Chip testing equipment
CN309267924SActive Publication Date: 2025-05-02SEICHI INTEGRATED CIRCUIT (HEFEI) CO LTD
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Patent Information
- Application Number
- CN202430618117.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-27
- Publication Date
- 2025-05-02
- Estimated Expiration
- 2039-09-27
Smart Images
Figure 000007_ABST
Abstract
1. The name of the product of this design: chip testing equipment. 2. Purpose of this design product: This design product is used to detect semiconductor chips. 3. The design key point of this appearance design product lies in the shape of the product. 4. The picture or photo that best illustrates the design points: Stereoscopic diagram 1.
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