The supporting leg part of the beam used to mount the microscope of the semiconductor device inspection machine

Abstract

1. Name of the product of this design: Supporting leg portion of a beam for mounting a microscope of a semiconductor device inspection machine. 2. Purpose of the product of this design: The overall purpose of this product is to position the needle of the probe card relative to the wafer in a semiconductor inspection machine (probe), and the local purpose is a pair of left and right support legs for installing the beam of a microscope. 3. The key design feature of this design product lies in the shape of the part for which protection is requested. 4. The picture or photo that best illustrates the design points: three-dimensional picture. 5. Other situations that need explanation: This design requests partial design protection. The part indicated by the solid line is the part requested for protection, and the part indicated by the dotted line is the part not requested for protection. Component 1 represents a single support foot.

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