Semiconductor device test equipment conveyor

Abstract

1. The name of the product of this design: Conveying device part of semiconductor device testing equipment. 2. Purpose of the product of this design: This product as a whole is a semiconductor testing instrument (detector) used to calibrate the probe protection needle relative to the wafer. The part is the conveying device part that allows the wafers to enter and exit the main body. 3. The key design feature of this design product lies in the shape of the part for which protection is sought. 4. The picture or photo that best illustrates the design points: Stereoscopic diagram 1. 5. Other situations that require explanation: This design requires partial protection of the design. The part indicated by the solid line is the part that requires protection, and the part indicated by the dotted line is the part that does not require protection.

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