Radio Frequency Chip Test Equipment (ATE)
CN309935166SActive Publication Date: 2026-04-21SHANGHAI MINGJIAN MEASUREMENT & CONTROL EQUIPMENT CO LTD
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- SHANGHAI MINGJIAN MEASUREMENT & CONTROL EQUIPMENT CO LTD
- Filing Date
- 2025-10-22
- Publication Date
- 2026-04-21
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Figure 000007_ABST
Abstract
1. Name of the product in this design: Radio Frequency Chip Tester (ATE). 2. Purpose of this design: This design is used for mass production testing of various electrical performance parameters of radio frequency chips. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: a 3D model.
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