Power semiconductor device tester
CN309203531SActive Publication Date: 2025-03-28PANXIN TECH (SHANGHAI) CO LTD
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Patent Information
- Application Number
- CN202430528758.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-20
- Publication Date
- 2025-03-28
- Estimated Expiration
- 2039-08-20
Smart Images
Figure 000001_ABST
Abstract
1. The name of the product of this design: Power semiconductor device testing machine. 2. Purpose of this design product: used for screening, aging, testing, etc. of power semiconductor devices. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: three-dimensional picture.
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