Microscopic infrared thermal imaging measurement system cabinet
CN309186827SActive Publication Date: 2025-03-21BEIJING YASHI HENGYUAN TECHNOLOGY DEVELOPMENT CO LTD
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Patent Information
- Application Number
- CN202430508676.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-12
- Publication Date
- 2025-03-21
- Estimated Expiration
- 2039-08-12
Smart Images
Figure 000001_ABST
Abstract
1. The name of the product of this design: Microscopic infrared thermal imaging measurement system cabinet. 2. The purpose of this design product: to shield the ambient light, heat and vibration when measuring the junction temperature of the chip; to indicate the test measurement status and to isolate the moving parts of the optical temperature measuring equipment from dust, etc. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: three-dimensional picture.
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