Bit error tester

Abstract

This utility model relates to the field of digital communication testing instrument technology, and provides a bit error rate tester, including: a housing, multiple pairs of first upright plates, multiple second upright plates, and multiple functional modules. Multiple pairs of first upright plates are symmetrically arranged on opposite sides of the housing, and each first upright plate has multiple first sliding grooves along its height direction. Multiple second upright plates are arranged inside the housing along its length direction to divide the space inside the housing into multiple accommodating spaces. Each second upright plate has multiple second sliding grooves along its height direction on opposite sides, with each second sliding groove opposite to a first sliding groove. Each accommodating space has multiple slots. Each functional module is slidably connected to the first and second sliding grooves and hot-swappably connected to the slots. In this bit error rate tester, the functional modules can be freely combined or replaced according to specific testing requirements, facilitating system expansion and upgrades, and enabling data exchange with other testing equipment. In case of a failure in a functional module, it is easy to disassemble and replace.

Description

Technical Field

[0001] This utility model relates to the field of digital communication testing instrument technology, and in particular to a bit error rate tester. Background Technology

[0002] Traditional bit error rate testers typically employ a fixed, integrated hardware structure. Their functional modules and signal processing flows are designed for specific communication protocols or signal specifications, lacking necessary flexibility and scalability. Specifically: First, the equipment's functions are rigid and difficult to upgrade. Detection, processing, and display functions are all integrated, making it impossible to flexibly adjust or expand functional modules according to testing needs, and thus difficult to adapt to the rapid evolution of communication technologies. Second, testing adaptability is insufficient. Traditional designs struggle to quickly switch between different communication protocols, signal amplitudes, or rates, limiting their application scope. Third, maintenance and updates are difficult. Due to the highly integrated system structure, failures or functional upgrades usually require complete disassembly, resulting in long maintenance cycles, high costs, and disruption to the continuity of testing work. Therefore, existing bit error rate testers can no longer meet the testing requirements of modern communication systems for multi-protocol compatibility, high precision, and flexible configuration, necessitating the design of a new type of bit error rate tester. Utility Model Content

[0003] This invention provides a bit error rate tester to address the shortcomings of existing bit error rate testers, such as fixed equipment, poor adaptability, and difficulty in maintenance and updates.

[0004] This utility model provides a bit error rate tester, comprising: a housing, wherein multiple pairs of first upright plates are symmetrically arranged on opposite sides of the housing, and the first upright plates are provided with multiple first sliding grooves along their height direction; multiple second upright plates are arranged in the housing along the length direction of the housing to divide the space inside the housing into multiple accommodating spaces, each second upright plate is located between a pair of first upright plates, and multiple second sliding grooves are provided on opposite sides of the second upright plates along their height direction, each second sliding groove being arranged opposite to a first sliding groove, and each accommodating space being provided with multiple slots; and multiple functional modules, each functional module being slidably connected to the first sliding grooves and the second sliding grooves, and hot-swappably connected to the slots.

[0005] According to the present invention, a bit error rate tester further includes multiple pull-out devices. A pair of first upright plates or any one of the first upright plates and the second upright plate are provided with multiple slots along their height direction. One end of each pull-out device is embedded in the slot. The pull-out device is provided with a protrusion, and the protrusion abuts against the functional module.

[0006] According to the present invention, a bit error rate tester is provided in the housing, wherein a third upright plate is provided inside the housing, and the two ends of the third upright plate are connected to a pair of first upright plates. The third upright plate is provided with a plurality of first pins, which are used to connect to slot connectors.

[0007] According to the error tester provided by this utility model, the third upright plate is further provided with multiple pairs of second pins, which are used to connect to the signal module and the power module.

[0008] According to the present invention, a bit error rate tester is provided, the housing includes: a pair of side plates, the pair of side plates being arranged opposite to each other, each side plate having a plurality of first upright plates along its length direction; a rear plate, the two ends of the rear plate being respectively connected to the first ends of the pair of side plates; a bottom plate, the side plates and the rear plate being disposed on the bottom plate, and the second upright plates being disposed on the bottom plate.

[0009] According to the present invention, the error tester further includes a pair of heat dissipation plates, each heat dissipation plate being sandwiched between the side plate and the first upright plate. The first upright plate and the side plate are provided with multiple hollow structures, and the heat dissipation plate is provided with multiple heat dissipation holes, which are connected to the hollow structures.

