Automated Spinneret Microscopic Inspection Machine
CN310085281SActive Publication Date: 2026-07-14HENAN QICE ELECTRONIC TECH CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- HENAN QICE ELECTRONIC TECH CO LTD
- Filing Date
- 2025-12-30
- Publication Date
- 2026-07-14
Smart Images
Figure 000008_ABST
Abstract
1. Name of the product in this design: Automated Spinneret Microscopic Inspection Machine. 2. Purpose of this design: To inspect the micropores of the spinneret to determine whether they are blocked, whether their shape is normal, and whether there are defects such as impurities, carbonization, or damage. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: a 3D model.
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