High and low temperature storage test cabinet
CN309203457SActive Publication Date: 2025-03-28SHENZHEN KINGSPEC ELECTRONICS TECH
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Patent Information
- Application Number
- CN202430407843.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-01
- Publication Date
- 2025-03-28
- Estimated Expiration
- 2039-07-01
Smart Images
Figure 000007_ABST
Abstract
1. The name of this design product: high and low temperature storage test cabinet. 2. Purpose of this design product: This design product is used as a high and low temperature storage test cabinet to test the performance changes of products after long-term storage at specific temperature and humidity. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: three-dimensional picture.
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