Integrated semiconductor parameter test platform
CN309269868SActive Publication Date: 2025-05-02BEIJING IECUBE TECH CO LTD
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Patent Information
- Application Number
- CN202430623234.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-29
- Publication Date
- 2025-05-02
- Estimated Expiration
- 2039-09-29
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Figure 000001_ABST
Abstract
1. The name of this design product: integrated semiconductor parameter testing platform. 2. Purpose of the product of this design: Equipment used for testing and training of semiconductor materials and devices. 3. The design key point of this appearance design product lies in the combination of shape and pattern. 4. The picture or photo that best illustrates the design points: three-dimensional picture.
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