Film Thickness Tester
CN309256136SActive Publication Date: 2025-04-25JIANGSU JICUI ZHONGKE ADVANCED PHOTOELECTRIC TECH RES INST CO LTD
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Patent Information
- Application Number
- CN202430577083.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-10
- Publication Date
- 2025-04-25
- Estimated Expiration
- 2039-09-10
Smart Images
Figure 000007_ABST
Abstract
1. The name of this design product: film thickness meter. 2. Purpose of this design product: This design product is used for measuring film thickness in the fields of semiconductors, optics, biomedicine, materials science, etc. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: three-dimensional picture.
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