates symmetrically arranged in the front-back direction are fixed at the upper end of the pressure plate. The connecting plates are L-shaped. A clamping plate is slidably installed above the connecting plates. The top of the clamping plate is curved and the bottom is vertical. A telescopic rod is provided between the clamping plate and the connecting plate. A limiting spring is provided on the outside of the telescopic rod. Two front-back symmetrical limiting plates are fixedly installed on the surface of the clamping plate. The chip body is located between the two clamping plates. A dust blowing structure for blowing dust off the surface of the chip body is provided at the front of the fixed frame.

[0006] Preferred: The soot blowing structure includes a baffle fixedly installed inside the fixed frame, a compression chamber between the rear side of the baffle and the fixed frame, a blowing chamber between the front side of the baffle and the fixed frame, the blowing chamber and the bottom end of the compression chamber being connected, a pressure plate being slidably connected to the compression chamber, a compression spring being connected between the bottom end of the pressure plate and the compression chamber, multiple blowing holes being opened on the front side above the blowing chamber, and a waste box being slidably installed on the front side inside the test box.

[0007] Preferably, the pressing structure includes a cover plate rotatably mounted above the test box, a rotating cavity at the lower end of the cover plate, a cotton pad below the rotating cavity, a pressing spring connecting the upper end of the cotton pad to the rotating cavity, a cotton pad installed at the bottom end of the cover plate, a base plate at the center of the test box, a test plate above the base plate, a rotating plate rotatably mounted at the front end of the cover plate, a torsion spring connecting the rotating end of the rotating plate to the cover plate, a locking plate installed at the front end of the test box, the locking plate engaging with the rotating plate, and a driving structure between the cotton pad and the rotating cavity for driving the cotton pad to move downward.

[0008] Preferably, the drive structure includes a rotating rod rotatably mounted on the upper end of the rotating cavity, a rotating handle fixed to the upper end of the rotating rod, an upper arc-shaped block fixed to the bottom end of the rotating rod, and a lower arc-shaped block installed on the upper end of the cotton pad, with the lower arc-shaped block slidingly engaging with the upper arc-shaped block.

[0009] Preferably, the limiting plate is made of rubber.

[0010] Preferably, the top of the clamping plate is made of a smooth material, and the bottom is made of silicone.

[0011] Preferred design: The front end of the waste bin is fixed with a handle, and a cotton pad is installed at the bottom of the cover.

[0012] Compared with existing technologies, the beneficial effects are as follows: The chip body is clamped and limited by a limiting structure to ensure stability during testing. Then, the chip body is pressed down by a pressing structure to test it. During the downward movement of the chip body, a dust blowing structure is used to blow off and collect the dust attached to the surface of the chip body to prevent dust from affecting the chip body during testing, thereby improving the accuracy of test results and reducing damage to the chip body. Attached Figure Description

[0013] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0014] Figure 1 This is a spatial perspective view of the chip testing device described in this utility model; Figure 2 This is a cross-sectional view of the internal structure of the test box of the chip testing device described in this utility model; Figure 3 This is a cross-sectional view of the internal structure of the fixed frame of the chip testing device described in this utility model; Figure 4 This is a schematic diagram of the structure between the test board and the chip body of the chip testing device described in this utility model; Figure 5 This is a cross-sectional view of the internal structure of the rotating cavity of the chip testing device described in this utility model; Figure 6 This is a schematic diagram of the structure between the upper arc-shaped block and the lower arc-shaped block of the chip testing device described in this utility model.

[0015] The annotations in the attached figures are explained as follows: 100. Test box; 201. Base plate; 202. Test board; 203. Cover plate; 204. Cotton pad; 205. Rotating plate; 206. Clamping plate; 207. Fixing frame; 208. Baffle; 209. Compression chamber; 210. Air blowing chamber; 211. Air blowing hole; 212. Pressure plate; 213. Connecting plate; 214. Clamping plate; 215. Limiting plate; 216. Chip body; 217. Waste bin; 218. Telescopic rod; 219. Rotating rod; 220. Upper arc block; 221. Lower arc block; 222. Rotating chamber. Detailed Implementation

[0016] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.

[0017] The present invention will be further described below with reference to the accompanying drawings: like Figures 1-6 As shown, the chip testing apparatus includes a test box 100 and a test mechanism for testing the chip under test, which is located inside the test box 100.

[0018] In this embodiment, the testing mechanism includes a limiting structure for clamping and limiting the chip under test, and a pressing structure for pressing down on the chip under test.