[0010] According to the error tester provided by this utility model, the housing further includes: a plurality of first reinforcing ribs, each of the first reinforcing ribs being detachably connected to a pair of first upright plates and a second upright plate; and a plurality of second reinforcing ribs, the second reinforcing ribs being sandwiched between the first upright plate and the heat dissipation plate.

[0011] According to the error tester provided by this utility model, the housing further includes: a first cover, the bottom plate being disposed in the first cover and detachably connected to the first cover; a second cover, covering the side plate and the rear plate; and a front plate, detachably connected to the first cover, the second cover, and the pair of side plates.

[0012] According to the error tester provided by this utility model, the housing further includes multiple snap-fit ​​components. Each snap-fit ​​component has a groove for accommodating the first cover, the second cover, the side plate, and the rear plate. The bottom of the groove is also provided with a first slot and a second slot. The first cover has a first protruding edge, and the second cover has a second protruding edge. The first slot engages with the first protruding edge, and the second slot engages with the second protruding edge.

[0013] According to the present invention, a bit error rate tester is provided, wherein the front plate and the rear plate are provided with airflow channels, and the airflow channels are used to connect a fan.

[0014] The bit error rate tester provided by this utility model features sliding grooves on the first and second vertical plates, with slots in each accommodating space. Functional modules can be hot-swapped into the slots as they slide along the grooves, achieving precise positioning during installation. The modules can be freely combined or replaced according to specific testing needs, facilitating system expansion and upgrades, and enabling data exchange with other testing equipment. Furthermore, the hot-swappable connection facilitates disassembly and replacement in case of module failure, meeting the testing requirements of modern communication systems for multi-protocol compatibility, high precision, and flexible configuration. Attached Figure Description

[0015] To more clearly illustrate the technical solutions in this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this utility model. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0016] Figure 1 This is a schematic diagram of the error tester provided by this utility model.

[0017] Figure 2 This is an exploded view of the bit error rate tester provided by this utility model.

[0018] Figure 3 yes Figure 1 The enlarged view of point A shown in the image.

[0019] Figure 4 This is a schematic diagram of the internal structure of the bit error rate tester provided by this utility model.

[0020] Figure 5 yes Figure 4 The enlarged view of point B shown in the image.

[0021] Figure 6 yes Figure 4 The enlarged view of point C is shown in the image.

[0022] Figure label: 100. Housing; 101. Side panel; 102. Front panel; 103. Rear panel; 104. Bottom panel; 105. First cover; 106. Second cover; 110. First upright plate; 111. First slide groove; 112. Slot; 120. Second upright plate; 121. Second slide groove; 130. Heat sink; 141. First reinforcing rib; 142. Second reinforcing rib; 150. Snap-fit ​​component; 151. First slot; 152. Second slot; 160. Handle; 170. Foot; 180. Third upright plate; 181. First pin; 182. Second pin; 190. Pull-out aid; 191. Protrusion; 192. Arc-shaped groove; 200. Functional module; 1051. First raised edge; 1061. Second raised edge. Detailed Implementation

[0023] To make the objectives, technical solutions, and advantages of this utility model clearer, the technical solutions of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model.

[0024] The following is combined Figures 1-6 This invention describes a bit error rate tester.

[0025] like Figure 1 and Figure 3 As shown in the embodiment of this utility model, the bit error rate tester includes: a housing 100, multiple pairs of first upright plates 110, multiple second upright plates 120, and multiple functional modules 200. Multiple pairs of first upright plates 110 are symmetrically arranged on opposite sides of the housing 100. Each pair of first upright plates 110 is arranged sequentially along the length of the housing 100. Each first upright plate 110 has multiple first sliding grooves 111 along its height direction. Multiple second upright plates 120 are arranged within the housing 100 along the length of the housing 100. In this embodiment, each second upright plate 120 is located between a pair of first upright plates 110. The second upright plates 120 divide the space within the housing 100 into multiple accommodating spaces. Each accommodating space is used to accommodate multiple functional modules 200, and each accommodating space has multiple slots. The second vertical plate 120 has multiple second slide grooves 121 on its opposite sides along its height direction. Each second slide groove 121 is opposite to a first slide groove 111. Each functional module 200 can slide along the first slide groove 111 and the second slide groove 121 and be inserted into the slot to achieve hot-swap precise positioning.

