A graphical user interface for semiconductor equipment inspection in electronic devices, used to adjust the range of chip quality judgment on semiconductor equipment.
CN309825791SActive Publication Date: 2026-03-03HAMAMATSU PHOTONICS KK
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-08
- Publication Date
- 2026-03-03
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Figure 000001_ABST
Abstract
1. Name of the product in this design: A graphical user interface for semiconductor equipment inspection in electronic devices, used to adjust the range of chip quality judgment on semiconductor equipment. 2. Intended use of this design: This product is used in an electronic device. 3. The key design feature of this product is its graphical user interface. 4. The image or photograph that best illustrates the design's key features: the front view. 5. Purpose of the graphical user interface: The graphical user interface of this design is used for human-computer interaction and for adjusting the range of acceptable products for each chip formed on the semiconductor device during semiconductor equipment inspection. 6. Human-computer interaction method of graphical user interface: In the main view interface, the interface jumps sequentially from the main view according to the interface change state diagram 1, interface change state diagram 2 and interface change state diagram 3 through operations such as clicking, touching or voice commands. 7. Other situations requiring explanation: In the view, the parts shown by solid lines are the designs for which protection is required, and the parts shown by dashed lines are the parts for which protection is not required.
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