Semiconductor material testing equipment
CN309195375SActive Publication Date: 2025-03-25JIANGSU YSPHOTECH INTERGRATED CIRCUIT EQUIP CO LTD
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Patent Information
- Application Number
- CN202430523520.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-19
- Publication Date
- 2025-03-25
- Estimated Expiration
- 2039-08-19
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Figure 000001_ABST
Abstract
1. The name of the product of this design: semiconductor material testing equipment. 2. Purpose of this design product: Suitable for wafer or mask plate inspection. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: three-dimensional picture.
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