Wafer defect analysis graphical user interface for electronic devices

Abstract

1. The name of the product of this design: Graphical user interface for wafer defect analysis for electronic equipment. 2. Purpose of this design product: This design product is used for an electronic device. 3. The key design point of this appearance design product lies in the graphical user interface. 4. The picture or photo that best illustrates the key points of the design: Design 1 change state diagram. 5. Designate Design 1 as the base design. 6. Purpose of the graphical user interface: This appearance design product is used to view wafer defect data and wafer defect image data; interface interaction process: the upper left corner of the design 1 main view is a wafer defect data statistics table; based on the design 1 main view, select a row of statistical data in the design 1 main view to jump to the design 1 change state diagram, and the design 1 change state diagram 1 can display the wafer distribution bar chart and wafer distribution diagram corresponding to the data selected by the user; the interaction method and purpose of design 2 are similar to design 1, the only difference is that based on the design 2 change state diagram 1, by selecting the defect in the wafer distribution diagram of the design 2 change state diagram 1, jump to the design 2 change state diagram 2, and the design 2 change state diagram 2 can display the defect graph of the selected defect.

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