Graphical user interface for statistical analysis of wafer data for electronic devices

Abstract

1. The name of the product of this design: Graphical user interface for statistical analysis of wafer data for electronic equipment. 2. Purpose of this design product: This design product is used for an electronic device. 3. The key design point of this appearance design product lies in the graphical user interface. 4. The picture or photo that best illustrates the key points of the design: Design 1 change state diagram. 5. Designate Design 1 as the base design. 6. Purpose of the graphical user interface: This design product is used to view the statistical data of wafers and quickly find the data source, wafer and wafer effective position of abnormal yield; Interface interaction process: The left side of the main view of Design 1 is an operation bar that supports filtering of various data dimensions, and the upper right side is a statistical chart of various data types, such as CP statistical data / WAT statistical data / FT statistical data / MET statistical data; Design 1 status diagram 1: Based on the main view of Design 1, after selecting data in the data statistics bar above, a data analysis chart or statistical table is generated below. The data analysis chart can be data Semiconductor analysis charts such as trend charts and box plots, such as the line chart of the design 1 change state diagram; the interaction method and purpose of design 2 are similar to those of design 1, the only difference is that on the basis of design 2 change state diagram 1, by selecting the data point or data object in the line chart below design 2 change state diagram 1, jump to design 2 change state diagram 2, and design 2 change state diagram 2 can display the area selected by the user; end the selection in design 2 change state diagram 2 and jump to design 2 change state diagram 3. Design 2 change state diagram 3 can generate a wafer failure diagram of the selected wafer on the lower right side.

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