[0026] In this embodiment, the functional modules include: a signal acquisition module, a bit error detection module, a data processing module, a communication interface module, and a power supply module. Each functional module 200 is hot-swappable within the enclosure 100. Each functional module 200 uses a unified standard interface and integrates an EEPROM to store its ID and operating parameters. The functional modules 200 can be freely combined or replaced according to specific testing requirements, facilitating system expansion and upgrades. Simultaneously, the enclosure 100 can also be connected to other testing equipment to achieve data exchange.

[0027] The bit error rate tester provided in this embodiment of the invention features sliding grooves on the first and second vertical plates, with slots in each accommodating space. Functional modules can be hot-swapped into the slots as they slide along the grooves, achieving precise positioning during installation. The modules can be freely combined or replaced according to specific testing needs, facilitating system expansion and upgrades, and enabling data exchange with other testing equipment. Furthermore, the hot-swappable connection facilitates disassembly and replacement in case of module failure, meeting the testing requirements of modern communication systems for multi-protocol compatibility, high precision, and flexible configuration.

[0028] like Figure 2 As shown, in an embodiment of this utility model, the box 100 includes: a pair of side plates 101, a rear plate 103, and a bottom plate 104. The pair of side plates 101 are disposed opposite to each other on the bottom plate 104, and both ends of the rear plate 103 are respectively connected to the first ends of the pair of side plates 101. Both the side plates 101 and the rear plate 103 are connected to the bottom plate 104 to form a box structure. Each side plate 101 has a plurality of first upright plates 110 along its length direction, and a second upright plate 120 is disposed parallel to the first upright plate 110 and located on the bottom plate 104.

[0029] like Figure 2 As shown, in an embodiment of this utility model, the housing 100 further includes a pair of heat dissipation plates 130, each heat dissipation plate 130 being sandwiched between a side plate 101 and a first upright plate 110. In this embodiment, both the first upright plate 110 and the side plate 101 have multiple hollow structures, and the heat dissipation plate 130 is provided with multiple heat dissipation holes, which communicate with the hollow structures to dissipate the heat generated by the functional modules 200 and the motherboard inside the housing 100 during operation.

[0030] like Figure 2As shown, in this embodiment of the present invention, the housing 100 further includes a plurality of first reinforcing ribs 141 and a plurality of second reinforcing ribs 142. Each first reinforcing rib 141 is detachably connected to a pair of first upright plates 110 and second upright plates 120 to form a torque-resistant frame, thereby improving the rigidity of the housing 100. A plurality of second reinforcing ribs 142 are provided between the first upright plate 110 and the heat dissipation plate 130 to improve the rigidity of the sidewalls of the housing 100. In this embodiment, by providing the first reinforcing ribs 141 and the second reinforcing ribs 142, the influence of transportation or on-site vibration on the internal functional module 200 can be resisted, thereby improving the testing accuracy.

[0031] Optionally, in this embodiment, the first reinforcing rib 141 can be a strip, and the second reinforcing rib 142 can be a strip block. The surface of the strip block facing the first upright plate 110 has multiple protrusions, which abut against the first upright plate 110, and the strip block abuts against the heat dissipation plate 130. In this embodiment, the second reinforcing rib 142 not only strengthens the rigidity of the side wall of the housing 100, but also, by providing protrusions, creates a gap between the first upright plate 110 and the heat dissipation plate 130 to facilitate heat conduction.

[0032] like Figure 4 and Figure 5 As shown, in this embodiment of the present invention, a third upright plate 180 is further provided inside the housing 100. The two ends of the third upright plate 180 are connected to a pair of first upright plates 110, and the third upright plate 180 is located on one side of the rear plate 103. The third upright plate 180 is provided with a plurality of first pins 181, which are used to connect to slot connectors. In this embodiment, the first pins 181 are designed with graded contact, and their contact sequence during connection is: first contact with the ground wire, then with the signal detection line, then with the high-speed signal data line, and finally with the power line. This design reduces the risk of transient impacts and contact arcing, protecting the integrity of high-speed signal transmission and circuit safety. Optionally, the lengths of the plurality of first pins 181 can be set to be different, so that during connection, the longer pins are connected first, and the shortest pins are connected last, to achieve graded contact.