[0019] The limiting structure includes a fixed frame 207 located inside the rear side of the test box 100. A pressure plate 212 is provided inside the fixed frame 207. Two connecting plates 213 are fixedly fixed at the upper end of the pressure plate 212, which are symmetrically arranged in the front-back direction. The connecting plates 213 are L-shaped. A clamping plate 214 is slidably installed above the connecting plates 213. The top end of the clamping plate 214 is arc-shaped, and the bottom end is vertical. A telescopic rod 218 is provided between the clamping plate 214 and the connecting plate 213. A limiting spring is provided on the outside of the telescopic rod 218. Two front-back symmetrical limiting plates 215 are fixedly installed on the surface of the clamping plate 214. A chip body 216 is provided between the two clamping plates 214. The limiting plates 215 are made of rubber. The top end of the clamping plate 214 is made of smooth material, and the bottom end is made of silicone material. A dust blowing structure for blowing dust off the surface of the chip body 216 is provided on the front side of the fixed frame 207.

[0020] The soot blowing structure includes a baffle 208 fixedly installed inside the fixed frame 207. A compression chamber 209 is provided between the rear side of the baffle 208 and the fixed frame 207. A blowing chamber 210 is provided between the front side of the baffle 208 and the fixed frame 207. The blowing chamber 210 is connected to the bottom end of the compression chamber 209. A pressure plate 212 is slidably connected to the compression chamber 209. A compression spring is connected between the bottom end of the pressure plate 212 and the compression chamber 209. Multiple blowing holes 211 are opened on the front side above the blowing chamber 210. A waste bin 217 is slidably installed on the front side inside the test box 100. A handle is fixed to the front end of the waste bin 217.

[0021] The pressing structure includes a cover plate 203 rotatably mounted above the test box 100. A rotating cavity 222 is opened at the lower end of the cover plate 203. A cotton pad 204 is provided below the rotating cavity 222. A pressing spring is connected between the upper end of the cotton pad 204 and the rotating cavity 222. The cotton pad 204 is installed at the bottom end of the cover plate 203. A base plate 201 is provided at the center of the test box 100. A test plate 202 is provided above the base plate 201. A rotating plate 205 is rotatably mounted at the front end of the cover plate 203. A torsion spring is connected between the rotating end of the rotating plate 205 and the cover plate 203. A locking plate 206 is installed at the front end of the test box 100. The locking plate 206 is engaged with the rotating plate 205. A driving structure for driving the cotton pad 204 to move downward is provided between the cotton pad 204 and the rotating cavity 222.

[0022] The driving structure includes a rotating rod 219 rotatably mounted on the upper end of the rotating cavity 222. A rotating handle is fixed to the upper end of the rotating rod 219, and an upper arc-shaped block 220 is fixed to the bottom end of the rotating rod 219. A lower arc-shaped block 221 is installed on the upper end of the cotton pad 204. The lower arc-shaped block 221 and the upper arc-shaped block 220 slide together. The limiting structure clamps and limits the chip body 216 to ensure stability during testing. Then, the pressing structure presses the chip body 216 downward to test the chip body 216. During the downward movement of the chip body 216, the dust blowing structure blows off and collects the dust attached to the surface of the chip body 216 to prevent the dust from affecting the chip body 216 during testing, thereby improving the accuracy of the test results and reducing damage to the chip body 216.

[0023] Working principle: First, the chip body 216 is placed between two clamping plates 214. Then, the two limiting plates 215 on the clamping plates 214 are used to limit and clamp the front and rear ends of the chip body 216, thus fixing the chip body 216 in place. Next, the cover plate 203 is pressed down, causing the cotton pad 204 to move downward. When the cover plate 203 moves downward, it will press the pressure plate 212 downward. The pressure plate 212 will move the clamped chip body 216 down to above the test board 202. Then, the rotating rod 219 is rotated to move the upper arc block 220. When rotated, the upper arc-shaped block 220 and the lower arc-shaped block 221 press against each other, which applies downward pressure to the lower arc-shaped block 221. This causes the lower arc-shaped block 221 to move the cotton pad 204 downward. The cotton pad 204 then contacts the chip body 216, applying downward pressure to the chip body 216 and causing it to move downward. Consequently, the chip body 216 presses against the two clamping plates 214 to both sides, causing the two clamping plates 214 to move away from each other to one side. This moves the chip body 216 between the bottom ends of the two clamping plates 214, clamping and fixing the chip body 216.

