atomic force microscope

CN310006771SActive Publication Date: 2026-05-29SAILAI INSTRUMENTS (BEIJING) CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
SAILAI INSTRUMENTS (BEIJING) CO LTD
Filing Date
2025-11-04
Publication Date
2026-05-29

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Abstract

1. Name of the designed product: Atomic Force Microscope. 2. Use of the designed product: It is suitable for analytical instrument for studying the surface structure of solid materials including insulator. 3. Design points of the designed product: in shape. 4. Picture or photo showing the design points: perspective view.
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