An automated memory chip testing device

Abstract

This utility model discloses an automated memory chip testing device, including a chip testing socket, a base ring, and a panel. The panel is disposed on the surface of the base ring, and the surface of the panel has a ring-shaped structure with multiple positioning ports. Each of the four corners of a positioning port has a positioning groove, and a base is slidably disposed in each positioning groove. A portion of each base extends through the positioning groove into the positioning port, and the surface of each base protrudes upward to form an extension that contacts the inner wall of the positioning groove. Multiple positioning parts protrude from the four sides of each positioning port, and a chip to be tested is disposed in each positioning port. The four corners of the chip to be tested are supported on the base, and the sides of the chip to be tested are in contact with the positioning parts. This utility model has a simple structure, the entire process is controlled by a microcontroller, and the degree of automation is high, effectively avoiding the inefficiency of manual operation and significantly improving the testing efficiency of memory chips.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, and specifically to an automated memory chip testing device. Background Technology

[0002] Memory chip testing is a crucial and indispensable part of semiconductor manufacturing. Testing is not just about whether the chip "works," but about systematically checking its various functions and performance indicators.

[0003] Currently, common tests use chip test sockets. However, the current chip test sockets have a simple structure and cannot automatically detect the test operation. Generally, workers need to press the chip into the test slot of the chip test socket, and then open the pressing mechanism on the chip test socket. The operation is relatively troublesome and affects the efficiency of the test. Summary of the Invention

[0004] The technical problem to be solved by this utility model is to provide an automated memory chip testing device, in which the chip to be tested can be placed into the positioning port, supported by the base, and the testing operation can be completed automatically by rotation, so as to solve the problems mentioned in the background art.

[0005] This utility model is achieved through the following technical solution: an automated memory chip testing device, comprising a chip testing socket, a bottom ring, and a panel. The panel is disposed on the surface of the bottom ring, and the surface of the panel has a ring structure with multiple positioning ports. Each of the four corners of the positioning ports has a positioning groove, and a base is slidably disposed in each positioning groove. A portion of the base extends through the positioning groove into the positioning port, and the surface of the base protrudes upward to form an extension that contacts the inner wall of the positioning groove. Multiple positioning parts protrude from the four sides of the positioning port, and a chip to be tested is disposed in each positioning port. The four corners of the chip to be tested are mounted on the base, and the sides of the chip to be tested are in contact with the positioning parts. The chip testing socket is mounted on the inner ring surface of the bottom ring, and a drive mechanism for rotating the panel is installed at one end of the chip testing socket.

[0006] As a preferred technical solution, a support frame is installed on the outer ring surface of the bottom ring, and the other end of the support frame extends to the top of the panel and is vertically mounted with an electric push rod. A lower pressure seat is installed on the piston rod of the electric push rod, and the lower pressure seat is set perpendicularly to any positioning port.

[0007] As a preferred technical solution, the drive mechanism includes a fixed plate and a geared motor. One end of the fixed plate is mounted on the chip test socket, and the other end of the fixed plate is provided with a shaft hole. The geared motor is mounted on the outer side of the fixed plate, and the shaft of the geared motor passes through the shaft hole and is fixedly connected to the center of the panel.

[0008] As a preferred technical solution, both sides of the positioning port are provided with a material retrieval port for inserting fingers.

[0009] As a preferred technical solution, the chip test socket has grooves at all four corners of the test slot, the grooves are all positioned opposite the positioning slots, and the depth of the grooves is lower than the bottom surface of the test slot.

[0010] As a preferred technical solution, a top plate is installed in the opening at the end of the positioning groove away from the bottom ring, and a compression spring is installed between the top plate and the base.

[0011] As a preferred technical solution, both the electric actuator and the drive mechanism are controlled by a microcontroller.

[0012] As a preferred technical solution, the panel is made of insulating plastic material.

[0013] The beneficial effects of this utility model are as follows: This utility model has a simple structure. The chip can be placed into the positioning slot and supported by the base. The base can lift the chip, avoiding friction or collision between the bottom of the chip and the surface of the chip test socket during rotation. The drive mechanism can drive the panel to rotate, so that the chip to be tested can automatically rotate to the top of the chip test socket. The extension of the piston rod on the electric push rod can drive the lower pressure seat to descend, so that the chip to be tested can be automatically pressed into the chip test socket for testing, increasing the testing efficiency. After the test is completed, the return energy of the compression spring can automatically detach the chip from the test slot and pull it back into the positioning slot without affecting the subsequent rotation of the panel. Attached Figure Description

[0014] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0015] Figure 1 This is a schematic diagram of the overall structure of this utility model; Figure 2 This is a schematic diagram of the structure of this utility model after the chip to be tested has been removed; Figure 3 This is a schematic diagram of the structure of this utility model after the panel is removed; Figure 4 This is a bottom view of the present invention.

