Chip tester (SYT-M810)
CN309195434SActive Publication Date: 2025-03-25HANGZHOU SHIDE CLOUD MEASUREMENT TECH CO LTD
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Patent Information
- Application Number
- CN202430656960.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-18
- Publication Date
- 2025-03-25
- Estimated Expiration
- 2039-10-18
Smart Images
Figure 000017_ABST
Abstract
1. The name of the product of this design: Chip tester (SYT‑M810). 2. Purpose of this design product: used to test memory and other chips. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: reference diagram of the combined state. 5. Other circumstances that require explanation Component description: The product involved in this design application is a component product, which consists of component 1 (test cabinet) and component 2 (test head).
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