Measuring instrument probe
CN309203407SActive Publication Date: 2025-03-28DUNXU TECHNOLOGY CO LTD
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Patent Information
- Application Number
- CN202430501514.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-08
- Publication Date
- 2025-03-28
- Estimated Expiration
- 2039-08-08
Smart Images
Figure 000001_ABST
Abstract
1. The name of the product of this design: measuring instrument probe. 2. Purpose of this design product: This design product is a measuring tool. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: Stereoscopic diagram 1. 5. Other situations that require explanation Description of change status: Usage Status Reference Figure 1 and Usage Status Reference Figure 2 respectively show the measurement instrument probe installed in different positions of the measurement instrument.
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