Wafer carrier inspection machine
CN309294607SActive Publication Date: 2025-05-16DONGGUAN WEIYIJIA AUTOMATION EQUIPMENT CO LTD
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Patent Information
- Application Number
- CN202430653221.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-16
- Publication Date
- 2025-05-16
- Estimated Expiration
- 2039-10-16
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Figure 000001_ABST
Abstract
1. The name of the product of this design: Wafer carrier inspection machine. 2. Purpose of this design product: used for wafer transportation and front and back side inspection of wafers. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: three-dimensional picture.
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