[0016] The components are as follows: 1. Bottom ring; 2. Panel; 3. Positioning port; 4. Feed port; 5. Positioning part; 6. Top plate; 7. Compression spring; 8. Chip to be tested; 9. Electric push rod; 10. Lower pressure seat; 11. Support frame; 12. Base; 13. Chip test seat; 14. Groove; 15. Fixing plate; 16. Gear motor. Detailed Implementation

[0017] The embodiments of this utility model are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this utility model, and should not be construed as limiting this utility model.

[0018] All features disclosed in this specification, or all steps in all disclosed methods or processes, may be combined in any way, except for mutually exclusive features and / or steps.

[0019] Any feature disclosed in this specification (including any appended claims, abstract, and drawings) may be replaced by other equivalent or similar features for a similar purpose, unless specifically stated otherwise. That is, unless specifically stated otherwise, each feature is merely one example of a series of equivalent or similar features.

[0020] like Figure 1 , Figure 2 , Figure 3 and Figure 4 As shown, an automated memory chip testing device of this utility model includes a chip testing socket 13, a bottom ring 1, and a panel 2. The panel 2 is disposed on the surface of the bottom ring 1. The surface of the panel 2 has a ring structure with multiple positioning ports 3. Each of the four corners of the positioning port 3 has a positioning groove. A base 12 is slidably disposed in each positioning groove. A portion of the base 12 extends through the positioning groove into the positioning port 3. The surface of the base 12 protrudes upward to form an extension that contacts the inner wall of the positioning groove. Multiple positioning parts 5 protrude from the four sides of the positioning port 3. A chip 8 to be tested is disposed in each positioning port 3. The four corners of the chip 8 to be tested are mounted on the base 12. The sides of the chip 8 to be tested are in contact with the positioning parts 5. The chip testing socket 13 is mounted on the inner ring surface of the bottom ring 1. A drive mechanism for rotating the panel 2 is installed at one end of the chip testing socket 13.

[0021] In this embodiment, a support frame 11 is installed on the outer ring surface of the bottom ring 1. The other end of the support frame 11 extends to the top of the panel 2 and is vertically installed with an electric push rod 9. A lower pressure seat 10 is installed on the piston rod of the electric push rod 9. The lower pressure seat 10 is vertically opposite to any one of the positioning ports 3.

[0022] In this embodiment, the driving mechanism includes a fixed plate 15 and a reduction motor 16. One end of the fixed plate 15 is mounted on the chip test socket 13, and the other end of the fixed plate 15 is provided with a shaft hole. The reduction motor 16 is mounted on the outer side of the fixed plate 15, and the shaft of the reduction motor 16 passes through the shaft hole and is fixedly connected to the center of the panel 2. A position sensor (not shown) is mounted on the inner side of the mounting plate. The microcontroller controls the geared motor to rotate continuously until it receives a "position" signal from the position sensor. Once the signal arrives, the microcontroller immediately issues a stop command, and the motor brakes to a stop. This ensures that one positioning port is accurately aligned with the test slot each time.

[0023] After the panel stops, the microcontroller starts an internal timer (for example, pausing for 0.5 seconds to ensure stability). After the short pause, the microcontroller sends an "extend" command to the electric push rod 9. The piston rod of the electric push rod extends downward, pushing the pressure seat 10 to press the chip to be tested 8 into the test slot, thus initiating the physical and electrical connection.

[0024] After the chip is pressed into the test slot, the chip tester begins testing the chip. At the same time, the microcontroller starts another internal timer, which is preset according to the time required for the test process (e.g., 5 seconds). During this test time, the microcontroller keeps the electric push rod in the extended state to ensure a stable test connection.

[0025] After the test timer expires, the microcontroller sends a "retract" command to the electric push rod. After the electric push rod is fully retracted (which may be confirmed by the limit switch on the push rod itself), the microcontroller sends a start command to the geared motor 16 again. The system jumps back to step 1 and starts the next work cycle, sending the next chip to be tested into the test station.

[0026] In this embodiment, both sides of the positioning port 3 are provided with a feeding port 4 for inserting fingers.

[0027] In this embodiment, the chip test socket 13 has grooves 14 at the four corners of the test slot. The grooves 14 are all opposite to the positioning slots, and the depth of the grooves 14 is lower than the bottom surface of the test slot. After the chip to be tested is pressed down, the base can enter the groove, thus avoiding affecting the tight contact between the chip to be tested and the test slot.

[0028] In this embodiment, a top plate 6 is installed in the opening at the end of the positioning groove away from the bottom ring 1, and a compression spring 7 is installed between the top plate 6 and the base 12.

[0029] In this embodiment, both the electric push rod and the drive mechanism are controlled by a microcontroller.

[0030] In this embodiment, panel 2 is made of insulating plastic material, which avoids conductivity and increases safety.

[0031] Working principle: The operator places the chip to be tested 8 into a positioning port 3 on the panel 2. The four corners of the chip are respectively mounted on four sliding bases 12, which support the chip and keep the bottom of the chip at a certain distance from the bottom surface of the positioning port 3.

[0032] The side of the chip contacts the positioning part 5 on the inner wall of the positioning port 3, so as to achieve precise positioning of the chip in the horizontal direction and prevent it from shifting during subsequent rotation.

