Semiconductor parameter analyzer
CN309178671SActive Publication Date: 2025-03-18WUHAN PUSAISI INSTR CO LTD
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Patent Information
- Application Number
- CN202430461883.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-23
- Publication Date
- 2025-03-18
- Estimated Expiration
- 2039-07-23
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Figure 000007_ABST
Abstract
1. The name of the product of this design: semiconductor parameter analyzer. 2. Purpose of this design product: This design product is used for testing semiconductor materials and devices. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: three-dimensional picture.
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