[0033] like Figure 5 As shown, in this embodiment of the invention, the third upright plate 180 is further provided with multiple pairs of second pins 182, which are used to connect to the signal module and the power module. In this embodiment, the second pins 182 adopt a dual-redundant contact design, so that if one second pin 182 fails, it can connect to another second pin 182. Compared with a single-contact structure, the dual-redundant contact design can significantly reduce the probability of signal jitter and poor contact, making it suitable for high-speed bit error rate testing scenarios. Furthermore, elastic contact pieces can be provided at the signal module and the power module to absorb vibration displacement.

[0034] like Figure 2 As shown in the embodiment of this utility model, the box 100 further includes: a front plate 102, a first cover 105, and a second cover 106. A bottom plate 104 is disposed on the first cover 105 and is detachably connected to the first cover 105. The second cover 106 is disposed on the side plate 101 and the rear plate 103 and is detachably connected to the side plate 101 and the rear plate 103. The front plate 102 is detachably connected to the first cover 105, the second cover 106, and the second ends of the pair of side plates 101.

[0035] Specifically, in this embodiment, the first cover 105 can be a plate with three edges having bent protrusions. A bottom plate 104 is disposed inside the first cover 105. The lower parts of the side plates 101 and the rear plate 103 are each provided with rotatable latches. When the latches are rotated, they engage with the protrusions, thereby engaging the side plates 101 and the rear plate 103 with the first cover 105. Correspondingly, the second cover 106 can have three edges having bent protrusions. The upper parts of the side plates 101 and the rear plate 103 are also provided with rotatable latches. When the latches are rotated, they engage with the protrusions, thereby detachably connecting the side plates 101 and the rear plate 103 to the second cover 106. The front plate 102 can be detachably connected to the first cover 105, the second cover 106, and the second ends of the pair of side plates 101 via bolts.

[0036] like Figure 6 As shown in the embodiment of this utility model, the box body 100 further includes a plurality of snap-fit ​​members 150. The snap-fit ​​members 150 are provided with grooves. The bottom of the grooves is provided with a first snap-fit ​​groove 151 and a second snap-fit ​​groove 152. The first cover 105 has a first protruding edge 1051, and the second cover 106 has a second protruding edge 1061. The first snap-fit ​​groove 151 is snapped with the first protruding edge 1051, and the second snap-fit ​​groove 152 is snapped with the second protruding edge 1061.

[0037] Specifically, in this embodiment, the first cover 105 includes a first plate and a first protruding edge 1051. The first plate has upwardly extending first protruding edges 1051 on all three sides. The bottom plate 104 is disposed on the first plate. The first protruding edges 1051 located on both sides of the first plate are embedded between the heat sink 130 and the side plate 101, and the remaining first protruding edge 1051 is fitted to the rear plate 103. Correspondingly, the second cover 106 includes a second plate and a second protruding edge. The second plate has downwardly extending second protruding edges 1061 on all three sides. Two second protruding edges 1061 located on both sides of the second plate are embedded between the heat sink 130 and the side plate 101, and the other second protruding edge 1061 is fitted to the rear plate 103.

[0038] For ease of description, the structure after the above connection is referred to as a rectangular frame structure. Multiple snap-fit ​​pieces 150 are disposed on the rear plate 103, located at two corners of the rectangular frame structure. These two corners are located within two snap-fit ​​pieces 150; that is, portions of the side plate 101, the rear plate 103, the first cover 105, and the second cover 106 are all accommodated within the grooves of the snap-fit ​​pieces 150. The first protruding edge 1051 of the first cover 105 is engaged in the first slot 151, and the second protruding edge 1061 of the second cover 106 is engaged in the second slot 152. The snap-fit ​​pieces 150 connect the first cover 105 and the second cover 106 to the side plate 101 and the rear plate 103. The front plate 102 is detachably connected to the first cover 105, the second cover 106, and the second ends of the pair of side plates 101 via bolts. In this embodiment, by removing the snap-fit ​​connector 150, the first cover 105 and the second cover 106 can be separated from the side plate 101 and the rear plate 103, so as to facilitate the maintenance and replacement of the functional module 200 inside the housing 100.

[0039] Furthermore, the front panel 102 and rear panel 103 are provided with airflow channels, which can be connected to a fan to force cooling of the core heat-generating area. The front panel 102 also has multiple sets of standard interface openings for mounting signal interface boards as needed.

