A graphical user interface for inspecting semiconductor devices in electronic equipment, used to inspect portions of the upper area of ​​semiconductor devices.

CN309825792SActive Publication Date: 2026-03-03HAMAMATSU PHOTONICS KK
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
Filing Date
2025-01-08
Publication Date
2026-03-03

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Abstract

1. Name of the product in this design: A portion of the upper area of ​​a semiconductor device for inspecting semiconductor devices using a graphical user interface for inspecting semiconductor devices in electronic devices. 2. Intended use of this design: This product is used in an electronic device. 3. The key design feature of this product is its graphical user interface. 4. The image or photograph that best illustrates the design's key features: the front view. 5. Purpose of the graphical user interface: The graphical user interface of this design is used for human-computer interaction and for inspecting each block area when multiple block areas composed of multiple chips are formed on the semiconductor equipment. 6. Human-computer interaction methods of graphical user interface: In the main view interface, settings can be made through clicking, touching, voice commands or scene triggering. 7. Other situations requiring explanation: The parts shown in solid lines in the views are the protected designs; the parts in each reference drawing other than those marked with red diagonal lines are the protected partial designs.
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