[0024] As the chip body 216 moves downward, it causes the connecting plate 213 to move downward, which in turn causes the pressure plate 212 to move downward. As the pressure plate 212 moves downward, it compresses the air inside the compression chamber 209 into the blowing chamber 210, which then discharges the air outward through multiple blowing holes 211 at the front end of the blowing chamber 210. This blows away dust from the surface of the chip body 216. Because the blown air moves from back to front, it causes the dust to move forward and eventually fall into the waste bin 217 on the front side for collection, thus cleaning the chip body 216. Dust on the surface of chip 216 is cleaned to prevent it from affecting the chip body 216 during testing. Then, the chip body 216 is pressed down until it is in contact with the test board 202, so that the chip body 216 can be tested using the test board 202. The rotating plate 205 at the front end of the cover plate 203 is engaged with the card plate 206 on the front side of the test box 100 to fix the cover plate 203, so that the cover plate 203 covers the chip body 216 inside the test box 100 for testing.

[0025] The foregoing has shown and described the basic principles, main features, and advantages of this utility model. Those skilled in the art should understand that this utility model is not limited to the above embodiments. The embodiments and descriptions in the specification are merely illustrative of the principles of this utility model. Various changes and modifications can be made to this utility model without departing from its spirit and scope, and all such changes and modifications fall within the scope of the claimed utility model.

Claims

1. Chip testing device comprising a test cartridge (100), characterized in that: It also includes a test mechanism for testing the chip under test, the test mechanism being located inside the test box (100); The testing mechanism includes a limiting structure for clamping and limiting the chip under test, and a pressing structure for pressing down on the chip under test. The limiting structure includes a fixed frame (207) disposed inside the rear side of the test box (100). A pressure plate (212) is provided inside the fixed frame (207). Two connecting plates (213) are fixed at the upper end of the pressure plate (212) and arranged symmetrically in the front-back direction. The connecting plate (213) is L-shaped. A clamping plate (214) is slidably installed above the connecting plate (213). The top end of the clamping plate (214) is arc-shaped and the bottom end is vertical. A telescopic rod (218) is provided between the clamping plate (214) and the connecting plate (213). A limiting spring is provided on the outside of the telescopic rod (218). Two front-back symmetrical limiting plates (215) are fixedly installed on the surface of the clamping plate (214). A chip body (216) is provided between the two clamping plates (214). A dust blowing structure for blowing dust off the surface of the chip body (216) is provided on the front side of the fixed frame (207).

2. The chip testing apparatus according to claim 1, characterized by: The soot blowing structure includes a baffle (208) fixedly installed inside the fixed frame (207). A compression chamber (209) is provided between the rear side of the baffle (208) and the fixed frame (207). A blowing chamber (210) is provided between the front side of the baffle (208) and the fixed frame (207). The blowing chamber (210) is connected to the bottom end of the compression chamber (209). The pressure plate (212) is slidably connected to the compression chamber (209). A compression spring is connected between the bottom end of the pressure plate (212) and the compression chamber (209). Multiple blowing holes (211) are opened on the front side above the blowing chamber (210). A waste bin (217) is slidably installed on the front side inside the test box (100).

3. The chip testing apparatus according to claim 2, characterized by: The pressing structure includes a cover plate (203) rotatably mounted above the test box (100). A rotating cavity (222) is provided at the lower end of the cover plate (203). A cotton pad (204) is provided below the rotating cavity (222). A pressing spring connects the upper end of the cotton pad (204) to the rotating cavity (222). The cotton pad (204) is installed at the bottom end of the cover plate (203). A base plate (201) is provided at the center of the test box (100). (201) A test plate (202) is provided above. A rotating plate (205) is rotatably installed at the front end of the cover plate (203). A torsion spring is connected between the rotating end of the rotating plate (205) and the cover plate (203). A clamping plate (206) is installed at the front end of the test box (100). The clamping plate (206) is engaged with the rotating plate (205). A driving structure for driving the cotton pad (204) to move downward is provided between the cotton pad (204) and the rotating cavity (222).

4. The chip testing apparatus according to claim 3, characterized by: The driving structure includes a rotating rod (219) rotatably disposed at the upper end of the rotating cavity (222), a rotating handle fixed at the upper end of the rotating rod (219), an upper arc block (220) fixed at the bottom end of the rotating rod (219), and a lower arc block (221) installed at the upper end of the cotton pad (204), the lower arc block (221) slidingly engaging with the upper arc block (220).

5. The chip testing apparatus according to claim 4, characterized by: The limiting plate (215) is made of rubber.

6. The chip testing apparatus according to claim 5, characterized by: The top of the clamping plate (214) is made of smooth material, and the bottom is made of silicone material.

7. The chip testing apparatus according to claim 6, characterized by: The waste bin (217) is fixed with a handle at the front end, and a cotton pad (204) is installed at the bottom of the cover plate (203).

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