Material Characterization Test Equipment (1)
CN309178674SActive Publication Date: 2025-03-18CHINA ELECTRONIS TECH INSTR CO LTD
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Patent Information
- Application Number
- CN202430463410.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-24
- Publication Date
- 2025-03-18
- Estimated Expiration
- 2039-07-24
Smart Images
Figure 000007_ABST
Abstract
1. Name of the product of this design: Material characterization test device (1). 2. Purpose of the product of this design: a device for testing the absorption and reflection of terahertz waves by non-metallic materials. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: three-dimensional picture.
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