Semiconductor Defect Detector
CN309135096SActive Publication Date: 2025-02-25WUHAN SANGU IND DESIGN CO LTD
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Patent Information
- Application Number
- CN202430419100.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-05
- Publication Date
- 2025-02-25
- Estimated Expiration
- 2039-07-05
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Figure 000003_ABST
Abstract
1. The name of the product of this design: semiconductor defect detector. 2. Purpose of this design product: This design product is used for detecting semiconductor defects. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: three-dimensional picture.
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