Housing of semiconductor device testing instrument

Abstract

1. Name of the product of this design: Shell part of a semiconductor device testing instrument. 2. Purpose of the product of this design: This product as a whole is a semiconductor test instrument (detector) used to calibrate the probe protection needle relative to the wafer. The part is a shell that protects the built-in components. 3. The key design feature of this design product lies in the shape of the part for which protection is sought. 4. The picture or photo that best illustrates the design points: Stereoscopic diagram 1. 5. Other situations that require explanation: This design requires partial protection of the design. The part indicated by the solid line is the part that requires protection, and the part indicated by the dotted line is the part that does not require protection.

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