[0040] like Figure 6 As shown, in an embodiment of this utility model, the bit error rate tester further includes multiple pull-out aids 190. A pair of first upright plates 110, or any one of the first upright plates 110 and the second upright plate 120, are provided with multiple slots 112 along their height direction. The pull-out aid 190 is provided with a protrusion 191. When the functional module 200 is inserted into the slot, one end of the pull-out aid 190 is inserted into the slot 112, and the protrusion 191 abuts against the functional module 200 to lock the functional module 200 in its current installation position, preventing it from loosening due to vibration. Furthermore, the surface of the pull-out aid 190 facing the functional module 200 is provided with an arc-shaped groove 192 to form a handle. When the pull-out aid 190 is pulled, it can be withdrawn from the slot 112 to release the locking of the functional module 200. In this embodiment, by setting up the hot-swap assistant 190, the module replacement time is shortened and the hot-swap efficiency is improved while ensuring the reliability of locking.

[0041] like Figure 2 As shown in the embodiment of this utility model, the bottom surface of the first cover 105 is also provided with a plurality of feet 170 to ensure that the bit error rate tester is placed stably, and at the same time absorb some vibrations to improve the overall operational stability.

[0042] like Figure 2As shown in the embodiment of this utility model, the housing 100 also includes a pair of handles 160, which are disposed on a pair of side plates 101. The handles 160 are used for transporting and installing the bit error rate tester.

[0043] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this utility model, and not to limit it. Although this utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this utility model.

Claims

1. A bit error rate tester, characterized in that, include: The box body has multiple pairs of first upright plates symmetrically arranged on opposite sides, and the first upright plates have multiple first sliding grooves along their height direction; Multiple second uprights are disposed within the box along the length of the box body to divide the space within the box body into multiple accommodating spaces. Each second upright is located between a pair of first uprights. Multiple second sliding grooves are provided on the opposite sides of the second upright along its height direction. Each second sliding groove is disposed opposite to a first sliding groove. Multiple slots are provided in each accommodating space. Multiple functional modules, each of which is slidably connected to the first slide groove and the second slide groove, and hot-swappably connected to the slot.

2. The bit error rate tester according to claim 1, characterized in that, It also includes multiple pull-out aids. A pair of first upright plates or any one of the first upright plates and the second upright plate are provided with multiple slots along their height direction. One end of each pull-out aid is embedded in the slot. The pull-out aid is provided with a protrusion, and the protrusion abuts against the functional module.

3. The bit error rate tester according to claim 1, characterized in that, The housing is also provided with a third upright plate, the two ends of which are connected to a pair of first upright plates. The third upright plate is provided with a plurality of first pins, which are used to connect to slot connectors.

4. The bit error rate tester according to claim 3, characterized in that, The third upright plate is also provided with multiple pairs of second pins, which are used to connect to the signal module and the power module.

5. The bit error rate tester according to claim 1, characterized in that, The enclosure includes: A pair of side plates, the pair of side plates being arranged opposite to each other, each side plate having a plurality of first upright plates along its length direction; The rear plate, with its two ends respectively connected to the first ends of the pair of side plates; A base plate, the side plates and the rear plate are disposed on the base plate, and the second upright plate is disposed on the base plate.

6. The bit error rate tester according to claim 5, characterized in that, The housing also includes a pair of heat dissipation plates, each heat dissipation plate being sandwiched between the side plate and the first upright plate. The first upright plate and the side plate are provided with multiple hollow structures, and the heat dissipation plates are provided with multiple heat dissipation holes, which are connected to the hollow structures.

7. The bit error rate tester according to claim 6, characterized in that, The enclosure also includes: Multiple first reinforcing ribs, each of which is detachably connected to a pair of first upright plates and a pair of second upright plates; Multiple second reinforcing ribs are sandwiched between the first vertical plate and the heat dissipation plate.

8. The bit error rate tester according to claim 5, characterized in that, The enclosure also includes: The first cover body, wherein the bottom plate is disposed within the first cover body and is detachably connected to the first cover body; The second cover is disposed on the side plate and the rear plate; The front panel is detachably connected to the first cover, the second cover, and the pair of side panels.

9. The bit error rate tester according to claim 8, characterized in that, The housing also includes multiple snap-fit ​​components, each snap-fit ​​component having a groove for accommodating the first cover, the second cover, the side plate, and the rear plate. The bottom of the groove also has a first slot and a second slot. The first cover has a first protruding edge, the second cover has a second protruding edge, the first slot engages with the first protruding edge, and the second slot engages with the second protruding edge.

10. The bit error rate tester according to claim 8, characterized in that, The front panel and the rear panel are provided with airflow channels for connecting a fan.

Images