Probe pin for integrated circuits testing

CN309834534SActive Publication Date: 2026-03-06HICON CO LTD +2
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Patent Information

Application Number
CN202560001062.X
Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
Priority Date
2023-11-07
Filing Date
2024-05-03
Publication Date
2026-03-06
Estimated Expiration
2039-05-03

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