[0033] The drive mechanism (consisting of a fixed plate 15 and a geared motor 16) is started, and the geared motor 16 drives the panel 2 to rotate on the bottom ring 1.

[0034] The panel 2 has multiple positioning ports 3 arranged in a ring. By rotating, the positioning ports 3 on which the chip to be tested 8 is placed can be sequentially transported to the test station directly above the chip test holder 13.

[0035] When the positioning port 3 carrying the chip to be tested 8 rotates to the test station (i.e., the position perpendicular to the lower pressure seat 10), the panel 2 stops rotating.

[0036] The electric push rod 9, controlled by the microcontroller, is activated, and its piston rod extends downward, pushing the lower pressure seat 10 down. The lower pressure seat 10 presses against the top of the chip 8 under test, forcing the chip as a whole to move downward.

[0037] When the chip is pressed down, its four corners press against the base 12, causing the base 12 to slide downward in the positioning groove and compress the compression spring 7 below it.

[0038] The chip is finally fully pressed into the test slot of the chip test socket 13 and connected to the contacts in the test slot, and the automatic functional and performance tests of the memory chip begin.

[0039] After the test is completed, the piston rod of the electric push rod 9 retracts upward, causing the lower pressure seat 10 to rise, relieving the pressure on the chip. The four compressed springs 7 release their elasticity, pushing the base 12 to slide upward and reset in the positioning groove.

[0040] The upper surface of the base 12 lifts the chip that has completed the test, allowing it to smoothly detach from the test slot of the chip test holder 13 and return to the original height position of the positioning port 3.

[0041] The grooves 14 at the four corners of the test slot of the chip test socket 13 provide necessary clearance for the base 12 and its movement, ensuring smooth and interference-free pressing and lifting processes.

[0042] After the above is completed, the drive mechanism starts again, the panel 2 rotates, moving the tested chip away from the test station, and at the same time sending the next chip to be tested 8 into the test station. The operator can conveniently pick up and put down the chip through the pick-up port 4 to realize a continuous automated testing process.

[0043] The above description is merely a specific embodiment of this utility model, but the protection scope of this utility model is not limited thereto. Any changes or substitutions conceived without inventive effort should be included within the protection scope of this utility model. Therefore, the protection scope of this utility model should be determined by the scope defined in the claims.

Claims

1. An automated memory chip testing device, characterized in that: The device includes a chip test socket (13), a bottom ring (1), and a panel (2). The panel (2) is disposed on the surface of the bottom ring (1). The surface of the panel (2) has a ring structure with multiple positioning ports (3). Each of the four corners of the positioning port (3) has a positioning groove. Each positioning groove has a base (12) slidably disposed in the positioning groove. A part of the base (12) extends through the positioning groove into the positioning port (3). The surface of the base (12) protrudes upward to form an extension that contacts the inner wall of the positioning groove. Each of the four sides of the positioning port (3) protrudes to form multiple positioning parts (5). Each positioning port (3) has a chip (8) to be tested. Each of the four corners of the chip (8) to be tested is mounted on the base (12). Each side of the chip (8) to be tested contacts the positioning part (5). The chip test socket (13) is mounted on the inner ring surface of the bottom ring (1). One end of the chip test socket (13) is equipped with a drive mechanism that drives the panel (2) to rotate.

2. The automated memory chip testing device according to claim 1, characterized in that: A support frame (11) is installed on the outer ring surface of the bottom ring (1). The other end of the support frame (11) extends to the top of the panel (2) and is vertically installed with an electric push rod (9). A lower pressure seat (10) is installed on the piston rod of the electric push rod (9). The lower pressure seat (10) is vertically opposite to any one of the positioning ports (3).

3. The automated memory chip testing device according to claim 1, characterized in that: The drive mechanism includes a fixed plate (15) and a geared motor (16). One end of the fixed plate (15) is mounted on the chip test socket (13), and the other end of the fixed plate (15) is provided with a shaft hole. The geared motor (16) is mounted on the outer side of the fixed plate (15), and the shaft of the geared motor (16) passes through the shaft hole and is fixedly connected to the center of the panel (2).

4. The automated memory chip testing device according to claim 1, characterized in that: Both sides of the positioning port (3) are provided with material picking ports (4) for inserting fingers.

5. The automated memory chip testing device according to claim 1, characterized in that: The chip test socket (13) has grooves (14) on each of the four corners of the test slot. The grooves (14) are all positioned opposite the positioning slots, and the depth of the grooves (14) is lower than the bottom surface of the test slot.

6. The automated memory chip testing device according to claim 1, characterized in that: A top plate (6) is installed in the opening at the end of the positioning groove away from the bottom ring (1), and a compression spring (7) is installed between the top plate (6) and the base (12).

7. The automated memory chip testing device according to claim 2, characterized in that: Both the electric actuator and the drive mechanism are controlled by a microcontroller.

8. The automated memory chip testing device according to claim 1, characterized in that: The panel (2) is made of insulating plastic material.

Images