Scanning electron microscope (ZEM18)
CN310097151SActive Publication Date: 2026-07-17ANHUI ZEYOU TECH CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- ANHUI ZEYOU TECH CO LTD
- Filing Date
- 2026-02-06
- Publication Date
- 2026-07-17
Smart Images
Figure 000007_ABST
Abstract
1. Name of the product in this design: Scanning Electron Microscope (ZEM18). 2. Purpose of this design: To observe nanoscale microstructures. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: 3D view 1.
Need to check novelty before this filing date? Find Prior Art