Probe (Flat Type)
CN309170487SActive Publication Date: 2025-03-14上海般若仪器科技中心
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Patent Information
- Application Number
- CN202430507828.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-12
- Publication Date
- 2025-03-14
- Estimated Expiration
- 2039-08-12
Smart Images
Figure 000007_ABST
Abstract
1. The name of this design product: Probe (flat type). 2. Purpose of this product design: used for eddy current testing of metal parts to facilitate subsequent sorting of material, hardness, metallographic structure, cracks and size. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: three-dimensional picture.
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